A Review of Diffusion and Interfacial Reactions in Sandwich Thin-Film Couples

2013 ◽  
Vol 344 ◽  
pp. 107-128 ◽  
Author(s):  
Amitava Ghorai ◽  
D. Roy
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Photoelectron Spectroscopy ◽  
Electron Spectroscopy ◽  
Secondary Ion Mass Spectrometry ◽  
Direct Methods ◽  
Interfacial Reactions ◽  
X Ray ◽  
Force Microscopy ◽  
Transmission Electron

In this paper different techniques for sandwich thin film production, characterization and interfacial reactions have been reviewed in order to understand the kinetic behaviour in the above systems. The contact and composite resistance measurements are the indirect methods for this purpose, while X-ray diffraction studies (XRD), Transmission electron microscopy (TEM), Scanning electron microscopy (SEM), Rutherford backscattering (RBS), Auger electron spectroscopy (AES), secondary ion mass spectrometry (SIMS), ion sputtering spectrometry (ISS), X-ray photoelectron spectroscopy (XPS) which is also referred to as electron spectroscopy for chemical analysis (ESCA) and atomic force microscopy (AFM) are some of the direct methods. Trends indicate that interfacial reactions start at room temperature.

Electroless Synthesis of 1.4 nm Pd and Pt Nanoparticles on Self-Assembled Rosette Nanotubes

2011 ◽  
Vol 1301 ◽  
Author(s):  
Rahul Chhabra ◽  
Hicham Fenniri
Keyword(s):  
Electron Microscopy ◽  
Photoelectron Spectroscopy ◽  
Pt Nanoparticles ◽  
Hierarchical Organization ◽  
X Ray ◽  
Force Microscopy ◽  
Rosette Nanotubes ◽  
Atomic Force ◽  
Transmission Electron ◽  
Self Assembled

ABSTRACTElectroless synthesis and hierarchical organization of 1.4 nm Pd and Pt nanoparticles (NPs) on self-assembled Rosette Nanotubes (RNTs) is described. The nucleated NPs are nearly monodisperse and reveal supramolecular organizations guided by RNT templates. Interestingly, the narrow size distribution is attributable to unique templating behavior of RNTs. The resulting metal NP-RNT composites were characterized by Atomic Force Microscopy (AFM), Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM). X-ray Photoelectron Spectroscopy (XPS) was also performed to confirm the nature and composition of RNT-templated NPs.

Carbon nanotubes and metalloporphyrins and metallophthalocyanines-based materials for electroanalysis

2012 ◽  
Vol 16 (07n08) ◽  
pp. 713-740 ◽  
Author(s):  
José H. Zagal ◽  
Sophie Griveau ◽  
Mireya Santander-Nelli ◽  
Silvia Gutierrez Granados ◽  
Fethi Bedioui
Keyword(s):  
Electron Microscopy ◽  
Carbon Nanotubes ◽  
Hybrid Materials ◽  
Photoelectron Spectroscopy ◽  
State Of The Art ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Walled Carbon Nanotubes

We discuss here the state of the art on hybrid materials made from single (SWCNT) or multi (MWCNT) walled carbon nanotubes and MN4complexes such as metalloporphyrins and metallophthalocyanines. The hybrid materials have been characterized by several methods such as cyclic voltammetry (CV), scanning electron microscopy (SEM), transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS), atomic force microscopy (AFM) and scanning electrochemical microscropy (SECM). The materials are employed for electrocatalysis of reactions such as oxygen and hydrogen peroxide reduction, nitric oxide oxidation, oxidation of thiols and other pollutants.

scholarly journals Ultrashort Pulsed Laser Ablation of Magnesium Diboride: Plasma Characterization and Thin Films Deposition

2015 ◽  
Vol 2015 ◽  
pp. 1-9 ◽  
Author(s):  
Angela De Bonis ◽  
Agostino Galasso ◽  
Antonio Santagata ◽  
Roberto Teghil
Keyword(s):  
Electron Microscopy ◽  
Photoelectron Spectroscopy ◽  
Optical Emission ◽  
Silicon Substrates ◽  
X Ray Diffraction ◽  
Laser Target ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron

