Comparison of Several Sem Imaging Modes in Studying Intracellular Particulates in the Lung

1976 ◽  
Vol 34 ◽  
pp. 222-223
Author(s):  
J. L. Abraham ◽  
K. Miyai
Keyword(s):  
Electron Microscope ◽  
Secondary Electron ◽  
X Ray ◽  
Radiographic Contrast Medium ◽  
Radiographic Contrast ◽  
Distribution Mapping ◽  
Backscattered Electron ◽  
Sem Imaging ◽  
Analysis System ◽  
Scanning Electron

The scanning electron microscope (SEM) offers several signal modes, each of which may contain unique information about the specimen. In this paper we demonstrate and compare the merits of the familiar secondary electron (SE) mode, the backscattered electron (BSE) mode, and x-ray distribution mapping.Lungs of hamsters treated intratracheally with the radiographic contrast medium tantalum suspended in carboxymethyl cellulose were fixed with intratracheal buffered 2% glutaraldehyde. Blocks were razor cut to a few mm, dehydrated and critical point dried. The dried blocks were mounted on aluminum SEM studs and coated with carbon,, followed in some instances by gold/palladium (60/40). Examination at 20 kv and 45° specimen tilt was done in an Etec SEM with a solid state BSE detector and a Cambridge S4 SEM with an ORTEC energy dispersive x-ray analysis system.

X-Ray Mapping with Energy-Dispersive and Wavelength-Dispersive X-Ray Spectrometry in the Scanning Electron Microscope: a Tutorial

1999 ◽  
Vol 5 (S2) ◽  
pp. 518-519
Author(s):  
Dale E. Newbury ◽  
David S. Bright
Keyword(s):  
Image Processing ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Recording System ◽  
X Ray ◽  
On Line ◽  
Current Electron ◽  
Sem Imaging ◽  
Display Systems ◽  
Scanning Electron

X-ray mapping is one of the most popular modes for displaying information obtained with x-ray spectrometry performed in the scanning electron microscope. This popularity arises from the ready accessibility and apparent simplicity of information presented in a pictorial fashion, especially when used in conjunction with other SEM imaging modes, such as backscattered, secondary, and specimen current electron images. Further, the rise of powerful, inexpensive computer systems capable of image processing and display has given the analyst a dedicated, on-line tool with the capacity and flexibility needed for problem solving. Figure 1 shows a typical example of mapping. Although the interpretation of x-ray images obtained with a modern digital control and recording system would seem to be straightforward and relatively trivial, there are significant pitfalls and limitations that can easily fool the unwary. In Figure 1, within an individual x-ray map, the observer can reasonably judge where the concentration is lower or higher, at least for a group of contiguous pixels. Can such judgments be made among a set of maps of the same region for different elements, or even for the same element from different regions of the same specimen? With current x-ray processing and display systems, the answers are generally no. In fact, problems that can influence interpretation can arise at each stage of x-ray generation/emission, x-ray spectral collection, processing, and display.

Research and Application of S-4800 Scanning Electron Microscope in Modern Testing and Analysis Technology

2014 ◽  
Vol 668-669 ◽  
pp. 936-939
Author(s):  
Quan Wen ◽  
Zhao Yang Ding ◽  
Fu Sheng Kou ◽  
Peng Zhou
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Secondary Electron ◽  
Forming Mechanism ◽  
Main Application ◽  
Signal Transformation ◽  
Backscattered Electron ◽  
Application Fields ◽  
Scanning Electron

Mechanism and functions of S-4800 Scanning Electron Microscope are introduced in this paper. The image-forming mechanism and structure of SEM are studied, and the signal transformation of secondary electron and backscattered electron is presented. The main application fields of SEM are researched.

Forensic Uses of Deflection (Y) Modulation and X-Ray Dot Mapping

1985 ◽  
Vol 43 ◽  
pp. 512-513
Author(s):  
S. Basu
Keyword(s):  
Signal Processing ◽  
Electron Microscope ◽  
Chemical Analysis ◽  
Scanning Electron Microscope ◽  
Sample Preparation ◽  
Secondary Electron ◽  
Energy Dispersive ◽  
X Ray ◽  
Image Forensic ◽  
Scanning Electron

The imaging capabilities of the scanning electron microscope in conjunction with an energy dispersive x-ray spectrometer (SEM-EDX) allow both topographical and compositional displays that can be readily interpreted. Illustrative evidence of this type would be valuable in forensic determinations, since the associated techniques of image formation, chemical analysis and sample preparation are well understood and documented. Various methods of signal processing are also available, which allow intuitive, stylistic and synthetic interpretation of the image. Forensic applications of two such methods will be stressed in this report using a AMR 1000 SEM. These are deflection modulation (DM) or “Y-modulation” of secondary electron signal^ and x-ray dot mapping.

