Design and Analysis of Novel Four-Quadrant Double Liquid Lens Based on EWOD

2011 ◽  
Vol 403-408 ◽  
pp. 4388-4397
Author(s):  
Xiao Hu ◽  
Jiu Li ◽  
Jin Feng Liu ◽  
Zi Qiang Huang
Keyword(s):  
Electric Field ◽  
Applied Voltage ◽  
Optical Axis ◽  
Focal Point ◽  
Focal Length ◽  
Electrowetting On Dielectric ◽  
Voltage Difference ◽  
Liquid Lens ◽  
Four Quadrant ◽  
The Relationship

A novel double liquid lens based on Electrowetting-On-Dielectric (EWOD) is presented and analyzed. The special construction is that the lens was divided into four quadrants. The particular fabrication process is presented to achieve the structure. It was proved that the lens not only expressed the electric zoom character but also shifted focal point away from optical axis. It also achieved an infinite focal length under zero electric field. The paper presented the relationship between the focus length and applied voltage, also gave the association between focus length and the applied voltage from 0V to 80V. We analyzed how the optical axis shifted according to the voltage difference between quadrants, furthermore, explained the new function that the focus object was away from center of lens.

scholarly journals Necessary conditions of physical realizability of the bifocal lens collimator

2020 ◽  
pp. 68-78
Author(s):  
Maksim Stepanov ◽  
◽  
Yulia Nikulina ◽  
Keyword(s):  
Necessary Conditions ◽  
Optical Axis ◽  
Focal Point ◽  
Focal Length ◽  
Necessary Condition ◽  
Systems Of Inequalities ◽  
Relationship Of ◽  
The Relationship ◽  
Lens Surface ◽  
Physical Realizability

The conditions of physical realizability of one of the varieties of aplanitic lens collimators, a bifocal lens collimator, which has two points of perfect focus and do not lie on the main optical axis, are considered. Based on the relationship of the parameters specified during the design of the bifocal lens collimator (aperture size, thickness, focal length, distance from the main optical axis to the focal point, tilt of the phase front in the aperture), conditions that are necessary for the synthesis of a physically feasible collimator are formulated. The solution of this problem is based on the properties of an ellipse of equal edges and the geometry of a bifocal lens collimator. The graphic dependencies of the obtained expressions are given and analyzed. Based on this analysis, the mutual dependence of the parameters specified at the beginning of the calculation of the lens surface is determined. Systems of inequalities that establish the conditions for the realizability of a bifocal lens collimator are written. A number of restrictions on the initial parameters of the bifocal lens collimator are recorded. The fulfillment of the inequalities obtained in the article is a necessary condition for the physical realizability of the bifocal lens collimator.

ON OPTIMUM PUPIL FIELDS WITH MAXIMUM ELECTRIC FIELD COMPONENT IN FOCUS

2010 ◽  
Vol 19 (01) ◽  
pp. 189-201
Author(s):  
H. P. URBACH ◽  
S. F. PEREIRA ◽  
D. J. BROER
Keyword(s):  
Electric Field ◽  
Field Component ◽  
Optical Axis ◽  
Focal Point ◽  
Longitudinal Component ◽  
Electric Field Component ◽  
Incident Power ◽  
Entrance Pupil ◽  
Maximum Electric Field ◽  
High Na Lens

The field in the entrance pupil of a high NA lens can be optimized such that, for given incident power, the electric field component in a given direction in the focal point is maximum. If the field component is chosen parallel to the optical axis, the longitudinal component is maximized and it is found that the optimum longitudinal component is narrower than the Airy spot. We discuss how this can be used to obtain higher resolution in photolithography when a resist is used that is sensitive to only the longitudinal component. We describe a proposition for realizing such resist.