A MgB2target has been ablated by Nd:glass laser with a pulse duration of 250 fs. The plasma produced by the laser-target interaction, showing two temporal separated emissions, has been characterized by time and space resolved optical emission spectroscopy and ICCD fast imaging. The films, deposited on silicon substrates and formed by the coalescence of particles with nanometric size, have been analyzed by scanning electron microscopy, atomic force microscopy, X-ray photoelectron spectroscopy, micro-Raman spectroscopy, and X-ray diffraction. The first steps of the films growth have been studied by Transmission Electron Microscopy. The films deposition has been studied by varying the substrate temperature from 25 to 500°C and the best results have been obtained at room temperature.

scholarly journals Facile Synthesis of Highly Conductive Vanadium-Doped NiO Film for Transparent Conductive Oxide

2020 ◽  
Vol 10 (16) ◽  
pp. 5415
Author(s):  
Ashique Kotta ◽  
Hyung Kee Seo
Keyword(s):  
Electron Microscopy ◽  
Nickel Oxide ◽  
Photoelectron Spectroscopy ◽  
Transparent Conductive Oxide ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Conductive Oxide ◽  
P Type

Metal-oxide-based electrodes play a crucial role in various transparent conductive oxide (TCO) applications. Among the p-type materials, nickel oxide is a promising electrically conductive material due to its good stability, large bandgap, and deep valence band. Here, we display pristine and 3 at.%V-doped NiO synthesized by the solvothermal decomposition method. The properties of both the pristine and 3 at.%V:NiO nanoparticles were characterized by field emission scanning electron microscopy (FESEM), transmission electron microscopy (TEM), X-ray diffractometry (XRD), Raman spectroscopy, ultraviolet–visible spectroscopy (UV–vis), and X-ray photoelectron spectroscopy (XPS). The film properties were characterized by atomic force microscopy (AFM) and a source meter. Our results suggest that incorporation of vanadium into the NiO lattice significantly improves both electrical conductivity and hole extraction. Also, 3 at.%V:NiO exhibits a lower crystalline size when compared to pristine nickel oxide, which maintains the reduction of surface roughness. These results indicate that vanadium is an excellent dopant for NiO.

Chemical deterioration of Al film prepared on CF4 plasma-etched LiNbO3 surface

2000 ◽  
Vol 15 (2) ◽  
pp. 476-482 ◽  
Author(s):  
Hirotoshi Nagata ◽  
Yasuyuki Miyama ◽  
Naoki Mitsugi ◽  
Kaori Shima
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Buffer Layer ◽  
Amorphous Phase ◽  
Photoelectron Spectroscopy ◽  
X Ray ◽  
Transmission Electron ◽  
Optical Polarizer ◽  
Al Thin Film

The fabrication process of an Al thin-film optical polarizer on LiNbO3 waveguides after CF4 plasma dry etching of a previously deposited SiO2 buffer layer was investigated. The problem in this process is a precipitation of compounds containing C, O, F, and Li on the etched LiNbO3 surface and a chemical deterioration of the Al caused by a reaction with these precipitates. Most notably, the growth of amorphous phase in addition to the crystalline Al metal grains and a partial oxidization of Al were found at the interface using transmission electron microscopy and x-ray photoelectron spectroscopy.

scholarly journals The Influence of Annealing on the Optical Properties and Microstructure Recrystallization of the TiO2 Layers Produced by Means of the E-BEAM Technique

Materials ◽  
2021 ◽  
Vol 14 (19) ◽  
pp. 5863
Author(s):  
Katarzyna Jurek ◽  
Robert Szczesny ◽  
Marek Trzcinski ◽  
Arkadiusz Ciesielski ◽  
Jolanta Borysiuk ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Photoelectron Spectroscopy ◽  
Room Temperature ◽  
Dielectric Films ◽  
X Ray ◽  
Force Microscopy ◽  
Titanium Dioxide Films ◽  
Transmission Electron ◽  
Two Phases ◽  
Beam Technique