Utilization of a high-speed x-ray analysis system with a SEM

1989 ◽  
Vol 47 ◽  
pp. 660-661
Author(s):  
A. O. Sandborg ◽  
R. W. Anderhalt
Keyword(s):  
Electron Microscope ◽  
High Speed ◽  
Energy Dispersive Spectrometer ◽  
Full Spectrum ◽  
X Ray ◽  
Peak Overlap ◽  
Average Analysis ◽  
Full Analysis ◽  
Analysis System ◽  
Scanning Electron

A high speed x-ray analysis system has been developed using a scanning electron microscope(SEM) with an energy dispersive spectrometer(EDS). In this system digital beam control is combined with other microscope control from the EDS system. The EDS system has specially designed software to allow a full quantitative analysis to be performed in fractions of a second. This allows several novel forms of analysis, such as fully quantitative x-ray maps and analysis of non-homogeneous specimens. Due to the high speed of the software, conventional intensity x-ray maps are made into quantitative maps, during the process of acquiring them. Non-homogeneous samples are analysed by randomly positioning the beam on the sample, doing a full analysis, then moving the beam to a new point. When this procedure is repeated many times, the specimen is sampled in a way to produce a true average analysis.Background and peak overlap corrections must be applied to obtain net elemental intensities from the EDS spectrum. It is impractical to store a full spectrum at each analysis location of the map, so the corrections must be made “on the fly”. Normally it requires tens of seconds to obtain net elemental intensities and to convert these to concentrations with a ZAF technique. In this work these times have been reduced to 100 milliseconds by the use of optimized programming of the various correction procedures.

Microanalysis of Particulate Materials

1973 ◽  
Vol 31 ◽  
pp. 248-249
Author(s):  
R. E. Ferrell ◽  
G. G. Paulson
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Particulate Material ◽  
Particulate Materials ◽  
X Ray ◽  
Qualitative And Quantitative ◽  
Chemical Determination ◽  
Analysis System ◽  
Micro Analysis ◽  
Scanning Electron

The scanning electron microscope (SEM) and energy dispersive X-ray (EDX) analysis system is probably the best combination instrument for the micro- analysis of particulate material. The versatility of image forming capabilities with the SEM and the rapid chemical determination which are possible with the EDX are the most notable advantages. The purpose of this paper is to illustrate some of the qualitative and quantitative techniques of the system and their applicability to the analysis of particulate materials. An AMR 1000 scanning electron microscope and an Ortec X-ray microanalysis system were employ d to generate the results discussed below.

Charge Contrast Imaging (CCI): Revealing Enhanced Diagenetic Features of A Coquina Limestone

2016 ◽  
Vol 86 (6) ◽  
pp. 734-748 ◽  
Author(s):  
James O. Buckman ◽  
Patrick W.M. Corbett ◽  
Lauren Mitchell
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Lower Cretaceous ◽  
Secondary Electron ◽  
Contrast Imaging ◽  
Carbonate Cement ◽  
Additional Information ◽  
Backscattered Electron ◽  
Imaging Conditions ◽  
Scanning Electron

Abstract: Charge Contrast Imaging (CCI) is a low-vacuum scanning electron microscope (LV-SEM) technique that can be induced through partial surface charge suppression of uncoated nonconductive samples, imaged with a suitable detector such as a gaseous secondary electron detector (GSED). The technique commonly produces results similar in style to that of SEM-cathodoluminescence (SEM-CL), providing information on zoning, twinning, annealed fractures, and subtle chemical changes. The current work outlines an example from a Brazilian Lower Cretaceous coquina limestone, in which both optical and SEM-CL imaging produces a limited response from much of the sample. Backscattered electron (BSE) imaging typically suggests only a hint of the cement present, whereas CCI clearly displays a rich and varied cement stratigraphy. The earliest cement displays strong CCI, but appears mainly dark under CL imaging conditions (SEM-CL and optical CL). Later-stage manganese-“enriched” carbonate cement displays luminescence with both optical and SEM-CL, as well as a CCI response. Therefore CCI can provide additional information on cement zonation in an area where CL cannot.

