scholarly journals Surface Modification of the EBM Ti-6Al-4V Alloy by Pulsed Ion Beam

Metals ◽  
2021 ◽  
Vol 11 (3) ◽  
pp. 512
Author(s):  
Natalia Pushilina ◽  
Ekaterina Stepanova ◽  
Andrey Stepanov ◽  
Maxim Syrtanov
Keyword(s):  
Surface Modification ◽  
Ion Beam ◽  
Tensile Tests ◽  
Alpha Phase ◽  
Uniaxial Tensile ◽  
Tem Analysis ◽  
Gradient Microstructure ◽  
Carbon Ion Beam ◽  
Phase Plates ◽  
Slight Rise

The effect of surface modification of Ti-6Al-4V samples manufactured by electron beam melting (EBM) using a pulsed carbon ion beam is studied in the present work. Based on the results of XRD, SEM, and TEM analysis, patterns of changes in the microstructure and phase composition of the EBM Ti-6Al-4V alloy, depending on the number of pulses of pulsed ion beam exposure, are revealed. It was found that gradient microstructure is formed as a result of pulsed ion beam irradiation of the EBM Ti-6Al-4V samples. The microstructure of the surface layer up to 300 nm thick is represented by the (α + α”) phase. At depths of 0.3 μm, the microstructure is mixed and contains alpha-phase plates and needle-shaped martensite. The mechanical properties were investigated using methods of uniaxial tensile tests, micro- and nanohardness measurements, and tribological tests. It was shown that surface modification by a pulsed ion beam at an energy density of 1.92 J/cm2 and five pulses leads to an increase in the micro- and nanohardness of the surface layers, a decrease in the wear rate, and a slight rise in the plasticity of EBM Ti-6Al-4V alloy.

scholarly journals Fabrication of Nanopore in MoS2-Graphene vdW Heterostructure by Ion Beam Irradiation and the Mechanical Performance

Nanomaterials ◽  
2022 ◽  
Vol 12 (2) ◽  
pp. 196
Author(s):  
Xin Wu ◽  
Ruxue Yang ◽  
Xiyue Chen ◽  
Wei Liu
Keyword(s):  
Mechanical Performance ◽  
Ion Irradiation ◽  
Ion Beam ◽  
Tensile Tests ◽  
Uniaxial Tensile ◽  
Beam Irradiation ◽  
Ion Beam Irradiation ◽  
Stacking Order ◽  
Vdw Heterostructure ◽  
Nanopore Structure

Nanopore structure presents great application potential especially in the area of biosensing. The two-dimensional (2D) vdW heterostructure nanopore shows unique features, while research around its fabrication is very limited. This paper proposes for the first time the use of ion beam irradiation for creating nanopore structure in 2D vdW graphene-MoS2 heterostructures. The formation process of the heterostructure nanopore is discussed first. Then, the influence of ion irradiation parameters (ion energy and ion dose) is illustrated, based on which the optimal irradiation parameters are derived. In particular, the effect of stacking order of the heterostructure 2D layers on the induced phenomena and optimal parameters are taken into consideration. Finally, uniaxial tensile tests are conducted by taking the effect of irradiation parameters, nanopore size and stacking order into account to demonstrate the mechanical performance of the heterostructure for use under a loading condition. The results would be meaningful for expanding the applications of heterostructure nanopore structure, and can arouse more research interest in this area.

scholarly journals Influence of the surface modification by sanding of carbon textile reinforcements on the bond and load-bearing behavior of textile reinforced concrete

2019 ◽  
Vol 289 ◽  
pp. 04006
Author(s):  
Cynthia Morales Cruz ◽  
Michael Raupach
Keyword(s):  
Surface Modification ◽  
Reinforced Concrete ◽  
Tensile Tests ◽  
Measuring System ◽  
Uniaxial Tensile ◽  
Testing Time ◽  
Textile Reinforced Concrete ◽  
Load Bearing ◽  
Surface Modified ◽  
Bearing Behavior

