scholarly journals Microwave Assisted Growth of ZnO Nanorods and Nanopolypods Nanostructure Thin Films for Gas and Explosives Sensing

2013 ◽  
Vol 2013 ◽  
pp. 1-12
Author(s):  
A. K. Singh
Keyword(s):  
Thin Films ◽  
Recovery Time ◽  
Zno Nanorods ◽  
Hexagonal Wurtzite Structure ◽  
Liquefied Petroleum Gas ◽  
X Ray Diffraction ◽  
Chemical Route ◽  
X Ray ◽  
Microwave Assisted ◽  
Temperature Ranges

The growth of uniformly distributed and densely packed array of zinc oxide (ZnO) nanorods (NRs) and nanorods (NRs)/nanopolypods (NPPs) was successfully achieved through microwave-assisted chemical route at low temperature. The ZnO NRs and NRs/NPPs were characterized using X-ray diffraction (XRD), scanning electron microscope (SEM), energy dispersive X-ray analysis (EDX), and UV-Vis absorption spectroscopy. The ZnO NRs were of 100–150 nm diameter and 0.5–1 μm length, while the NPPs were of diameter about 150–200 nm and 1.5–2 μm pod length. The prepared films are polycrystalline in nature and highly oriented along (002) plane with a hexagonal wurtzite structure. These films were studied for the sensing properties of liquefied petroleum gas (LPG), oxygen, and hazardous explosives, that is, 2,4,6-trinitrotoluene (TNT) and cyclotrimethylenetrinitramines (RDX), in the temperature ranges of 25–425 °C and 100–200 °C, respectively. The grown nanostructure films showed reliable stable response to several on-off cycles, and reduction in sensor recovery time was found with the increase in temperature. ZnO NRs and NRs/NPPs showed better sensitivity and recovery time for both LPG and oxygen, as compared to the literature-reported results for ZnO thin films.

Microwave-Assisted Preparation of Cu2O Octahedral Microcrystals

2011 ◽  
Vol 284-286 ◽  
pp. 746-749
Author(s):  
Chong Hai Deng ◽  
Han Mei Hu ◽  
Ming Di Yang
Keyword(s):  
Electron Microscopy ◽  
Solid Solution ◽  
Scanning Electron Microscopy ◽  
Growth Mechanism ◽  
X Ray Diffraction ◽  
Chemical Route ◽  
X Ray ◽  
Microwave Assisted ◽  
Morphology And Structure ◽  
Scanning Electron

In this paper, we reported a facile microwave-assisted green chemical route to prepare pure, uniform, and monodispersed Cu2O octahedron wrapped by the {111} faces by using glucose as a reducing agent. X-ray diffraction (XRD), energy dispersive X-ray spectrometry(EDX) and field emission scanning electron microscopy (FESEM) were used to characterize the as-synthesized products. It was found that the morphology and structure of Cu2O crystals were greatly affected by the concentration of NaOH. A solid-solution-solid growth mechanism was possibly proposed on the basis of the comparative experimental results.

Preparation and Characterization of Tourmaline/ZnO Composite Thin Films by a Facile Wet-Chemical Route

2014 ◽  
Vol 809-810 ◽  
pp. 649-653 ◽  
Author(s):  
Yun Guo ◽  
Qing Huang Zhang ◽  
Li Rong Wang ◽  
Wen Zhao Lu ◽  
Lin Jun Wang
Keyword(s):  
Thin Films ◽  
X Ray Diffraction ◽  
Sem Images ◽  
Chemical Route ◽  
Composite Thin Films ◽  
X Ray ◽  
Peak Intensity ◽  
Wet Chemical ◽  
Wet Chemical Route

A series of tourmaline/ZnO composite thin films were prepared by the facile route of low-temperature wet chemical method. X-ray diffraction (XRD) and Raman Spectroscopy analyses showed the hybrid spectroscopic characters of tourmaline and ZnO. With adding the different amount of tourmaline powder, ZnO tended to exhibit the different peak intensity of X-ray diffraction and Raman vibration. ZnO deposited into bending nanosheets and intersected to upstanding nanostucture on the surface of tourmaline particles in SEM images. The optical adsorption properities obtained by the UV-Vis spectra indicated that the addition of tourmaline had enhanced the maximum absorption strength, and had shifted the absorption wavelength and the absorption range of ZnO crystals.

ZnO Nanorods on Polymer Substrate by Solution Method

2013 ◽  
Vol 378 ◽  
pp. 198-201
Author(s):  
Seung Rok Lee ◽  
Si Nae Heo ◽  
M.S. Anwar ◽  
Ahmed Faheem ◽  
Bon Heun Koo
Keyword(s):  
Room Temperature ◽  
Solution Method ◽  
Zno Nanorods ◽  
Hydrothermal Process ◽  
Hexagonal Wurtzite Structure ◽  
Polymer Substrate ◽  
X Ray Diffraction ◽  
High Crystalline Quality ◽  
X Ray ◽  
Related Mode

In this research, ZnO nanorods were fabricated on the polymer substrate using a hydrothermal process. The grown nanorods were characterized by x-ray diffraction (XRD), field emission scanning electron microscopy (FE-SEM), and Raman measurements. ZnO nanorod arrays have been fabricated with diameter of 30-50 nm, and highly c-axis oriented with hexagonal wurtzite structure and perpendicular to the substrate with high crystalline quality. Room temperature Raman measurements exhibit high intensity E2 high mode and low intensity defect related mode.