The Research of a Variable-Focus Ultrasonic Liquid Lens

2014 ◽  
Vol 598 ◽  
pp. 371-374
Author(s):  
Yu Wang ◽  
Wei Wang ◽  
Xu Zhou ◽  
Fu Long Zhai
Keyword(s):  
Response Time ◽  
Focal Length ◽  
Influence Factors ◽  
Ultrasonic Field ◽  
External Control ◽  
Control Voltage ◽  
External Voltage ◽  
Liquid Lens ◽  
Variable Focus ◽  
The Relationship

In this paper, a variable-focus ultrasonic liquid lens controlled by the external voltage is demonstrated. That is, the liquid lens can be reshaped with the external voltage, which will cause the focal length to change. The relationship between liquid lens’ shape and the control voltage was obtained. The influence factors of the response time were researched. And the distribution of the ultrasonic field after the lens under different external control voltages was simulated.

Lenses for Electron Microscopy and Microanalysis: Shadowgraph Method of Determining Focal Properties and Aberration Coefficients

1998 ◽  
Vol 4 (1) ◽  
pp. 34-49 ◽  
Author(s):  
Gertrude F. Rempfer ◽  
Margaret S. Fyfield ◽  
O. Hayes Griffith
Keyword(s):  
Electron Microscopy ◽  
Experimental Data ◽  
Focal Point ◽  
Focal Length ◽  
Practical Method ◽  
Classroom Discussions ◽  
Focal Distance ◽  
Chromatic Aberrations ◽  
Electron Microscopes ◽  
The Relationship

The performance characteristics of electron microscopes and probe-forming instruments depend ultimately on the focal properties and aberrations of electron lenses. A practical method of experimentally determining the properties of electron lenses is described. The method utilizes shadows cast by two meshes inserted separately in front of the lens and behind the lens to study the properties of the image of a point source. The image properties are then used to calculate the lens properties. The paraxial values of the focal length and focal distance as well as their spherical and chromatic aberrations are determined. Experimental data and the analysis are presented in the form of a tutorial that has been tested in the classroom. Discussions of the relationship between image properties and lens properties, in particular, focal point aberrations and focal length aberrations, and the various ways aberration coefficients can be defined, are included to clarify concepts in optics that are important for microscopists.

Protonation-induced molecular permeation at the oil/water interface in an electric field

2018 ◽  
Vol 20 (46) ◽  
pp. 29012-29017 ◽  
Author(s):  
Shenglong Gan ◽  
Longbin Chen ◽  
Yancong Feng ◽  
Yong Deng ◽  
Rui Zhou ◽  
...  
Keyword(s):  
Electric Field ◽  
Applied Voltage ◽  
Water Interface ◽  
Oil Water ◽  
The Relationship ◽  
Protonation Degree

The relationship between the protonation degree increment and applied voltage was proposed as a guide for controlling the protonation via applying an electric field.

Electrostatic optics and aberration correction in the 1940s and today

1992 ◽  
Vol 50 (1) ◽  
pp. 6-7
Author(s):  
Gertrude F. Rempfer
Keyword(s):  
Electron Microscope ◽  
Focal Point ◽  
Focal Length ◽  
High Vacuum ◽  
Electron Optics ◽  
Applied Physics ◽  
Electrostatic Lenses ◽  
Commercial Instrument ◽  
The University ◽  
Theory And Experiment

I became involved in electron optics in early 1945, when my husband Robert and I were hired by the Farrand Optical Company. My husband had a mathematics Ph.D.; my degree was in physics. My main responsibilities were connected with the development of an electrostatic electron microscope. Fortunately, my thesis research on thermionic and field emission, in the late 1930s under the direction of Professor Joseph E. Henderson at the University of Washington, provided a foundation for dealing with electron beams, high vacuum, and high voltage.At the Farrand Company my co-workers and I used an electron-optical bench to carry out an extensive series of tests on three-electrode electrostatic lenses, as a function of geometrical and voltage parameters. Our studies enabled us to select optimum designs for the lenses in the electron microscope. We early on discovered that, in general, electron lenses are not “thin” lenses, and that aberrations of focal point and aberrations of focal length are not the same. I found electron optics to be an intriguing blend of theory and experiment. A laboratory version of the electron microscope was built and tested, and a report was given at the December 1947 EMSA meeting. The micrograph in fig. 1 is one of several which were presented at the meeting. This micrograph also appeared on the cover of the January 1949 issue of Journal of Applied Physics. These were exciting times in electron microscopy; it seemed that almost everything that happened was new. Our opportunities to publish were limited to patents because Mr. Farrand envisaged a commercial instrument. Regrettably, a commercial version of our laboratory microscope was not produced.

