ECCI, EBSD and EPSC characterization of rhombohedral twinning in polycrystalline α-alumina deformed in a D-DIA apparatus

2017 ◽  
Vol 50 (6) ◽  
pp. 1691-1704 ◽  
Author(s):  
Shirin Kaboli ◽  
Pamela C. Burnley
Keyword(s):  
Electron Backscatter Diffraction ◽  
X Ray Diffraction ◽  
Contrast Imaging ◽  
Twin Boundaries ◽  
Experimental Conditions ◽  
Polycrystalline Alumina ◽  
Orientation Mapping ◽  
Pole Figures ◽  
Backscatter Diffraction ◽  
Critical Resolved Shear Stress

Rhombohedral twinning in alumina (aluminium oxide, α-Al2O3) is an important mechanism for plastic deformation under high-temperature–pressure conditions. Rhombohedral twins in a polycrystalline alumina sample deformed in a D-DIA apparatus at 965 K and 4.48 GPa have been characterized. Three classes of grains were imaged, containing single, double and mosaic twins, using electron channeling contrast imaging (ECCI) in a field emission scanning electron microscope. These twinned grains were analyzed using electron backscatter diffraction (EBSD). The methodology for twin identification presented here is based on comparison of theoretical pole figures for a rhombohedral twin with experimental pole figures obtained with EBSD crystal orientation mapping. An 85°〈02{\overline 2}1〉 angle–axis pair of misorientation was identified for rhombohedral twin boundaries in alumina, which can be readily used in EBSD post-processing software to identify the twin boundaries in EBSD maps and distinguish the rhombohedral twins from basal twins. Elastic plastic self-consistent (EPSC) modeling was then used to model the synchrotron X-ray diffraction data from the D-DIA experiments utilizing the rhombohedral twinning law. From these EPSC models, a critical resolved shear stress of 0.25 GPa was obtained for rhombohedral twinning under the above experimental conditions, which is internally consistent with the value estimated from the applied load and Schmid factors determined by EBSD analysis.

Local Texture and Electromigration in Fine Line Microelectronic Aluminum Metallization

1994 ◽  
Vol 343 ◽  
Author(s):  
J. L. Hurd ◽  
K. P. Rodbell ◽  
D. B. Knorr ◽  
N. L. Koligman
Keyword(s):  
Electron Backscatter Diffraction ◽  
Fiber Texture ◽  
X Ray Diffraction ◽  
Aluminum Films ◽  
Pole Figures ◽  
Grain Orientations ◽  
Aluminum Metallization ◽  
Backscatter Diffraction ◽  
Relationship Of ◽  
The Relationship

ABSTRACTAluminum films 1 μm thick were deposited on oxidized silicon by sputtering and partially ionized beam evaporation to vary the crystallographic texture. These films were patterned into lines and subsequently annealed at 400 °C for 1 h. A strong correlation between the electromigration behavior and the blanket film texture (X-ray diffraction (XRD) / pole figures) has been reported previously for these films. In this work, an Electron Backscatter Diffraction (EBSD) a.k.a. Backscatter Kikuchi Diffraction (BKD) technique was employed using a scanning electron microscope (SEM) to interrogate individual grain orientations. BKD pole figures were acquired for lines ≥0.3 μm wide and for blanket (pad) regions. Identical, inverse pole figures were found for blanket films measured using both XRD and BKD (pads). Furthermore, the BKD (111) fiber texture shows a line width dependency, with narrow lines having a slightly improved texture over blanket (pad) regions. Local grain orientations were investigated near and within electromigration testing sites with characteristic void and hillock morphologies. The relationship of neighboring grain orientations to electromigration damage is shown.

scholarly journals Stable and Metastable Phase Equilibria Involving the Cu6Sn5 Intermetallic

2021 ◽  
Author(s):  
A. Leineweber ◽  
M. Löffler ◽  
S. Martin
Keyword(s):  
Phase Equilibria ◽  
Electron Backscatter Diffraction ◽  
Metastable Phase ◽  
Stable Phase ◽  
X Ray Diffraction ◽  
X Ray ◽  
Heat Treated ◽  
Ordered Phases ◽  
Backscatter Diffraction ◽  
Kinetics Of

