Thermal Performance and Reliability of Large-Area Bonded Interfaces in Power Electronics Packages

2011 ◽  
Author(s):  
Sreekant Narumanchi ◽  
Douglas DeVoto ◽  
Mark Mihalic ◽  
Tim Popp ◽  
Patrick McCluskey
Keyword(s):  
Thermal Resistance ◽  
Power Electronics ◽  
Thermal Performance ◽  
Phase Change Materials ◽  
Coefficient Of Thermal Expansion ◽  
Heat Removal ◽  
Acoustic Microscopy ◽  
Large Area ◽  
Electronics Packages ◽  
Interface Materials

In automotive power electronics packages (e.g., insulated gate bipolar transistor [IGBT] packages), conventional polymeric thermal interface materials (TIMs) such as greases, gels, and phase-change materials pose a bottleneck to heat removal and are also associated with reliability concerns. High thermal performance bonded interfaces have become an industry trend. However, due to mismatches in the coefficient of thermal expansion between materials/layers and the resultant thermomechanical stresses, there could be voids and crack formations in these bonded interfaces as well as delaminations, which pose a problem from a reliability standpoint. These defects manifest themselves in increased thermal resistance in the package, which acts as a bottleneck to heat removal from the package. Hence, the objective of this research is to investigate and improve the thermal performance and reliability of novel bonded interface materials for power electronics packaging applications. Thermal performance and reliability of bonds/joints is presented for bonds based on a thermoplastic (polyamide) adhesive with embedded micron-sized carbon fibers, sintered silver (Ag), and conventional lead (Pb)-based solder materials. These materials form a bond between 50.8 mm × 50.8 mm footprint direct-bond-copper (DBC) substrate and copper (Cu) base plate samples. Samples undergo thermal cycling (−40°C to 150°C) for up to 2,000 cycles as an upper limit. Damage occurrence is monitored every 100 temperature cycles by several non-destructive techniques, including steady-state thermal resistance measurement, acoustic microscopy, and high-voltage potential testing. This yields a consistent story on the thermal performance and reliability of large-area joints under accelerated stress conditions.

Reliability of Bonded Interfaces for Automotive Power Electronics

2013 ◽  
Author(s):  
Douglas DeVoto ◽  
Paul Paret ◽  
Sreekant Narumanchi ◽  
Mark Mihalic
Keyword(s):  
Thermal Resistance ◽  
Power Electronics ◽  
Carbon Fibers ◽  
Thermal Performance ◽  
Coefficient Of Thermal Expansion ◽  
Base Plate ◽  
Acoustic Microscopy ◽  
Thermal Cycles ◽  
Interface Materials ◽  
Sintered Silver

In automotive power electronics packages, conventional thermal interface materials such as greases, gels, and phase change materials pose bottlenecks to heat removal and are also associated with reliability concerns. There is an industry trend towards high thermal performance bonded interfaces. However, due to coefficient of thermal expansion mismatches between materials/layers and resultant thermomechanical stresses, adhesive and cohesive fractures could occur, posing a problem from a reliability standpoint. These defects manifest themselves in increased thermal resistance in the package. The objective of this research is to investigate and improve the thermal performance and reliability of emerging bonded interface materials for power electronics packaging applications. We present results for thermal performance and reliability of bonded interfaces based on thermoplastic (polyamide) adhesive, with embedded near-vertical aligned carbon fibers, as well as sintered silver material. The results for these two materials are compared to conventional lead-based (Sn63Pb37) bonded interfaces. These materials were bonded between 50.8-mm × 50.8-mm cross-sectional footprint silicon nitride substrates and copper base plate samples. Samples of the substrate/base plate bonded assembly underwent thermal cycling from −40°C to 150°C according to Joint Electron Devices Engineering Council standard Number 22-A104D for up to 2,000 cycles. The dwell time of the cycle was 10 minutes and the ramp rate was 5°C/minute. Damage was monitored every 100 cycles by acoustic microscopy as an indicator of an increase in thermal resistance of the interface layer. The acoustic microscopic images of the bonded interfaces after 2,000 thermal cycles showed that thermoplastics with embedded carbon fibers performed quite well with no defects, whereas interface delamination occurred in the case of sintered silver material. Both these materials showed a superior bond quality as compared to the lead-based solder interface even after 1,000 thermal cycles.

scholarly journals Stress Intensity of Delamination in a Sintered-Silver Interconnection

