Sinterability of 8 mol% Yttria Stabilized Zirconia

2018 ◽  
Vol 280 ◽  
pp. 102-108
Author(s):  
Tinesha Selvaraj ◽  
Johar Banjuraizah ◽  
S.F. Khor ◽  
M.N. Mohd Zainol
Keyword(s):  
Low Cost ◽  
Crystal Structure Analysis ◽  
Yttria Stabilized Zirconia ◽  
Holding Time ◽  
X Ray Diffraction ◽  
Stabilized Zirconia ◽  
Holding Period ◽  
Particle Size And Morphology ◽  
Size And Morphology ◽  
Sintering Behaviour

The sintering behaviour of low cost 8 mol% yttria stabilized zirconia powders has been studied. The effect of sintering holding time of the sintered granulated and milled 8YSZ were determined using density measurements, scanning electron microscopy (SEM) and X-ray diffraction (XRD). The elemental composition, particle size and morphology of the as-received 8YSZ powder and proceed for milling was investigated. 48 hours of ball milling on granulated 8YSZ resulted rises in specific surface area and sintered at 1550°C with the various period of time (4, 5, 6 and 7 hours). The milled 8YSZ sample with 5h sintering holding period coded as F5, sintering activity improved and the relative density came up to 98.3%. But then, granulated 8YSZ achieved only 62.7% with 5 hours holding time. Crystal structure analysis for milled 8YSZ powder consists of 59.6% of cubic ZrO2 phase, 40.1% of tetragonal ZrO2 and 0.3% of monoclinic ZrO2. Meanwhile, granulated 8YSZ indicated low content in cubic ZrO2 but high amount in monoclinic ZrO2 phase. In brief, low cost 8YSZ reached higher densification of 98% successfully.

Characterizations of Synthetic 8mol% YSZ with Comparison to 3mol %YSZ for HT-SOFC

2020 ◽  
Vol 38 (4A) ◽  
pp. 491-500
Author(s):  
Abeer F. Al-Attar ◽  
Saad B. H. Farid ◽  
Fadhil A. Hashim
Keyword(s):  
Ionic Conductivity ◽  
Electrochemical Impedance ◽  
Structural Information ◽  
Impedance Analysis ◽  
High Energy ◽  
Yttria Stabilized Zirconia ◽  
X Ray Diffraction ◽  
Stabilized Zirconia ◽  
Powder Morphology ◽  
X Ray

In this work, Yttria (Y2O3) was successfully doped into tetragonal 3mol% yttria stabilized Zirconia (3YSZ) by high energy-mechanical milling to synthesize 8mol% yttria stabilized Zirconia (8YSZ) used as an electrolyte for high temperature solid oxide fuel cells (HT-SOFC). This work aims to evaluate the densification and ionic conductivity of the sintered electrolytes at 1650°C. The bulk density was measured according to ASTM C373-17. The powder morphology and the microstructure of the sintered electrolytes were analyzed via Field Emission Scanning Electron Microscopy (FESEM). The chemical analysis was obtained with Energy-dispersive X-ray spectroscopy (EDS). Also, X-ray diffraction (XRD) was used to obtain structural information of the starting materials and the sintered electrolytes. The ionic conductivity was obtained through electrochemical impedance spectroscopy (EIS) in the air as a function of temperatures at a frequency range of 100(mHz)-100(kHz). It is found that the 3YSZ has a higher density than the 8YSZ. The impedance analysis showed that the ionic conductivity of the prepared 8YSZ at 800°C is0.906 (S.cm) and it was 0.214(S.cm) of the 3YSZ. Besides, 8YSZ has a lower activation energy 0.774(eV) than that of the 3YSZ 0.901(eV). Thus, the prepared 8YSZ can be nominated as an electrolyte for the HT-SOFC.

