VUV reflective coatings on thin concave float glass substrates with a perimeter of 86cm to be used as provisional HADES RICH mirror segments

Author(s):  
P Maier-Komor ◽  
J Friese ◽  
R Gernhäuser ◽  
J Homolka ◽  
A Kastenmüller ◽  
...  
2001 ◽  
Vol 695 ◽  
Author(s):  
J. G. Wang ◽  
M. E. Stahley ◽  
C. G. Pantano ◽  
D. H. Yang ◽  
T. Anderson ◽  
...  

ABSTRACTTin oxide thin films on glass are used in a variety of applications ranging from transparent conductors to coupling layers to wear resistant coatings. The mechanical properties and wear resistance are crucial to most applications of tin oxide films. In the present study, ultrathin tin oxide films were sputter-deposited on the two different glass substrates. Nanoindentation, nanoscratch and nanowear experiments were performed on the tin oxide films with different thickness using a Hysitron TriboScope at different loads. Hardness and Young's modulus of elasticity were determined from the depth sensing load-displacement data. A lower friction coefficient was observed on the thinner film using the ramping load scratch test. Critical loads were determined by the ramping load scratch test and multi-slide nanowear tests on the tin oxide film deposited on the alkali contained commercial float glass (LOF-P16) glass. Discussion on the effect of surface chemistry on the mechanical properties was made.


2007 ◽  
Vol 336-338 ◽  
pp. 750-753
Author(s):  
Dao Li Zhang ◽  
Zhi Bing Deng ◽  
Liang Yan Chen ◽  
Jian Bing Zhang

A simple laboratory technique for the routine preparation of antimony-doped tin oxide (ATO) on float glass substrates (25×76×1mm3) was described. The process employed sol-gel dip-coating approach in the absolute ethanol solution of metal salts of tin (II) chloride dehydrate and antimony trichloride. Microstructural and morphological analyses of as-prepared films were performed at different conditions. With increase of annealing temperature from 400 to 550°C, the evolution of grain size and the morphologies of ATO films were analyzed by means of atom force microscopy (AFM). The studies on the morphological development suggested that higher annealing temperature led to a decrease in the surface roughness of the deposited films. The XRD patterns revealed that as-prepared ATO films were in the crystallization of a tetragonal rutile structure of SnO2 with highly (110) preferred orientation.


2012 ◽  
Vol 1447 ◽  
Author(s):  
Desaraju Varaprasad ◽  
Sudip Mukhopadhyay ◽  
Boris Korolev ◽  
Amanuel Gebrebrhan ◽  
Ya Qun Liu ◽  
...  

ABSTRACTIt has been demonstrated in literature that chemical liquid deposition (CLD) processes such as dip coating, spray coating, roll coating, spin coating, curtain coating, meniscus coating etc. can be successfully used to deposit anti-reflective coatings on glass substrates. In comparison to physical vapor deposition (PVD), a CLD process generally is cost efficient because of lower capital requirements to set up coating manufacturing lines. Within the realm of CLD processes only some application techniques are suitable for high speed continuous manufacturing processes to deposit coatings on large area glass substrates. Significant differences in transfer efficiencies of these high speed application processes are readily apparent when material utilization per unit area of glass are compared. Roll coat process among all the high speed CLD processes stands out for its high material transfer efficiency due to direct contact printing on flat glass substrates. Honeywell Electronic Materials expanded its line of SOLARC® anti-reflective coating materials to include a new coating formulation SOLARC® RPV, which is customized for roll coating application. This paper highlights the advantages of using SOLARC® RPV in roll coat process and the performance attributes of SOLARC® anti-reflective coatings. Durability characteristics of these anti-reflective coatings in accelerated aging tests designed to simulate harsh field conditions will also be discussed.


2013 ◽  
Vol 24 (50) ◽  
pp. 505201 ◽  
Author(s):  
Hemant Kumar Raut ◽  
Saman Safari Dinachali ◽  
Kwadwo Konadu Ansah-Antwi ◽  
V Anand Ganesh ◽  
Seeram Ramakrishna

2015 ◽  
Vol 22 (04) ◽  
pp. 1550046 ◽  
Author(s):  
YA-DONG SUN ◽  
QI-XIANG CHEN ◽  
YU-FEI FENG ◽  
JUN CHEN ◽  
SEN-JIANG YU

We report on the buckling morphologies and interfacial properties of silicon nitride films deposited on float glass substrates. The coexistence of straight-sided and telephone cord buckles can be observed in the silicon nitride films after annealing at a high temperature. The straight-sided structure is metastable and can spontaneously evolve into the telephone cord structure accompanied by the increase in the buckle width and height. The geometric parameters of various buckling structures (including the straight blister, telephone cord and their transition state) have been measured by optical microscopy and atomic force microscopy (AFM). The internal stress and interfacial adhesion of the films are evaluated and analyzed based on the continuum elastic theory. It is valid to measure the interfacial properties of thin films by simplifying the telephone cord buckle as a straight-sided structure. This measurement technique is suitable for all the film systems provided that the buckles can form in the film.


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