Abstract Cu6Sn5 intermetallic occurs in the form of differently ordered phases η, η′ and η′′. In solder joints, this intermetallic can undergo changes in composition and the state of order without or while interacting with excess Cu and excess Sn in the system, potentially giving rise to detrimental changes in the mechanical properties of the solder. In order to study such processes in fundamental detail and to get more detailed information about the metastable and stable phase equilibria, model alloys consisting of Cu3Sn + Cu6Sn5 as well as Cu6Sn5 + Sn-rich melt were heat treated. Powder x-ray diffraction and scanning electron microscopy supplemented by electron backscatter diffraction were used to investigate the structural and microstructural changes. It was shown that Sn-poor η can increase its Sn content by Cu3Sn precipitation at grain boundaries or by uptake of Sn from the Sn-rich melt. From the kinetics of the former process at 513 K and the grain size of the η phase, we obtained an interdiffusion coefficient in η of (3 ± 1) × 10−16 m2 s−1. Comparison of this value with literature data implies that this value reflects pure volume (inter)diffusion, while Cu6Sn5 growth at low temperature is typically strongly influenced by grain-boundary diffusion. These investigations also confirm that η′′ forming below a composition-dependent transus temperature gradually enriches in Sn content, confirming that Sn-poor η′′ is metastable against decomposition into Cu3Sn and more Sn-rich η or (at lower temperatures) η′. Graphic Abstract

Mitrofanovite, Pt3Te4, a new mineral from the East Chuarvy deposit, Fedorovo–Pana intrusion, Kola Peninsula, Russia

2018 ◽  
Vol 83 (4) ◽  
pp. 523-530 ◽  
Author(s):  
Victor V. Subbotin ◽  
Anna Vymazalová ◽  
František Laufek ◽  
Yevgeny E. Savchenko ◽  
Chris J. Stanley ◽  
...  
Keyword(s):  
Kola Peninsula ◽  
Electron Backscatter Diffraction ◽  
New Mineral ◽  
Synthetic Analogue ◽  
X Ray Diffraction ◽  
X Ray ◽  
Structural Identity ◽  
Polarised Light ◽  
Fe Alloys ◽  
Backscatter Diffraction

AbstractMitrofanovite, Pt3Te4, is a new telluride discovered in low-sulfide disseminated ore in the East Chuarvy deposit, Fedorovo–Pana intrusion, Kola Peninsula, Russia. It forms anhedral grains (up to ~20 μm × 50 μm) commonly in intergrowths with moncheite in aggregates with lukkulaisvaaraite, kotulskite, vysotskite, braggite, keithconnite, rustenburgite and Pt–Fe alloys hosted by a chalcopyrite–pentlandite–pyrrhotite matrix. Associated silicates are: orthopyroxene, augite, olivine, amphiboles and plagioclase. Mitrofanovite is brittle; it has a metallic lustre and a grey streak. Mitrofanovite has a good cleavage, along {001}. In plane-polarised light, mitrofanovite is bright white with medium to strong bireflectance, slight pleochroism, and strong anisotropy on non-basal sections with greyish brown rotation tints; it exhibits no internal reflections. Reflectance values for the synthetic analogue of mitrofanovite in air (Ro, Re’ in %) are: 58.4, 54.6 at 470 nm; 62.7, 58.0 at 546 nm; 63.4, 59.1 at 589 nm; and 63.6, 59.5 at 650 nm. Fifteen electron-microprobe analyses of mitrofanovite gave an average composition: Pt 52.08, Pd 0.19, Te 47.08 and Bi 0.91, total 100.27 wt.%, corresponding to the formula (Pt2.91Pd0.02)Σ2.93(Te4.02Bi0.05)Σ4.07 based on 7 atoms; the average of eleven analyses on synthetic analogue is: Pt 52.57 and Te 47.45, total 100.02 wt.%, corresponding to Pt2.94Te4.06. The density, calculated on the basis of the formula, is 11.18 g/cm3. The mineral is trigonal, space group R$\overline 3 $m, with a = 3.9874(1), c = 35.361(1) Å, V = 486.91(2) Å3 and Z = 3. The crystal structure was solved and refined from the powder X-ray-diffraction data of synthetic Pt3Te4. Mitrofanovite is structurally and chemically related to moncheite (PtTe2). The strongest lines in the powder X-ray diffraction pattern of synthetic mitrofanovite [d in Å (I) (hkl)] are: 11.790(23)(003), 5.891(100)(006), 2.851(26)(107), 2.137(16)(1013), 2.039(18)(0114), 1.574(24)(0120), 1.3098(21)(0027). The structural identity of natural mitrofanovite with synthetic Pt3Te4 was confirmed by electron backscatter diffraction measurements on the natural sample. The mineral name is chosen to honour Felix P. Mitrofanov, a Russian geologist who was among the first to discover platinum-group element mineralisation in the Fedorova–Pana complex.