2014 ◽  
Vol 2014 (HITEC) ◽  
pp. 000190-000197 ◽  
Author(s):  
D. J. DeVoto ◽  
P. P. Paret ◽  
A. A. Wereszczak
Keyword(s):  
Stress Intensity ◽  
Power Electronics ◽  
Thermal Performance ◽  
Phase Change Materials ◽  
Coefficient Of Thermal Expansion ◽  
Heat Removal ◽  
Element Model ◽  
Large Area ◽  
Degradation Rates ◽  
Sintered Silver

In automotive power electronics packages, conventional thermal interface materials such as greases, gels, and phase-change materials pose bottlenecks to heat removal and are also associated with reliability concerns. The industry trend is toward high thermal performance bonded interfaces for large-area attachments. However, because of coefficient of thermal expansion mismatches between materials/layers and resultant thermomechanical stresses, adhesive and cohesive fractures could occur, posing a reliability problem. These defects manifest themselves in increased thermal resistance. This research aims to investigate and improve the thermal performance and reliability of sintered-silver for power electronics packaging applications. This has been experimentally accomplished by the synthesis of large-area bonded interfaces between metalized substrates and copper base plates that have subsequently been subjected to thermal cycles. A finite element model of crack initiation and propagation in these bonded interfaces will allow for the interpretation of degradation rates by a crack-velocity (V)-stress intensity factor (K) analysis. A description of the experiment and the modeling approach are discussed.

Characterizing Bulk Thermal Conductivity and Interface Contact Resistance Effects of Thermal Interface Materials in Electronic Cooling Applications

2003 ◽  
Author(s):  
Vadim Gektin ◽  
Sai Ankireddi ◽  
Jim Jones ◽  
Stan Pecavar ◽  
Paul Hundt
Keyword(s):  
Thermal Conductivity ◽  
Thermal Resistance ◽  
Contact Resistance ◽  
Thermal Performance ◽  
Electronic Cooling ◽  
Thermal Interface Materials ◽  
Thermal Interface ◽  
Interface Contact ◽  
Interface Materials ◽  
Bulk Thermal Conductivity

Thermal Interface Materials (TIMs) are used as thermally conducting media to carry away the heat dissipated by an energy source (e.g. active circuitry on a silicon die). Thermal properties of these interface materials, specified on vendor datasheets, are obtained under conditions that rarely, if at all, represent real life environment. As such, they do not accurately portray the material thermal performance during a field operation. Furthermore, a thermal engineer has no a priori knowledge of how large, in addition to the bulk thermal resistance, the interface contact resistances are, and, hence, how much each influences the cooling strategy. In view of these issues, there exists a need for these materials/interfaces to be characterized experimentally through a series of controlled tests before starting on a thermal design. In this study we present one such characterization for a candidate thermal interface material used in an electronic cooling application. In a controlled test environment, package junction-to-case, Rjc, resistance measurements were obtained for various bondline thicknesses (BLTs) of an interface material over a range of die sizes. These measurements were then curve-fitted to obtain numerical models for the measured thermal resistance for a given die size. Based on the BLT and the associated thermal resistance, the bulk thermal conductivity of the TIM and the interface contact resistance were determined, using the approach described in the paper. The results of this study permit sensitivity analyses of BLT and its effect on thermal performance for future applications, and provide the ability to extrapolate the results obtained for the given die size to a different die size. The suggested methodology presents a readily adaptable approach for the characterization of TIMs and interface/contact resistances in the industry.

Embedded Die Packages and Modules for Power Electronics Applications

2016 ◽  
Vol 2016 (DPC) ◽  
pp. 001918-001947 ◽  
Author(s):  
Lars Boettcher ◽  
S. Karaszkiewicz ◽  
D. Manessis ◽  
A. Ostmann
Keyword(s):  
Power Electronics ◽  
Power Efficiency ◽  
High Reliability ◽  
Heat Removal ◽  
Testing Temperature ◽  
Temperature Cycling ◽  
Switching Frequency ◽  
Large Area ◽  
Power Modules ◽  
Embedded Power

