Chitin deacetylase: from molecular structure to practical applications

A simple molecular structure of ortho-derived perylene diimides (PDI) diploid has been developed for non-fullerene organic solar cells (OSCs) with a high power conversion efficiency (PCE) of 8.3%, indicating that such a concise molecular structure with a high PCE has great potential for the practical applications in OSCs.

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Molecular structure of bottlebrush polymers in melts

Science Advances ◽

10.1126/sciadv.1601478 ◽

2016 ◽

Vol 2 (11) ◽

pp. e1601478 ◽

Cited By ~ 105

Author(s):

Jarosław Paturej ◽

Sergei S. Sheiko ◽

Sergey Panyukov ◽

Michael Rubinstein

Keyword(s):

Molecular Structure ◽

Chemical Composition ◽

Numerical Simulations ◽

Chain Length ◽

Polymer Melts ◽

Side Chain ◽

Molecular Architecture ◽

Practical Applications ◽

Grafting Density ◽

Theoretical Predictions

Bottlebrushes are fascinating macromolecules that display an intriguing combination of molecular and particulate features having vital implications in both living and synthetic systems, such as cartilage and ultrasoft elastomers. However, the progress in practical applications is impeded by the lack of knowledge about the hierarchic organization of both individual bottlebrushes and their assemblies. We delineate fundamental correlations between molecular architecture, mesoscopic conformation, and macroscopic properties of polymer melts. Numerical simulations corroborate theoretical predictions for the effect of grafting density and side-chain length on the dimensions and rigidity of bottlebrushes, which effectively behave as a melt of flexible filaments. These findings provide quantitative guidelines for the design of novel materials that allow architectural tuning of their properties in a broad range without changing chemical composition.

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Application of FT-IR technique to bituminous materials

Budownictwo i Architektura ◽

10.35784/bud-arch.1862 ◽

2014 ◽

Vol 13 (4) ◽

pp. 317-324

Author(s):

Adam Zofka ◽

Dominika Maliszewska ◽

Maciej Maliszewski

Keyword(s):

Molecular Structure ◽

Quality Assurance ◽

Ir Spectra ◽

Material Science ◽

Functional Group ◽

Construction Materials ◽

Practical Applications ◽

Bituminous Materials ◽

Ft Ir ◽

Detection And Quantification

Spectroscopy is a fundamental method used in the material science that relies on the interaction of the electromagnetic radiation with a matter. Infrared spectroscopy allows for material fingerprinting as well as detection and quantification of compounds in a sample. In principle, IR spectrometers record the absorption of electromagnetic energy by chemical bounds in a sample as a function of wavelength. Chemical bounds have unique spectra bands at specific wavelengths regardless of the composition of the remaining molecular structure. The absorbance at these specific wavelengths can be used to quantify a particular functional group in the analyzed material. Absorbance peaks are easily identified on the IR spectra and can be used to fingerprint a compound in a mixture, especially when compared to the original unmodified IR spectra. In the recent years, the FT-IR method has become a popular tool for the quality assurance in the practical applications as well as it became a very useful tool in studying various construction materials, e.g. portland cement, bitumen, etc.

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Molecular Structure of the Outermost Cell Wall Component of Spirillum Serpens

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100079218 ◽

1977 ◽

Vol 35 ◽

pp. 342-343

Author(s):

Wah Chiu ◽

David Grano

Keyword(s):

Molecular Structure ◽

Cell Wall ◽

Outer Membrane ◽

Gel Electrophoresis ◽

Electron Microscopic Examination ◽

Electron Microscopic ◽

Cell Wall Component ◽

Protein Components ◽

Exposure Technique ◽

Structural Aspects

The periodic structure external to the outer membrane of Spirillum serpens VHA has been isolated by similar procedures to those used by Buckmire and Murray (1). From SDS gel electrophoresis, we have found that the isolated fragments contain several protein components, and that the crystalline structure is composed of a glycoprotein component with a molecular weight of ∽ 140,000 daltons (2). Under an electron microscopic examination, we have visualized the hexagonally-packed glycoprotein subunits, as well as the bilayer profile of the outer membrane. In this paper, we will discuss some structural aspects of the crystalline glycoproteins, based on computer-reconstructed images of the external cell wall fragments.The specimens were prepared for electron microscopy in two ways: negatively stained with 1% PTA, and maintained in a frozen-hydrated state (3). The micrographs were taken with a JEM-100B electron microscope with a field emission gun. The minimum exposure technique was essential for imaging the frozen- hydrated specimens.

