This chapter discusses various aspects of scanning tunneling spectroscopy (STS). It is an extension of the classical tunneling spectroscopy experiment to nanometer-scale or atomic-scale features on the sample surface. First, the electronics for STS is presented. The nature of STS as a convolution of tip DOS and sample DOS is discussed. Special tip treatment for the STS experiment, often different from the atomic-resolution STM, is described. The purpose is to produce tips with flat DOS, instead of special tip orbitals. Experimental methods to determine tip DOS is discussed. A detailed account of the inelastic scanning tunneling spectroscopy, or STM-IETS, is then discussed. It includes the principles, the electronics, and the instrumental broadening of the features. This chapter concludes with the STS study of superconductors, especially High-Tc supercondoctors.