Integrating Points-of-Interest and Areas-Of-Interest for Commercial Space Pattern Analysis

Increased nuclear size, resulting in an increase in the relative proportion of nuclear to cytoplasmic sizes, is an important morphologic criterion for the evaluation of neoplastic and pre-neoplastic cells. This paper describes investigations into the suitability of automated image analysis for quantitating changes in nuclear and cytoplasmic cross-sectional areas in exfoliated cells from tracheas treated with carcinogen.Neoplastic and pre-neoplastic lesions were induced in the tracheas of Syrian hamsters with the carcinogen N-methyl-N-nitrosourea. Cytology samples were collected intra-tracheally with a specially designed catheter (1) and stained by a modified Papanicolaou technique. Three cytology specimens were selected from animals with normal tracheas, 3 from animals with dysplastic changes, and 3 from animals with epidermoid carcinoma. One hundred randomly selected cells on each slide were analyzed with a Bausch and Lomb Pattern Analysis System automated image analyzer.

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Selection and Preparation of Specific Tissue Regions For Tem Using Large Epoxy-Embedded Blocks

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010007206x ◽

1973 ◽

Vol 31 ◽

pp. 324-325 ◽

Cited By ~ 1

Author(s):

P. M. Lowrie ◽

W. S. Tyler

Keyword(s):

Electron Microscopy ◽

Anatomical Structures ◽

Ultrastructural Studies ◽

Transmission Electron ◽

Microscopic Evaluation ◽

Embedded Blocks ◽

Specific Tissue ◽

Definition Of ◽

Areas Of Interest ◽

Selection Of

The importance of examining stained 1 to 2μ plastic sections by light microscopy has long been recognized, both for increased definition of many histologic features and for selection of specimen samples to be used in ultrastructural studies. Selection of specimens with specific orien ation relative to anatomical structures becomes of critical importance in ultrastructural investigations of organs such as the lung. The uantity of blocks necessary to locate special areas of interest by random sampling is large, however, and the method is lacking in precision. Several methods have been described for selection of specific areas for electron microscopy using light microscopic evaluation of paraffin, epoxy-infiltrated, or epoxy-embedded large blocks from which thick sections were cut. Selected areas from these thick sections were subsequently removed and re-embedded or attached to blank precasted blocks and resectioned for transmission electron microscopy (TEM).

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Precipitation in silicon: Microanalysis

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100104431 ◽

1988 ◽

Vol 46 ◽

pp. 474-475

Author(s):

R.W. Carpenter

Keyword(s):

Transition Metals ◽

Spatial Resolution ◽

Thin Foil ◽

Precipitation Reaction ◽

High Current ◽

Reaction Products ◽

Carbon And Nitrogen ◽

Dielectric Layers ◽

Precipitation Processes ◽

Areas Of Interest

Interest in precipitation processes in silicon appears to be centered on transition metals (for intrinsic and extrinsic gettering), and oxygen and carbon in thermally aged materials, and on oxygen, carbon, and nitrogen in ion implanted materials to form buried dielectric layers. A steadily increasing number of applications of microanalysis to these problems are appearing. but still far less than the number of imaging/diffraction investigations. Microanalysis applications appear to be paced by instrumentation development. The precipitation reaction products are small and the presence of carbon is often an important consideration. Small high current probes are important and cryogenic specimen holders are required for consistent suppression of contamination buildup on specimen areas of interest. Focussed probes useful for microanalysis should be in the range of 0.1 to 1nA, and estimates of spatial resolution to be expected for thin foil specimens can be made from the curves shown in Fig. 1.

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An Interactive Minicomputer Program for the Indexing and Simulation of Electron Diffraction Patterns

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100092670 ◽

1976 ◽

Vol 34 ◽

pp. 542-543

Author(s):

R.P. Goehner ◽

W.T. Hatfield ◽

Prakash Rao

Keyword(s):

Electron Diffraction ◽

Real Time ◽

Pattern Analysis ◽

Flow Diagram ◽

Hard Copy ◽

Time Analysis ◽

Real Time Analysis ◽

Transmission Electron ◽

One Step ◽

Diffraction Patterns

Computer programs are now available in various laboratories for the indexing and simulation of transmission electron diffraction patterns. Although these programs address themselves to the solution of various aspects of the indexing and simulation process, the ultimate goal is to perform real time diffraction pattern analysis directly off of the imaging screen of the transmission electron microscope. The program to be described in this paper represents one step prior to real time analysis. It involves the combination of two programs, described in an earlier paper(l), into a single program for use on an interactive basis with a minicomputer. In our case, the minicomputer is an INTERDATA 70 equipped with a Tektronix 4010-1 graphical display terminal and hard copy unit.A simplified flow diagram of the combined program, written in Fortran IV, is shown in Figure 1. It consists of two programs INDEX and TEDP which index and simulate electron diffraction patterns respectively. The user has the option of choosing either the indexing or simulating aspects of the combined program.

