X-ray film as a two-dimensional detector for X-ray diffraction analysis

2003 ◽  
Vol 18 (2) ◽  
pp. 91-98 ◽  
Author(s):  
T. N. Blanton
Keyword(s):  
Diffraction Analysis ◽  
Spatial Resolution ◽  
Diffraction Data ◽  
High Spatial Resolution ◽  
Silver Halide ◽  
X Rays ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
Film Composition ◽  
X Ray

Silver halide based photographic imaging elements have been utilized as detectors for X-rays for over 100 years. These elements comprised of gelatin dispersed silver halide coated on one or both sides of a support, have been utilized in diffraction experiments since the discovery of X-ray diffraction by Laue and co-workers. X-ray film has high spatial resolution and can be adapted to flat or curved two-dimensional detection geometries. This paper describes the use of X-ray film as a two-dimensional detector for X-ray diffraction analysis, and discusses X-ray film composition, exposure, and processing, along with considerations for analyzing X-ray diffraction data collected using X-ray film.

Micro Diffraction Imaging of Bulk Polycrystalline Materials

2006 ◽  
Vol 524-525 ◽  
pp. 273-278
Author(s):  
Thomas Wroblewski ◽  
A. Bjeoumikhov ◽  
Bernd Hasse
Keyword(s):  
High Spatial Resolution ◽  
Polycrystalline Materials ◽  
X Rays ◽  
X Ray Diffraction ◽  
Short Sample ◽  
X Ray ◽  
Detector Distance ◽  
Transmission Geometry ◽  
Diffraction Imaging ◽  
Position Sensitive

X-ray diffraction imaging applies an array of parallel capillaries in front of a position sensitive detector. Conventional micro channel plates of a few millimetre thickness have successfully been used as collimator arrays but require short sample to detector distances to achieve high spatial resolution. Furthermore, their limited absorption restricts their applications to low energy X-rays of around 10 keV. Progress in the fabrication of long polycapillaries allows an increase in the sample to detector distance without decreasing resolution and the use of high X-ray energies enables bulk investigations in transmission geometry.

Applications of a Laboratory X-ray Micropsobe to Materials Analysis

1988 ◽  
Vol 32 ◽  
pp. 115-120 ◽  
Author(s):  
D. A. Carpenter ◽  
M. A. Taylor ◽  
C. E. Holcombe
Keyword(s):  
Spatial Resolution ◽  
High Spatial Resolution ◽  
High Sensitivity ◽  
Specimen Preparation ◽  
X Rays ◽  
Glass Capillary ◽  
Materials Analysis ◽  
X Ray ◽  
Small Glass

A laboratory-based X-ray microprobe, composed of a high-brilliance microfocus X-ray tube, coupled with a small glass capillary, has been developed for materials applications. Because of total external reflectance of X rays from the smooth inside bore of the glass capillary, the microprobe has a high sensitivity as well as a high spatial resolution. The use of X rays to excite elemental fluorescence offers the advantages of good peak-to-background, the ability to operate in air, and minimal specimen preparation. In addition, the development of laboratory-based instrumentation has been of Interest recently because of greater accessibility when compared with synchrotron X-ray microprobes.

A synchrotron X-ray diffraction analysis of near-stoichiometric LiNbO3

2001 ◽  
Vol 216 (8) ◽  
Author(s):  
B. Etschmann ◽  
N. Ishizawa ◽  
V. Streltsov ◽  
S. Oishi
Keyword(s):  
Single Crystal ◽  
Diffraction Analysis ◽  
Diffraction Data ◽  
X Ray Diffraction ◽  
Single Crystal Diffraction ◽  
X Ray

AbstractSingle-crystal diffraction data was collected at 120 and 294 K for an approximately spherical LiNbO

Small-angle scattering of X-rays in a conventional Bragg–Brentano diffractometer for quantitative analysis