Titanium dioxide films, about 200 nm in thickness, were deposited using the e-BEAM technique at room temperature and at 227 °C (500K) and then annealed in UHV conditions (as well as in the presence of oxygen (at 850 °C). The fabricated dielectric films were examined using X-ray powder diffraction, Raman spectroscopy, X-ray photoelectron spectroscopy, atomic force microscopy, scanning electron microscopy, transmission electron microscopy, and spectroscopic ellipsometry. The applied experimental techniques allowed us to characterize the phase composition and the phase transformation of the fabricated TiO2 coatings. The films produced at room temperature are amorphous but after annealing consist of anatase crystallites. The layers fabricated at 227 °C contain both anatase and rutile phases. In this case the anatase crystallites are accumulated near the substrate interface whilst the rutile crystallites were formed closer to the surface of the TiO2 film. It should be emphasized that these two phases of TiO2 are distinctly separated from each other.

Improvement of Strength and Reliability of Structural Ceramic through Ion Implantations

1993 ◽  
Vol 316 ◽  
Author(s):  
Rabi S. Bhattacharya ◽  
A.K. Rai
Keyword(s):  
Electron Microscopy ◽  
Photoelectron Spectroscopy ◽  
Electron Spectroscopy ◽  
Auger Electron ◽  
Ion Pairs ◽  
Structural Ceramic ◽  
Flexure Strength ◽  
X Ray ◽  
Transmission Electron ◽  
Ion Species

ABSTRACTThe feasibility of strength and reliability improvements of Si3N4 through ion implantations has been studied. The approach has been to implant elements that may chemically combine with themselves to form precipitates after appropriate annealing. These precipitates can improve the strength and reliability of ceramics through the introduction of a compressive stress in the implanted surface layer and/or by modifying the fracture originating machining flaws. Sequential implantations of ion pairs of Ti+ and C+, and Si+ and C+ were performed at energies in the range 46 to 175 keV and at doses of 1×1017 cm-2 for each ion species. Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS) and Transmission electron microscopy (TEM) techniques were used to analyze the implanted layer. Strength and reliability were determined from four-point flexure strength measurements. Precipitates of TiN and C were found to form in Ti++C+ and Si++C+ implanted Si3N4 surfaces, respectively. Si++C+ implantation resulted in improvements of both strength and reliability of Si3N4, while Ti++C+ implantations had no effect.

scholarly journals Study on the Adsorption Properties of Iron Tailings for GO

Coatings ◽  
2021 ◽  
Vol 11 (7) ◽  
pp. 768
Author(s):  
Jiawei Zhou ◽  
Liming Yao ◽  
Yunfeng Wang ◽  
Weiqi Zhao ◽  
Jiahui Gu
Keyword(s):  
Electron Microscopy ◽  
Aqueous Solutions ◽  
Photoelectron Spectroscopy ◽  
Adsorption Process ◽  
Physical Adsorption ◽  
Exothermic Reaction ◽  
Single Layer ◽  
X Ray ◽  
Force Microscopy ◽  
Transmission Electron

Iron tailings can be used as adsorbents to effectively remove graphene oxide (GO) in aqueous solutions. Experimental data show that pH, iron tailing quality, GO concentration and temperature have significant effects on the removal of GO, the adsorption of the tail involves a single layer adsorbed Langmuir model with exothermic reaction, and it compliance with the proposed dynamics model meets the requirements, the adsorption process is a spontaneous physical adsorption process. Combining scanning electron microscopy (SEM), transmission electron microscopy (TEM), atomic force microscopy (AFM), X-ray diffractometry (XRD), Fourier transform infrared spectroscopy (FT-IR) and X-ray photoelectron spectroscopy (XPS) to analyze the iron tail according to the mechanisms of ore adsorption of GO, it was concluded that iron tailings might be a very promising material to effectively remove GO in aqueous solutions. The results of this research provide key information for the transportation and potential fate of GO in the natural environment.

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