Low-frequency Noise Analysis of the Impact of an LaO Cap Layer in HfSiON/Ta2C Gate Stack nMOSFETs
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2011 ◽
Vol 324
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pp. 441-444
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2014 ◽
Vol 778-780
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pp. 428-431
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2013 ◽
Vol 60
(3)
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pp. 1272-1275
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2002 ◽
Vol 46
(12)
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pp. 2281-2285
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