1995 ◽  
Vol 10 (3) ◽  
pp. 170-172
Author(s):  
Stefano Battaglia
Keyword(s):  
Quantitative Analysis ◽  
Diffraction Analysis ◽  
Small Angle ◽  
Carbonate Rocks ◽  
International Standards ◽  
X Rays ◽  
X Ray Diffraction ◽  
X Ray ◽  
Orientation Effects ◽  
Angle Scattering

A technique is presented utilizing an unmodified commercial X-ray diffractometer, equipped with a Bragg–Brentano geometry, for reducing preferred orientation effects in measured intensities during quantitative diffraction analysis. The diffractometer setup examined makes possible data acquisition with Θ fixed at 1° and 2Θ scanning the Bragg line. The results obtained with this technique are shown in the quantitative X-ray diffraction analysis of three international standards of carbonate rocks (401,402,403).

X-ray diffraction analysis of (Na0.6H0.4)(Ta0.7Nb0.3)O3

1999 ◽  
Vol 14 (3) ◽  
pp. 231-233 ◽  
Author(s):  
Raj P. Singh ◽  
Michael J. Miller ◽  
Jeffrey N. Dann
Keyword(s):  
High Temperature ◽  
Diffraction Analysis ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Unit Cell ◽  
Type Structure ◽  
Powder Diffraction Data ◽  
X Ray Diffraction ◽  
X Ray

(Na0.6H0.4)(Ta0.7Nb0.3)O3 was synthesized by heating a tantalum/niobium scale containing two sodium tantalate/niobate phases :Na14(Ta0.7Nb0.3)12O37·31H2O and NaH2Ta0.7Nb0.3O4. Powder X-ray diffraction data for (Na0.6H0.4)(Ta0.7Nb0.3)O3 indicated it to be a cubic perovskite (ABO3/ReO3 type structure) with unit cell a0=3.894 Å. The compound is analogous to the mineral lueshite (NaNbO3), and to the high temperature forms of NaTaO3 and NaNbO3. Powder diffraction data for (Na0.6H0.4)(Ta0.7Nb0.3)O3 will be useful in the analysis of synthetic tantalum/niobium concentrates.

Masquerade: removing non-sample scattering from integrated reflection intensities

2012 ◽  
Vol 45 (2) ◽  
pp. 292-298 ◽  
Author(s):  
J. A. Coome ◽  
A. E. Goeta ◽  
J. A. K. Howard ◽  
M. R. Probert
Keyword(s):  
Data Collection ◽  
Diffraction Data ◽  
Low Temperatures ◽  
Test Case ◽  
X Rays ◽  
Atmospheric Conditions ◽  
X Ray Diffraction ◽  
New Approach ◽  
X Ray ◽  
Internal Agreement

X-ray diffraction experiments at very low temperatures require samples to be isolated from atmospheric conditions and held under vacuum. These conditions are usually maintainedviathe use of beryllium chambers, which also scatter X-rays, causing unwanted contamination of the sample's diffraction pattern. The removal of this contamination requires novel data-collection and processing procedures to be employed. Herein a new approach is described, which utilizes the differences in origin of scattering vectors from the sample and the beryllium to eliminate non-sample scattering. The programMasqueradehas been written to remove contaminated regions of the diffraction data from the processing programs. Coupled with experiments at different detector distances, it allows for the acquisition of decontaminated data. Studies of several single crystals have shown that this approach increases data quality, highlighted by the improvement in internal agreement factor with the test case of cytidine presented herein.

scholarly journals HiSPoD: a program for high-speed polychromatic X-ray diffraction experiments and data analysis on polycrystalline samples

2016 ◽  
Vol 23 (4) ◽  
pp. 1046-1053 ◽  
Author(s):  
Tao Sun ◽  
Kamel Fezzaa
Keyword(s):  
Diffraction Data ◽  
High Speed ◽  
Short Pulse ◽  
Frame Rate ◽  
Short Exposure ◽  
X Rays ◽  
X Ray Diffraction ◽  
Short Exposure Time ◽  
X Ray ◽  
Structure Information

