Experiments are described in which the a.c. impedance of the system Al/Al2O3/electrolyte (glycol–borate) is measured under conditions of steady-state film growth. Using an equivalent circuit of a resistive and capacitive element in parallel, the results are presented in the form of the a.c. conductance, σac, and effective dielectric constant, Keff, of the oxide film as a function of the d.c. current density, I0, and angular frequency ω. The results show that σac/I0 and Keff vary with (ω/I0), but within experimental error are independent of ω and I0 separately. The dielectric relaxation model, assuming two ion-current-driven relaxation processes and using the constants determined in Part I, reproduces the data almost within experimental scatter. A poorer fit is achieved if only one relaxation process is assumed.