The formation of intermetallic layer structure of SAC405/Cu and SAC405/ENImAg solder joint interfaces

2020 ◽  
Vol ahead-of-print (ahead-of-print) ◽  
Author(s):  
Rabiatul Adawiyah Mohamed Anuar ◽  
Saliza Azlina Osman
Keyword(s):  
Shear Strength ◽  
Surface Finish ◽  
Printed Circuit Boards ◽  
Solder Joints ◽  
Layer Structure ◽  
Ageing Time ◽  
Intermetallic Layer ◽  
Electroless Nickel ◽  
Optical Microscope ◽  
Content Type

Purpose The surface finish is an essential step in printed circuit boards design because it provides a solderable surface for electronic components. The purpose of this study to investigate the effects of different surface finishes during the soldering and ageing process. Design/methodology/approach The solder joints of Sn-4.0Ag-0.5Cu/Cu and Sn-4.0Ag-0.5Cu/electroless nickel/immersion silver (ENImAg) were investigated in terms of intermetallic (IMC) thickness, morphology and shear strength. The microstructure and compositions of solder joints are observed, and analyzed by using scanning electron microscopy (SEM-EDX) and optical microscope (OM). Findings Compounds of Cu6Sn5 and (Cu, Ni)6Sn5 IMC were formed in SAC405/Cu and SAC405/ENImAg, respectively, as-reflowed. When the sample was exposed to ageing, new layers of Cu3Sn and (Ni, Cu)3Sn5 were observed at the interface. Analogous growth in the thickness of the IMC layer and increased grains size commensurate with ageing time. The results equally revealed an increase in shear strength of SAC405/ENImAg because of the thin layer of IMC and surface finish used compared to SAC405/Cu. Hence, a ductile fracture was observed at the bulk solder. Overall, the ENImAg surface finish showed excellent performance of solder joints than that of bare Cu. Originality/value The novel surface finish (ENImAg) has been developed and optimized. This alternative lead-free surface finish solved the challenges in electroless nickel/immersion gold and reduced cost without affecting the performance.

Effect of intermetallic compound layer thickness on the shear strength of 1206 chip resistor solder joint

2015 ◽  
Vol 27 (1) ◽  
pp. 52-58 ◽  
Author(s):  
Peter K. Bernasko ◽  
Sabuj Mallik ◽  
G. Takyi
Keyword(s):  
Shear Strength ◽  
Intermetallic Compound ◽  
Solder Joint ◽  
Layer Thickness ◽  
Solder Joints ◽  
Ageing Time ◽  
Circuit Board ◽  
Intermetallic Compound Layer ◽  
Content Type ◽  
Surface Mount

Purpose – The purpose of this paper is to study the effect of intermetallic compound (IMC) layer thickness on the shear strength of surface-mount component 1206 chip resistor solder joints. Design/methodology/approach – To evaluate the shear strength and IMC thickness of the 1206 chip resistor solder joints, the test vehicles were conventionally reflowed for 480 seconds at a peak temperature of 240°C at different isothermal ageing times of 100, 200 and 300 hours. A cross-sectional study was conducted on the reflowed and aged 1206 chip resistor solder joints. The shear strength of the solder joints aged at 100, 200 and 300 hours was measured using a shear tester (Dage-4000PXY bond tester). Findings – It was found that the growth of IMC layer thickness increases as the ageing time increases at a constant temperature of 175°C, which resulted in a reduction of solder joint strength due to its brittle nature. It was also found that the shear strength of the reflowed 1206 chip resistor solder joint was higher than the aged joints. Moreover, it was revealed that the shear strength of the 1206 resistor solder joints aged at 100, 200 and 300 hours was influenced by the ageing reaction times. The results also indicate that an increase in ageing time and temperature does not have much influence on the formation and growth of Kirkendall voids. Research limitations/implications – A proper correlation between shear strength and fracture mode is required. Practical implications – The IMC thickness can be used to predict the shear strength of the component/printed circuit board pad solder joint. Originality/value – The shear strength of the 1206 chip resistor solder joint is a function of ageing time and temperature (°C). Therefore, it is vital to consider the shear strength of the surface-mount chip component in high-temperature electronics.