In the context of the application of carbon Textile Reinforced Concrete (TRC) layers for the durable repair of building surfaces, uniaxial tensile tests on rectangular TRC samples were carried out to compare the bond and load-bearing behavior of an epoxy-impregnated carbon textile and its surface modified version. The aim of the surface modification, consisting of a subsequent coating with epoxy resin and sanding with quartz sand, is the improvement of the composite material regarding crack width reduction and an increase of the load-bearing capacity. A total of 15 series were examined and the parameters: reinforcement type, orientation and ratio were varied. In addition, long-term load tests were conducted. An optical 3D-video measuring system in combination with a DIC-software was used, which allowed the analysis of the process of crack formation during the entire testing time. With the surface modified reinforcement the formation of approx. 1.5 times the number of cracks with averagely 33 % smaller crack widths and up to 50 % smaller crack spacings were observed, regardless of the ratio of reinforcement. The residual behaviour of the series subjected to a permanent load of 1500 MPa over 1000 h showed no reduction of the tensile stress compared to short-term tests.

scholarly journals Strength and toughness of structural fibres for composite material reinforcement

2016 ◽  
Vol 374 (2071) ◽  
pp. 20150274 ◽  
Author(s):  
M. Herráez ◽  
A. Fernández ◽  
C. S. Lopes ◽  
C. González
Keyword(s):  
Focused Ion Beam ◽  
Structural Integrity ◽  
Ion Beam ◽  
Permanent Deformation ◽  
Tensile Tests ◽  
Beam Current ◽  
Fibre Axis ◽  
Uniaxial Tensile ◽  
Glass Fibres ◽  
Milling Operations

The characterization of the strength and fracture toughness of three common structural fibres, E-glass, AS4 carbon and Kevlar KM2, is presented in this work. The notched specimens were prepared by means of selective carving of individual fibres by means of the focused ion beam. A straight-fronted edge notch was introduced in a plane perpendicular to the fibre axis, with the relative notch depth being a 0 / D ≈0.1 and the notch radius at the tip approximately 50 nm. The selection of the appropriate beam current during milling operations was performed to avoid to as much as possible any microstructural changes owing to ion impingement. Both notched and un-notched fibres were submitted to uniaxial tensile tests up to failure. The strength of the un-notched fibres was characterized in terms of the Weibull statistics, whereas the residual strength of the notched fibres was used to determine their apparent toughness. To this end, the stress intensity factor of a fronted edge crack was computed by means of the finite-element method for different crack lengths. The experimental results agreed with those reported in the literature for polyacrylonitrile-based carbon fibres obtained by using similar techniques. After mechanical testing, the fracture surface of the fibres was analysed to ascertain the failure mechanisms. It was found that AS4 carbon and E-glass fibres presented the lower toughness with fracture surfaces perpendicular to the fibre axis, emanating from the notch tip. The fractured region of Kevlar KM2 fibres extended along the fibre and showed large permanent deformation, which explains their higher degree of toughness when compared with carbon and glass fibres. This article is part of the themed issue ‘Multiscale modelling of the structural integrity of composite materials’.

Development of Electrostatic Actuated Nano Tensile Testing Device for Mechanical and Electrical Characteristics of FIB Deposited Carbon Nanowire

2006 ◽  
Vol 924 ◽  
Author(s):  
Mario Kiuchi ◽  
Shinji Matsui ◽  
Yoshitada Isono
Keyword(s):  
Ion Beam ◽  
Tensile Load ◽  
Chemical Vapor ◽  
Tensile Tests ◽  
Carbon Films ◽  
Uniaxial Tensile ◽  
Resistance Change ◽  
Carbon Nanowire ◽  
Focus Ion Beam ◽  
Carbon Nanowires

ABSTRACTThis research develops Electrostatic Actuated NAno Tensile testing devices (EANATs) to evaluate mechanical and electrical properties of carbon nanowires fabricated by focus ion beam- assisted chemical vapor deposition (FIB-CVD). This research carried out nanoscale uniaxial tensile tests for 90 nm- to 150 nm-diametric carbon nanowires using EANATs. Young's modulus of cabon nanowires averaged 58 GPa, which was close to that of hydrogenated diamond-like carbon films. On average, fracture stress and strain of carbon nanowires reached values of 4.2 GPa and 0.08, respectively. This research also measured I-V characteristics of 100 nm-diametric carbon nanowires under tensile loading to reveal the piezo resistivity of nanowires. The piezoresistive effect of carbon nanowire was observed. The tensile load was about 0.75 GPa at maximum value of the resistance change.