A high-speed X-ray diffraction technique was recently developed at the 32-ID-B beamline of the Advanced Photon Source for studying highly dynamic, yet non-repeatable and irreversible, materials processes. In experiments, the microstructure evolution in a single material event is probed by recording a series of diffraction patterns with extremely short exposure time and high frame rate. Owing to the limited flux in a short pulse and the polychromatic nature of the incident X-rays, analysis of the diffraction data is challenging. Here,HiSPoD, a stand-alone Matlab-based software for analyzing the polychromatic X-ray diffraction data from polycrystalline samples, is described. WithHiSPoD, researchers are able to perform diffraction peak indexing, extraction of one-dimensional intensity profiles by integrating a two-dimensional diffraction pattern, and, more importantly, quantitative numerical simulations to obtain precise sample structure information.

scholarly journals Synthesis, Crystal Structure, and Luminescence of Cadmium(II) and Silver(I) Coordination Polymers Based on 1,3-Bis(1,2,4-triazol-1-yl)adamantane

Molecules ◽  
2021 ◽  
Vol 26 (17) ◽  
pp. 5400
Author(s):  
Roman D. Marchenko ◽  
Taisiya S. Sukhikh ◽  
Alexey A. Ryadun ◽  
Andrei S. Potapov
Keyword(s):  
Crystal Structure ◽  
Coordination Polymer ◽  
Metal Ions ◽  
Single Crystal ◽  
Diffraction Analysis ◽  
Coordination Polymers ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
One Dimensional ◽  
X Ray

Coordination polymers with a new rigid ligand 1,3-bis(1,2,4-triazol-1-yl)adamantane (L) were prepared by its reaction with cadmium(II) or silver(I) nitrates. Crystal structure of the coordination polymers was determined using single-crystal X-ray diffraction analysis. Silver formed two-dimensional coordination polymer [Ag(L)NO3]n, in which metal ions are linked by 1,3-bis(1,2,4-triazol-1-yl)adamantane ligands, coordinated by nitrogen atoms at positions 2 and 4 of 1,2,4-triazole rings. Layers of the coordination polymer consist of rare 18- and 30-membered {Ag2L2} and {Ag4L4} metallocycles. Cadmium(II) nitrate formed two kinds of one-dimensional coordination polymers depending on the metal-to-ligand ratio used in the synthesis. Coordination polymer [Cd(L)2(NO3)2]n was obtained in case of a 1:2 M:L ratio, while for M:L = 2:1 product {[Cd(L)(NO3)2(CH3OH)]·0.5CH3OH}n was isolated. All coordination polymers demonstrated ligand-centered emission near 450 nm upon excitation at 370 nm.

X-ray detection performance of a 300KV field-emission Analytical Electron Microscope

1993 ◽  
Vol 51 ◽  
pp. 250-251
Author(s):  
C. E. Lyman ◽  
J. I. Goldstein ◽  
D.B. Williams ◽  
D.W. Ackland ◽  
S. von Harrach ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Field Emission ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Detection Performance ◽  
Electron Gun ◽  
X Rays ◽  
X Ray ◽  
Analytical Electron ◽  
Analytical Electron Microscope

A major goal of analytical electron micrsocopy (AEM) is to detect small amounts of an element in a given matrix at high spatial resolution. While there is a tradeoff between low detection limit and high spatial resolution, a field emission electron gun allows detection of small amounts of an element at sub-lOnm spatial resolution. The minimum mass fraction of one element measured in another is proportional to [(P/B)·P]-1/2 where the peak-to-background ratio P/B and the peak intensity P both must be high to detect the smallest amount of an element. Thus, the x-ray detection performance of an analytical electron microscope may be characterized in terms of standardized measurements of peak-to-background, x-ray intensity, the level of spurious x-rays (hole count), and x-ray detector performance in terms of energy resolution and peak shape.This paper provides measurements of these parameters from Lehigh’s VG Microscopes HB-603 field emission AEM. This AEM was designed to provide the best x-ray detection possible.

Sign in / Sign up

Export Citation Format

Share Document