High performance parallel multiplier using Wallace-Booth algorithm

2004 ◽  
Author(s):  
Lakshmanan ◽  
M. Othman ◽  
M.A.M. Ali
Keyword(s):  
High Performance ◽  
Parallel Multiplier

scholarly journals VLSI ARCHITECTURE OF PARALLEL MULTIPLIER– ACCUMULATOR BASED ON RADIX-2 MODIFIED BOOTH ALGORITHM

2012 ◽  
pp. 40-46
Author(s):  
Mr.M.V. Sathish ◽  
Mrs. Sailaja
Keyword(s):  
Signal Processing ◽  
High Speed ◽  
High Performance ◽  
Vlsi Architecture ◽  
Clock Frequency ◽  
Parallel Multiplier ◽  
Hybrid Type ◽  
Standard Design ◽  
Overall Performance ◽  
And Performance

A new architecture of multiplier-andaccumulator (MAC) for high-speed arithmetic. By combining multiplication with accumulation and devising a hybrid type of carry save adder (CSA), the performance was improved. Since the accumulator that has the largest delay in MAC was merged into CSA, the overall performance was elevated. The proposing method CSA tree uses 1’s-complement-based radix-2 modified Booth’s algorithm (MBA) and has the modified array for the sign extension in order to increase the bit density of the operands. The proposed MAC showed the superior properties to the standard design in many ways and performance twice as much as the previous research in the similar clock frequency. We expect that the proposed MAC can be adapted to various fields requiring high performance such as the signal processing areas.

scholarly journals A New VLSI Architecture of Parallel Multiplier–Accumulator Based on Radix-2 Modified Booth Algorithm

2011 ◽  
pp. 196-202
Author(s):  
P.Sasi Bala ◽  
S. Raghavendra
Keyword(s):  
High Speed ◽  
High Performance ◽  
Vlsi Architecture ◽  
Alpha Power ◽  
Clock Frequency ◽  
Parallel Multiplier ◽  
Standard Design ◽  
Overall Performance ◽  
And Performance ◽  
Least Significant Bits

In this paper, we proposed a new architecture of multiplier-and-accumulator (MAC) for high-speed arithmetic.By combining multiplication with accumulation and devising a hybrid type of carry save adder (CSA), the performance was improved. Since the accumulator that has the largest delay in MAC was merged into CSA, the overall performance was elevated. The proposed CSA tree uses 1’s-complement-based radix-2 modified Booth’s algorithm (MBA) and has the modified array for the sign extension in order to increase the bit density of the operands. The CSA propagates the carries to the least significant bits of the partial products and generates the least significant bits in advance to decrease the number of the input bits of the final adder. Also, the proposed MAC accumulates the intermediate results in the type of sum and carry bits instead of the output of the final adder, which made it possible to optimize the pipeline scheme to improve the performance. The proposed architecture was synthesized with 250, 180 and 130 m, and 90 nm standard CMOS library. Based on the theoretical and experimental estimation, we analyzed the results such as the amount of hardware resources, delay, and pipelining scheme. We used Sakurai’s alpha power law for the delay modeling. The proposed MAC showed the superior properties to the standard design in many ways and performance twice as much as the previous research in the similar clock frequency. We expect that the proposed MAC can be adapted to various fields requiring high performance such as the signal processing areas.

scholarly journals A Regularly Structured Parallel Multiplier with Low-power Non-binary-logic Counter Circuits

VLSI Design ◽  
2001 ◽  
Vol 12 (3) ◽  
pp. 377-390 ◽  
Author(s):  
Rong Lin
Keyword(s):  
Low Power ◽  
High Performance ◽  
Partial Product ◽  
Recursive Decomposition ◽  
Binary Logic ◽  
Parallel Multiplier ◽  
Low Leakage ◽  
Binary Arithmetic ◽  
Distinct Features ◽  
Cmos Implementation

