Study on Nano-SiO2 Measured by Atomic Force Microscope

2011 ◽  
Vol 399-401 ◽  
pp. 2130-2133
Author(s):  
Zhang Jing ◽  
Qi Zhi Cao ◽  
Jian Ying Li
Keyword(s):  
Atomic Force Microscope ◽  
Physical Mechanism ◽  
Structural Evolution ◽  
Particle Growth ◽  
Experimental Results ◽  
Particle Sizes ◽  
X Ray Diffraction ◽  
X Ray ◽  
Atomic Force ◽  
Different Temperatures

The morphology and structural evolution of nano-SiO2powers obtained by pressuring samples and sintering in muffle at different temperatures were studied by X-ray diffraction (XRD) and atomic force microscope (AFM). The experimental results show that the particle sizes of nano-SiO2increase with temperature rising, and it meets the physical mechanism of particle growth.

Microstructure and Properties of Nanosemicrystalline Si3N4 Ceramics with Doped Sintering Additives: Part II. Phase Transformation and Microstructural Control

1998 ◽  
Vol 13 (9) ◽  
pp. 2588-2596 ◽  
Author(s):  
K. H. Ryu ◽  
J-M. Yang
Keyword(s):  
Electron Microscopy ◽  
Pressureless Sintering ◽  
Particle Sizes ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sintering Additives ◽  
Different Temperatures ◽  
Si3n4 Ceramics ◽  
Scanning Electron ◽  
Microstructural Control

The low temperature pressureless sintering of a nanosized Si3N4 powder with doped sintering additives was investigated. The microstructural evolution during sintering at different temperatures was analyzed using x-ray diffraction and scanning electron microscopy. The effect of using nanosized Si3N4 powder as a catalyst to accelerate the α→β–Si3N4 transformation of a commercial Si3N4 powder with larger particle sizes was also investigated. Finally, two stage sintering was used to study the feasibility of controlling the microstructure and the mechanical properties of the nanosized silicon nitride.

scholarly journals Effects of Size and Dispersity of Microcrystalline Celluloses on Size, Structure and Stability of Nanocrystalline Celluloses Extracted by Acid Hydrolysis

Nano LIFE ◽  
2014 ◽  
Vol 04 (04) ◽  
pp. 1441014 ◽  
Author(s):  
Qi Liu ◽  
Weiping Hao ◽  
Yongguang Yang ◽  
Aurore Richel ◽  
Canbin Ouyang ◽  
...  
Keyword(s):  
Particle Size ◽  
Acid Hydrolysis ◽  
Size Structure ◽  
Particle Sizes ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Sonication Treatment

Nanocrystalline celluloses (NCCs) were separated from four commercial microcrystalline celluloses (MCCs) by an acid hydrolysis–sonication treatment. Transmission electron microscopy (TEM), atomic force microscopy (AFM), Fourier transform infrared (FTIR) spectrum, X-ray diffraction (XRD) and thermogravimetric analysis (TGA) were conducted to investigate the NCCs. MCCs with different morphologies and particle sizes showed different aggregation degrees. The aggregation of MCCs followed the order MCC1 > MCC3 > MCC2 > MCC4, which is the same order of the heights of the resulting NCCs. The best uniformity and thermal stability were characterized for NCC3, which was produced by MCC3 with smallest original particle size and good dispersity among the four MCCs. This result suggests that both the original particle size and dispersity of MCCs had significant effects on separated NCCs.

Growth and Surface Morphology of Thin Silicon Films Using an Atomic Force Microscope

1992 ◽  
Vol 280 ◽  
Author(s):  
Rama I. Hegde ◽  
Mark A. Chonko ◽  
Philip J. Tobin
Keyword(s):  
Surface Morphology ◽  
Atomic Force Microscope ◽  
Amorphous Film ◽  
Silicon Films ◽  
X Ray Diffraction ◽  
Cross Sectional ◽  
Atomic Force ◽  
Average Grain Size ◽  
Different Temperatures ◽  
Higher Temperature

