Analytical method for the accurate determination of tricothecenes in grains using LC-MS/MS: a comparison between MRM transition and MS3 quantitation

2011 ◽  
Vol 403 (10) ◽  
pp. 2801-2806 ◽  
Author(s):  
Chee Wei Lim ◽  
Siew Hoon Tai ◽  
Lin Min Lee ◽  
Sheot Harn Chan
2017 ◽  
Vol 32 (10) ◽  
pp. 2034-2040
Author(s):  
Z. T. Wang ◽  
J. Zheng ◽  
T. Imanaka ◽  
S. Uchida

A rapid sector field inductively coupled plasma mass spectrometry based 241Am analytical method for nuclear emergency response.


2015 ◽  
Vol 13 (1) ◽  
Author(s):  
Tingting Liu ◽  
Yangyang Chen ◽  
Gang Hu ◽  
Xiaofeng Shen ◽  
Jimei Song ◽  
...  

AbstractAn analytical method for the determination of tannic acid is proposed by the sequential perturbation caused by different amounts of tannic acid on the Belousov-Zhabotinskii oscillating system. The oscillating system is catalyzed by tetraazamacrocyclic complex [CuL](ClO4)2, where L is 5,7,7,12,14,14-hexamethyl-1,4,8,11-tetraazacyclotetradeca-4,11-diene. The method relies on the linear relationship between the changes in the inhibition time and the logarithm of the concentration of tannic acid. The calibration curve obeys a linear equation very well when the concentration of tannic acid is over the range of 6.25 × 10-7 ~ 1.56 × 10- 5 M (n = 16, R = 0.9984). This analytical method, equipped with a simple instrument, provides a new way to accurate determination of tannic acid.


2015 ◽  
Vol 809-810 ◽  
pp. 117-122
Author(s):  
Ion Nae ◽  
Gabriela Cristina Ionescu ◽  
Octavian Narcis Ionescu

From practical experience is well known that the establishment of the right values for the cutting regime parameters (without taking into consideration the cutting schematics) is requiring a large volume of work, thorough calculations and accurate input information regarding the process to be conducted. The high competition from the market is generating increased requirements concerning the productivity of processes, quality of the products as well as the production costs. There it is a strong correlation between these issues and the accurate determination of the cutting regime parameters. This article presents the methods of calculation for the cutting regime parameters for drilling process by using analytical method (classical) and automated method (by using specialized software packages) and the analysis of the results obtained with the goal of establishing which of them are providing the best results in the shortest period of time.


Author(s):  
Mohammed Nasir Ansari ◽  
Ankit Dalal ◽  
Praveen Kumar ◽  
Minoru Kikuchi ◽  
Kohei Yamaguchi ◽  
...  

Author(s):  
R.D. Leapman ◽  
P. Rez ◽  
D.F. Mayers

Microanalysis by EELS has been developing rapidly and though the general form of the spectrum is now understood there is a need to put the technique on a more quantitative basis (1,2). Certain aspects important for microanalysis include: (i) accurate determination of the partial cross sections, σx(α,ΔE) for core excitation when scattering lies inside collection angle a and energy range ΔE above the edge, (ii) behavior of the background intensity due to excitation of less strongly bound electrons, necessary for extrapolation beneath the signal of interest, (iii) departures from the simple hydrogenic K-edge seen in L and M losses, effecting σx and complicating microanalysis. Such problems might be approached empirically but here we describe how computation can elucidate the spectrum shape.The inelastic cross section differential with respect to energy transfer E and momentum transfer q for electrons of energy E0 and velocity v can be written as


Author(s):  
M.A. Gribelyuk ◽  
M. Rühle

A new method is suggested for the accurate determination of the incident beam direction K, crystal thickness t and the coordinates of the basic reciprocal lattice vectors V1 and V2 (Fig. 1) of the ZOLZ plans in pixels of the digitized 2-D CBED pattern. For a given structure model and some estimated values Vest and Kest of some point O in the CBED pattern a set of line scans AkBk is chosen so that all the scans are located within CBED disks.The points on line scans AkBk are conjugate to those on A0B0 since they are shifted by the reciprocal vector gk with respect to each other. As many conjugate scans are considered as CBED disks fall into the energy filtered region of the experimental pattern. Electron intensities of the transmitted beam I0 and diffracted beams Igk for all points on conjugate scans are found as a function of crystal thickness t on the basis of the full dynamical calculation.


Author(s):  
F.A. Ponce ◽  
H. Hikashi

The determination of the atomic positions from HRTEM micrographs is only possible if the optical parameters are known to a certain accuracy, and reliable through-focus series are available to match the experimental images with calculated images of possible atomic models. The main limitation in interpreting images at the atomic level is the knowledge of the optical parameters such as beam alignment, astigmatism correction and defocus value. Under ordinary conditions, the uncertainty in these values is sufficiently large to prevent the accurate determination of the atomic positions. Therefore, in order to achieve the resolution power of the microscope (under 0.2nm) it is necessary to take extraordinary measures. The use of on line computers has been proposed [e.g.: 2-5] and used with certain amount of success.We have built a system that can perform operations in the range of one frame stored and analyzed per second. A schematic diagram of the system is shown in figure 1. A JEOL 4000EX microscope equipped with an external computer interface is directly linked to a SUN-3 computer. All electrical parameters in the microscope can be changed via this interface by the use of a set of commands. The image is received from a video camera. A commercial image processor improves the signal-to-noise ratio by recursively averaging with a time constant, usually set at 0.25 sec. The computer software is based on a multi-window system and is entirely mouse-driven. All operations can be performed by clicking the mouse on the appropiate windows and buttons. This capability leads to extreme friendliness, ease of operation, and high operator speeds. Image analysis can be done in various ways. Here, we have measured the image contrast and used it to optimize certain parameters. The system is designed to have instant access to: (a) x- and y- alignment coils, (b) x- and y- astigmatism correction coils, and (c) objective lens current. The algorithm is shown in figure 2. Figure 3 shows an example taken from a thin CdTe crystal. The image contrast is displayed for changing objective lens current (defocus value). The display is calibrated in angstroms. Images are stored on the disk and are accessible by clicking the data points in the graph. Some of the frame-store images are displayed in Fig. 4.


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