Lorentz electron microscopy of magnetic domains in rapidly solidified and annealed Pt-Co-B alloys

1991 ◽  
Vol 49 ◽  
pp. 784-785
Author(s):  
N. Qiu ◽  
J. E. Wittig
Keyword(s):  
Rapid Solidification ◽  
Ion Beam ◽  
Magnetic Behavior ◽  
High Coercivity ◽  
Magnetic Domains ◽  
Beam Angle ◽  
Tem Analysis ◽  
Intrinsic Coercivity ◽  
Hard Magnets ◽  
Rapidly Solidified

PtCo hard magnets have specialized applications owing to their relatively high coercivity combined with corrosion resistance and ductility. Increased intrinsic coercivity has been recently obtained by rapid solidification processing of PtCo alloys containing boron. After rapid solidification by double anvil splat quenching and subsequent annealing for 30 minutes at 650°C, an alloy with composition Pt42Co45B13 (at.%) exhibited intrinsic coercivity up to 14kOe. This represents a significant improvement compared to the average coercivities in conventional binary PtCo alloys of 5 to 8 kOe.Rapidly solidified specimens of Pt42Co45B13 (at.%) were annealed at 650°C and 800°C for 30 minutes. The magnetic behavior was characterized by measuring the coercive force (Hc). Samples for TEM analysis were mechanically thinned to 100 μm, dimpled to about 30 nm, and ion milled to electron transparency in a Gatan Duomill at 5 kV and 1 mA gun current. The incident ion beam angle was set at 15° and the samples were liquid nitrogen cooled during milling. These samples were analyzed with a Philips CM20T TEM/STEM operated at 200 kV.

TEM Sample Preparation Tricks for Advanced DRAMs

2015 ◽  
Author(s):  
Ching Shan Sung ◽  
Hsiu Ting Lee ◽  
Jian Shing Luo
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Sample Preparation ◽  
Integrated Circuit ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Tem Analysis ◽  
Cross Sectional ◽  
Transmission Electron ◽  
Characterization Of Materials

Abstract Transmission electron microscopy (TEM) plays an important role in the structural analysis and characterization of materials for process evaluation and failure analysis in the integrated circuit (IC) industry as device shrinkage continues. It is well known that a high quality TEM sample is one of the keys which enables to facilitate successful TEM analysis. This paper demonstrates a few examples to show the tricks on positioning, protection deposition, sample dicing, and focused ion beam milling of the TEM sample preparation for advanced DRAMs. The micro-structures of the devices and samples architectures were observed by using cross sectional transmission electron microscopy, scanning electron microscopy, and optical microscopy. Following these tricks can help readers to prepare TEM samples with higher quality and efficiency.

Direct Plan View FIB Liftout for Near-Surface Defect Analysis in TEM

2013 ◽  
Author(s):  
Max L. Lifson ◽  
Carla M. Chapman ◽  
D. Philip Pokrinchak ◽  
Phyllis J. Campbell ◽  
Greg S. Chrisman ◽  
...  
Keyword(s):  
Failure Analysis ◽  
Silicon Germanium ◽  
Focused Ion Beam ◽  
Surface Defects ◽  
Ion Beam ◽  
Misfit Dislocations ◽  
Tem Analysis ◽  
Plan View ◽  
Near Surface ◽  
Straightforward Method

