Chrysophyllum cainito. L alleviates diabetic and complications by playing antioxidant, antiglycation, hypoglycemic roles and the chemical profile analysis

2021 ◽  
Vol 281 ◽  
pp. 114569
Author(s):  
Yajie Wang ◽  
Yue Chen ◽  
Yanan Jia ◽  
Zihan Xue ◽  
Zhongqin Chen ◽  
...  
Keyword(s):  
Profile Analysis ◽  
Chemical Profile ◽  
Chrysophyllum Cainito

High-resolution atomic structures of rubidium compounds in L X-ray spectral lines: a promising exploration for chemical analysis

2020 ◽  
Vol 35 (6) ◽  
pp. 1187-1198
Author(s):  
Harpreet Singh Kainth
Keyword(s):  
High Resolution ◽  
Chemical Analysis ◽  
Profile Analysis ◽  
Spectral Lines ◽  
Chemical Profile ◽  
X Ray ◽  
Atomic Structures ◽  
Materials Used ◽  
Xrf Spectroscopy

X-ray fluorescence (XRF) spectroscopy has made a significant impact on the chemical profile analysis of various materials used for industrial and medical purposes.

SIMS as a subnanometer probe: A new tool for chemical profile analysis of grafted molecules

2007 ◽  
Vol 253 (14) ◽  
pp. 6140-6143 ◽  
Author(s):  
Frédéric Chérioux ◽  
Bernard Gauthier-Manuel ◽  
John Eccles ◽  
Thierry Grenut ◽  
Marc Briant
Keyword(s):  
Profile Analysis ◽  
Chemical Profile

Chemical Profile Analysis of Ling-Gui-Zhu-Gan Decoction by LC–QTOF MS and Simultaneous Determination of Nine Major Components Using QAMS Method

2020 ◽  
Vol 83 (11) ◽  
pp. 1371-1389
Author(s):  
Qi Yuan ◽  
Hong-li Zhang ◽  
Qian-cheng Zhang ◽  
Hong-mei Wen ◽  
Xiao-bing Cui ◽  
...  
Keyword(s):  
Simultaneous Determination ◽  
Profile Analysis ◽  
Chemical Profile

scholarly journals Chemical Profile Analysis and Comparison of Two Versions of the Classic TCM Formula Danggui Buxue Tang by HPLC-DAD-ESI-IT-TOF-MSn

Molecules ◽  
2014 ◽  
Vol 19 (5) ◽  
pp. 5650-5673 ◽  
Author(s):  
Ya-Zhou Zhang ◽  
Feng Xu ◽  
Tao Yi ◽  
Jian-Ye Zhang ◽  
Jun Xu ◽  
...  
Keyword(s):  
Profile Analysis ◽  
Chemical Profile ◽  
Danggui Buxue Tang

scholarly journals Development and application of a chemical profiling method for the assessment of the quality and consistency of the Pelargonium sidoides extract

2021 ◽  
Vol 12 (1) ◽  
Author(s):  
Se Mi Yu ◽  
Sung Jun Kim ◽  
Yeong Cheol Yoon ◽  
Jong Hoon Kim
Keyword(s):  
Profile Analysis ◽  
Pearson Correlation ◽  
Herbal Medicines ◽  
Correlation Coefficients ◽  
Chemical Profile ◽  
Chemical Profiling ◽  
Pelargonium Sidoides ◽  
Accuracy And Precision ◽  
Consistency Evaluation

AbstractThe evaluation of chemical similarity is very significant for the evaluation and standardization of the quality of herbal medicines as the biological activity of herbal medicines depends on the composition and proportion of many individual components. Many health organizations have recommended chemical profiling for the quality and consistency evaluation of herbal medicines. In this study, chemical profiling was performed to evaluate the similarity between batches of Pelargonium sidoides maltodextrin mixture (PMM) from EPs® 7630, a Pelargonium sidoides extract preparation. For chemical profile analysis, 7 common peaks were selected from 27 different PMM batches and specificity, linearity, accuracy, and precision tests were performed to develop the analytical method. The Pearson correlation coefficients of the similarity for all 27 batches manufactured over the years were higher than 0.90, indicating that quality consistency is well ensured over the years. This profiling method confirms the chemical profile of various commercial products using not only PMM but also Pelargonium sidoides extract and shows that it can be applied to standardization of quality.

Applications of SIMS to electronic materials and devices

1992 ◽  
Vol 50 (2) ◽  
pp. 1682-1683
Author(s):  
S.F. Corcoran
Keyword(s):  
Depth Distribution ◽  
Secondary Ion Mass Spectrometry ◽  
Semiconductor Device ◽  
Electronic Materials ◽  
Profile Analysis ◽  
Semiconductor Industry ◽  
Small Diameter ◽  
Depth Resolution ◽  
Detection Sensitivity

Over the past decade secondary ion mass spectrometry (SIMS) has played an increasingly important role in the characterization of electronic materials and devices. The ability of SIMS to provide part per million detection sensitivity for most elements while maintaining excellent depth resolution has made this technique indispensable in the semiconductor industry. Today SIMS is used extensively in the characterization of dopant profiles, thin film analysis, and trace analysis in bulk materials. The SIMS technique also lends itself to 2-D and 3-D imaging via either the use of stigmatic ion optics or small diameter primary beams.By far the most common application of SIMS is the determination of the depth distribution of dopants (B, As, P) intentionally introduced into semiconductor materials via ion implantation or epitaxial growth. Such measurements are critical since the dopant concentration and depth distribution can seriously affect the performance of a semiconductor device. In a typical depth profile analysis, keV ion sputtering is used to remove successive layers the sample.

Identifying Suicide Typologies Among Trauma-Exposed Veterans

Crisis ◽  
2020 ◽  
Vol 41 (4) ◽  
pp. 288-295 ◽  
Author(s):  
Nadia Bounoua ◽  
Jasmeet P. Hayes ◽  
Naomi Sadeh
Keyword(s):  
Latent Profile Analysis ◽  
Suicide Attempts ◽  
Clinical Symptoms ◽  
Profile Analysis ◽  
Risky Behaviors ◽  
Self Report ◽  
Cross Sectional ◽  
Research Priority ◽  
Self Harm ◽  
And Behaviors

Abstract. Background: Suicide among veterans has increased in recent years, making the identification of those at greatest risk for self-injurious behavior a high research priority. Aims: We investigated whether affective impulsivity and risky behaviors distinguished typologies of self-injurious thoughts and behaviors in a sample of trauma-exposed veterans. Method: A total of 95 trauma-exposed veterans (ages 21–55; 87% men) completed self-report measures of self-injurious thoughts and behaviors, impulsivity, and clinical symptoms. Results: A latent profile analysis produced three classes that differed in suicidal ideation, suicide attempts and nonsuicidal self-injury (NSSI): A low class that reported little to no self-injurious thoughts or behaviors; a self-injurious thoughts (ST) class that endorsed high levels of ideation but no self-harm behaviors; and a self-injurious thoughts and behaviors (STaB) class that reported ideation, suicide attempts and NSSI. Membership in the STaB class was associated with greater affective impulsivity, disinhibition, and distress/arousal than the other two classes. Limitations: Limitations include an overrepresentation of males in our sample, the cross-sectional nature of the data, and reliance on self-report measures. Conclusion: Findings point to affective impulsivity and risky behaviors as important characteristics of veterans who engage in self-injurious behaviors.

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