scholarly journals Application of an Improved Seeds Local Averaging Algorithm in X-ray Spectrum

2021 ◽  
Vol 2021 ◽  
pp. 1-8
Author(s):  
Lin Tang ◽  
Jianwei Zhang ◽  
Kaibo Shi ◽  
Bingqi Liu ◽  
Xingyue Liu ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Detection System ◽  
Element Content ◽  
Full Width ◽  
Half Maximum ◽  
Spent Fuel ◽  
Theoretical Derivation ◽  
X Ray ◽  
Advantages And Disadvantages ◽  
Local Averaging

As an element content analysis technology, X-ray fluorescence spectrometry can be used for quantitative or semiquantitative analysis of the element content in the sample, which is of great significance for mineral census and spent fuel reprocessing. Due to the limitation of the inherent energy resolution of the detector itself, the accuracy of X-ray fluorescence analysis is difficult to be greatly improved. In some applications, even if the semiconductor detector with the best energy resolution is used, the characteristic peaks of different elements cannot be completely separated. Therefore, greatly improving the energy resolution of the detection system is a hot issue in the existing research field. To solve these problems, this paper analyzes the advantages and disadvantages of the traditional MCA (multichannel analyzer) and SLA (seeds local averaging) algorithm and proposes an ISLA (improved seeds local averaging) algorithm based on mathematical statistics. In the section of theoretical derivation, the principle of ISLA algorithm is described, whose theoretical characteristics and spectral results with different parameters are derived and simulated. In the application effect evaluation, the spectrum obtained by each method is analyzed in detail. Simulation and experimental results show that the spectrum obtained by SLA algorithm has a smaller full width at half maximum than that obtained by MCA, but the seed average process in SLA algorithm also reduces its counting rate. The optimized ISLA algorithm can not only effectively reduce the full width at half maximum of the spectral line and sharpen the spectrum peak but also compensate for the loss of the count rate of SLA algorithm.

Temperature-gradient analyzers for non-resonant inelastic X-ray scattering

2021 ◽  
Vol 28 (3) ◽  
Author(s):  
Daisuke Ishikawa ◽  
Alfred Q. R. Baron
Keyword(s):  
Temperature Gradient ◽  
Solid Angle ◽  
Dispersion Compensation ◽  
Full Width ◽  
Half Maximum ◽  
Sensitive Detector ◽  
X Ray ◽  
X Ray Scattering ◽  
Position Sensitive ◽  
And Performance

The detailed fabrication and performance of the temperature-gradient analyzers that were simulated by Ishikawa & Baron [(2010). J. Synchrotron Rad. 17, 12–24] are described and extended to include both quadratic and 2D gradients. The application of a temperature gradient compensates for geometric contributions to the energy resolution while allowing collection of a large solid angle, ∼50 mrad × 50 mrad, of scattered radiation. In particular, when operating relatively close to backscattering, π/2 − θB = 1.58 mrad, the application of a gradient of 1.32 K per 80 mm improves the measured total resolution from 60 to 25 meV at the full width at half-maximum, while when operating further from backscattering, π/2 − θB = 6.56 mrad, improvement from 330 to 32 meV is observed using a combination of a gradient of 6.2 K per 80 mm and dispersion compensation with a position-sensitive detector. In both cases, the operating energy was 15.8 keV and the incident bandwidth was 22 meV. Notably, the use of a temperature gradient allows a relatively large clearance at the sample, permitting installation of more complicated sample environments.

Evaluation of Railway Rails Suffered from Rolling Contact Fatigue Using X-Ray Generalized cosα Method

2018 ◽  
Vol 941 ◽  
pp. 2378-2383
Author(s):  
Toshihiko Sasaki
Keyword(s):  
Rolling Contact Fatigue ◽  
Contact Fatigue ◽  
Rolling Contact ◽  
Full Width ◽  
Half Maximum ◽  
Diffraction Ring ◽  
X Ray ◽  
Depth Direction

In this study, the diffraction rings were measured point by point all over the head of rail sample which was used in service, and shearing stresses with respect to the depth direction were determined using the generalized cosα method. The full width at half maximum was also estimated from the diffraction ring.

scholarly journals Backward runaway electrons in a subnanosecond air discharge at atmospheric pressure