Analysis of Retention Time Degradation Caused by Electrostatic Potential Variation between Adjacent Bit-Line and Adjacent Contact Node in DRAM

2016 ◽  
Author(s):  
Jungil Mok ◽  
Byungki Kang ◽  
Daesun Kim ◽  
Hongsun Hwang ◽  
Sangjae Rhee ◽  
...  
Keyword(s):  
Electric Field ◽  
Electrostatic Potential ◽  
Critical Dimension ◽  
Data Retention ◽  
Signal Line ◽  
Adjacent Node ◽  
Storage Node ◽  
Retention Characteristics ◽  
Node Voltage ◽  
The Relationship

Abstract Systematic retention failure related on the adjacent electrostatic potential is studied with sub 20nm DRAM. Unlike traditional retention failures which are caused by gate induced drain leakage or junction leakage, this failure is influenced by the combination of adjacent signal line and adjacent contact node voltage. As the critical dimension between adjacent active and the adjacent signal line and contact node is scaled down, the effect of electric field caused by adjacent node on storage node is increased gradually. In this paper, we will show that the relationship between the combination electric field of adjacent nodes and the data retention characteristics and we will demonstrate the mechanism based on the electrical analysis and 3D TCAD simulation simultaneously.

scholarly journals Observation of a comb-shaped filamentary plasma array under subcritical condition in 303-GHz millimetre-wave air discharge

2019 ◽  
Vol 9 (1) ◽  
Author(s):  
Masafumi Fukunari ◽  
Shunsuke Tanaka ◽  
Ryuji Shinbayashi ◽  
Yuusuke Yamaguchi ◽  
Yoshinori Tatematsu ◽  
...  
Keyword(s):  
Electric Field ◽  
Focal Point ◽  
Incident Beam ◽  
Wave Structure ◽  
Field Vector ◽  
Interesting Phenomenon ◽  
Millimetre Wave ◽  
Field Plane ◽  
Subcritical Condition ◽  
Air Discharge

AbstractGas breakdown in the millimetre-wave frequency band is an interesting phenomenon in nonlinear dynamics such as self-organized structure formation. We observed the transition between two types of filamentary plasma arrays in air discharge driven by a 303-GHz millimetre wave. Plasma is ignited at a parabolic mirror’s focal point in the overcritical condition. One array parallel to the electric field vector appears with a spacing of λ/4 at the focal point. Filaments then separate into plasma lumps ~10 μs after ignition. At 20 μs, a new comb-shaped array grows in the subcritical condition. Filaments are parallel to the incident beam with spacing of 0.96 λ and elongate towards the incident beam. This comb-shaped array appears only in the electric field plane; bulk plasma with a sharp vertex forms in the magnetic field plane. This array is created by a standing wave structure generated by waves diffracted from the plasma surface. Filamentary plasma array formations can influence the energy absorption by the plasma, which is important for engineering applications such as beamed energy propulsion.

DIRECTIONAL DIFFUSION OF K ATOMS ON A GaAs(110) SURFACE

2006 ◽  
Vol 05 (06) ◽  
pp. 895-900 ◽  
Author(s):  
NOBUYUKI ISHIDA ◽  
AGUS SUBAGYO ◽  
KAZUHISA SUEOKA
Keyword(s):  
Dipole Moment ◽  
Electric Field ◽  
Radial Direction ◽  
Negative Sample ◽  
Directional Diffusion ◽  
Sample Bias ◽  
Induced Dipole ◽  
High K ◽  
Scanning Area ◽  
The Relationship

We performed STM measurements on the K/GaAs (110) surface with high K coverage. The K atoms gradually disappeared while scanning the tip over the surface at negative sample bias voltage. The phenomenon strongly occurred over the scanning area and can be explained by the field-induced surface diffusion from the scanning area to radial direction. Considering the interaction between the dipole moment of the adsorbed K atoms and the electric field, we discuss the relationship between the static and induced dipole moment of K atoms on a GaAs (110) surface.

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