Application of frozen hydrated x-ray microanalysis to bulk frozen embryological tissue

1984 ◽  
Vol 42 ◽  
pp. 286-287
Author(s):  
S. B. Klein
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Secondary Electron ◽  
Heat Dissipation ◽  
Yolk Granule ◽  
X Ray ◽  
Chemical Gradients ◽  
Dissection Techniques ◽  
Visual Clues ◽  
Scanning Electron

The examination of bulk frozen fully hydrated tissue by secondary electron and characteristic x-ray emission presents opportunities particularly suited to the study of rapidly differentiating embryological tissue. Because of the extended magnification range of the scanning electron microscope (SEM), embryonic development can be followed from the macroscopic egg to the microscopic adult cells, maintaining familiar visual clues. Advantages such as ease of handling, preservation of morphological relationships, increased heat dissipation and reduced contamination have been discussed previously in the literature and apply to frozen hydrated tissue in general. X-ray microanalysis of fully frozen hydrated embryos may be viewed as an extention of classical dissection techniques which allows selectivity without separation. Phenomena occurring within the unicellular egg such as fertilization, polarization and yolk granule composition can be examined by x-ray microanalysis without prior physical or chemical manipulation. Chemical gradients can be detected in the unperturbed, frozen hydrated matrix.

scholarly journals Can X-ray Spectrum Imaging (XSI) Replace Backscattered Electron (BSE) Imaging for Compositional Contrast in the Scanning Electron Microscope?

2009 ◽  
Vol 15 (S2) ◽  
pp. 666-667 ◽  
Author(s):  
DE Newbury
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
X Ray ◽  
Backscattered Electron ◽  
Spectrum Imaging ◽  
Scanning Electron

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

scholarly journals STUDI SCANNING ELECTRON MICROSCOPY (SEM) UNTUK KARAKTERISASI PROSES OXIDASI PADUAN ZIRKONIUM

2017 ◽  
Vol 9 (1) ◽  
pp. 44
Author(s):  
Agus Sujatno ◽  
Rohmad Salam ◽  
Bandriyana Bandriyana ◽  
Arbi Dimyati
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Secondary Electron ◽  
Energy Dispersive ◽  
X Ray ◽  
Backscattered Electron ◽  
Scanning Electron

STUDI SCANNING ELEKTRON MICROSCOPY (SEM) UNTUK KARAKTERISASI PROSES OXIDASI PADUAN ZIRKONIUM. Studi analisis Scanning Electron Microscopy (SEM) telah dilakukan untuk mengkarakterisasi struktur mikro dan lapisan oksida paduan zirkonium, bahan yang prospektif digunakan sebagai material kelongsong bahan bakar reaktor nuklir generasi ke IV dan struktur reaktor fusi modern. Tujuan penelitian adalah guna mendapatkan informasi yang detil dan akurat yang diperlukan untuk mendukung analisis ketahanan korosi paduan zirkonium yang disebabkan oleh proses oksidasi suhu tinggi dengan menggunakan berbagai metode analisis pada SEM. Sampel uji yang digunakan adalah ingot paduan zirkonium ZrNbMoGe setelah tes oksidasi dalam Mass Suspension Balance (MSB) pada temperatur 500 dan 700 oC masing-masing selama 5 jam. Komposisi unsur dalam sampel paduan adalah 96,9 %Zr, 2,5 %Nb, 0,5 %Mo dan 0,1 %Ge. Pengujian SEM dilakukan dengan JEOL JSM-6510LA yang dilengkapi dengan perangkat Energy Dispersive X-Ray Spectroscopy (EDS) untuk analisis komposisi kimia. Metode Secondary Electron (SE) dan Backscattered Electron (BSE) dengan opsi Low-Vacuum dilakukan untuk mendapatkan kontras yang optimal. Hasil analisa menunjukan bahwa pada kedua sampel telah tumbuh lapisan oksida berupa ZrO2 dengan ketebalan maksimal 2.4 dan 3.5 mm untuk masing-masing temperatur 500 dan 700 oC. Gambar BSE telah menunjukan batas lapisan dengan jelas, tidak memberikan ruang untuk interpretasi ganda.

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