Effect of Yttria-Stabilized Zirconia Concentration in an Electroless Bath on Microstructure and Composition of Ni/Yttria-Stabilized Zirconia Nanocomposite

2021 ◽  
Vol 21 (11) ◽  
pp. 5592-5602
Author(s):  
Samira Almasi ◽  
Ali Mohammad Rashidi
Keyword(s):  
High Performance ◽  
Yttria Stabilized Zirconia ◽  
X Ray Diffraction ◽  
Stabilized Zirconia ◽  
Nickel Ion ◽  
Nanocomposite Particles ◽  
X Ray ◽  
Ni Content ◽  
Naoh Solution ◽  
Average Size

The effect of the yttria-stabilized zirconia (YSZ) nanoparticle loading in an electro-less bath was considered as one of the vital synthesis variables for control Ni content and microstructure of prepared nanocomposite particles, which are two crucial factors to achieving high-performance SOFC anode. Nanocomposite particles were prepared using a simple electroless method without any expensive pretreatment of sensitizing by Sn2+ ions as well as activating by Pd2+ ions that are usually used to apply nickel coating on the surface of a non-conductive substrate. The process was performed by adding YSZ nanoparticles into NaOH solution, separating them from the solution by the centrifugal method, then providing several water-based nanofluids with different concentrations of activated YSZ nanoparticles, mixing them with NiCI2 solution, followed by adding the hydrazine and then NaOH solution. X-ray diffraction and scanning electron microscopy coupled with energy dispersive X-ray analysis were used to analyze the prepared nanocomposite particles. It is observed that after adding YSZ nanoparticles into the NaOH solution, the pH of the solution varied gradually from a starting pH of 10.2 to 9. Also, by increasing the YSZ nanoparticles loading in the electroless bath from 76 mg/l to 126 mg/l, the grain size of Ni deposits, the Ni content and the average size of the prepared nanocomposite particles decreased. The electrochemical mechanism previously proposed for the nickel ion reduction was modified, and a novel analytical model was proposed for variation of the efficiency of Ni deposition with YSZ nanoparticles loading.

EPITAXIAL GROWTH OF YTTRIA-STABILIZED ZIRCONIA FILMS ON SILICON BY R.F. MAGNETRON SPUTTERING

1991 ◽  
Vol 05 (27) ◽  
pp. 1829-1835 ◽  
Author(s):  
Q.X. SU ◽  
L. LI ◽  
Y.Y. ZHAO ◽  
Y.Z. ZHANG ◽  
P. XU
Keyword(s):  
Magnetron Sputtering ◽  
Yttria Stabilized Zirconia ◽  
Processing Conditions ◽  
Full Width ◽  
X Ray Diffraction ◽  
Stabilized Zirconia ◽  
X Ray ◽  
Si Substrates ◽  
Zirconia Films ◽  
Scanning Electron

Yttria-stabilized Zirconia(YSZ) films were deposited on (100)Si substrates by R.F. magnetron sputtering method. X-ray diffraction analysis showed that the best YSZ films were cubic in structure and was grown epitaxially with (100) orientation. The (200) peak of YSZ films was 0.8° of the full width at half of the maximum, X-ray diffraction based on Seemann-Bohlin focusing geometry showed no peaks. The morphology of the YSZ films was observed by scanning electron microscopy. The effects of the processing conditions (such as substrate temperature, oxygen partial pressure, etc.) on the structure of the film were also discussed.

scholarly journals Identification of tetragonal and cubic structures of zirconia using synchrotron x-radiation source

1991 ◽  
Vol 6 (6) ◽  
pp. 1287-1292 ◽  
Author(s):  
Ram Srinivasan ◽  
Robert J. De Angelis ◽  
Gene Ice ◽  
Burtron H. Davis
Keyword(s):  
Particle Size ◽  
Radiation Source ◽  
Sol Gel ◽  
Yttria Stabilized Zirconia ◽  
Tetragonal Structure ◽  
Cubic Phase ◽  
X Ray Diffraction ◽  
Stabilized Zirconia ◽  
Synchrotron Source ◽  
Three Samples

X-ray diffraction from a synchrotron source was employed in an attempt to identify the crystal structures in zirconia ceramics produced by the sol-gel method. The particles of chemically precipitated zirconia, after calcination below 600 °C, are very fine, and have a diffracting particle size in the range of 7–15 nm. As the tetragonal and cubic structures of zirconia have similar lattice parameters, it is difficult to distinguish between the two. The tetragonal structure can be identified only by the characteristic splittings of the Bragg profiles from the “c” index planes. However, these split Bragg peaks from the tetragonal phase in zirconia overlap with one another due to particle size broadening. In order to distinguish between the tetragonal and cubic structures of zirconia, three samples were studied using synchrotron radiation source. The results indicated that a sample containing 13 mol% yttria-stabilized zirconia possessed the cubic structure with a0 = 0.51420 ± 0.00012 nm. A sample containing 6.5 mol% yttria stabilized zirconia was found to consist of a cubic phase with a0 = 0.51430 ± 0.00008 nm. Finally, a sample which was precipitated from a pH 13.5 solution was observed to have the tetragonal structure with a0 = 0.51441 ± 0.00085 nm and c0 = 0.51902 ± 0.00086.