A highly regular parallel multiplier architecture along with the novel low-power, high-performance CMOS implementation circuits is presented. The superiority is achieved through utilizing a unique scheme for recursive decomposition of partial product matrices and a recently proposed non-binary arithmetic logic as well as the complementary shift switch logic circuits.The proposed 64×64-b parallel multiplier possesses the following distinct features: (1) generating 64 8×8-b partial product matrices instead of a single large one; (2) comprising only four stages of bit reductions: first, by 8×8-b small parallel multipliers, then, by small parallel counters in each of the remaining three stages. A family of shift switch parallel counters, including non-binary (6, 3)∗ and complementary (k, 2) for 2 ≤ k ≤ 8, are proposed for the efficient bit reductions; (3) using a simple final adder.The non-binary logic operates 4-bit state signals (representing integers ranging from (0 to 3), where no more than half of the signal bits are subject to value-change at any logic stage. This and others including minimum transistor counts, fewer inverters, and low-leakage logic structure, significantly reduce circuit power dissipation.

A High Performance Energy Analyzer for Use in Electron Scanning Microscopy

1969 ◽  
Vol 27 ◽  
pp. 14-15
Author(s):  
A. V. Crewe ◽  
M. Isaacson ◽  
D. Johnson
Keyword(s):  
High Performance ◽  
Vertical Plane ◽  
Median Plane ◽  
Electron Gun ◽  
Uniform Field ◽  
Loss Mechanism ◽  
Electron Scanning Microscopy ◽  
Sector Type ◽  
Double Focusing ◽  
Electron Energy Loss

A double focusing magnetic spectrometer has been constructed for use with a field emission electron gun scanning microscope in order to study the electron energy loss mechanism in thin specimens. It is of the uniform field sector type with curved pole pieces. The shape of the pole pieces is determined by requiring that all particles be focused to a point at the image slit (point 1). The resultant shape gives perfect focusing in the median plane (Fig. 1) and first order focusing in the vertical plane (Fig. 2).

Vacuum System to Minimize the Specimen Contamination of High-Performance EM

1977 ◽  
Vol 35 ◽  
pp. 68-69
Author(s):  
N. Yoshimura ◽  
K. Shirota ◽  
T. Etoh
Keyword(s):  
Electron Microscope ◽  
High Speed ◽  
High Performance ◽  
High Vacuum ◽  
Vacuum System ◽  
Pump System ◽  
Pumping System ◽  
Diffusion Pump ◽  
Almost All ◽  
Cascade Type

One of the most important requirements for a high-performance EM, especially an analytical EM using a fine beam probe, is to prevent specimen contamination by providing a clean high vacuum in the vicinity of the specimen. However, in almost all commercial EMs, the pressure in the vicinity of the specimen under observation is usually more than ten times higher than the pressure measured at the punping line. The EM column inevitably requires the use of greased Viton O-rings for fine movement, and specimens and films need to be exchanged frequently and several attachments may also be exchanged. For these reasons, a high speed pumping system, as well as a clean vacuum system, is now required. A newly developed electron microscope, the JEM-100CX features clean high vacuum in the vicinity of the specimen, realized by the use of a CASCADE type diffusion pump system which has been essentially improved over its predeces- sorD employed on the JEM-100C.

Use of the Magnetostatic Analogue In Electromagnetic Lens Engineering

1970 ◽  
Vol 28 ◽  
pp. 360-361
Author(s):  
John W. Coleman
Keyword(s):  
Boundary Conditions ◽  
High Performance ◽  
Force Fields ◽  
Optical Design ◽  
Direct Conversion ◽  
Design Engineering ◽  
Design Data ◽  
Scalar Potentials ◽  
Geometric Elements ◽  
At Will

In the design engineering of high performance electromagnetic lenses, the direct conversion of electron optical design data into drawings for reliable hardware is oftentimes difficult, especially in terms of how to mount parts to each other, how to tolerance dimensions, and how to specify finishes. An answer to this is in the use of magnetostatic analytics, corresponding to boundary conditions for the optical design. With such models, the magnetostatic force on a test pole along the axis may be examined, and in this way one may obtain priority listings for holding dimensions, relieving stresses, etc..The development of magnetostatic models most easily proceeds from the derivation of scalar potentials of separate geometric elements. These potentials can then be conbined at will because of the superposition characteristic of conservative force fields.

