Design of Experiment (DOE) of Powder Metallurgy Technique in Fabricating SnCu/Carbon Lead-Free Composite Solder with Different Mixing Parameters

2014 ◽  
Vol 803 ◽  
pp. 269-272
Author(s):  
Sayyidah Amnah Musa ◽  
Norainiza Saud
Keyword(s):  
Powder Metallurgy ◽  
High Performance ◽  
Composite Solder ◽  
Mixing Time ◽  
Physical And Mechanical Properties ◽  
Optical Microscope ◽  
Lead Free ◽  
Lead Free Solder ◽  
Best Parameter ◽  
Free Solder

Physical and mechanical properties of a solder joint will be improved by adding the high performance of reinforcement particulates in the monolithic lead-free solder. In this study, 0.1wt% of activated carbon (AC) was added into Sn-0.7Cu lead-free solder which fabricated via powder metallurgy (PM) techniques. Various parameters used in PM technique such as mixing time, compacting load and sintering temperature has been carried out in fabricating the composite solder. In this study, the best mixing time has been optimized. The distribution of carbon in SnCu matrix for each mixing time was observed by using optical microscope. Microstructural observation showed that the increasing in mixing time has increased the number of AC particles to become agglomerated. It is found out that 1hour of mixing time is the best parameter to fabricate SnCu/AC composite solder via powder metallurgy route since the distribution of reinforcement particles has distributed uniformly at the grain boundaries without any agglomeration.

Microstructural Observation and Phase Analysis of Sn-Cu-Ni (SN100C) Lead Free Solder with Addition of Micron-Size Silicon Nitride (Si3N4) Reinforcement

2015 ◽  
Vol 754-755 ◽  
pp. 518-523 ◽  
Author(s):  
Mohd Izrul Izwan Ramli ◽  
Norainiza Saud ◽  
Mohd Arif Anuar Mohd Salleh ◽  
Mohd Nazree Derman ◽  
Rita Mohd Said ◽  
...  
Keyword(s):  
Silicon Nitride ◽  
Powder Metallurgy ◽  
Phase Analysis ◽  
Solder Alloy ◽  
Composite Solder ◽  
Lead Free ◽  
Lead Free Solder ◽  
Microstructural Observation ◽  
Micron Size ◽  
Free Solder

The effect of micron-size silicon nitride (Si3N4) particles additions, up to 1.0 wt. % on Sn-Cu-Ni (SN100C) solder alloy was investigated. Sn-Cu-Ni composite solder were prepared via powder metallurgy (PM) technique. Different percentages of Si3N4(0, 0.25, 0.5, 0.75 and 1.0 wt. %) were added into the alloy. Result revealed that reinforcement was well distributed between the grain boundaries which could positively affect the properties of the composite solder.

Effect of TiO2 Reinforcement on Microstructure and Microhardness of Low-Silver SAC107 Lead-Free Solder Composite Solder

2014 ◽  
Vol 803 ◽  
pp. 273-277 ◽  
Author(s):  
Norhayanti Mohd Nasir ◽  
Norainiza Saud ◽  
Mohd Nazree Derman ◽  
Arif Anuar Mohd Salleh ◽  
Mohd Izrul Izwan Ramli ◽  
...  
Keyword(s):  
Titanium Dioxide ◽  
Powder Metallurgy ◽  
Solder Alloy ◽  
Composite Solder ◽  
Lead Free ◽  
Lead Free Solder ◽  
Physical Performances ◽  
Free Solder ◽  
Sac Solder ◽  
Solder Composite

This research has investigated the physical performances of low-silver Sn-Ag-Cu (SAC) lead-free composite solder reinforced with titanium dioxide (TiO2). The SAC/TiO2 composite solder were fabricated via powder metallurgy (PM) technique. The five different composition chosen were 0, 0.25, 0.5, 0.75, and 1.0. The results showed that distribution of TiO2 along the grain boundaries has increased the hardness of the SAC/TiO2 composite solders compared to monolithic SAC solder alloy.

Enhancement of Microstructural and Physical Properties of Sn-0.7Cu Lead-Free Solder with the Addition of SiC Particles

2018 ◽  
Vol 280 ◽  
pp. 181-186
Author(s):  
Z. Mahim ◽  
Nurul Razliana Abdul Razak ◽  
Mohd Arif Anuar Mohd Salleh ◽  
Norainiza Saud
Keyword(s):  
Mechanical Properties ◽  
Physical Properties ◽  
Composite Solder ◽  
Physical And Mechanical Properties ◽  
Lead Free ◽  
Attractive Alternative ◽  
Powder Metallurgy Method ◽  
Lead Free Solder ◽  
Free Solder ◽  
Sic Particle

