Modern Techniques for Automated Acquiring and Processing Data of Diffraction Electron Microscopy for Nano-Materials and Single-Crystals

2020 ◽  
Vol 992 ◽  
pp. 907-915 ◽  
Author(s):  
V. Sydorets ◽  
O. Berdnikova ◽  
Ye. Polovetskyi ◽  
Ye. Titkov ◽  
A. Bernatskyi
Keyword(s):  
Electron Microscope ◽  
Single Crystal ◽  
Single Crystals ◽  
Three Dimensional ◽  
Modern Science ◽  
Nano Materials ◽  
Modern Computer ◽  
Transmission Electron ◽  
Diffraction Patterns ◽  
Misorientation Angles

Progress in modern science and technology is impossible without the use of new materials, which include nanoparticles and single crystals. Existing approaches in the field of computer vision are difficult to apply to the processing of diffraction patterns, which contain information about the parameters of the fine structure of nanostructured and single-crystal materials. The aim of the work was to develop modern computer-aided techniques that, interacting with the software of the electron microscope, automatically receive and process the information contained in electron diffraction patterns. Replacing the diffraction pattern obtained by a transmission electron microscope with a three-dimensional relief makes it possible to reduce the problem to the solution of the optimization problem. This approach allows not only automating the process of scientific research, but also significantly reduces the time for obtaining the result and increases its accuracy. The application of the proposed approach is demonstrated in measuring the misorientation angles of large single-crystal tungsten ingots, which are obtained by the plasma-induction growing technology.

Development of a Mach-Zehnder type electron interferometer on a 1.2-MV field-emission transmission electron microscope

Microscopy ◽  
2020 ◽  
Vol 69 (6) ◽  
pp. 411-416
Author(s):  
Tetsuya Akashi ◽  
Yoshio Takahashi ◽  
Ken Harada
Keyword(s):  
Electron Microscope ◽  
Single Crystal ◽  
Single Crystals ◽  
Field Emission ◽  
Transmission Electron Microscope ◽  
Beam Splitters ◽  
Interference Fringes ◽  
Transmission Electron ◽  
Performance Results

Abstract We have developed an amplitude-division type Mach-Zehnder electron interferometer (MZ-EI). The developed MZ-EI is composed of single crystals corresponding to amplitude-division beam splitters, lenses corresponding to mirrors and an objective aperture. The spacings and azimuth angles of interference fringes can be controlled by single crystal materials and their orientations and by diffraction spots selected by the objective aperture. We built the MZ-EI on a 1.2-MV field-emission transmission electron microscope and tested its performance. Results showed that interference fringes were created for various spacings and azimuth angles, which demonstrates the practicability of the MZ-EI as an amplitude-division type electron interferometer.

Determine the Three-Dimensional Crystallographic Misorientation in Heterostructures by Selected Area Diffraction (SAD) in TEM

2000 ◽  
Vol 618 ◽  
Author(s):  
X. J. Guo ◽  
C.-Y. Wen ◽  
J. H. Huang ◽  
H. C. Shih
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Diffraction Pattern ◽  
Transmission Electron Microscope ◽  
Three Dimensional ◽  
Two Dimensional ◽  
Heteroepitaxial Structures ◽  
Transmission Electron ◽  
Microscope Images ◽  
Diffraction Patterns

ABSTRACTWe proposed a concise and novel scheme to determine the crystallographic misorientation of heteroepitaxial structures. In addition to subtle high-resolution transmission electron microscope images, the information revealed from selected-area diffraction patterns at the interfaces offers another path to determine the angles of misorientations. The principle is to extract the basically three-dimensional misorientation information from a two-dimensional selected-area diffraction pattern through the employment of the Laue circle

scholarly journals Microstructure Evolution and Texture Development in a Cu-8.5%AT. AL Material Subjected to Hydrostatic Extrusion

2016 ◽  
Vol 61 (2) ◽  
pp. 933-936 ◽  
Author(s):  
D. Jakubowska ◽  
J. Zdunek ◽  
M. Kulczyk ◽  
J. Mizera ◽  
K. J. Kurzydłowski
Keyword(s):  
Electron Microscope ◽  
Single Crystal ◽  
Single Crystals ◽  
Transmission Electron Microscope ◽  
Texture Evolution ◽  
True Strain ◽  
Nanocrystalline Structure ◽  
Transmission Electron ◽  
The Stability ◽  
Xrd Method