2015 ◽  
Vol 34 (1) ◽  
pp. 23-30 ◽  
Author(s):  
Victor F. Tarasenko ◽  
Igor' D. Kostyrya ◽  
Dmitry V. Beloplotov
Keyword(s):  
High Voltage ◽  
Atmospheric Pressure ◽  
Exposure Dose ◽  
X Rays ◽  
Runaway Electrons ◽  
Full Width ◽  
Half Maximum ◽  
X Ray ◽  
Grid Cathode ◽  
Air Discharge

AbstractIn the paper, we study the conditions for the generation of backward runaway electrons through a grounded grid cathode in atmospheric pressure air at high-voltage pulses with a full width at half maximum of 1 ns and risetime of 0.3 ns applied to the gap from a SLEP-150 pulser. The study confirms that backward runaway electrons and X-rays do arise near grid cathodes in atmospheric pressure air. It is shown that the current of the backward beam and the X-rays from the gas diode depend differently on the interelectrode distance. The average X-ray exposure dose in a pulse is more than 3.5 mR.

Effects of Sputtering Pressure on (ZnO)x(InN)1-x Crystal Film Growth at 450°C

2018 ◽  
Vol 941 ◽  
pp. 2093-2098
Author(s):  
Naho Itagaki ◽  
Kazuto Takeuchi ◽  
Nanoka Miyahara ◽  
Kouki Imoto ◽  
Hyun Woong Seo ◽  
...  
Keyword(s):  
Film Growth ◽  
Rf Magnetron Sputtering ◽  
Full Width ◽  
Half Maximum ◽  
X Ray Diffraction ◽  
X Ray ◽  
Crystal Film ◽  
Crystal Films ◽  
Sputtering Pressure

We studied effects of sputtering pressure on growth of (ZnO)x(InN)1-xcrystal films deposited at 450°C by rf magnetron sputtering. Epitaxial growth of (ZnO)x(InN)1-xfilms was realized on single-crystalline ZnO template. X-ray diffraction measurements show that full width at half maximum of the rocking curves from the (101) plane of the films reaches minimum value of 0.11º at 0.5 Pa. The sputtering gas pressure is a key tuning knob for controlling the crystal quality of ZION films.

La cristallinité de l'illite revisitée: un bilan des connaissances acquises ces trente dernières années

Clay Minerals ◽  
2001 ◽  
Vol 36 (2) ◽  
pp. 143-157 ◽  
Author(s):  
B. Kübler ◽  
D. Goy-Eggenberger
Keyword(s):  
Clay Minerals ◽  
Full Width ◽  
Half Maximum ◽  
X Ray Diffraction ◽  
Illite Crystallinity ◽  
X Ray ◽  
Diffraction Patterns ◽  
Gaseous Hydrocarbons ◽  
Definition Of ◽  
Technological Improvements

AbstractThe main reason for the initial determinations of illite crystallinity (IC) was to support the exploration for liquid and gaseous hydrocarbons. The application in 1960 of the Weaver Sharpness Ratio to core materials of a borehole from eastern France indicated that it was not a reliable tool for identifying well-crystallized illite. This ratio was later replaced by the Full Width at Half-Maximum (FWHM), the value of which decreases regularly and consistently towards greenschist facies. The use of FWHM allowed a precise definition of the anchimetamorphic zone between the upper diagenesis and the epimetamorphism. Afterwards, analysis of weak-tointermediate diagenetic sequences showed that illite crystallinity decreases together with the amount of swelling interlayers in mixed-layer clay minerals. Technological improvements, such as computing and modelling of X-ray diffraction patterns, increased the analytical precision relative to measurements of the plain FWHM. Consequently, illite crystallinity went back to its initial use, namely detection of the transitions between diagenesis, anchi- and epi-metamorphism in smectitefree lithologies, where it can be used as a stratigraphic and mineralogic marker of alteration stages.

