On the Characterization of Ultra Thin Al Films Deposited onto SiC Substrate Using PIXE Technique

2011 ◽  
Vol 324 ◽  
pp. 302-305
Author(s):  
Ghassan Younes ◽  
Maher Soueidan ◽  
Gabriel Ferro ◽  
Khaled Zahraman ◽  
Bilal Nsouli
Keyword(s):  
Limit Of Detection ◽  
Ion Beam ◽  
Al Doping ◽  
X Ray ◽  
Tilting Angle ◽  
Silicon Carbide Substrate ◽  
Non Destructive ◽  
Accurate Quantification ◽  
Good Agreement

In this work the capability of the proton induced X-ray emission (PIXE) technique to monitor a rapid, non-destructive and accurate quantification of Al on or inside SiC is discussed. Optimization of PIXE acquisition parameters was performed using as reference, a thin Al film (2.5 nm) thermally evaporated onto silicon carbide substrate. In order to improve the sensitivity for Al detection and quantitative determination, a systematic study was undertaken using proton ion beam at different energies (from 0.2 to 3 MeV) with a different tilting angle (0°, 60°, and 80°). The limit of detection (LOD) was found to be lower than 0.02 nm. The optimum PIXE conditions (energy, angle) were applied for determining the Al doping concentration in thin (1 µm) 4H-SiC homoepitaxial layer. The Al concentration as determined by PIXE was found to be 3.9x1020 at/cm3 in good agreement with SIMS measurements, and the LOD was estimated to be 6x1018 at/cm3.

On the Quantification of Al Incorporated in SiC Material Using Particle Induced X-Ray Emission Technique

2011 ◽  
Vol 679-680 ◽  
pp. 189-192
Author(s):  
Maher Soueidan ◽  
Bilal Nsouli ◽  
Gabriel Ferro ◽  
Ghassan Younes
Keyword(s):  
Quantitative Determination ◽  
Doping Concentration ◽  
Limit Of Detection ◽  
Ion Beam ◽  
Al Doping ◽  
X Ray ◽  
Tilting Angle ◽  
Non Destructive ◽  
Accurate Quantification ◽  
Good Agreement

In this work the capability of the proton induced X-ray emission (PIXE) technique to monitor a rapid, non-destructive and accurate quantification of Al on and in Si-based matrix is discussed. Optimization of PIXE acquisition parameters was performed using as reference a thin Al film (2.5 nm) thermally evaporated onto silicon substrate. In order to improve the sensitivity for Al detection and quantitative determination, a systematic study was undertaken using proton ion beam at different energies (from 0.3 to 3 MeV) with a different tilting angle (0°, 60°, and 80°). The limit of detection (LOD) was found to be lower than 0.2 nm. The optimum PIXE conditions (energy, angle) were applied for determining the Al doping concentration in thin (1 µm) 4H-SiC homoepitaxial layer. The Al concentration as determined by PIXE was found to be 3.9x1020 at/cm3 in good agreement with SIMS measurements, and the LOD was estimated to be 6x1018 at/cm3.

Non-Destructive Micro-Chemical and Micro-Luminescence Characterization of Jadeite

2016 ◽  
Vol 22 (6) ◽  
pp. 1304-1315 ◽  
Author(s):  
Alejandro Mitrani Viggiano ◽  
José Luis Ruvalcaba Sil ◽  
Mayra D. Manrique Ortega ◽  
Victoria Corregidor Berdasco
Keyword(s):  
Ion Beam ◽  
Nuclear Microprobe ◽  
X Ray Diffraction ◽  
Mineral Contents ◽  
Spanish Conquest ◽  
Distinctive Features ◽  
X Ray ◽  
Fourier Transformed Infrared Spectroscopy ◽  
Non Destructive

AbstractJadeite was greatly appreciated by pre-Hispanic cultures in Mesoamerica. Despite its importance, knowledge of its mining sources was lost after the Spanish conquest. In the 1950s the only confirmed jadeite deposits in Mesoamerica were found in the Motagua River Fault (MRF), Guatemala. The aim of this study is to present a methodology that is appropriate for the study of archeological jadeite objects using non-destructive spectroscopic and micro-ion beam analysis techniques. This methodology has been applied to perform mineral, elemental, and luminescence characterization of five jadeite samples from the MRF, with white, lilac, and green colors. Fourier-transformed infrared spectroscopy and X-ray diffraction analysis confirmed the presence of jadeite, albite, and omphacite as the main mineral phases in the samples. Elemental maps using particle-induced X-ray emission (PIXE) with a nuclear microprobe and elemental concentration analysis from individual mineral grains using micro-PIXE coupled with micro-ionoluminescence (IL) allowed the detection of minor feldspar, titanite, and grossular mineral contents. Distinctive features from the mineral, elemental, and luminescence characterization have been found that allow the identification of these five jadeite samples.

