ERROR PROPAGATION OF THE UNCERTAINTY IN VARIOUS PARAMETERS TO THE UNCERTAINTY IN THE PRIMARY PIXE YIELD AND SECONDARY FLUORESCENCE YIELD
In this article the uncertainty in the PIXE yield due to the uncertainty in various parameters such as the ionization cross section, the stopping power, the X-ray attenuation coefficient, the matrix composition and the proton beam energy, is discussed. This is done for both the primary PIXE and the secondary fluorescence yield. A numerical approach to the propagation of an uncertainty in a parameter to the uncertainty in the yield is given. For this a new parameter, the propagation factor, which is the partial relative error in the yield due to the error in a parameter divided by the relative error in the parameter, is introduced. The dependence of the propagation factor on the X-ray and proton energies and or the matrix composition is investigated for the above named parameters. The physical background of these dependencies is explained; this also makes it possible to obtain a better physical insight in the formulas for the primary yield and the secondary fluorescence yield.