Prospects for convergent beam electron diffraction with a 200kV cold field-emission transmission electron microscope

1991 ◽  
Vol 49 ◽  
pp. 466-467
Author(s):  
J W Steeds ◽  
R Vincent
Keyword(s):  
Field Emission ◽  
High Performance ◽  
Small Diameter ◽  
Convergent Beam Electron Diffraction ◽  
Zone Axis ◽  
Medium Voltage ◽  
Transmission Electron ◽  
Good Crystallinity ◽  
Special Modification ◽  
Convergent Beam

We review the analytical powers which will become more widely available as medium voltage (200-300kV) TEMs with facilities for CBED on a nanometre scale come onto the market. Of course, high performance cold field emission STEMs have now been in operation for about twenty years, but it is only in relatively few laboratories that special modification has permitted the performance of CBED experiments. Most notable amongst these pioneering projects is the work in Arizona by Cowley and Spence and, more recently, that in Cambridge by Rodenburg and McMullan.There are a large number of potential advantages of a high intensity, small diameter, focussed probe. We discuss first the advantages for probes larger than the projected unit cell of the crystal under investigation. In this situation we are able to perform CBED on local regions of good crystallinity. Zone axis patterns often contain information which is very sensitive to thickness changes as small as 5nm. In conventional CBED, with a lOnm source, it is very likely that the information will be degraded by thickness averaging within the illuminated area.

Current State of Biological High-Resolution Scanning Electron Microscopy

1988 ◽  
Vol 46 ◽  
pp. 180-181 ◽  
Author(s):  
Klaus-Ruediger Peters
Keyword(s):  
High Performance ◽  
Low Voltage ◽  
Backscattered Electrons ◽  
Lens Position ◽  
Low Voltage Operation ◽  
Signal Collection ◽  
Probe Size ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes ◽  
Scanning Electron

A new generation of high performance field emission scanning electron microscopes (FSEM) is now commercially available (JEOL 890, Hitachi S 900, ISI OS 130-F) characterized by an "in lens" position of the specimen where probe diameters are reduced and signal collection improved. Additionally, low voltage operation is extended to 1 kV. Compared to the first generation of FSEM (JE0L JSM 30, Hitachi S 800), which utilized a specimen position below the final lens, specimen size had to be reduced but useful magnification could be impressively increased in both low (1-4 kV) and high (5-40 kV) voltage operation, i.e. from 50,000 to 200,000 and 250,000 to 1,000,000 x respectively.At high accelerating voltage and magnification, contrasts on biological specimens are well characterized1 and are produced by the entering probe electrons in the outmost surface layer within -vl nm depth. Backscattered electrons produce only a background signal. Under these conditions (FIG. 1) image quality is similar to conventional TEM (FIG. 2) and only limited at magnifications >1,000,000 x by probe size (0.5 nm) or non-localization effects (%0.5 nm).

A high-performance oil-free backing pump for electron microscopes

1978 ◽  
Vol 36 (1) ◽  
pp. 110-111
Author(s):  
G.K.W. Balkau ◽  
E. Bez ◽  
J.L. Farrant
Keyword(s):  
Molecular Weight ◽  
Electron Microscope ◽  
Hot Spots ◽  
High Performance ◽  
Carbonaceous Material ◽  
Contamination Rate ◽  
Low Molecular Weight ◽  
Principal Source ◽  
Rotary Pumps ◽  
Electron Microscopes

The earliest account of the contamination of electron microscope specimens by the deposition of carbonaceous material during electron irradiation was published in 1947 by Watson who was then working in Canada. It was soon established that this carbonaceous material is formed from organic vapours, and it is now recognized that the principal source is the oil-sealed rotary pumps which provide the backing vacuum. It has been shown that the organic vapours consist of low molecular weight fragments of oil molecules which have been degraded at hot spots produced by friction between the vanes and the surfaces on which they slide. As satisfactory oil-free pumps are unavailable, it is standard electron microscope practice to reduce the partial pressure of organic vapours in the microscope in the vicinity of the specimen by using liquid-nitrogen cooled anti-contamination devices. Traps of this type are sufficient to reduce the contamination rate to about 0.1 Å per min, which is tolerable for many investigations.

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