Combining surface X-ray scattering and ellipsometry for non-destructive characterization of ion beam-induced GaSb surface nanostructures

2014 ◽  
Vol 571 ◽  
pp. 538-542
Author(s):  
Kristin Høydalsvik ◽  
Lars Martin S. Aas ◽  
Ellen Døli ◽  
Elin Søndergård ◽  
Morten Kildemo ◽  
...  
Keyword(s):  
Ion Beam ◽  
X Ray ◽  
X Ray Scattering ◽  
Surface Nanostructures ◽  
Non Destructive ◽  
Non Destructive Characterization ◽  
Ray Scattering

Characterization of Natural and Synthesized FeTiO3 Crystals With RBS/PIXE/XRD

1997 ◽  
Vol 07 (03n04) ◽  
pp. 265-275
Author(s):  
R. Q. Zhang ◽  
S. Yamamoto ◽  
Z. N. Dai ◽  
K. Narumi ◽  
A. Miyashita ◽  
...  
Keyword(s):  
Single Crystals ◽  
Ion Beam ◽  
Pressure Control ◽  
Floating Zone ◽  
X Ray Diffraction ◽  
X Ray ◽  
Beam Analysis ◽  
Ppm Level

Natural FeTiO 3 (illuminate) and synthesized FeTiO 3, single crystals were characterized by Rutherford backscattering spectroscopy combined with channeling technique and particle-induced x-ray emission (RBS-C and PIXE). The results obtained by the ion beam analysis were supplemented by the x-ray diffraction analysis to identify the crystallographic phase. Oriented single crystals of synthesized FeTiO 3 were grown under the pressure control of CO 2 and H 2 mixture gas using a single-crystal floating zone technique. The crystal quality of synthesized FeTiO 3 single crystals could be improved by the thermal treatment but the exact pressure control is needed to avoid the precipitation of Fe 2 O 3 even during the annealing procedure. Natural FeTiO 3 contains several kinds of impurities such as Mn , Mg , Na and Si . The synthesized samples contain Al , Si and Na which are around 100 ppm level as impurities. The PBS-C results of the natural sample imply that Mn impurities occupy the Fe sublattice in FeTiO 3 or in mixed phase between ilmenite and hematite.

Characterisation of concrete, mortar and calcium silicate hydrated phases (CSH) and thorium retention analyses by ion beam techniques.

2012 ◽  
Vol 1475 ◽  
Author(s):  
Ursula Alonso ◽  
Tiziana Missana ◽  
Miguel Garcia-Gutierrez ◽  
Henar Rojo ◽  
Alessandro Patelli ◽  
...  
Keyword(s):  
Calcium Silicate ◽  
Cement Hydration ◽  
Ion Beam ◽  
X Ray ◽  
Tetravalent Actinide ◽  
Radioactive Waste Repositories ◽  
Edx Analyses ◽  
Waste Repositories ◽  
Beam Technique

ABSTRACTCement-based materials, like concrete and mortar, are widely used in radioactive waste repositories. A deep characterization of these heterogeneous materials, and of their main phases, is necessary to evaluate their capability of retaining critical radionuclides (RN).In this study, the ion beam technique micro- Particle Induced X- Ray Emission (μPIXE) is used to characterize the concrete and mortar used in the Spanish low level waste repository. Two calcium silicate hydrate (CSH) phases with different Ca/Si ratio are also studied, because they are known to be amongst the most relevant phases, formed upon cement hydration, that retain RN. The retention of thorium on the above mention materials, as relevant tetravalent actinide, is also analyzed. Results are compared with Scanning Electron Microscopy- Energy Dispersive X-Ray Spectroscopy (SEM-EDX) analyses.

Handheld Portable Energy-Dispersive X-Ray Fluorescence Spectrometry (pXRF)

2016 ◽  
pp. 362-381 ◽  
Author(s):  
Elisabeth Holmqvist
Keyword(s):  
Production Systems ◽  
Matrix Effects ◽  
Chemical Characterization ◽  
High Sensitivity ◽  
Limited Range ◽  
Energy Dispersive ◽  
Analytical Sensitivity ◽  
X Ray ◽  
Non Destructive

Handheld portable energy-dispersive X-ray fluorescence (pXRF) spectrometry is used for non-destructive chemical characterization of archaeological ceramics. Portable XRF can provide adequate analytical sensitivity to discriminate geochemically distinct ceramic pastes, and to identify compositional clusters that correlate with data patterns acquired by NAA or other high sensitivity techniques. However, successful non-destructive analysis of unprepared inhomogeneous ceramic samples requires matrix-defined scientific protocols to control matrix effects which reduce the sensitivity and precision of the instrumentation. Quantification of the measured fluorescence intensities into absolute concentration values and detection of light elements is encumbered by the lack of matrix matched calibration and proper vacuum facilities. Nevertheless, semi-quantitative values for a limited range of high Z elements can be generated. Unstandardized results are difficult to validate by others, and decreased analytical resolution of non-destructive surface analysis may disadvantage site-specific sourcing, jeopardize correct group assignments, and lead to under-interpretation of ceramic craft and production systems.

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