Synthesis of Ternary Semiconductor Silver Bismuth Telluride by Chemical Bath Deposition

2017 ◽  
Vol 751 ◽  
pp. 489-493 ◽  
Author(s):  
Patamaporn Termsaithong ◽  
Aphichart Rodchanarowan
Keyword(s):  
Chemical Bath Deposition ◽  
Bismuth Telluride ◽  
X Ray Diffraction ◽  
Solar Cell Application ◽  
X Ray ◽  
Rhombohedral Crystal Structure ◽  
Rhombohedral Crystal ◽  
Ternary Semiconductor ◽  
Cbd Method ◽  
Scanning Electron

In this study, the synthesis of the ternary semiconductor sensitized silver bismuth telluride (AgBiTe2: SBT) particles was produced in the solution of AgNO3, Bi (NO3)3×5H2O and Na2O3Te by using a chemical bath deposition (CBD) method and annealing at 200°C for 1 h. According to scanning electron microscopy (SEM), the particle size of SBT after annealing was bigger than before annealing. Based on X-ray diffraction, the SBT after annealing for 1h became more crystalline. In addition, the XRF data also demonstrated that the SBT powder consists of Ag, Bi, and Te as dominant elements. The XRD result confirms a successful growth of the SBT particles with rhombohedral crystal structure. Based on the obtaining results, the SBT particles were successfully synthesized and potentially applied for solar cell application.

An XRD Phase Analysis of Al-F Re-Deposition Produced from Reactive Ion Etching

2015 ◽  
Vol 659 ◽  
pp. 575-579
Author(s):  
Chu Pong Pakpum
Keyword(s):  
Plasma Etching ◽  
Alpha Phase ◽  
Chemical Formula ◽  
X Ray Diffraction ◽  
X Ray ◽  
Rhombohedral Crystal Structure ◽  
Xrd Phase Analysis ◽  
Rhombohedral Crystal ◽  
Composition Structure ◽  
Scanning Electron

This paper reports the analysis of the composition, structure and phase of the re-deposition material that was generated from the reaction from CF4 plasma etching on the Al2O3-TiC substrate. The re-deposition was sputtered from the etching area and deposited on a silicon coupon for analysis. The morphology of the re-deposition was investigated by scanning electron microscope (SEM) and the composite element of the re-deposition was detected by using energy dispersive x-ray spectroscopy (SEM-EDX). X-ray diffraction (XRD) was used to analyse the structure and phase of the re-deposition. The results show that the prepared re-deposition was composed of F and Al atoms, with 51.24 At% and 27.67 At%, respectively. XRD revealed that this was owing to the chemical formula AlF3, which has a rhombohedral crystal structure in the most stable alpha phase (α-AlF3).

Microwave-Assisted Solution Combustion Synthesis and Characterization of Thermoelectric Ca3Co2O6 Powders

2013 ◽  
Vol 802 ◽  
pp. 84-88
Author(s):  
Sagulthai Kahatta ◽  
Nopsiri Chaiyo ◽  
Chesta Ruttanapun ◽  
Wicharn Techitdheera ◽  
Wisanu Pecharapa ◽  
...  
Keyword(s):  
Combustion Synthesis ◽  
Solution Combustion Synthesis ◽  
Molar Ratio ◽  
X Ray Diffraction ◽  
Solution Combustion ◽  
X Ray ◽  
Microwave Assisted ◽  
Product Characterization ◽  
Rhombohedral Crystal Structure ◽  
Rhombohedral Crystal

The microwave-assisted solution combustion synthesis was applied to the initial synthesizing of Ca3Co2O6powder using glycine as a fuel and nitrate as an oxidant. The as-synthesized powders were calcined at 700-1,000ºC for 4h. Product characterization was performed using Fourier transform infrared spectroscopy (FT-IR), X-ray diffraction (XRD) and Scanning electron microscope (SEM). The fuel-to-oxidizer molar ratio was found to affect the combustion reaction and character of the powder obtained. The phase composition of powder after calcination at various temperatures has shown that the formation of Ca3Co2O6occurs directly. The calcined powder possesses a rhombohedral crystal structure with an X-ray diffraction pattern that could be matched with the Ca3Co2O6JCPDS: 89-0629. This method is a simple way of synthesizing fine Ca3Co2O6powder with a low calcination temperature.

scholarly journals Properties of Nanostructure Bismuth Telluride Thin Films Using Thermal Evaporation

2017 ◽  
Vol 2017 ◽  
pp. 1-4 ◽  
Author(s):  
Swati Arora ◽  
Vivek Jaimini ◽  
Subodh Srivastava ◽  
Y. K. Vijay
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Bismuth Telluride ◽  
Room Temperature ◽  
Thermal Evaporation ◽  
Silicon Substrates ◽  
X Ray Diffraction ◽  
Thermal Evaporation Method ◽  
X Ray ◽  
Scanning Electron

Bismuth telluride has high thermoelectric performance at room temperature; in present work, various nanostructure thin films of bismuth telluride were fabricated on silicon substrates at room temperature using thermal evaporation method. Tellurium (Te) and bismuth (Bi) were deposited on silicon substrate in different ratio of thickness. These films were annealed at 50°C and 100°C. After heat treatment, the thin films attained the semiconductor nature. Samples were studied by X-ray diffraction (XRD) and scanning electron microscopy (SEM) to show granular growth.