Codoping Effects and Electrical Properties in Sol-Gel Li-Al Doped Zinc Oxide

2010 ◽  
Vol 663-665 ◽  
pp. 546-550
Author(s):  
Hong En Nian ◽  
Eui Jung Kim ◽  
Yuan Zhou ◽  
Xiu Feng Ren ◽  
Yu Na Pang ◽  
...  
Keyword(s):  
Thin Films ◽  
Zinc Oxide ◽  
Sol Gel ◽  
Hexagonal Wurtzite Structure ◽  
X Ray Diffraction ◽  
High Carrier Concentration ◽  
X Ray ◽  
Polycrystalline Hexagonal Wurtzite Structure ◽  
High Carrier ◽  
P Type

Li and Al codoped ZnO (LAZO) thin films have been prepared by sol-gel method. The electrical and structural properties of the LAZO films have been investigated. X-ray diffraction (XRD) results showed that the prepared LAZO films had a polycrystalline hexagonal wurtzite structure. X-ray photoelectron spectrometer (XPS) measurements indicated that our sol-gel prepared films were of high purity and codoped with Li and Al evidenced by peaks centered at 74.1 and 55.6 eV. The resulting LAZO films were p-type, and had a low resistivity in the range of 10-3~100 Ωcm, and high carrier concentration in the range of 1014~1018 cm-3.

scholarly journals STRUCTURE AND OPTICAL PROPERTIES OF CdSe THIN FILMS AS A FUNCTION OF THE ANNEALING TIME

2017 ◽  
Vol 27 (5) ◽  
pp. 102
Author(s):  
Eman M. Noori
Keyword(s):  
Thin Films ◽  
Cadmium Selenide ◽  
Structural Investigation ◽  
Wave Length ◽  
Hexagonal Wurtzite Structure ◽  
Band Gap Energy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Air Atmosphere ◽  
Deposited Films

Cadmium (Cd) and selenide powder used to prepared cadmium selenide alloy. (CdSe) thin films of thickness 1320 Å were thermally evaporated technique deposited on glass substrate at room temperature. The as-deposited films were annealed in air atmosphere at 100oC, for three different annealing times (60, 120 and 180 minutes). The structural investigation performed by x-ray diffraction (XRD) technique; showed that the films have a polycrystalline and hexagonal (wurtzite) structure. For all deposited films the preferential orientation is (002).The value of lattice constant (a), grain size, strain and dislocation density of the deposited films are calculated and their variations with annealing times are studied. The absorbance spectra of cadmium selenide thin films were recorded in the wave length range of 400 nm to 900 nm. The values of the optical band gap energy, Eg (allowed direct transitions), calculated from the absorption spectra, ranged between (2.54 and 2.41) eV.

Structural and dielectric properties of Ca1-x MgxCu3Ti4O12 thin films

2003 ◽  
Vol 785 ◽  
Author(s):  
L. A. Bermúdez ◽  
R. P. Guzman ◽  
M.S. Tomar ◽  
R.E. Melgarejo
Keyword(s):  
Thin Films ◽  
Single Phase ◽  
High Dielectric Constant ◽  
Film Material ◽  
X Ray Diffraction ◽  
Detailed Characterization ◽  
Chemical Route ◽  
X Ray ◽  
High Dielectric

ABSTRACTCa1-xMgxCu3Ti4O12 material has been synthesized by chemical route for different compositions and thin films have been deposited by spin coating. X-ray diffraction and Raman spectroscopy were used for detailed characterization of this material for both powder and thin films. X-ray diffraction shows single phase film material for different compositions x < 0.80. The initial measurements on dielectric response indicates high dielectric constant > 10, 000 for the composition x = 0.1.

scholarly journals Synthesis Of Zincoxide Nanorods And Its Application To Humidity Sensor

2015 ◽  
Vol 20 (1) ◽  
pp. 36-39 ◽  
Author(s):  
Indra Bahadur Karki ◽  
Jeevan Jyoti Nakarmi ◽  
Suman Chatterjee
Keyword(s):  
Thin Films ◽  
Glass Substrate ◽  
Humidity Sensor ◽  
Sol Gel ◽  
Zno Nanorods ◽  
X Ray Diffraction ◽  
Humidity Sensors ◽  
X Ray ◽  
Sem Image ◽  
Humid Environment