Nowadays, composite solder has gained researcher’s attention due to its promising improvement in physical and mechanical properties for lead-free solder. To improve the properties of Sn-0.7Cu (SnCu): the promising lead-free candidate, addition of silicon carbide (SiC) as a reinforcement was used into this study. However, its limitation on solderability as compared with SnAgCu (SAC) make it not an attractive alternative lead-free solder. This study was carried out to investigate the effect of SiC particle on microstructure evolution and physical properties of SnCu based solder alloys. SnCu-SiC composite solders were synthesized by powder metallurgy method (PM), which consists of several processes such as mechanical blending, compaction and sintering. Five different weight percentages of SiC particle; 0.00, 0.25, 0.50, 0.75 and 1.00 were mechanically blended with SnCu lead-free solder. The result shows that the addition of SiC particle has decreased the β-Sn area and refined the microstructure of composite solder. In addition, the improvement in microhardness of composite was achieved.

Influence of Silicon Nitride (Si3N4) Addition on Microstructure, Mechanical and Thermal Properties of Sn-0.7Cu Lead-Free Solder

2015 ◽  
Vol 754-755 ◽  
pp. 530-534
Author(s):  
Norhayanti Mohd Nasir ◽  
Norainiza Saud ◽  
Mohd Arif Anuar Mohd Salleh ◽  
M.N. Derman ◽  
Mohd Izrul Izwan Ramli ◽  
...  
Keyword(s):  
Thermal Properties ◽  
Silicon Nitride ◽  
Powder Metallurgy ◽  
Entire Range ◽  
Composite Solder ◽  
Lead Free ◽  
Mechanical And Thermal Properties ◽  
Lead Free Solder ◽  
Alloy Addition ◽  
Free Solder

This research has investigated the solder performances of Sn-0.7Cu lead-free solder reinforced with silicon nitride (Si3N4). The Sn-0.7Cu + Si3N4 composite solder were fabricated via powder metallurgy (PM) technique with five different weight percentages (0, 0.25, 0.5, 0.75 and 1.0). Results showed that distribution of Si3N4 along the grain boundaries has increased the hardness of the Sn-0.7Cu + Si3N4 composite solders compared to monolithic Sn-0.7Cu solder alloy. Addition of Si3N4 reinforcement had no significant effect to the melting temperature of the solder. Overall, the entire range of Sn-0.7Cu + Si3N4 composition greatly improves the microhardness of the eutectic solder.

Evaluation of High-Speed Copper Plating Products for RDL, Micropillar, and Fan-Out Applications

2016 ◽  
Vol 2016 (DPC) ◽  
pp. 000631-000649
Author(s):  
Matthew A Thorseth ◽  
Mark Scalisi ◽  
Inho Lee ◽  
Sang-Min Park ◽  
Yil-Hak Lee ◽  
...  
Keyword(s):  
High Performance ◽  
Performance Criteria ◽  
Lead Free ◽  
Lead Free Solder ◽  
Market Demand ◽  
Feature Size ◽  
Deposition Rates ◽  
Cu Pillar ◽  
Free Solder ◽  
Pure Cu

Increasing market demand for portable high-performance electronic devices is requiring an increase in the I/O density in the chip packaging used to make these products. Flip-chip interconnects that enable advanced packaging utilize a C4 bumping process with lead-free solder to make the chip interconnection. However, with the decreasing chip size and tighter I/O pitch requirements that are needed to realize high-performance, Cu pillar plating has emerged as an enabling technology to meet the technical demands. Cu pillars, capped with a lead-free solder, allow for increased I/O density while still maintaining the standoff needed for proper thermal and electrical performance of stacked chips. With this realized performance, there is expected to be a significant increase in capacity of Cu pillar in the industry, requiring electrolytic Cu plating products with fast deposition rates in order to decrease wafer plating time and increase throughput. In this paper, Cu electroplating products are evaluated for plating performance at increased deposition rates for Cu pillar applications ranging from micropillar (<20 μm feature size), to standard pillar (20 – 75 μm feature size), redistribution layer (RDL) wiring, and the emerging fan-out wafer level packaging (FO-WLP), which encompasses megapillars (>150 μm feature sizes) as well as stacked via RDL designs. The chief performance criteria for evaluation is the ability to increase deposition rates while maintaining feature height uniformity, smooth and uniform feature morphology, and ability to plate a wide variety of feature sizes and shapes. Additionally, performance of these products is assessed on their ability to plate highly pure Cu deposits which enable void-free integration with lead-free solder without the need of (but is compatible with) a cost-added barrier layer.