Chemical Precipitation Synthesis of Nano-Crystalline Mg(OH)2

2012 ◽  
Vol 1481 ◽  
pp. 45-52
Author(s):  
A. Medina ◽  
L. Béjar ◽  
G. Herrera-Pérez
Keyword(s):  
Fourier Transform ◽  
Synthesis Method ◽  
Chemical Precipitation ◽  
X Ray Diffraction ◽  
Nano Crystalline ◽  
Transmission Electron ◽  
Particle Size And Morphology ◽  
Precipitation Synthesis ◽  
Size And Morphology ◽  
Analytical Tools

ABSTRACTMagnesium hydroxide (Mg(OH)2) nanoparticles were synthesized by chemical precipitation synthesis method. The influence of the nano-sized Mg(OH)2 on the structural modification was evaluated. The formation of Mg(OH)2 crystals were evaluated by Fourier transform infrared spectroscopy (FTIR) and thermogravimetric analysis (TGA). The particle size and morphology of Mg(OH)2was confirmed by high resolution transmission electron microscopy (HRTEM). The crystalline structure of nanoparticles was characterized by fast Fourier transform (FFT) and X-Ray diffraction (XRD), like analytical tools.

Synchrotron radiation study of yttria-stabilized zirconia, Zr0.758Y0.242O1.879

1999 ◽  
Vol 55 (5) ◽  
pp. 726-735 ◽  
Author(s):  
N. Ishizawa ◽  
Y. Matsushima ◽  
M. Hayashi ◽  
M. Ueki
Keyword(s):  
Synchrotron Radiation ◽  
Single Crystal ◽  
Yttria Stabilized Zirconia ◽  
Data Sets ◽  
X Ray Diffraction ◽  
Stabilized Zirconia ◽  
X Ray ◽  
Ideal Position ◽  
Fluorite Type ◽  
The Ideal

The fluorite-related cubic structure of yttria-stabilized zirconia, Zr0.75 8Y0.24 2O1.87 9, has been studied by single-crystal X-ray diffraction using synchrotron radiation and by EXAFS. Two diffraction data sets obtained at X-ray energies of 512 and 10 eV below the Y K edge revealed that in the average structure Zr atoms are displaced from the origin of the space group Fm3¯m along 〈111〉 by 0.19 Å, while Y atoms reside at the origin. Approximately 48% of the O atoms occupy the ideal position in the fluorite-type structure, while 43% of O atoms are displaced from the ideal position along 〈001〉 by 0.31 Å. The remaining 9% of O atoms are presumably sited at interstitial positions. Local structures around Zr and Y are investigated by combining the results of single-crystal X-ray diffraction and EXAFS studies.

Low Temperature Synthesis of Lanthanum Silicate Apatite Type by Modified Sol Gel Process

2014 ◽  
Vol 975 ◽  
pp. 143-148 ◽  
Author(s):  
Agatha Matos Misso ◽  
Daniel Ricco Elias ◽  
Fernando dos Santos ◽  
Chieko Yamagata
Keyword(s):  
Colloidal Silica ◽  
High Efficiency ◽  
Ceramic Body ◽  
Low Cost ◽  
Sol Gel ◽  
Lanthanum Nitrate ◽  
Yttria Stabilized Zirconia ◽  
Stabilized Zirconia ◽  
Lanthanum Silicate ◽  
Apatite Type