ABSTRACTThe growth and surface morphology of thin LPCVD silicon films were investigated with an atomic force microscope (AFM). Silicon films of 30 nm thicknesses were deposited on SiO2 using SiH4 at four different temperatures between 550 °C and 625 °C. These AFM results permitted visualization of silicon surface granularity, roughness, and the transition with temperature from amorphous to crystalline structure between 550 °C and 580 °C. The surface of the amorphous film deposited at 550 °C is very smooth and the film is continuous physically, while the film formed at 580 °C appears crystalline, rough and porous. At 600 °C and 625 °C the films are fully crystalline. For these higher temperature films surface roughness and the average grain size decreased significantly compared to 580 °C film. Crystallinity and film continuity were further examined by x-ray diffraction (XRD) and cross-sectional TEM measurements.

scholarly journals Synthesis and Catalase Mimic Activity of MnO2 Nano Powder Prepared by Hydrothermal Process

2019 ◽  
Vol 27 (2) ◽  
pp. 228-237 ◽  
Author(s):  
Rashed T. Rasheed ◽  
Sariya D. Al-Algawi ◽  
Rosul M. N.
Keyword(s):  
Crystal Structure ◽  
Electron Microscopy ◽  
Annealing Temperature ◽  
Hydrothermal Process ◽  
X Ray Diffraction ◽  
X Ray ◽  
Nano Powder ◽  
Atomic Force ◽  
Different Temperatures ◽  
Scanning Electron

Manganese dioxide (MnO2) nanopowder has been synthesized by hydrothermal method. MnO2 was annealed at different temperatures (250, 400, 550, 700˚C). The crystal structure and surface morphology of these nanostructures were characterized by X-ray diffraction (XRD), Atomic Force Microscope (AFM) and Scanning Electron Microscopy (SEM). The catalase mimic activity (catalytic activity) of MnO2 against hydrogen peroxide (H2O2) was studied by using the new method and found that 400˚C is the best annealing temperature.

Room temperature recrystallization of nanocrystalline thin copper foils

1994 ◽  
Vol 362 ◽  
Author(s):  
J. Dille ◽  
J.-L. Delplancke ◽  
J. Charlier ◽  
R. Winand
Keyword(s):  
Electron Microscopy ◽  
Diffraction Pattern ◽  
Room Temperature ◽  
Structural Evolution ◽  
Preferential Orientation ◽  
X Ray Diffraction ◽  
X Ray ◽  
Copper Foils ◽  
Different Temperatures ◽  
Anodized Titanium

AbstractThin copper foils (100 micrometers thick) are produced by electrolysis on anodized titanium substrates. A sharp distribution of grain diameter is observed around 200 nanometers. The X-ray diffraction pattern shows a slight preferential orientation of the crystals with the (111) planes parallel to the substrate. This X-ray diffraction pattern evolves at room temperature. After 60 days, a preferential orientation of the (200) planes parallel to the substrate is observed. This effect is associated with the recrystallisation of the foil with growth of large copper grains (diameter higher than 5 micrometers) as observed by high resolution transmission electron microscopy.The structural evolution of the copper foils is studied by electron microscopy, X-ray and electron diffractions at different temperatures.The mechanical properties of the foils are also studied as a function of time after electrodeposition.

Resistivity-Temperature Properties of La(TixMn1-x)O3 Ceramics

2007 ◽  
Vol 336-338 ◽  
pp. 763-764
Author(s):  
Wei Bing Ma ◽  
Yan Xia Hao ◽  
Yuan Fang Qu ◽  
Ting Xian Xu
Keyword(s):  
Crystal Structure ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Experimental Results ◽  
X Ray Diffraction ◽  
X Ray ◽  
Different Temperatures ◽  
Scanning Electron

Samples of La(TixMn1-x)O3 (0.1 ≤ x ≤ 0.7) were sintered at different temperatures. The experimental results showed that the resistivity-temperature curves of the samples match NTC characteristic. The crystal structure was analyzed using X-ray diffraction and the microstructure was observed by scanning electron microscope.