GROWTH CONTROL OF ZnO FILMS ON GLASS BY CHEMICAL BATH DEPOSITION

2006 ◽  
Vol 13 (04) ◽  
pp. 369-373 ◽  
Author(s):  
MUNAN YU ◽  
HAIYAN XU ◽  
HAO WANG ◽  
HUI YAN ◽  
ZHILIANG PEI ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Chemical Bath Deposition ◽  
Deposition Temperature ◽  
Growth Control ◽  
Solution Concentration ◽  
Zno Films ◽  
X Ray Diffraction ◽  
Axis Orientation ◽  
X Ray ◽  
Scanning Electron

The effects of substrate-placing manner, deposition temperature and solution concentration on the preparation of ZnO films by chemical bath deposition were investigated in this work. The structures and the morphologies of as-deposited ZnO films were characterized by X-ray diffraction and scanning electron microscope, respectively. The results show that compared with vertically insertion, floating the substrates on the solutions could greatly improve the c-axis orientation of the films. The growth of ZnO films with orientation would also be favored at lower precursor concentrations and temperatures. When the concentration of Zn ( CH 3 COO )2·2 H 2 O is 0.033 M/L and the deposited temperature is 60°C, ZnO films which are well crystallized and highly c-axis orientated were obtained.

scholarly journals Microstructure and Tribological Properties of Self-Lubricating FeS Coating Prepared by Chemical Bath Deposition Coating Technique

2019 ◽  
Vol 9 (20) ◽  
pp. 4422 ◽  
Author(s):  
Jianjun Hu ◽  
Chuan He ◽  
Xian Yang ◽  
Hui Li ◽  
Hongbin Xu ◽  
...  
Keyword(s):  
Wear Resistance ◽  
Chemical Bath Deposition ◽  
Tribological Properties ◽  
Energy Dispersive Spectrometry ◽  
X Ray Diffraction ◽  
Influence Of Temperature ◽  
X Ray ◽  
Coating Technique ◽  
Influence Of Temperature On ◽  
Scanning Electron

The FeS solid lubricating coatings were prepared on the AISI 5140 steel by chemical bath deposition (CBD) coating technique at various temperatures from 30 to 90 °C. The influence of temperature on microstructure, microcracks, and tribological properties was characterized and studied by X-ray diffraction (XRD), scanning electron microscope (SEM), and energy dispersive spectrometry (EDS). The results show that the coating mainly consists of FexSy (FeS, FeS2, and Fe1−xS), and has a chrysanthemum-shaped (CS) morphology composed of the FeS crystal petals. The CS particles nucleate at about 30 °C, rapidly grow and reach a peak thickness at about 50–70 °C, and finally disappear and are replaced by disordered thick petals at 90 °C. The wear resistance of the steel was improved obviously after introducing of FeS coatings, owing to that the coatings can provide better lubrication and improve the wear resistance.

Growth of ZnO Microstructure on Porous Silicon

2019 ◽  
Vol 290 ◽  
pp. 261-266
Author(s):  
Nurizati Rosli ◽  
Mohd Mahadi Halim ◽  
M. Roslan Hashim
Keyword(s):  
Electron Microscopy ◽  
Porous Silicon ◽  
Growth Time ◽  
X Ray Diffraction ◽  
High Quality ◽  
X Ray ◽  
Good Crystallinity ◽  
Wurtzite Lattice ◽  
Cbd Method ◽  
Scanning Electron

In this study, Zinc Oxide (ZnO) microstructures were grown on porous silicon (PS) using chemical bath deposition (CBD) method by varying the growth time. The field emission scanning electron microscopy (FESEM) revealed the morphology and sized of ZnO. The X-ray diffraction (XRD) spectra indicate the high quality growth of ZnO on PS surface. Raman analyses revealed the peaks shift of E2(High), characterized wurtzite lattice and indicates good crystallinity of ZnO.

X-ray diffraction and microstructural studies in 2 : 17 type Sm–Co magnetic alloys containing Fe, Cu, and Zr

1999 ◽  
Vol 14 (6) ◽  
pp. 2430-2435 ◽  
Author(s):  
R. Gopalan ◽  
T. S. R. K. Sastry ◽  
A. K. Singh ◽  
V. Chandrasekaran
Keyword(s):  
Single Phase ◽  
Solution Treatment ◽  
X Ray Diffraction ◽  
X Ray ◽  
Heat Treated ◽  
Rhombohedral Crystal Structure ◽  
Cast Alloys ◽  
Rhombohedral Crystal ◽  
Co Alloys ◽  
Microstructural Studies

X-ray diffraction and microstructural studies were carried out on 2 : 17 type Sm–Co alloys containing Fe, Cu, and Zr (13–14 at.% Sm, 57–60 at.% Co, 20–22 at.% Fe, 4 at.% Cu, and 3 at.% Zr) in as-cast and heat-treated conditions. Microstructural studies revealed that the as-cast alloys contain three phases. It was observed that the samples subjected to sintering at 1463 K for 45 min followed by a solution treatment at 1448 K for 1 h resulted in nearly a single-phase, rhombohedral crystal structure (Th2Zn17-type). Subsequent isothermal aging at 1123 K and ramp-cooling to 673 K resulted in a mixture of Sm2Co17- and SmCo5-type phases with the former as major phase. It was also found that samples (Sm > 13 at.%) sintered at temperatures >1463 K showed incipient melting and multiphase formation.

