Matrix Method for X-Ray Stress Measurement in Single Crystals, and the Rational Planning of the Measurements
Keyword(s):
X Ray
◽
With the so-called matrix method stress calculation from x-ray diffraction measurements is much easier than it used to be with older methods. The matrix method is also well suited to optimize the choice of reflections (hkl) to be measured in order to obtain the best results with least experimental effort. Pseudocodes for the stress calculation are given.