AbstractThe aim of the present paper was to investigate microstructure and texture evolution of two single crystals and polycrystal of Cu-8.5%at.Al material. All of mentioned samples were deformed by HE to achieve true strain ε = 1.17. For microstructure analyzes observations by transmission electron microscope (STEM) were done. Crystalline size for samples after SPD were determine using XRD method. The global texture measurements were done using Bruker D8 Discover diffractometer equipped in Cr radiation. Microstructure investigations revealed nanocrystalline structure in single crystals with initial orientations <110> and <100> and polycrystalline Cu-8.5%at.Al material after SPD. The global texture measurements have shown the stability of initial orientation of <100> Cu-8.5%at.Al single crystal after HE, whereas the same SPD process strongly brakes up the orientation <110> Cu-8.5%at. Al single crystal.

Deviations from Ideal Decagonal Symmetry in Electron Diffraction Patterns of the “Decagonal” Phase in the Al-Co-Cu Alloy System

1991 ◽  
Vol 49 ◽  
pp. 914-915
Author(s):  
Atul S. Ramani ◽  
Earle R. Ryba ◽  
Paul R. Howell
Keyword(s):  
Electron Microscope ◽  
Alloy System ◽  
Nominal Composition ◽  
Dimensional Lattice ◽  
3 Dimensional ◽  
Decagonal Phase ◽  
Cu Alloy ◽  
Transmission Electron ◽  
Lattice Periodicity ◽  
Diffraction Patterns

The “decagonal” phase in the Al-Co-Cu system of nominal composition Al65CO15Cu20 first discovered by He et al. is especially suitable as a topic of investigation since it has been claimed that it is thermodynamically stable and is reported to be periodic in the dimension perpendicular to the plane of quasiperiodic 10-fold symmetry. It can thus be expected that it is an important link between fully periodic and fully quasiperiodic phases. In the present paper, we report important findings of our transmission electron microscope (TEM) study that concern deviations from ideal decagonal symmetry of selected area diffraction patterns (SADPs) obtained from several “decagonal” phase crystals and also observation of a lattice of main reflections on the 10-fold and 2-fold SADPs that implies complete 3-dimensional lattice periodicity and the fundamentally incommensurate nature of the “decagonal” phase. We also present diffraction evidence for a new transition phase that can be classified as being one-dimensionally quasiperiodic if the lattice of main reflections is ignored.

Reconstruction of electron holograms recorded in a non-FEG, non-biprism TEM

1995 ◽  
Vol 53 ◽  
pp. 618-619
Author(s):  
Z.L. Wang
Keyword(s):  
Electron Microscope ◽  
Single Crystal ◽  
Experimental Technique ◽  
Transmission Electron Microscope ◽  
The Other ◽  
Electron Holography ◽  
Transmission Electron ◽  
Coherent Sources ◽  
Imaging Theory ◽  
Normal Specimen

An experimental technique for performing electron holography using a non-FEG, non-biprism transmission electron microscope (TEM) has been introduced by Ru et al. A double stacked specimens, one being a single crystal foil and the other the specimen, are loaded in the normal specimen position in TEM. The single crystal, which is placed onto the specimen, is responsible to produce two beams that are equivalent to two virtual coherent sources illuminating the specimen beneath, thus, permitting electron holography of the specimen. In this paper, the imaging theory of this technique is described. Procedures are introduced for digitally reconstructing the holograms.

Observation of dislocations in dynamically loaded Cu-SiO2

1986 ◽  
Vol 44 ◽  
pp. 424-425
Author(s):  
D. S. Pritchard
Keyword(s):  
Electron Microscope ◽  
Strain Rate ◽  
Single Crystal ◽  
Transmission Electron Microscope ◽  
Volume Fraction ◽  
Screw Dislocations ◽  
Spherical Inclusions ◽  
Transmission Electron ◽  
Crystal Dispersion ◽  
Strain Rate Loading

The effect of varying the strain rate loading conditions in compression on a copper single crystal dispersion-hardened with SiO2 particles has been examined. These particles appear as small spherical inclusions in the copper lattice and have a volume fraction of 0.6%. The structure of representative crystals was examined prior to any testing on a transmission electron microscope (TEM) to determine the nature of the dislocations initially present in the tested crystals. Only a few scattered edge and screw dislocations were viewed in those specimens.