Packages and modules with embedded semiconductor dies are of interest for various application fields and power classes. First packages in the lower power range are available in volume production since almost six years. Recent developments focus on medium and higher power applications raging over 500W into the kW range. Different approaches are available to realize such packages and modules. This paper will give an overview and detailed description of the latest approaches for such embedded die structures. In common of all of these approaches, is the use of laminate based die embedding, which uses standard PCB manufacturing technologies. Main differences are the used base substrate, which can still be a ceramic (DBC), Cu leadframe or high current substrate. Examples for the different methods will be given. As the main part, this paper will describe concepts, which enable significant smaller form-factor of power electronics modules, thereby allowing for lower price, high reliability, capability of direct mounting on e.g. a motor so as to form one unit with the motor housing, wide switching frequency range (for large application field) and high power efficiency. The innovative character of this packaging concept is the idea to embed the power drive components (IGBTs, MOSFETs, diode) as thinned chips into epoxy-resin layer built-up and to realize large-area interconnections on both sides by direct copper plating the dies to form a conductor structure with lowest possible electrical impedance and to achieve an optimum heat removal. In this way a thin core is formed on a large panel format which is called Embedded Power Core. The paper will specifically highlight the first results on manufacturing an embedded power discrete package as an example of an embedded power core containing a thin rectifier diode. For module realization, the power cores are interconnected to insulated metal substrates (IMS) by the use of Ag sintering interconnection technologies for the final manufacturing of Power modules. The paper will elaborate on the sintering process for Power Core/IMS interconnections, the microscopically features of the sintered interfaces, and the lateral filling of the sintering gap with epoxy prepregs. Firstly, 500W power modules were manufactured using this approach. Reliability testing results, solder reflow testing, temperature cycling test and active power cycling, will be discussed in detail.

Integrated Vapor Chamber Heat Spreader for Power Module Applications

2017 ◽  
Author(s):  
Clayton L. Hose ◽  
Dimeji Ibitayo ◽  
Lauren M. Boteler ◽  
Jens Weyant ◽  
Bradley Richard
Keyword(s):  
Heat Flux ◽  
Thermal Resistance ◽  
Power Electronics ◽  
Coefficient Of Thermal Expansion ◽  
High Heat ◽  
Heat Fluxes ◽  
High Heat Flux ◽  
Vapor Chamber ◽  
Power Module ◽  
Heat Spreader

This work presents a demonstration of a coefficient of thermal expansion (CTE) matched, high heat flux vapor chamber directly integrated onto the backside of a direct bond copper (DBC) substrate to improve heat spreading and reduce thermal resistance of power electronics modules. Typical vapor chambers are designed to operate at heat fluxes > 25 W/cm2 with overall thermal resistances < 0.20 °C/W. Due to the rising demands for increased thermal performance in high power electronics modules, this vapor chamber has been designed as a passive, drop-in replacement for a standard heat spreader. In order to operate with device heat fluxes >500 W/cm2 while maintaining low thermal resistance, a planar vapor chamber is positioned onto the backside of the power substrate, which incorporates a specially designed wick directly beneath the active heat dissipating components to balance liquid return and vapor mass flow. In addition to the high heat flux capability, the vapor chamber is designed to be CTE matched to reduce thermally induced stresses. Modeling results showed effective thermal conductivities of up to 950 W/m-K, which is 5 times better than standard copper-molybdenum (CuMo) heat spreaders. Experimental results show a 43°C reduction in device temperature compared to a standard solid CuMo heat spreader at a heat flux of 520 W/cm2.

Thermal Resistance Analysis of Sn-Bi Solder Paste Used as Thermal Interface Material for Power Electronics Applications

2014 ◽  
Vol 136 (1) ◽  
Author(s):  
Rui Zhang ◽  
Jian Cai ◽  
Qian Wang ◽  
Jingwei Li ◽  
Yang Hu ◽  
...  
Keyword(s):  
Thermal Resistance ◽  
Power Electronics ◽  
Heat Dissipation ◽  
Laser Flash ◽  
Acoustic Microscopy ◽  
Thermal Interface Material ◽  
Solder Paste ◽  
Good Reliability ◽  
Thermal Interface ◽  
Power Modules

To promote heat dissipation in power electronics, we investigated the thermal conduction performance of Sn-Bi solder paste between two Cu plates. We measured the thermal resistance of Sn-Bi solder paste used as thermal interface material (TIM) by laser flash technique, and a thermal resistance less than 5 mm2 K/W was achieved for the Sn-Bi TIM. The Sn-Bi solder also showed a good reliability in terms of thermal resistance after thermal cycling, indicating that it can be a promising candidate for the TIM used for power electronics applications. In addition, we estimated the contact thermal resistance at the interface between the Sn-Bi solder and the Cu plate with the assistance of scanning acoustic microscopy. The experimental data showed that Sn-Bi solder paste could be a promising adhesive material used to attach power modules especially with a large size on the heat sink.

scholarly journals Electric-Drive Vehicle Power Electronics Thermal Management: Current Status, Challenges, and Future Directions

2021 ◽  
Author(s):  
Gilberto Moreno ◽  
Sreekant Narumanchi ◽  
Xuhui Feng ◽  
Paul Anschel ◽  
Steve Myers ◽  
...  
Keyword(s):  
Thermal Resistance ◽  
Power Electronics ◽  
Thermal Management ◽  
Power Density ◽  
Thermal Performance ◽  
Electric Drive ◽  
Thermal Analyses ◽  
Heat Fluxes ◽  
Current Status ◽  
Dielectric Fluid