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Theory and Errors in Stereo Electron Microscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100101426 ◽

1968 ◽

Vol 26 ◽

pp. 336-337

Author(s):

J. M. Pankratz

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Plane Wave ◽

Focal Length ◽

Foil Thickness ◽

Points Of Interest ◽

Transmission Electron ◽

Vertical Spacing ◽

Illuminating System

It is often desirable in transmission electron microscopy to know the vertical spacing of points of interest within a specimen. However, in order to measure a stereo effect, one must have two pictures of the same area taken from different angles, and one must have also a formula for converting measured differences between corresponding points (parallax) into a height differential.Assume (a) that the impinging beam of electrons can be considered as a plane wave and (b) that the magnification is the same at the top and bottom of the specimen. The first assumption is good when the illuminating system is overfocused. The second assumption (the so-called “perspective error”) is good when the focal length is large (3 x 107Å) in relation to foil thickness (∼103 Å).

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Small Computer System for Micrograph Analysis

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100097879 ◽

1981 ◽

Vol 39 ◽

pp. 270-271

Author(s):

J. F. Hainfeld ◽

J. S. Wall

Keyword(s):

Large Range ◽

Small Computer ◽

Black And White ◽

Contour Maps ◽

Points Of Interest ◽

Computer Aided Analysis ◽

Specialized Hardware ◽

Additional Memory ◽

Selection Of ◽

Publication Quality

Cost reduction and availability of specialized hardware for image processing have made it reasonable to purchase a stand-alone interactive work station for computer aided analysis of micrographs. Some features of such a system are: 1) Ease of selection of points of interest on the micrograph. A cursor can be quickly positioned and coordinates entered with a switch. 2) The image can be nondestructively zoomed to a higher magnification for closer examination and roaming (panning) can be done around the picture. 3) Contrast and brightness of the picture can be varied over a very large range by changing the display look-up tables. 4) Marking items of interest can be done by drawing circles, vectors or alphanumerics on an additional memory plane so that the picture data remains intact. 5) Color pictures can easily be produced. Since the human eye can detect many more colors than gray levels, often a color encoded micrograph reveals many features not readily apparent with a black and white display. Colors can be used to construct contour maps of objects of interest. 6) Publication quality prints can easily be produced by taking pictures with a standard camera of the T.V. monitor screen.

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Bilingual and Monolingual Students' Perceptions of the CSD Major: A Qualitative Study

Perspectives on Issues in Higher Education ◽

10.1044/ihe18.1.16 ◽

2015 ◽

Vol 18 (1) ◽

pp. 16-31 ◽

Cited By ~ 1

Author(s):

Flora Keshishian ◽

Rebecca Wiseheart

Keyword(s):

Qualitative Study ◽

Undergraduate Students ◽

Critical Role ◽

School Setting ◽

The United States ◽

Bilingual Students ◽

Speech Language Pathology ◽

Diverse Environment ◽

Language Pathology ◽

Areas Of Interest

There is a growing demand for bilingual services in speech-language pathology and audiology. To meet this growing demand, and given their critical role in the recruitment of more bilingual professionals, higher education institutions need to know more about bilingual students' impression of Communication Sciences and Disorders (CSD) as a major. The purpose of this qualitative study was to investigate bilingual and monolingual undergraduate students' perceptions of the CSD major. One hundred and twenty-two students from a large university located in a highly multicultural metropolitan area responded to four open-ended questions aimed at discovering students' major areas of interest (and disinterest) as well as their motivations for pursuing a degree in CSD. Consistent with similar reports conducted outside the United States, students from this culturally diverse environment indicated choosing the major for altruistic reasons. A large percentage of participants were motivated by a desire to work with children, but not in a school setting. Although 42% of the participants were bilingual, few indicated an interest in taking an additional course in bilingual studies. Implications of these findings as well as practical suggestions for the recruitment of bilingual students are discussed.

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