Effect of Double-Layered Al[sub 2]O[sub 3] Gate Insulator on the Bias Stability of ZnO Thin Film Transistors

2010 ◽  
Vol 13 (8) ◽  
pp. H264 ◽  
Author(s):  
Sung-Min Yoon ◽  
Sang-Hee Ko Park ◽  
Shin-Hyuk Yang ◽  
Chun-Won Byun ◽  
Chi-Sun Hwang
2010 ◽  
Vol 13 (4) ◽  
pp. H101 ◽  
Author(s):  
Mamoru Furuta ◽  
Takashi Nakanishi ◽  
Mutsumi Kimura ◽  
Takahiro Hiramatsu ◽  
Tokiyoshi Matsuda ◽  
...  

2010 ◽  
Vol 10 (5) ◽  
pp. 1306-1308 ◽  
Author(s):  
L. Zhang ◽  
J. Li ◽  
X.W. Zhang ◽  
D.B. Yu ◽  
H.P. Lin Khizar-ul-Haq ◽  
...  

RSC Advances ◽  
2017 ◽  
Vol 7 (44) ◽  
pp. 27699-27706 ◽  
Author(s):  
Manoj Kumar ◽  
Hakyung Jeong ◽  
Dongjin Lee

Nonvolatile memory devices based on solution-processed thin film transistors (TFTs) of undoped ZnO and ZnO doped with Hf and NaF incorporating Ag nanowires (AgNWs) as charge trapping media between the ZnO and insulator interface are demonstrated.


Langmuir ◽  
2013 ◽  
Vol 29 (23) ◽  
pp. 7143-7150 ◽  
Author(s):  
Kwang-Suk Jang ◽  
Duyoung Wee ◽  
Yun Ho Kim ◽  
Jinsoo Kim ◽  
Taek Ahn ◽  
...  

2012 ◽  
Vol 69 ◽  
pp. 27-30 ◽  
Author(s):  
Gun Woo Hyung ◽  
Jaehoon Park ◽  
Ja Ryong Koo ◽  
Kyung Min Choi ◽  
Sang Jik Kwon ◽  
...  

2011 ◽  
Vol 125 (1) ◽  
pp. 162-167
Author(s):  
Z. H. Chen ◽  
X. B. Liu ◽  
M. C. Chen ◽  
H. H. Yu ◽  
A. Q. Jiang

2006 ◽  
Vol 89 (20) ◽  
pp. 202908 ◽  
Author(s):  
Mi-Hwa Lim ◽  
KyongTae Kang ◽  
Ho-Gi Kim ◽  
Il-Doo Kim ◽  
YongWoo Choi ◽  
...  

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