Design and Characterization of PbS/CdS Based Photovoltaic Cell

2013 ◽  
Vol 820 ◽  
pp. 7-10
Author(s):  
Zhong Biao Zhao ◽  
Peng Wang ◽  
Li Bo Fan ◽  
Zi Fa Chen ◽  
Zi Guan Shen
Keyword(s):  
Magnetron Sputtering ◽  
Chemical Bath Deposition ◽  
Photovoltaic Cell ◽  
X Ray Diffraction ◽  
X Ray ◽  
Ito Glass ◽  
Cbd Method ◽  
Cds Films

A PbS/CdS based photovoltaic cell was designed and characterized. The as-designed photovoltaic cell has a structure of Al/PbS/CdS/ITO/Glass. The CdS films were prepared by magnetron sputtering. The PbS films were synthesized by chemical bath deposition (CBD) method. The CdS and PbS films were characterized by X-ray diffraction (XRD) and photoelectrochemical (PEC) properties.

scholarly journals Deposition time and annealing effects on morphological and optical properties of ZnS thin films prepared by chemical bath deposition

2019 ◽  
Vol 37 (3) ◽  
pp. 404-416
Author(s):  
N. Chabou ◽  
B. Birouk ◽  
M.S. Aida ◽  
J.P. Raskin
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Scanning Electron Microscopy ◽  
Chemical Bath Deposition ◽  
Deposition Time ◽  
Ammonium Hydroxide ◽  
Complexing Agent ◽  
X Ray Diffraction ◽  
X Ray ◽  
Scanning Electron

AbstractNanocrystalline zinc sulfide thin films were prepared on glass substrates by chemical bath deposition method using aqueous solutions of zinc chloride, thiourea ammonium hydroxide along with non-toxic complexing agent trisodium citrate in alkaline medium at 80 °C. The effect of deposition time and annealing on the properties of ZnS thin films was investigated by X-ray diffraction, scanning electron microscopy, optical transmittance spectroscopy and four-point probe method. The X-ray diffraction analysis showed that the samples exhibited cubic sphalerite structure with preferential orientation along 〈2 0 0〉 direction. Scanning electron microscopy micrographs revealed uniform surface coverage, UV-Vis (300 nm to 800 nm) spectrophotometric measurements showed transparency of the films (transmittance ranging from 69 % to 81 %), with a direct allowed energy band gap in the range of 3.87 eV to 4.03 eV. After thermal annealing at 500 °C for 120 min, the transmittance increased up to 87 %. Moreover, the electrical conductivity of the deposited films increased with increasing of the deposition time from 0.35 × 10−4 Ω·cm−1 to 2.7 × 10−4 Ω·cm−1.

scholarly journals Investigation on structural, dielectric and ferroelectric properties of samarium-substituted BiFeO3–PbTiO3 composites

2017 ◽  
Vol 07 (01) ◽  
pp. 1750001 ◽  
Author(s):  
Truptimayee Sahu ◽  
Banarji Behera
Keyword(s):  
High Temperature ◽  
Thermal Activation ◽  
Room Temperature ◽  
Ferroelectric Properties ◽  
X Ray Diffraction ◽  
Solid State Reaction Technique ◽  
Conventional Solid State Reaction ◽  
X Ray ◽  
Rhombohedral Crystal Structure ◽  
Rhombohedral Crystal

The polycrystalline samples of 0.8BiSmxFe[Formula: see text]O3–0.2PbTiO3 ([Formula: see text] and 0.20) were prepared by using the conventional solid-state reaction technique and sintered at high temperature (850[Formula: see text]C). X-ray diffraction (XRD) confirms the distorted rhombohedral crystal structure for all the composites at room temperature. The surface morphology was checked by field-emission scanning electron microscope (FESEM) technique and homogeneous mixing of the components was confirmed by energy-dispersive analysis of X-ray (EDAX). The detailed study of dielectric properties of the composites reveals an increasing nature of dielectric constant ([Formula: see text]) and loss tangent (tan[Formula: see text]) with the increase of temperature due to thermal activation. The Arrhenius plots of temperature dependence of AC conductivity yield the activation energy within the material at high-temperature range. The ferroelectric study shows that the remnant polarization decreases with the increase of Samarium (Sm) concentration.

Sign in / Sign up

Export Citation Format

Share Document