Preparation and Properties of Graphene/TiO2 Thin Films

2015 ◽  
Vol 778 ◽  
pp. 136-139
Author(s):  
Tao Bai ◽  
Shi Gen Zhu
Keyword(s):  
Thin Films ◽  
Atomic Force Microscope ◽  
Differential Scanning Calorimeter ◽  
Crystalline Phase ◽  
Sol Gel ◽  
X Ray Diffraction ◽  
Thermo Gravimetric ◽  
X Ray ◽  
Structure And Morphology ◽  
Atomic Force

This study prepared a Graphene/TiO2(G/TiO2) thin films by using a sol–gel method The structure and morphology of the materials were characterized using X-ray diffraction (XRD), atomic force microscope (AFM) and thermo gravimetric- differential scanning calorimeter techniques (TG/DTG).AFM images showed that the G/TiO2 film is typically amorphous hot-treated at 300°C. When the temperature was increased to 500 °C, G/TiO2 thin films are all crystalline. The XRD results showed that G/TiO2 thin films contained crystalline phase of anatase after calcining at 500°C. TG/DTG measurement showed that the change of the crystal phase did not occur in gel until to 500°C.

Growth and Surface Morphology of Thin Silicon Films Using an atomic Force Microscope

1992 ◽  
Vol 295 ◽  
Author(s):  
Rama I. Hegde ◽  
Mark A. Chonko ◽  
Philip J. Tobin
Keyword(s):  
Surface Morphology ◽  
Atomic Force Microscope ◽  
Amorphous Film ◽  
Silicon Films ◽  
X Ray Diffraction ◽  
Cross Sectional ◽  
Atomic Force ◽  
Average Grain Size ◽  
Different Temperatures ◽  
Higher Temperature

AbstractThe growth and surface morphology of thin LPCVD silicon films were investigated with an atomic force microscope (AFM). Silicon films of 30 nm thicknesses were deposited on SiO2 using SiH4 at four different temperatures between 550 °C and 625 °C. These AFM results permitted visualization of silicon surface granularity, roughness, and the transition with temperature from amorphous to crystalline structure between 550 °C and 580 °C. The surface of the amorphous film deposited at 550 °C is very smooth and the film is continuous physically, while the film formed at 580 °C appears crystalline, rough and porous. At 600 °C and 625 °C the films are fully crystalline. For these higher temperature films surface roughness and the average grain size decreased significantly compared to 580 °C film. Crystallinity and film continuity were further examined by x-ray diffraction (XRD) and cross-sectional TEM measurements.

CHARACTERIZATION AND MICROHARDNESS OF ELECTRODEPOSITED Ni–W COATINGS OBTAINED FROM GLUCONATE BATH

2015 ◽  
Vol 22 (01) ◽  
pp. 1550011 ◽  
Author(s):  
PARTHASARATHI BERA ◽  
M. DINESH KUMAR ◽  
CHINNASAMY ANANDAN ◽  
C. SHIVAKUMARA
Keyword(s):  
Photoelectron Spectroscopy ◽  
Pulse Current ◽  
Structural Characteristics ◽  
X Ray Diffraction ◽  
Scanning Calorimetry ◽  
X Ray ◽  
Force Microscopy ◽  
Dsc Studies ◽  
Atomic Force ◽  
Different Temperatures

Ni – W alloy coatings are electrodeposited with direct and pulse current using gluconate bath at pH5. Effects of direct current (DC) and pulse current (PC) on structural characteristics of the coatings have been investigated by energy dispersive X-ray spectroscopy (EDXS), X-ray diffraction (XRD), field emission scanning electron microscopy (FESEM), atomic force microscopy (AFM), differential scanning calorimetry (DSC) and X-ray photoelectron spectroscopy (XPS). EDXS shows that W contents are 13.3 and 12.6 at.% in DC and PC (10:40) Ni – W coatings, respectively. FESEM analysis exhibits the homogeneous coarse nodular morphology in DC plated deposits. DSC studies reveal that Ni – W coatings are thermally stable up to 400°C. XPS studies demonstrate that DC plated coating has significant amount of Ni and W in elemental form along with their respective oxidized species. In contrast, mainly oxidized metals are present in the as-deposited coatings prepared with PC plating. The microhardness of pulse current (100:400) deposited Ni – W coating is about 750 HK that is much higher than DC plated coating (635 HK). Heat treatment of the deposits carried out at different temperatures show a significant increase in microhardness which can be comparable with hard chromium coatings.

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