Unusual Microstructural Development upon Gaseous Nitriding of Fe-4.65at% Al Alloy

2010 ◽  
Vol 89-91 ◽  
pp. 371-376
Author(s):  
S. Meka ◽  
R.E. Schacherl ◽  
E. Bischoff ◽  
Eric J. Mittemeijer
Keyword(s):  
Electron Backscatter Diffraction ◽  
Ferrite Matrix ◽  
Microstructural Development ◽  
Al Alloy ◽  
X Ray Diffraction ◽  
Gaseous Nitriding ◽  
Backscatter Diffraction ◽  
Micro Analysis ◽  
Very High ◽  
Plate Type

Employing NH3/H2 gas mixtures, Fe-4.65at% Al alloy specimens were nitrided to assess how the presence of Al, originally dissolved in the ferrite matrix, influences the development of γ-Fe4N1-x phase in the surface adjacent region. The nitrided specimens were characterized by light microscopy, X-ray diffraction, Electron Backscatter Diffraction and Electron Probe Micro Analysis. Surprisingly, formation of ε-Fe2N1-x was observed, although, for the applied nitriding parameters (nitriding potential and temperature), only the formation of γ-Fe4N1-x would be expected in case of nitriding pure ferrite. An unusual plate-type morphology of γ-Fe4N1-x was observed, contrasting with the usual continuous layer-type growth observed upon nitriding iron, Fe-Cr and Fe-V alloys. These unexpected phenomena may be explained as consequences of the need to realize a very high nitrogen supersaturation in the ferrite matrix in order to initiate the precipitation of AlN.

Growth of 4H-SiC Single Crystals on 6H-SiC Seeds with an Open Backside by PVT Method

2009 ◽  
Vol 615-617 ◽  
pp. 15-18 ◽  
Author(s):  
Emil Tymicki ◽  
Krzysztof Grasza ◽  
Katarzyna Racka ◽  
Marcin Raczkiewicz ◽  
Tadeusz Łukasiewicz ◽  
...  
Keyword(s):  
Single Crystals ◽  
Electron Backscatter Diffraction ◽  
Structural Defects ◽  
X Ray Diffraction ◽  
Force Microscopy ◽  
Optical Scanning ◽  
Atomic Force ◽  
The Stability ◽  
Backscatter Diffraction ◽  
Source Materials

4H-SiC single crystals grown by the seeded physical vapour transport method have been investigated. These crystals were grown on 6H-SiC seeds. The influence of the seed temperature, form and granulation of SiC source materials on the stability and efficiency of the 4H polytype growth have been investigated. A new way of the seed mounting - with an open backside - has been used. Crystals obtained were free of structural defects in the form of hexagonal voids. The crystalline structure of SiC crystals was investigated by EBSD (Electron Backscatter Diffraction) and X-Ray diffraction methods. Moreover, defects in crystals and wafers cut from these crystals were examined by optical, scanning electron and atomic force microscopy combined with KOH etching.

Temperature-Dependent Mechanical Stability of Retained Austenite in Thermomechanically Processed 3Mn Steel

2021 ◽  
Vol 1016 ◽  
pp. 762-767
Author(s):  
Aleksandra Kozłowska ◽  
Adam Grajcar ◽  
Aleksandra Janik ◽  
Krzysztof Radwański
Keyword(s):  
Retained Austenite ◽  
Mechanical Stability ◽  
Electron Backscatter Diffraction ◽  
Tensile Tests ◽  
Trip Effect ◽  
X Ray Diffraction ◽  
Temperature Dependent ◽  
Static Tensile ◽  
The Stability ◽  
Backscatter Diffraction