Rare earth silicate apatite type is a very important and promising material for application as an electrolyte in IT-SOFC (Intermediate Temperature Solid Oxide Fuel Cell). Lanthanum silicate apatite, La9,33Si6O26, exhibits high conductivity and has high efficiency, long term stability, fuel flexibility, low emissions and relatively low cost compared to yttria stabilized zirconia (YSZ - yttria stabilized zirconia), at temperatures between 600 to 800 °C. One of the problems of YSZ is its high operating temperature which results in long starting times and problems of mechanical and chemical compatibility. The interest of investigating lanthanum silicate apatite as an electrolyte is to overcome the problems caused by high temperature operation required by YSZ electrolyte. In the present study, sol-gel method was used to synthesize La9,33Si6O26. Initially, the reagents (sodium silicate and lanthanum nitrate) were mixed to obtain colloidal silica. Then, this gel containing lanthanum nitrate was thermally treated to allow the melting of lanthanum nitrate salt distributed on colloidal silica. The aim of this study was to verify if this method permits the formation of La9,33Si6O26 pure apatite phase, in order to obtain fine powders and uniform particles for further processing and obtaining a ceramic body.

Fabrication of Porous YSZ from ZnO-YSZ Cermet

2007 ◽  
Vol 124-126 ◽  
pp. 235-238
Author(s):  
Moon Jin Hwang ◽  
Chong Soo Han
Keyword(s):  
Electron Microscope ◽  
Gas Permeability ◽  
Acid Leaching ◽  
Yttria Stabilized Zirconia ◽  
X Ray Diffraction ◽  
Stabilized Zirconia ◽  
Scanning Electron Microscope Image ◽  
X Ray ◽  
Electron Microscope Image ◽  
Scanning Electron

Porous YSZ(8 mol% yttria-stabilized zirconia) was prepared by an acid leaching of ZnO-YSZ composite. The ZnO-YSZ composites were obtained by two different methods, a 1450 °C sintering of the mechanical mixture of ZnO and YSZ powders or a decomposition of Zn(NO3)2 deposited on YSZ and a subsequent sintering. The XRD (X-ray diffraction) pattern of the composite indicated that it was a mixture of ZnO and YSZ even after the sintering. Sharp edge or round edge of YSZ was observed in SEM (Scanning Electron Microscope) image of the porous-YSZ from the mixture of ZnO and YSZ, or Zn(NO3)2 deposited on YSZ, respectively. The porous YSZ from the composite having ZnO component greater than 60 wt% shows low mechanical strength. As the ZnO content of the composite increased, the porosity and gas permeability of the porous YSZ increased. From the result, it was suggested that ZnO is a candidate to generate pores in YSZ bulk or membrane.

Study of Crystallite Size of Yttria-Stabilized Zirconia Powders by Rietveld Method

2010 ◽  
Vol 660-661 ◽  
pp. 965-970 ◽  
Author(s):  
Wellington Claiton Leite ◽  
Adriana Scoton Antonio Chinelatto ◽  
André Maurício Brinatti ◽  
Mauricio Aparecido Ribeiro ◽  
André Vitor Chaves de Andrade ◽  
...  
Keyword(s):  
Rietveld Method ◽  
Pechini Method ◽  
Lattice Parameter ◽  
Yttria Stabilized Zirconia ◽  
Crystalline Size ◽  
Cubic Phase ◽  
Average Crystalline Size ◽  
X Ray Diffraction ◽  
Stabilized Zirconia ◽  
Atomic Scattering

The yttria-stabilized zirconia (YSZ) is used in a great variety of applications, for example, electrolytes of solid oxide fuel cells and oxygen sensors. In the study of YSZ, the particle size powders and sintering processes are important to define the final properties of the zirconia products. The objectives of this work were to determine the phases and the crystalline size using X-Ray Diffraction (XRD) data and the Rietveld Method (RM) of the YSZ powders obtained by chemical synthesis based on the Pechini method. It was used ZrOCl2.8H2O and Y(NO3)3.5H2O as precursors reagents. After calcination at 550oC during 24 hours, the powder was analyzed by XRD and scanning electronic microscopy (SEM). From XRD and using Rietveld method were verified that there is only cubic phase with lattice parameter a = 5.1307(1) Å and the space group Fm3m. Due to substitution of the Zr atoms in the Y atoms sites, there were vacancies in 17.72 % of O atoms sites. However, the percentage of substitution of Zr atoms in Y atoms sites in the structure not was determinate because the curves of atomic scattering of them are very similar. Using Scherrer equation and considering anisotropy effect, the average crystalline size was determinate: 10,43 nm (c axis) and 10,39 (b axis). This spherical symmetry also observed for SEM.

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