PHASE EVOLUTION AND MICROSTRUCTURE OF COMPLEX-STRUCTURED (1 - x)PZT-xBDT CERAMICS

2009 ◽  
Vol 23 (31n32) ◽  
pp. 3801-3807
Author(s):  
NAVAVAN THONGMEE ◽  
ANUCHA WATCHARAPASORN ◽  
SUKANDA JIANSIRISOMBOON
Keyword(s):  
Lattice Distortion ◽  
Phase Evolution ◽  
Grain Structure ◽  
Scanning Electron Micrographs ◽  
X Ray Diffraction ◽  
Rich Phase ◽  
X Ray ◽  
Ceramic Surfaces ◽  
Equiaxed Grains ◽  
Sintering Method

This study aims to fabricate and characterize a series of new complex-structured ceramics with formula (1 - x) Pb ( Zr 0.52 Ti 0.48) O 3-x Bi 3.25 Dy 0.75 Ti 3 O 12 or (1 - x)PZT-xBDT (when x = 0, 0.1, 0.3, 0.5, 0.7, 0.9 and 1.0) using a solid state mixed oxide and sintering method. Optimum sintering temperature for this system was found to be 1000°C for 4 h dwell time. Phase analysis using X-ray diffraction indicated existence of BDT- as well as PZT-based solid solutions with corresponding lattice distortion. Scanning electron micrographs of ceramic surfaces showed plate-like structure in BDT-rich phase while typical grain structure was observed for PZT-rich phase. PZT-rich ceramics also possessed high densities due to their more equiaxed grains with high packing capability compared to the ceramics with addition of plate-shaped BDT.

Toughening of PZT Ceramics by In Situ Complex Structures

2008 ◽  
Vol 55-57 ◽  
pp. 365-368
Author(s):  
N. Thongmee ◽  
Anucha Watcharapasorn ◽  
Sukanda Jiansirisomboon
Keyword(s):  
Lattice Distortion ◽  
Complex Structure ◽  
Solid State Reaction Method ◽  
Grain Structure ◽  
Complex Structures ◽  
Pzt Ceramics ◽  
Rich Phase ◽  
Ceramic Surfaces ◽  
Equiaxed Grains

This research fabricated ceramics with formula (1-x)PZT - xBLT, when x = 0, 0.03, 0.05, 0.07, 0.10, 0.15 and 0.20 by a solid-state reaction method and sintered at a temperature of 1150 oC for 4 h with a heating/cooling rate of 5 oCmin-1. Phase analysis using XRD indicated the existence of PZT-based solid solutions with corresponding lattice distortion. SEM micrographs of ceramic surfaces showed a typical grain structure for PZT-rich phase, while a plate-like structure in BLT-rich phase was observed. PZT-rich ceramics possessed relatively high densities due to their more equiaxed grains with high packing capability compared with the ceramics with an addition of BLT. An addition of BLT generally decreased grain size of the ceramics. Mechanical properties such as hardness and fracture toughness could be enhanced significantly with small addition of complex structure BLT.

The structure and magnetic properties of Eu-doped BiFeO3 prepared by a solid-phase sintering method

2019 ◽  
Vol 33 (08) ◽  
pp. 1950094 ◽  
Author(s):  
Zhengming Jiang ◽  
Anguo Peng ◽  
Min Liu ◽  
Guoqing Liu ◽  
Ge Zhang
Keyword(s):  
Magnetic Properties ◽  
Lattice Distortion ◽  
Solid Phase ◽  
Remnant Magnetization ◽  
X Ray Diffraction ◽  
Weiss Temperature ◽  
X Ray ◽  
Sintering Method ◽  
The Eu

In this work, [Formula: see text] and Eu-doped [Formula: see text] samples were prepared by a simple solid-phase sintering method and the structure and magnetic properties were studied. The results of X-ray diffraction show that [Formula: see text] sample maintains the same rhombohedral R3c structure as [Formula: see text] sample but with a slight lattice distortion due to the Eu substitution for Bi. Compared with [Formula: see text], the [Formula: see text] sample exhibits a larger remnant magnetization and a higher Curie–Weiss temperature. These results indicate that appropriate doping with Eu is effective in improving the magnetic properties of [Formula: see text] and the solid-phase sintering method used in this study is a simple and good solid-phase sintering method to prepare [Formula: see text].