Comparing the reliability and intermetallic layer of solder joints prepared with infrared and vapour phase soldering

2014 ◽  
Vol 26 (4) ◽  
pp. 214-222 ◽  
Author(s):  
Olivér Krammer
Keyword(s):  
Image Processing ◽  
Shear Strength ◽  
Solder Joints ◽  
Intermetallic Layer ◽  
Stress Test ◽  
Vapour Phase ◽  
Processing Algorithm ◽  
Maximum Temperature ◽  
Image Processing Algorithm ◽  
Content Type

Purpose – The purpose of this paper is to compare the reliability and intermetallic layer (IML) of solder joints prepared with infrared (IR) and vapour phase (VP) soldering. The reliability of 0603-sized resistors’ solder joints formed with IR and VP soldering was investigated. The IML of the joints was analysed based on image processing algorithm automatically. Design/methodology/approach – For the reliability analyses, the ageing method was a highly accelerated stress test (HAST) with +105°C maximum temperature, fully saturated (100 per cent) relative humidity at +0.5 atm overpressure. The joints were characterised based on the thickness of their IML and on their shear strength in as-reflowed stage, and after 400, 800, 1,200, 1,600 and 2,000 hours of HAST. An image processing algorithm was developed to measure the thickness of the IMLs on cross-sectional scanning electron microscopy (SEM) images automatically. Findings – The increase of the IML thickness is lower in the case of HAST ageing compared to other methods. The thickness increment of the Cu6Sn5 layer was higher for IR and lower for VP soldering; the Cu3Sn layer cannot be inspected even after 2,000 hours of HAST ageing. The results of shear strength measurements show better reliability for VP soldered joints. Practical implications – The developed image processing method is applicable to obtain quantitative results about the IMLs in an effective fast way. Originality/value – There is a lack of information in the literature regarding the reliability comparison of solder joints formed with VP and conventional reflow processes. Thus, we performed research about the lifetime of solder joints formed with VP and IR reflow method.

A STUDY OF SURFACE FINISHES FOR IC SUBSTRATES AND WIRE BOND APPLICATIONS

2011 ◽  
Vol 2011 (1) ◽  
pp. 000516-000520 ◽  
Author(s):  
John Ganjei ◽  
Ernest Long ◽  
Lenora Toscano
Keyword(s):  
Surface Finish ◽  
Printed Circuit Boards ◽  
Performance Enhancement ◽  
High Reliability ◽  
Cost Effective ◽  
Electroless Nickel ◽  
Gold Wire ◽  
Electronics Industry ◽  
Surface Finishes ◽  
And Performance

The continuing drive for ever increasing performance enhancement in the electronics industry, in combination with the recent, very significant increase in precious metal costs have left fabricators and OEMs questioning what the best, most cost effective, surface finish is for high reliability applications. Currently, the IC substrate market relies heavily on electrolytic nickel and gold as a solderable and superior wire bondable surface. The use of this finish has allowed manufacturers to avoid the reliability concerns However, this choice also results in significant design restraints being imposed. Many in the industry are now investigating the use of electroless nickel/electroless palladium/immersion gold (ENEPIG) to achieve both high reliability and performance, without the negative design restraints imparted by the use of electrolytic processes. However, over the last year alone, the industry has watched the price of gold increase by 50% and that of palladium double [1]. With this in mind, and considering the historic precedent set in the mid 1990’s when ENEPIG was also evaluated as a surface finish for printed circuit boards, when coincidentally, the cost of palladium also reached an all time high, it should be remembered that the electronics industry quickly moved to evaluate alternate, more cost sustainable, surface finishes. This paper details the use of lower cost, alternate surface finishes for IC substrate applications, with particular experimental focus on gold wire bonding capabilities and BGA solderability of the finishes described. The paper also discusses related process cycle advantages and the significantly reduced operating costs associated with these new finishes.

Fabrication and surface treatment of fine copper lines for HDI printed circuit board with modified full-additive method

Circuit World ◽  
2017 ◽  
Vol 43 (3) ◽  
pp. 131-138 ◽  
Author(s):  
Huirong He ◽  
Jida Chen ◽  
Shengtao Zhang ◽  
Minhui Liao ◽  
Lingxing Li ◽  
...  
Keyword(s):  
Printed Circuit Boards ◽  
High Efficiency ◽  
Oxidation Process ◽  
Optical Microscope ◽  
Circuit Board ◽  
Content Type ◽  
Printed Circuit ◽  
Additive Method ◽  
Fine Copper

Purpose This paper aims to propose a modified full-additive method (MFAM) to fabricate fine copper lines for high density interconnection (HDI) printed circuit boards (PCBs). In addition, the surface of the fine copper lines is treated with a brown oxidation process to obtain good adhesion between the copper and the dielectric resin. Design/methodology/approach Fine copper lines fabricated by MFAM were observed to evaluate the undercut quality, in comparison to undercut quality of copper lines fabricated by the semi-additive method and the subtractive method. The effect of the thickness of the dry film on the quality of the copper plating was investigated to obtain the regular shape of fine lines. The fine copper lines treated with the brown oxidation process were also examined to generate a coarse surface microstructure to improve the adhesion between the copper and the dielectric resin. The cross section and surface of as-fabricated fine copper lines were characterized using an optical microscope, a scanning electron microscope and an atomic force microscope. Findings MFAM has the potential to fabricate high-performance fine copper lines for HDI PCBs. Undercut of as-fabricated fine copper lines could be prevented to meet the design requirement of impedance. In addition, fine copper lines exhibit enough adhesive force to laminate with dielectric resin after the brown oxidation process. Originality/value MFAM, with the advantages of high efficiency and being a facile process, is developed to fabricate high-quality fine copper lines for industrial HDI PCB manufacture.