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Ion Beam Induced Interfacial Reactions in Molybdenum Thin Films on Silicon

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100097466 ◽

1981 ◽

Vol 39 ◽

pp. 162-163

Author(s):

L. J. Chen ◽

L. S. Hung ◽

J. W. Mayer

Keyword(s):

Ion Beam ◽

Chemical Vapor ◽

Interfacial Reactions ◽

Practical Applications ◽

Microelectronic Devices ◽

Recent Emergence ◽

Chemical Vapor Deposited ◽

Atomic Mixing ◽

Silicon Interface ◽

Kinetics Of

When an energetic ion penetrates through an interface between a thin film (of species A) and a substrate (of species B), ion induced atomic mixing may result in an intermixed region (which contains A and B) near the interface. Most ion beam mixing experiments have been directed toward metal-silicon systems, silicide phases are generally obtained, and they are the same as those formed by thermal treatment.Recent emergence of silicide compound as contact material in silicon microelectronic devices is mainly due to the superiority of the silicide-silicon interface in terms of uniformity and thermal stability. It is of great interest to understand the kinetics of the interfacial reactions to provide insights into the nature of ion beam-solid interactions as well as to explore its practical applications in device technology.About 500 Å thick molybdenum was chemical vapor deposited in hydrogen ambient on (001) n-type silicon wafer with substrate temperature maintained at 650-700°C. Samples were supplied by D. M. Brown of General Electric Research & Development Laboratory, Schenectady, NY.

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1250-kilovolt scanning transmission electron microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100113007 ◽

1984 ◽

Vol 42 ◽

pp. 624-625

Author(s):

T. Imura ◽

S. Maruse ◽

K. Mihama ◽

M. Iseki ◽

M. Hibino ◽

...

Keyword(s):

High Voltage ◽

Electron Probe ◽

Scanning Transmission Electron Microscope ◽

Pressure Vessels ◽

Practical Applications ◽

Voltage Generator ◽

Transmission Electron ◽

Scanning Transmission ◽

New Applications ◽

High Voltage Generator

Ultra high voltage STEM has many inherent technical advantages over CTEM. These advantages include better signal detectability and signal processing capability. It is hoped that it will explore some new applications which were previously not possible. Conventional STEM (including CTEM with STEM attachment), however, has been unable to provide these inherent advantages due to insufficient performance and engineering problems. Recently we have developed a new 1250 kV STEM and completed installation at Nagoya University in Japan. It has been designed to break through conventional engineering limitations and bring about theoretical advantage in practical applications.In the design of this instrument, we exercised maximum care in providing a stable electron probe. A high voltage generator and an accelerator are housed in two separate pressure vessels and they are connected with a high voltage resistor cable.(Fig. 1) This design minimized induction generated from the high voltage generator, which is a high frequency Cockcroft-Walton type, being transmitted to the electron probe.

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Characterization of intergranular cuprous oxide in polycrystalline YBa2Cu3O7-x

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100106466 ◽

1988 ◽

Vol 46 ◽

pp. 880-881

Author(s):

Bradley L. Thiel ◽

Chan Han R. P. ◽

Kurosky L. C. Hutter ◽

I. A. Aksay ◽

Mehmet Sarikaya

Keyword(s):

Grain Boundary ◽

Cuprous Oxide ◽

Room Temperature ◽

Boundary Phase ◽

Spectroscopic Techniques ◽

Transition Width ◽

Practical Applications ◽

Thin Foils ◽

Superconducting Oxides

The identification of extraneous phases is important in understanding of high Tc superconducting oxides. The spectroscopic techniques commonly used in determining the origin of superconductivity (such as RAMAN, XPS, AES, and EXAFS) are surface-sensitive. Hence a grain boundary phase several nanometers thick could produce irrelevant spectroscopic results and cause erroneous conclusions. The intergranular phases present a major technological consideration for practical applications. In this communication we report the identification of a Cu2O grain boundary phase which forms during the sintering of YBa2Cu3O7-x (1:2:3 compound).Samples are prepared using a mixture of Y2O3. CuO, and BaO2 powders dispersed in ethanol for complete mixing. The pellets pressed at 20,000 psi are heated to 950°C at a rate of 5°C per min, held for 1 hr, and cooled at 1°C per min to room temperature. The samples show a Tc of 91K with a transition width of 2K. In order to prevent damage, a low temperature stage is used in milling to prepare thin foils which are then observed, using a liquid nitrogen holder, in a Philips 430T at 300 kV.