TEM studies of solid-state reactions in sputter-deposited Nb/Al multilayer thin films

1996 ◽  
Vol 54 ◽  
pp. 1020-1021
Author(s):  
F. Ma ◽  
S. Vivekanand ◽  
K. Barmak ◽  
C. Michaelsen
Keyword(s):  
Thin Films ◽  
Solid State ◽  
Stoichiometric Composition ◽  
Analytical Electron Microscopy ◽  
Grain Structure ◽  
Solid State Reactions ◽  
Multilayer Thin Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sputter Deposited

Solid state reactions in sputter-deposited Nb/Al multilayer thin films have been studied by transmission and analytical electron microscopy (TEM/AEM), differential scanning calorimetry (DSC) and X-ray diffraction (XRD). The Nb/Al multilayer thin films for TEM studies were sputter-deposited on (1102)sapphire substrates. The periodicity of the films is in the range 10-500 nm. The overall composition of the films are 1/3, 2/1, and 3/1 Nb/Al, corresponding to the stoichiometric composition of the three intermetallic phases in this system.Figure 1 is a TEM micrograph of an as-deposited film with periodicity A = dA1 + dNb = 72 nm, where d's are layer thicknesses. The polycrystalline nature of the Al and Nb layers with their columnar grain structure is evident in the figure. Both Nb and Al layers exhibit crystallographic texture, with the electron diffraction pattern for this film showing stronger diffraction spots in the direction normal to the multilayer. The X-ray diffraction patterns of all films are dominated by the Al(l 11) and Nb(l 10) peaks and show a merging of these two peaks with decreasing periodicity.

scholarly journals First Report on the Geologic Occurrence of Natural Na–A Zeolite and Associated Minerals in Cretaceous Mudstones of the Paja Formation of Vélez (Santander), Colombia

Crystals ◽  
2021 ◽  
Vol 11 (2) ◽  
pp. 218
Author(s):  
Carlos Alberto Ríos-Reyes ◽  
German Alfonso Reyes-Mendoza ◽  
José Antonio Henao-Martínez ◽  
Craig Williams ◽  
Alan Dyer
Keyword(s):  
Natural Zeolite ◽  
Scanning Electron Micrographs ◽  
Total Sulfur ◽  
Zeolite A ◽  
X Ray Diffraction ◽  
X Ray ◽  
Mineral Phases ◽  
The World ◽  
Porosity And Permeability ◽  
First Time

This study reports for the first time the geologic occurrence of natural zeolite A and associated minerals in mudstones from the Cretaceous Paja Formation in the urban area of the municipality of Vélez (Santander), Colombia. These rocks are mainly composed of quartz, muscovite, pyrophyllite, kaolinite and chlorite group minerals, framboidal and cubic pyrite, as well as marcasite, with minor feldspar, sulphates, and phosphates. Total organic carbon (TOC), total sulfur (TS), and millimeter fragments of algae are high, whereas few centimeters and not biodiverse small ammonite fossils, and other allochemical components are subordinated. Na–A zeolite and associated mineral phases as sodalite occur just beside the interparticle micropores (honeycomb from framboidal, cube molds, and amorphous cavities). It is facilitated by petrophysical properties alterations, due to processes of high diagenesis, temperatures up to 80–100 °C, with weathering contributions, which increase the porosity and permeability, as well as the transmissivity (fluid flow), allowing the geochemistry remobilization and/or recrystallization of pre-existing silica, muscovite, kaolinite minerals group, salts, carbonates, oxides and peroxides. X-ray diffraction analyses reveal the mineral composition of the mudstones and scanning electron micrographs show the typical cubic morphology of Na–A zeolite of approximately 0.45 mμ in particle size. Our data show that the sequence of the transformation of phases is: Poorly crystalline aluminosilicate → sodalite → Na–A zeolite. A literature review shows that this is an unusual example of the occurrence of natural zeolites in sedimentary marine rocks recognized around the world.

scholarly journals Mining Wastes of an Albite Deposit as Raw Materials for Vitrified Mullite Ceramics

Minerals ◽  
2021 ◽  
Vol 11 (3) ◽  
pp. 232
Author(s):  
Pedro J. Sánchez-Soto ◽  
Eduardo Garzón ◽  
Luis Pérez-Villarejo ◽  
George N. Angelopoulos ◽  
Dolores Eliche-Quesada
Keyword(s):  
Particle Size ◽  
Raw Materials ◽  
Phase Evolution ◽  
Particle Size Analysis ◽  
Size Analysis ◽  
Mining Wastes ◽  
X Ray Diffraction ◽  
X Ray ◽  
Maximum Value

In this work, an examination of mining wastes of an albite deposit in south Spain was carried out using X-ray Fluorescence (XRF), X-ray diffraction (XRD), particle size analysis, thermo-dilatometry and Differential Thermal Analysis (DTA) and Thermogravimetric (TG) analysis, followed by the determination of the main ceramic properties. The albite content in two selected samples was high (65–40 wt. %), accompanied by quartz (25–40 wt. %) and other minor minerals identified by XRD, mainly kaolinite, in agreement with the high content of silica and alumina determined by XRF. The content of Na2O was in the range 5.44–3.09 wt. %, being associated with albite. The iron content was very low (<0.75 wt. %). The kaolinite content in the waste was estimated from ~8 to 32 wt. %. The particle size analysis indicated values of 11–31 wt. % of particles <63 µm. The ceramic properties of fired samples (1000–1350 °C) showed progressive shrinkage by the thermal effect, with water absorption and open porosity almost at zero at 1200–1250 °C. At 1200 °C, the bulk density reached a maximum value of 2.38 g/cm3. An abrupt change in the phase evolution by XRD was found from 1150 to 1200 °C, with the disappearance of albite by melting in accordance with the predictions of the phase diagram SiO2-Al2O3-Na2O and the system albite-quartz. These fired materials contained as main crystalline phases quartz and mullite. Quartz was present in the raw samples and mullite was formed by decomposition of kaolinite. The observation of mullite forming needle-shape crystals was revealed by Scanning Electron Microscopy (SEM). The formation of fully densified and vitrified mullite materials by firing treatments was demonstrated.