Preparation and research of electroless nickel on carbon fiber surfaces

2016 ◽  
Vol 63 (4) ◽  
pp. 256-261 ◽  
Author(s):  
Zhongcai Shao ◽  
Jian Guo ◽  
Pin Liu
Keyword(s):  
Activation Energy ◽  
Carbon Fiber ◽  
Carbon Fibers ◽  
Fiber Surface ◽  
Electroless Nickel ◽  
Transverse Cross Section ◽  
Optical Microscope ◽  
Operating Conditions ◽  
Content Type ◽  
Cold Setting

Purpose The paper aims to introduce the process flow of electroless nickel (EN) plating on carbon fiber surfaces, the effect of former processing on the properties of coating and the dynamics of the process. Design/methodology/approach The coated fibers were mounted in cold-setting epoxy resin, and transverse cross-section of the coated fibers were examined under an optical microscope to ascertain the thickness, uniformity and continuity of the coating over the fiber surface. The coating morphology was studied by using a scanning electron microscope (SEM). This study also determined the activation energy and electrical properties of EN coated on carbon fibers. Findings Activation temperatures have a greater impact on the quality of EN. At a temperature of 80°C, the EN layer prepared was uniform and compact and fully coated the carbon fibers. The optimum components of the EN plating process is NiSO4: 28 g/L; NaH2PO2: 30 g/L; NaAc: 20 g/L; Na3C6H5O7:10 g/L; C4O6H2KNa: 2 g/L; (NH4)2SO4: 18 g/L; thiourea and lead acetate: trace; operating conditions: pH = 8.5, temperature: 70°C; time: 0.5 h). The activation energy of the EN plating on carbon fiber is 12 kJ/mol, and the electrical conductivity of nickel-plated carbon fiber in 80 mL of distilled water is 16.5 μs/cm. Originality/value This paper determined the optimum processing conditions and the activation energy of the EN plating on carbon fiber.

Mechanical reliability of solder joints in PCBs assembled in surface mount technology

2016 ◽  
Vol 28 (1) ◽  
pp. 18-26 ◽  
Author(s):  
Janusz Borecki ◽  
Tomasz Serzysko
Keyword(s):  
Mechanical Strength ◽  
Shear Force ◽  
Printed Circuit Boards ◽  
Solder Joints ◽  
Electronic Device ◽  
Operating Conditions ◽  
Content Type ◽  
Operational Conditions ◽  
Soldering Process ◽  
The Individual

Purpose – The purpose of this paper is to determine the dependence of mechanical strength of solder joints on printed circuit boards from the soldering process parameters and operating conditions of the electronic device. Design/methodology/approach – The research was performed using the Taguchi method of planning of experiments. Evaluation of the quality of solder joints was made on the basis of microscopic observations, X-ray analysis and measurements of shear force of solder joints. Findings – The carried out research has shown the influence of the individual parameters of the soldering process on the mechanical strength of solder joints and the mechanism of damage of solder joints under the influence of shear force. Originality/value – The authors present results of their research using advanced techniques of experimental design and analysis of results. In this study, original approach was used to simulate the operational conditions of electronic devices including thermal imaging technology.

Solder joint quality evaluation based on heating factor

Circuit World ◽  
2018 ◽  
Vol 44 (1) ◽  
pp. 37-44 ◽  
Author(s):  
Petr Veselý ◽  
Eva Horynová ◽  
Jiří Starý ◽  
David Bušek ◽  
Karel Dušek ◽  
...  
Keyword(s):  
Shear Strength ◽  
Solder Alloy ◽  
Isothermal Aging ◽  
Solder Joints ◽  
Strength Increase ◽  
Technological Parameters ◽  
Content Type ◽  
Soldering Process ◽  
Before And After ◽  
Joint Quality

Purpose The purpose of this paper is to increase the reliability of manufactured electronics and to reveal reliability significant factors. The experiments were focused especially on the influence of the reflow oven parameters presented by a heating factor. Design/methodology/approach The shear strength of the surface mount device (SMD) resistors and their joint resistance were analyzed. The resistors were assembled with two Sn/Ag/Cu-based and one Bi-based solder pastes, and the analysis was done for several values of the heating factor and before and after isothermal aging. The measurement of thickness of intermetallic compounds was conducted on the micro-sections of the solder joints. Findings The shear strength of solder joints based on the Sn/Ag/Cu-based solder alloy started to decline after the heating factor reached the value of 500 s · K, whereas the shear strength of the solder alloy based on the Bi alloy (in the measured range) always increased with an increase in the heating factor. Also, the Bi-based solder joints showed shear strength increase after isothermal aging in contrast to Sn/Ag/Cu-based solder joints, which showed shear strength decrease. Originality/value The interpretation of the results of such a comprehensive measurement leads to a better understanding of the mutual relation between reliability and other technological parameters such as solder alloy type, surface finish and parameters of the soldering process.