The temperature-dependent mechanical stability of retained austenite in medium-Mn transformation induced plasticity 0.17C-3.3Mn-1.6Al-1.7Al-0.22Si-0.23Mo thermomechanically processed steel was investigated using scanning electron microscopy (SEM), electron backscatter diffraction (EBSD) and X-ray diffraction (XRD) methods. Specimens were deformed up to rupture in static tensile tests in a temperature range 20–200°C. It was found that deformation temperature affects significantly the intensity of TRIP effect. In case of specimens deformed at temperatures higher than 60°C, a gradual temperature-related decrease in the stability of γ phase was noted. It indicates a progressive decrease of the significance of the TRIP effect and at the same time the growing importance of the thermally activated processes affecting a thermal stability of retained austenite.

Defining the hematite topotaxial crystal growth in magnetite–hematite phase transformation

2020 ◽  
Vol 53 (4) ◽  
pp. 896-903
Author(s):  
Flávia Braga de Oliveira ◽  
Gilberto Álvares da Silva ◽  
Leonardo Martins Graça
Keyword(s):  
Electron Backscatter Diffraction ◽  
Inverse Pole Figure ◽  
Orientation Relationships ◽  
Transformation Matrices ◽  
Hematite Phase ◽  
Pole Figures ◽  
Magnetite Crystal ◽  
Diffraction Patterns ◽  
Backscatter Diffraction ◽  
Specific Orientation

Magnetite and hematite iron oxides are minerals of great economic and scientific importance. The oxidation of magnetite to hematite is characterized as a topotaxial reaction in which the crystallographic orientations of the hematite crystals are determined by the orientation of the magnetite crystals. Thus, the transformation between these minerals is described by specific orientation relationships, called topotaxial relationships. This study presents electron-backscatter diffraction analyses conducted on natural octahedral crystals of magnetite partially transformed into hematite. Inverse pole figure maps and pole figures were used to establish the topotaxial relationships between these phases. Transformation matrices were also applied to Euler angles to assess the diffraction patterns obtained and confirm the identified relationships. A new orientation condition resulting from the magnetite–hematite transformation was characterized, defined by the parallelism between the octahedral planes {111} of magnetite and rhombohedral planes \{10\bar {1}1\} of hematite. Moreover, there was a coincidence between one of the octahedral planes of magnetite and the basal {0001} plane of hematite, and between dodecahedral planes {110} of magnetite and prismatic planes \{11\bar {2}0\} of hematite. All these three orientation conditions are necessary and define a growth model for hematite crystals from a magnetite crystal. A new topotaxial relationship is also proposed: (111)Mag || (0001)Hem and (\bar {1}\bar {1}1)_{\rm Mag} || (10\bar {1}1)_{\rm Hem}.

Deformation Structures in a Duplex Stainless Steel

2018 ◽  
Vol 941 ◽  
pp. 176-181 ◽  
Author(s):  
Karin Yvell ◽  
Göran Engberg
Keyword(s):  
Electron Backscatter Diffraction ◽  
Texture Evolution ◽  
True Strain ◽  
Strain Curve ◽  
Tensile Tests ◽  
Uniaxial Tensile ◽  
Deformation Structure ◽  
Pole Figures ◽  
Two Phases ◽  
Backscatter Diffraction

The evolution of the deformation structure with strain has been studied using electron backscatter diffraction (EBSD). Samples from interrupted uniaxial tensile tests and from a cyclic tension/compression test were investigated. The evolution of low angle boundaries (LABs) was studied using boundary maps and by measuring the LAB density. From calculations of local misorientations, smaller orientation changes in the substructure can be illustrated. The different orientations developed with strain within a grain, due to operation of different slip systems in different parts of the grain, were studied using a misorientation profile showing substantial orientation changes after a true strain of 0.24. The texture evolution with increasing strain was followed by using inverse pole figures (IPFs). The observed substructure development in the ferritic and austenitic phases could be successfully correlated with the stress-strain curve from a tensile test. LABs were first observed in the different phases when the strain hardening rate changed in appearance indicating that cross slip started to operate as a significant dislocation recovery mechanism. The evolution of the deformation structure is concluded to occur in a similar manner in the austenitic and ferritic phases but with different texture evolution for the two phases.

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