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Resolution and measurement in the scanning electron microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100127256 ◽

1987 ◽

Vol 45 ◽

pp. 534-537 ◽

Cited By ~ 2

Author(s):

Michael T. Postek

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Engineering Design ◽

Resolving Power ◽

Practical Applications ◽

Instrument Resolution ◽

Accurate Definition ◽

Definition Of ◽

Scanning Electron ◽

Better Than

The term ultimate resolution or resolving power is the very best performance that can be obtained from a scanning electron microscope (SEM) given the optimum instrumental conditions and sample. However, as it relates to SEM users, the conventional definitions of this figure are ambiguous. The numbers quoted for the resolution of an instrument are not only theoretically derived, but are also verified through the direct measurement of images on micrographs. However, the samples commonly used for this purpose are specifically optimized for the measurement of instrument resolution and are most often not typical of the sample used in practical applications.SEM RESOLUTION. Some instruments resolve better than others either due to engineering design or other reasons. There is no definitively accurate definition of how to quantify instrument resolution and its measurement in the SEM.

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In situ TEM Studies of agglomeration of sub-nanometer Ru layers in Ru/C multilayers

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100121685 ◽

1992 ◽

Vol 50 (1) ◽

pp. 256-257

Author(s):

Tai D. Nguyen ◽

Ronald Gronsky ◽

Jeffrey B. Kortright

Keyword(s):

Layered Structure ◽

Driving Force ◽

High Energy ◽

Superior Performance ◽

In Situ Tem ◽

Rayleigh Instability ◽

Practical Applications ◽

Transmission Electron ◽

Diffraction Patterns

Nanometer period Ru/C multilayers are one of the prime candidates for normal incident reflecting mirrors at wavelengths < 10 nm. Superior performance, which requires uniform layers and smooth interfaces, and high stability of the layered structure under thermal loadings are some of the demands in practical applications. Previous studies however show that the Ru layers in the 2 nm period Ru/C multilayer agglomerate upon moderate annealing, and the layered structure is no longer retained. This agglomeration and crystallization of the Ru layers upon annealing to form almost spherical crystallites is a result of the reduction of surface or interfacial energy from die amorphous high energy non-equilibrium state of the as-prepared sample dirough diffusive arrangements of the atoms. Proposed models for mechanism of thin film agglomeration include one analogous to Rayleigh instability, and grain boundary grooving in polycrystalline films. These models however are not necessarily appropriate to explain for the agglomeration in the sub-nanometer amorphous Ru layers in Ru/C multilayers. The Ru-C phase diagram shows a wide miscible gap, which indicates the preference of phase separation between these two materials and provides an additional driving force for agglomeration. In this paper, we study the evolution of the microstructures and layered structure via in-situ Transmission Electron Microscopy (TEM), and attempt to determine the order of occurence of agglomeration and crystallization in the Ru layers by observing the diffraction patterns.

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A New Detector System For The HB5 Stem Instrument

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100117674 ◽

1985 ◽

Vol 43 ◽

pp. 134-135

Author(s):

J.M. Cowley

Keyword(s):

Dark Field ◽

Detector System ◽

Electron Holography ◽

Small Specimen ◽

Bright Field ◽

Multiple Images ◽

Practical Applications ◽

Wide Range ◽

Diffraction Patterns ◽

Operational Modes

The HB5 STEM instrument at ASU has been modified previously to include an efficient two-dimensional detector incorporating an optical analyser device and also a digital system for the recording of multiple images. The detector system was built to explore a wide range of possibilities including in-line electron holography, the observation and recording of diffraction patterns from very small specimen regions (having diameters as small as 3Å) and the formation of both bright field and dark field images by detection of various portions of the diffraction pattern. Experience in the use of this system has shown that sane of its capabilities are unique and valuable. For other purposes it appears that, while the principles of the operational modes may be verified, the practical applications are limited by the details of the initial design.

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