The present study is concerned the sensing behavior of ZnO nanorods thin films application to humidity sensors. ZnO nanorods were fabricated on a glass substrate by sol-gel spin coating technique. The crystal structure of the resulting thin films was investigated by X-ray diffraction (XRD). Minimum crystalline grain size of this film was found about 5nm. Surface morphology of the film was investigated by Scanning Electron Microscope (SEM). SEM image shows rods like films which are evenly distributed on the surface of the sample. The film on a glass substrate explored for humidity sensing of controlled humid environment by measuring electrical resistance. The resistance falls from M Ohms to K ohms as percentage relative humidity increases from 20 to 90 %.Journal of Institute of Science and Technology, 2015, 20(1): 36-39

Synthesis of Imine-Bearing ZnO Nanoparticle Thin Films and Characterization of Their Structural, Morphological and Optical Properties

2015 ◽  
Vol 15 (10) ◽  
pp. 8114-8119 ◽  
Author(s):  
Narinder Kaur ◽  
Sanjeev K. Sharma ◽  
Deuk Young Kim ◽  
Hemant Sharma ◽  
Narinder Singh
Keyword(s):  
Thin Films ◽  
Zno Nanoparticles ◽  
Visible Region ◽  
Hexagonal Wurtzite Structure ◽  
Xrd Analysis ◽  
Zno Nanoparticle ◽  
X Ray Diffraction ◽  
X Ray ◽  
Corning Glass

We are presenting the first report on the fabrication of imine-bearing ZnO nanoparticle thin films grown on Corning glass by spin coating. The sol was prepared by dissolving imine-bearing ZnO nanoparticles in dimethylsulfoxide (DMSO). The thickness of the films was manipulated to be 125–200 nm. The X-ray diffraction (XRD) analysis showed hexagonal wurtzite structure of imine-bearing ZnO nanoparticles thin films with a (002) preferential orientation. The stretching of chemical bonds of the imine linkage and Zn–O in imine-bearing ZnO nanoparticle thin films was confirmed by fourier transform infrared spectroscopy (FTIR). The grain size of the films increased with increasing the thickness of the films due to the number of coatings and subsequently dried at 200°C. The transmittance of imine-bearing ZnO nanoparticle thin films was observed to be ≥94%, which was in close agreement to pure ZnO thin films in the visible region. The bandgap of imine-bearing ZnO nanoparticle thin films (3.04 eV), evaluated from Tauc’s plot, was observed to be lower than that of pure ZnO (3.21 eV), which is attributed to the interaction of the ZnO nanoparticles with the imine receptor.

TEM studies of solid-state reactions in sputter-deposited Nb/Al multilayer thin films

1996 ◽  
Vol 54 ◽  
pp. 1020-1021
Author(s):  
F. Ma ◽  
S. Vivekanand ◽  
K. Barmak ◽  
C. Michaelsen
Keyword(s):  
Thin Films ◽  
Solid State ◽  
Stoichiometric Composition ◽  
Analytical Electron Microscopy ◽  
Grain Structure ◽  
Solid State Reactions ◽  
Multilayer Thin Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sputter Deposited

Solid state reactions in sputter-deposited Nb/Al multilayer thin films have been studied by transmission and analytical electron microscopy (TEM/AEM), differential scanning calorimetry (DSC) and X-ray diffraction (XRD). The Nb/Al multilayer thin films for TEM studies were sputter-deposited on (1102)sapphire substrates. The periodicity of the films is in the range 10-500 nm. The overall composition of the films are 1/3, 2/1, and 3/1 Nb/Al, corresponding to the stoichiometric composition of the three intermetallic phases in this system.Figure 1 is a TEM micrograph of an as-deposited film with periodicity A = dA1 + dNb = 72 nm, where d's are layer thicknesses. The polycrystalline nature of the Al and Nb layers with their columnar grain structure is evident in the figure. Both Nb and Al layers exhibit crystallographic texture, with the electron diffraction pattern for this film showing stronger diffraction spots in the direction normal to the multilayer. The X-ray diffraction patterns of all films are dominated by the Al(l 11) and Nb(l 10) peaks and show a merging of these two peaks with decreasing periodicity.

Palladium Nanowire Thin Films via Template Growth

2003 ◽  
Vol 775 ◽  
Author(s):  
Donghai Wang ◽  
David T. Johnson ◽  
Byron F. McCaughey ◽  
J. Eric Hampsey ◽  
Jibao He ◽  
...  
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Thin Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Conductive Substrate ◽  
Palladium Nanowires ◽  
Efficient Route ◽  
Silica Thin Film

AbstractPalladium nanowires have been electrodeposited into mesoporous silica thin film templates. Palladium continually grows and fills silica mesopores starting from a bottom conductive substrate, providing a ready and efficient route to fabricate a macroscopic palladium nanowire thin films for potentially use in fuel cells, electrodes, sensors, and other applications. X-ray diffraction (XRD) and transmission electron microscopy (TEM) indicate it is possible to create different nanowire morphology such as bundles and swirling mesostructure based on the template pore structure.

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