Effect of Blast Wave on Intermetallics Formation, Hardness and Reduced Modulus Properties of Solder Joints

2020 ◽  
Vol 307 ◽  
pp. 31-36
Author(s):  
Nur Shafiqa Safee ◽  
Wan Yusmawati Wan Yusoff ◽  
Ariffin Ismail ◽  
Norliza Ismail ◽  
Maria Abu Bakar ◽  
...  
Keyword(s):  
Surface Finish ◽  
Test Performance ◽  
Printed Circuit Board ◽  
Microstructural Analysis ◽  
Electroless Nickel ◽  
Optical Microscope ◽  
Circuit Board ◽  
Reduced Modulus ◽  
Free Solder ◽  
Tin Silver Copper

Tin-Silver-Copper (SnAgCu) lead-free solder on Electroless Nickel Immersion Gold (ENiG) and Immersion Tin (ImSn) surface finish printed circuit board was subjected to blast test. A variation of intermetallic compounds (IMC) layer, hardness and reduced modulus of soldered sample exposed to blast test were intensively investigated using optical microscope and nanoindentation machine. Formation of IMCs due to reaction between solder and substrate during blast test provided deleterious effect of metallurgical bond strength and reliability on the solder joint. Microstructural analysis was evaluated via Infinite Focused Microscope (IFM). The findings of these studies indicate that best surface finished for blast test performance was not necessarily the best surface finish for optimum reliability. ENiG and ImSn surface finish can be advantage or a disadvantage depending on the application, package and reliability requirements. As a result, most component assemblers are using ENiG and ImSn in order to improve solderability as well as the wettability between solder and the substrate and to meet various package requirements.

Property of Sn-37Pb solder bumps with different diameter during thermal shock

2021 ◽  
Vol ahead-of-print (ahead-of-print) ◽  
Author(s):  
Guisheng Gan ◽  
Donghua Yang ◽  
Yi-ping Wu ◽  
Xin Liu ◽  
Pengfei Sun ◽  
...  
Keyword(s):  
Shear Strength ◽  
Solder Joint ◽  
Thermal Shock ◽  
Solder Joints ◽  
Test Method ◽  
Content Type ◽  
Ball Size ◽  
Solder Bumps ◽  
Free Solder ◽  
The Impact

Purpose The impact strength of solder joint under high strain rate was evaluated by board level test method. However, the impact shear test of single solder bump was more convenient and economical than the board level test method. With the miniaturization of solder joints, solder joints were more prone to failure under thermal shock and more attention has been paid to the impact reliability of solder joint. But Pb-free solder joints may be paid too much attention and Sn-Pb solder joints may be ignored. Design/methodology/approach In this study, thermal shock test between −55°C and 125°C was conducted on Sn-37Pb solder bumps in the BGA package to investigate microstructural evolution and growth mechanism of interfacial intermetallic compounds (IMCs) layer. The effects of thermal shock and ball diameter on the mechanical property and fracture behavior of Sn-37Pb solder bumps were discussed. Findings With the increase of ball size, the same change tendency of shear strength with thermal shock cycles. The shear strength of the solder bumps was the highest after reflow; with the increase of the number of thermal shocks, the shear strength of the solder bumps was decreased. But at the time of 2,000 cycles, the shear strength was increased to the initial strength. Minimum shear strength almost took place at 1,500 cycles in all solder bumps. The differences between maximum shear strength and minimum shear strength were 9.11 MPa and 16.83 MPa, 17.07 MPa and 15.59 MPa in φ0.3 mm and φ0.4 mm, φ0.5 mm and φ0.6 mm, respectively, differences were increased with increasing of ball size. With similar reflow profile, the thickness of IMC decreased as the diameter of the ball increased. The thickness of IMC was 2.42 µm and 2.17 µm, 1.63 µm and 1.77 µm with increasing of the ball size, respectively. Originality/value Pb-free solder was gradually used to replace traditional Sn-Pb solder and has been widely used in industry. Nevertheless, some products inevitably used a mixture of Sn-Pb and Pb-free solder to make the transition from Sn-Pb to Pb-free solder. Therefore, it was very important to understand the reliability of Sn-Pb solder joint and more further research works were also needed.

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