Abstract Effective thermal management of traction-drive power electronics is critical to the advancement of electric-drive vehicles and is necessary for increasing power density and improving reliability. Replacing traditional silicon devices with more efficient, higher temperature, higher voltage, and higher frequency wide-bandgap (WBG) devices will enable increased power density but will result in higher device heat fluxes. Compact packaging of high-temperature WBG devices near low-temperature-rated components creates thermal management challenges that need to be addressed for future power-dense systems. This paper summarizes the thermal performance of on-road automotive power electronics thermal management systems and provides thermal performance and pumping-power metrics for select vehicles. Thermal analyses reveal that the package/conduction resistance dominates the total thermal resistance (for existing automotive systems). We model advanced packaging concepts and compare the results with existing packaging designs to quantify their thermal performance enhancements. Double-side-cooled configurations that do not use thermal interface materials are package concepts predicted to provide a low junction-to-fluid thermal resistance (compared to current packages). Dielectric-fluid-cooled concepts enable a redesign of the package to reduce the package resistance, can be implemented in single- and two-phase cooling approaches, and allow for cooling of passive components (e.g., capacitors) and bus bars.

Thermal Performance Measurements of Thermal Interface Materials Using the Laser Flash Method

2007 ◽  
Author(s):  
Vinh Khuu ◽  
Michael Osterman ◽  
Avram Bar-Cohen ◽  
Michael Pecht
Keyword(s):  
Thermal Resistance ◽  
Thermal Performance ◽  
Heat Sink ◽  
Composite Structures ◽  
Laser Flash ◽  
Flash Method ◽  
Thermal Interface Materials ◽  
Thermal Interface ◽  
Layer Composite ◽  
Interface Materials

Thermal interface materials are used to reduce the interfacial thermal resistance between contacting surfaces inside electronic packages, such as at the die-heat sink or heat spreader-heat sink interfaces. In this study, the change in thermal performance was measured for elastomeric gap pads, gap fillers, and an adhesive throughout reliability tests. Three-layer composite structures were used to simulate loading conditions encountered by thermal interface materials in actual applications. The thermal resistance of the thermal interface material, including contact and bulk resistance, was calculated using the Lee algorithm, an iterative method that uses properties of the single layers and the 3-layer composite structures, measured using the laser flash method. Test samples were subjected to thermal cycling tests, which induced thermomechanical stresses due to the mismatch in the coefficients of thermal expansion of the dissimilar coupon materials. The thermal resistance measurements from the laser flash showed little change or slight improvement in the thermal performance over the course of temperature cycling. Scanning acoustic microscope images revealed delamination in one group of gap pad samples and cracking in the putty samples.

Experimental Characterization of Two-Phase Cooling of Power Electronics in Thermosiphon and Forced Convection Modes

2021 ◽  
Vol 143 (3) ◽  
Author(s):  
Fabio Battaglia ◽  
Farah Singer ◽  
David C. Deisenroth ◽  
Michael M. Ohadi
Keyword(s):  
Heat Flux ◽  
Thermal Resistance ◽  
Power Electronics ◽  
Forced Convection ◽  
Heat Removal ◽  
High Heat ◽  
Heat Fluxes ◽  
High Heat Flux ◽  
Two Phase ◽  
Total Thermal Resistance

Abstract In this paper, we present the results of an experimental study involving low thermal resistance cooling of high heat flux power electronics in a forced convection mode, as well as in a thermosiphon (buoyancy-driven) mode. The force-fed manifold microchannel cooling concept was utilized to substantially improve the cooling performance. In our design, the heat sink was integrated with the simulated heat source, through a single solder layer and substrate, thus reducing the total thermal resistance. The system was characterized and tested experimentally in two different configurations: the passive (buoyancy-driven) loop and the forced convection loop. Parametric studies were conducted to examine the role of different controlling parameters. It was demonstrated that the thermosiphon loop can handle heat fluxes in excess of 200 W/cm2 with a cooling thermal resistance of 0.225 (K cm2)/W for the novel cooling concept and moderate fluctuations in temperature. In the forced convection mode, a more uniform temperature distribution was achieved, while the heat removal performance was also substantially enhanced, with a corresponding heat flux capacity of up to 500 W/cm2 and a thermal resistance of 0.125 (K cm2)/W. A detailed characterization leading to these significant results, a comparison between the performance between the two configurations, and a flow visualization in both configurations are discussed in this paper.

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