scholarly journals A Study of Thin Film Resistors Prepared Using Ni-Cr-Si-Al-Ta High Entropy Alloy

2015 ◽  
Vol 2015 ◽  
pp. 1-7 ◽  
Author(s):  
Ruei-Cheng Lin ◽  
Tai-Kuang Lee ◽  
Der-Ho Wu ◽  
Ying-Chieh Lee
Keyword(s):  
Annealing Temperature ◽  
Phase Evolution ◽  
Amorphous Structure ◽  
High Entropy Alloy ◽  
X Ray Diffraction ◽  
Temperature Coefficient Of Resistance ◽  
X Ray ◽  
High Entropy ◽  
Transmission Electron ◽  
Thin Film Resistors

Ni-Cr-Si-Al-Ta resistive thin films were prepared on glass and Al2O3substrates by DC magnetron cosputtering from targets of Ni0.35-Cr0.25-Si0.2-Al0.2casting alloy and Ta metal. Electrical properties and microstructures of Ni-Cr-Si-Al-Ta films under different sputtering powers and annealing temperatures were investigated. The phase evolution, microstructure, and composition of Ni-Cr-Si-Al-Ta films were characterized by X-ray diffraction (XRD), transmission electron microscopy (TEM), and Auger electron spectroscopy (AES). When the annealing temperature was set to 300°C, the Ni-Cr-Si-Al-Ta films with an amorphous structure were observed. When the annealing temperature was at 500°C, the Ni-Cr-Si-Al-Ta films crystallized into Al0.9Ni4.22, Cr2Ta, and Ta5Si3phases. The Ni-Cr-Si-Al-Ta films deposited at 100 W and annealed at 300°C which exhibited the higher resistivity 2215 μΩ-cm with −10 ppm/°C of temperature coefficient of resistance (TCR).

In Situ Synchrotron X-Ray Diffraction Study of a Deformed Cu-Fe-P Alloy during Heating

2016 ◽  
Vol 850 ◽  
pp. 191-196 ◽  
Author(s):  
Wei Wang ◽  
Cun Lei Zou ◽  
Ren Geng Li ◽  
Wen Wen ◽  
Hui Jun Kang ◽  
...  
Keyword(s):  
Room Temperature ◽  
Lattice Distortion ◽  
Copper Matrix ◽  
Heating Process ◽  
Recrystallization Process ◽  
Full Width ◽  
X Ray Diffraction ◽  
Dramatic Decrease ◽  
X Ray

In situ synchrotron X-ray diffraction was used to study a deformed Cu-0.88 Fe-0.24 P alloy during heating process. The measurements were performed at room temperature and also at high temperatures up to 893 K in order to determine the recovery, ageing and recrystallization process. With the increase of temperature, the angles of copper matrix peaks moved left and the FWHM (full width at half maximum) decreased slightly. Fe3P precipitates were first detected at 533 K, reached the maximum at 673 K, and re-dissolved into matrix at 853 K. A dramatic decrease in FWHM was observed accompanied by the precipitation of Fe3P phases, indicating the reduction of lattice distortion of copper matrix.

Electric-field-induced lattice distortion in epitaxial BiFeO3 thin films as determined by in situ time-resolved x-ray diffraction

2017 ◽  
Vol 111 (8) ◽  
pp. 082907 ◽  
Author(s):  
Seiji Nakashima ◽  
Osami Sakata ◽  
Hiroshi Funakubo ◽  
Takao Shimizu ◽  
Daichi Ichinose ◽  
...  
Keyword(s):  
Thin Films ◽  
Electric Field ◽  
Lattice Distortion ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
X Ray ◽  
Bifeo3 Thin Films

Thermal stability and miscibility of co-evaporated methyl ammonium lead halide (MAPbX3, X = I, Br, Cl) thin films analysed by in situ X-ray diffraction

2018 ◽  
Vol 6 (24) ◽  
pp. 11496-11506 ◽  
Author(s):  
Paul Pistor ◽  
Thomas Burwig ◽  
Carlo Brzuska ◽  
Björn Weber ◽  
Wolfgang Fränzel
Keyword(s):  
Thin Films ◽  
Thermal Stability ◽  
Thermal Treatment ◽  
Phase Evolution ◽  
X Ray Diffraction ◽  
Crystalline Phases ◽  
X Ray ◽  
Subsequent Thermal Treatment ◽  
Lead Halide

We present the identification of crystalline phases by in situ X-ray diffraction during growth and monitor the phase evolution during subsequent thermal treatment of CH3NH3PbX3 (X = I, Br, Cl) perovskite thin films.

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