Effect of Annealing on Electrical Degradation Characteristics of ZnO Varistors

2008 ◽  
Vol 388 ◽  
pp. 7-10 ◽  
Author(s):  
Masayuki Takada ◽  
Shinzo Yoshikado
Keyword(s):  
Grain Boundaries ◽  
Diffraction Peak ◽  
Full Width ◽  
Half Maximum ◽  
X Ray Diffraction ◽  
X Ray ◽  
Annealing Conditions ◽  
Electrical Degradation ◽  
Zno Varistors ◽  
Triple Points

The effects of the thermally annealing of Bi-Mn-Co-Sb2O3-added ZnO varistors on their electrical degradation were investigated. For the samples with 0.01mol% Sb2O3added and without Sb2O3, no marked difference in the non linearity index of the voltage-current (V-I) characteristics was observed upon electrical degradation for the annealed and nonannealed samples. Upon increasing the amount of Sb2O3 added, the values of  increased after electrical degradation for the annealed samples. Moreover, the value of  after electrical degradation was proportional to the full width at half maximum (FWHM) of the X-ray diffraction peak for Zn2.33Sb0.67O4-type spinel particles under various annealing conditions. The added Sb2O3 did not dissolve in the ZnO grains but became segregated at grain boundaries. Therefore, it is speculated that the increase in the FWHM for the spinel particles is due to the increase in the numbers of fine spinel particles at grain boundaries and triple points.

OS1205 Relationship between Full Width at Half Maximum of White X-ray Diffraction Profile and Plastic Strain

2009 ◽  
Vol 2009 (0) ◽  
pp. 654-655
Author(s):  
Takayoshi SUZUKI ◽  
Jun-ichi SHIBANO ◽  
Koji KIRIYAMA ◽  
Takayuki ARAI ◽  
Setsuo MIURA ◽  
...  
Keyword(s):  
Plastic Strain ◽  
Full Width ◽  
Half Maximum ◽  
X Ray Diffraction ◽  
Diffraction Profile ◽  
X Ray

X-ray diffraction in perfect t × l crystals. Rocking curves

1999 ◽  
Vol 55 (5) ◽  
pp. 840-854 ◽  
Author(s):  
Gunnar Thorkildsen ◽  
Helge B. Larsen
Keyword(s):  
Significant Influence ◽  
Full Width ◽  
Half Maximum ◽  
Fundamental Theory ◽  
Anomalous Absorption ◽  
X Ray Diffraction ◽  
X Ray ◽  
Infinite Crystal ◽  
Extinction Length ◽  
Kinematical Limit

A general formalism, based on the Takagi–Taupin equations, for calculating rocking curves in perfect t\times l crystals is presented. It includes nonsymmetrical scattering, refraction, and ordinary and anomalous absorption. t and l may be varied independently. In the limit of a semi-infinite crystal, the standard results from the fundamental theory are retrieved. For crystal dimensions less than the extinction length, the theory converges to the kinematical limit. Simulations for germanium and silicon show significant influence of crystal finiteness. When dynamical effects are prominent, the curves exhibit various degrees of asymmetry and the full width at half-maximum is generally larger than the corresponding Darwin width. This is attributed to combined Laue and Bragg contributions which are shifted with respect to each other owing to refraction.

High Resolution X-Ray Diffraction Analysis of Piezoelectric LiNbO3 Films.

1995 ◽  
Vol 401 ◽  
Author(s):  
Yoshihiko Shibata ◽  
Naohiro Kuze ◽  
Masahiro Matsui ◽  
Masaki Kanal ◽  
Tomoji Kawai
Keyword(s):  
Laser Ablation ◽  
High Resolution ◽  
The Other ◽  
Full Width ◽  
Half Maximum ◽  
X Ray Diffraction ◽  
High Quality ◽  
X Ray ◽  
Excimer Laser Ablation ◽  
Sapphire Substrates

AbstractThin LINbO3 films are deposited on (001) sapphire and (001) LiTaO3 substrates by using pulsed excimer-laser ablation. These films are evaluated by high-resolution X-ray diffraction (HRXRD) analysis. Strained LiNbO3 films in which the a-axis is longer and the c-axis is shorter than those of LiNbO3 single crystals are deposited on the sapphire substrates. On the other hand, extremely high-quality LiNbO3 films in which the a-axis of the films is the same as that of substrates are grown on the LiTaO substrates. X-ray rocking curves for the (006) reflection showed very narrow full width at half maximum (FWHM) of 208 arcsec for the films on the sapphire substrates, and 9 arcsec for the films on LiTaO3 substrates.

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