Effect of Cooling Rate on the Microstructural and Mechanical Properties of Sn-0.3Ag-0.7Cu-0.05Ni Solder Alloy

2017 ◽  
Vol 751 ◽  
pp. 9-13
Author(s):  
Kogaew Inkong ◽  
Phairote Sungkhaphaitoon
Keyword(s):  
Mechanical Properties ◽  
Cooling Rate ◽  
Solder Alloy ◽  
Testing Machine ◽  
Optical Microscope ◽  
Lead Free ◽  
Lead Free Solder ◽  
Cooling Systems ◽  
Lead Free Solder Alloy ◽  
Free Solder

The effect of cooling rate on the microstructural and mechanical properties of Sn-0.3Ag-0.7Cu-0.05Ni lead-free solder alloy was studied. The microstructure of specimens was characterized by using an optical microscope (OM) and an energy dispersive X-ray spectroscopy (EDX). The mechanical properties were performed by using a universal testing machine (UTM). The results showed that the cooling rate of water-cooled specimens was about 2.37 °C/s and the cooling rate of mold-cooled specimens was about 0.05 °C/s. To compare the different cooling rates, it was found that the grain size of water-cooled specimens was finer than that of the mold-cooled specimens, this resulted in an increment of mechanical properties of solder alloy. A higher tensile strength (33.10 MPa) and a higher elongation (34%) were observed when water-cooled and mold-cooled systems were used, respectively. The microstructure of Sn-0.3Ag-0.7Cu-0.05Ni lead-free solder alloy solidified by both cooling systems exhibited three phases: β-Sn, Ag3Sn and (Cu,Ni)6Sn5 IMCs.

Intermetallic Study on the Modified Sn-3.5Ag-1.0Cu-1.0Zn Lead Free Solder

2016 ◽  
Vol 857 ◽  
pp. 3-7 ◽  
Author(s):  
Ramani Mayappan ◽  
Nur Nadiah Zainal Abidin ◽  
Noor Asikin Ab Ghani ◽  
Iziana Yahya ◽  
Norlin Shuhaime
Keyword(s):  
Electron Microscope ◽  
Powder Metallurgy ◽  
Joint Strength ◽  
Lead Free ◽  
Environmental Concerns ◽  
Lead Free Solder ◽  
Free Solder ◽  
Lead Free Solders ◽  
Powder Metallurgy Route ◽  
Scanning Electron

Due to environmental concerns, lead-free solders were introduced to replace the lead-based solders in microelectronics devices technology. Although there are many lead-free solders available, the Sn-Ag-Cu solders are considered the best replacement due to their good wettability and joint strength. Although the Sn-Ag-Cu solders are accepted widely, but there are still some room for improvement. In this study, 1wt% Zn, which can be considered high percentage for a dopant, was added into the solder via powder metallurgy route. The effects of adding this dopant into the Sn-3.5Ag-1.0Cu solder on the interface intermetallic and thickness were investigated. The intermetallics phases formed were observed under Scanning Electron Microscope (SEM) and their thicknesses were measured. The SEM results showed the presence of Cu6Sn5, Cu3Sn and (Cu,Zn)6Sn5 intermetallics. It can be concluded that Zn behaved as retarding agent and significantly retarded the growth of Cu-Sn intermetallics.

Next-Generation Copper, Nickel and Lead-Free Metallization Products for Next-Generation Devices and Applications

2015 ◽  
Vol 2015 (DPC) ◽  
pp. 000611-000638
Author(s):  
Jonathan Prange ◽  
Yi Qin ◽  
Matthew Thorseth ◽  
Inho Lee ◽  
Masaaki Imanari ◽  
...  
Keyword(s):  
High Performance ◽  
Flip Chip ◽  
Low Cost ◽  
Lead Free ◽  
Lead Free Solder ◽  
Next Generation ◽  
Copper Nickel ◽  
Microelectronic Devices ◽  
Architectural Features ◽  
Free Solder

Flip-chip interconnect and 3-D packaging applications must utilize reliable, high-performance metallization products in order to produce highly-efficient, low-cost microelectronic devices. As the market moves to shrinking device architectural features and increasingly difficult pattern layouts, more demand is placed on the plating performance of the copper, nickel and lead-free solder products used to create these interconnects. Additionally, the move from traditional C4 bumping processes with lead-free solder to capping processes utilizing copper pillars with lead-free solder requires metal interfaces that are highly compatible in order to avoid defects that could occur. In this paper, next-generation products developed for copper pillar, nickel barrier, and lead-free solder plating will be introduced that are capable of delivering high-performance and highly reliable metallic interconnects. The additive packages that were selected and optimized allowing for increased rate of electrodeposition, uniform height control with controllable pillar shape and smooth surface morphology will be discussed. Furthermore, compatibility will be shown for a lead-free solder cap electrodeposited onto copper pillar structures, both with and without nickel barrier layers, on large pore features (≥50 μm diameter) and micro pore features (≤20 μm diameter) for both bumping and capping applications.

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