Modern TEM systems architecture

1986 ◽  
Vol 44 ◽  
pp. 602-605
Author(s):  
U. Gross ◽  
P. Hagemann
Keyword(s):  
Electron Microscope ◽  
Information Gathering ◽  
Systems Architecture ◽  
Control Functions ◽  
Transmission Electron ◽  
New Information ◽  
Comprehensive Information ◽  
Scanning Transmission ◽  
Diffraction Patterns ◽  
Analytical Equipment

By addition of analytical equipment, scanning transmission accessories and data processing equipment the basic transmission electron microscope (TEM) has evolved into a comprehensive information gathering system. This extension has led to increased complexity of the instrument as compared with the straightforward imaging microscope, since in general new information capacity has required the addition of new control hardware. The increased operational complexity is reflected in a proliferation of knobs and buttons.In the conventional electron microscope design the operating panel of the instrument has distinct control elements to alter optical conditions of the microscope column in different modes. As a consequence a multiplicity of control functions has been inevitable. Examples of this are the three pairs of focus and magnification controls needed for TEM imaging, diffraction patterns, and STEM images.

Automatic analysis of Kikuchi diffraction patterns

1994 ◽  
Vol 52 ◽  
pp. 900-901
Author(s):  
H. Weiland ◽  
D. P. Field
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Spatial Resolution ◽  
Relevant Information ◽  
Crystalline Materials ◽  
Large Size ◽  
Transmission Electron ◽  
New Type ◽  
Diffraction Patterns ◽  
Orientation Determination

Recent advances in the automatic indexing of backscatter Kikuchi diffraction patterns on the scanning electron microscope (SEM) has resulted in the development of a new type of microscopy. The ability to obtain statistically relevant information on the spatial distribution of crystallite orientations is giving rise to new insight into polycrystalline microstructures and their relation to materials properties. A limitation of the technique in the SEM is that the spatial resolution of the measurement is restricted by the relatively large size of the electron beam in relation to various microstructural features. Typically the spatial resolution in the SEM is limited to about half a micron or greater. Heavily worked structures exhibit microstructural features much finer than this and require resolution on the order of nanometers for accurate characterization. Transmission electron microscope (TEM) techniques offer sufficient resolution to investigate heavily worked crystalline materials.Crystal lattice orientation determination from Kikuchi diffraction patterns in the TEM (Figure 1) requires knowledge of the relative positions of at least three non-parallel Kikuchi line pairs in relation to the crystallite and the electron beam.

Mounting an individual submicrometer sized single crystal

1996 ◽  
Vol 211 (6) ◽  
Author(s):  
R. B. Neder ◽  
M. Burghammer ◽  
Th. Grasl ◽  
H. Schulz
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Single Crystal ◽  
Single Crystals ◽  
High Vacuum ◽  
Nanometer Resolution ◽  
Micro Manipulator ◽  
Scanning Electron

AbstractWe developed a new micro manipulator for mounting individual sub-micrometer sized single crystals within a scanning electron microscope. The translations are realized via a commercially available piezomicroscope, adapted for high vacuum usage and realize nanometer resolution. With this novel instrument it is routinely possible to mount individual single crystals with sizes down to 0.1

scholarly journals Meso-Scale Transmission Electron Microscope Tomography Applied for Wax Distribution in Toner Particles

2013 ◽  
Vol 19 (S5) ◽  
pp. 58-61 ◽  
Author(s):  
Mino Yang ◽  
Jun-Ho Lee ◽  
Hee-Goo Kim ◽  
Euna Kim ◽  
Young-Nam Kwon ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Three Dimensional ◽  
Chromatic Aberration ◽  
Laser Printer ◽  
Medium Voltage ◽  
Transmission Electron ◽  
Z Contrast ◽  
Contrast Image

AbstractDistribution of wax in laser printer toner was observed using an ultra-high-voltage (UHV) and a medium-voltage transmission electron microscope (TEM). As the radius of the wax spans a hundred to greater than a thousand nanometers, its three-dimensional recognition via TEM requires large depth of focus (DOF) for a volumetric specimen. A tomogram with a series of the captured images would allow the determination of their spatial distribution. In this study, bright-field (BF) images acquired with UHV-TEM at a high tilt angle prevented the construction of the tomogram. Conversely, the Z-contrast images acquired by the medium-voltage TEM produced a successful tomogram. The spatial resolution for both is discussed, illustrating that the image degradation was primarily caused by beam divergence of the Z-contrast image and the combination of DOF and chromatic aberration of the BF image from the UHV-TEM.

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