Abstract Plan view TEM imaging is a powerful technique for failure analysis and semiconductor process characterization. Sample preparation for near-surface defects requires additional care, as the surface of the sample needs to be protected to avoid unintentionally induced damage. This paper demonstrates a straightforward method to create plan view samples in a dual beam focused ion beam (FIB) for TEM studies of near-surface defects, such as misfit dislocations in heteroepitaxial growths. Results show that misfit dislocations are easily imaged in bright-field TEM and STEM for silicon-germanium epitaxial growth. Since FIB tools are ubiquitous in semiconductor failure analysis labs today, the plan view method presented provides a quick to implement, fast, consistent, and straightforward method of generating samples for TEM analysis. While this technique has been optimized for near-surface defects, it can be used with any application requiring plan view TEM analysis.

A Methodology to Reduce Ion Beam Induced Damage in TEM Specimens Prepared by FIB

2002 ◽  
Author(s):  
Chin Kai Liu ◽  
Chi Jen. Chen ◽  
Jeh Yan.Chiou ◽  
David Su
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Sample Preparation ◽  
Integrated Circuit ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Specimen Preparation ◽  
Tem Analysis ◽  
Sensitive Issue ◽  
Transmission Electron

Abstract Focused ion beam (FIB) has become a useful tool in the Integrated Circuit (IC) industry, It is playing an important role in Failure Analysis (FA), circuit repair and Transmission Electron Microscopy (TEM) specimen preparation. In particular, preparation of TEM samples using FIB has become popular within the last ten years [1]; the progress in this field is well documented. Given the usefulness of FIB, “Artifact” however is a very sensitive issue in TEM inspections. The ability to identify those artifacts in TEM analysis is an important as to understanding the significance of pictures In this paper, we will describe how to measure the damages introduced by FIB sample preparation and introduce a better way to prevent such kind of artifacts.

scholarly journals Texture Selection Mechanisms during Recrystallization and Grain Growth of a Magnesium-Erbium-Zinc Alloy

Metals ◽  
2021 ◽  
Vol 11 (1) ◽  
pp. 171
Author(s):  
Fatim-Zahra Mouhib ◽  
Fengyang Sheng ◽  
Ramandeep Mandia ◽  
Risheng Pei ◽  
Sandra Korte-Kerzel ◽  
...  
Keyword(s):  
Grain Growth ◽  
Ternary Alloy ◽  
Solute Drag ◽  
Tensile Tests ◽  
Electron Back Scatter Diffraction ◽  
Zinc Alloy ◽  
Uniaxial Tensile ◽  
Microstructural Stability ◽  
Solid Solution Strengthening ◽  
Zener Drag

Binary and ternary Mg-1%Er/Mg-1%Er-1%Zn alloys were rolled and subsequently subjected to various heat treatments to study texture selection during recrystallization and following grain growth. The results revealed favorable texture alterations in both alloys and the formation of a unique ±40° transvers direction (TD) recrystallization texture in the ternary alloy. While the binary alloy underwent a continuous alteration of its texture and grain size throughout recrystallization and grain growth, the ternary alloy showed a rapid rolling (RD) to transvers direction (TD) texture transition occurring during early stages of recrystallization. Targeted electron back scatter diffraction (EBSD) analysis of the recrystallized fraction unraveled a selective growth behavior of recrystallization nuclei with TD tilted orientations that is likely attributed to solute drag effect on the mobility of specific grain boundaries. Mg-1%Er-1%Zn additionally exhibited a stunning microstructural stability during grain growth annealing. This was attributed to a fine dispersion of dense nanosized particles in the matrix that impeded grain growth by Zener drag. The mechanical properties of both alloys were determined by uniaxial tensile tests combined with EBSD assisted slip trace analysis at 5% tensile strain to investigate non-basal slip behavior. Owing to synergic alloying effects on solid solution strengthening and slip activation, as well as precipitation hardening, the ternary Mg-1%Er-1%Zn alloy demonstrated a remarkable enhancement in the yield strength, strain hardening capability, and failure ductility, compared with the Mg-1%Er alloy.

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