Endocytosis in elongating root cells of Lobelia erinus

1990 ◽  
Vol 97 (1) ◽  
pp. 157-165
Author(s):  
A. L. SAMUELS ◽  
T. BISALPUTRA
Keyword(s):  
Cell Wall ◽  
Electron Microscope ◽  
Multivesicular Bodies ◽  
Secretory Vesicles ◽  
Membrane Material ◽  
Root Cells ◽  
Transmission Electron ◽  
Dense Deposits ◽  
The Relationship ◽  
Conventional Transmission Electron Microscope

Endocytosis was demonstrated in elongating cortical and epidermal root cells of Lobelia erinus using the apoplast marker lanthanum nitrate. Lanthanum treatment produced electron-dense deposits throughout the cell wall, as well as in coated and smooth vesicles, partially coated reticula, and multivesicular bodies. This labelling pattern was observed in root cells that had been ultrarapidly frozen on a copper mirror and freeze-substituted (cryofixation) or fixed by conventional transmission electron microscope (TEM) techniques. The amount of endocytosis occurring was measured by counting the number of vesicles μm−2 in root cells at various stages of development. Endocytosis occurred most in actively elongating cells, and least in mature cells, which were no longer elongating. The relationship between endocytosis and active cell wall secretion suggests that endocytosis may be acting to remove excess plasma membrane material added during exocytosis of secretory vesicles.

Resolution of a Transmitted Electron Image Formed by A Scanning Electron Microscope

1970 ◽  
Vol 28 ◽  
pp. 386-387
Author(s):  
S. Takashima ◽  
H. Hashimoto ◽  
S. Kimoto
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Objective Lens ◽  
Specimen Thickness ◽  
Probe Diameter ◽  
Transmission Electron ◽  
Electron Image ◽  
Conventional Transmission Electron Microscope ◽  
Scanning Electron

The resolution of a conventional transmission electron microscope (TEM) deteriorates as the specimen thickness increases, because chromatic aberration of the objective lens is caused by the energy loss of electrons). In the case of a scanning electron microscope (SEM), chromatic aberration does not exist as the restrictive factor for the resolution of the transmitted electron image, for the SEM has no imageforming lens. It is not sure, however, that the equal resolution to the probe diameter can be obtained in the case of a thick specimen. To study the relation between the specimen thickness and the resolution of the trans-mitted electron image obtained by the SEM, the following experiment was carried out.

Magnetic Material Observation Assembly for Tem with a Eucentric Goniometer

1976 ◽  
Vol 34 ◽  
pp. 540-541
Author(s):  
K. Shi rota ◽  
A. Yonezawa ◽  
K. Shibatomi ◽  
T. Yanaka
Keyword(s):  
Magnetic Material ◽  
Electron Microscope ◽  
Magnetic Domain ◽  
Objective Lens ◽  
Magnetic Domains ◽  
Lorentz Microscopy ◽  
Transmission Electron ◽  
Correction Of Astigmatism ◽  
Single Orientation ◽  
Conventional Transmission Electron Microscope

As is well known, it is not so easy to operate a conventional transmission electron microscope for observation of magnetic materials. The reason is that the instrument requires re-alignment of the axis and re-correction of astigmatism after each specimen shift, as the lens field is greatly disturbed by the specimen. With a conventional electron microscope, furthermore, it is impossible to observe magnetic domains, because the specimen is magnetized to single orientation by the lens field. The above mentioned facts are due to the specimen usually being in the lens field. Thus, special techniques or systems are usually required for magnetic material observation (especially magnetic domain observation), for example, the technique to switch off the objective lens current and Lorentz microscopy. But these cannot give high image quality and wide magnification range, and furthermore Lorentz microscopy is very complicated.

Observations of thick and thin sections in a field-emission SEM

1994 ◽  
Vol 52 ◽  
pp. 1018-1019
Author(s):  
W. P. Wergin ◽  
S. Roy ◽  
E. F. Erbe ◽  
C. A. Murphy ◽  
C. D. Pooley
Keyword(s):  
Electron Microscope ◽  
Field Emission ◽  
Room Temperature ◽  
Osmium Tetroxide ◽  
Uranyl Acetate ◽  
Chemical Fixation ◽  
Thin Sections ◽  
Transmission Electron ◽  
Conventional Transmission Electron Microscope ◽  
Scanning Electron

Larvae of the nematode, Steinernema carpocapsae Weiser strain All, were cryofixed and freezesubstituted for 3 days in acetone containing 2% osmium tetroxide according to established procedures. Following chemical fixation, the nematodes were brought to room temperature, embedded in Spurr's medium and sectioned for observation with a Hitachi S-4100 field emission scanning electron microscope that was equipped with an Oxford CT 1500 Cryotrans System. Thin sections, about 80 nm thick, similar to those generally used in conventional transmission electron microscope (TEM) studies were mounted on copper grids and stained with uranyl acetate for 30 min and lead citrate for 5 min. Sections about 2 μm thick were also mounted and stained in a similar fashion. The grids were mounted on an Oxford grid holder, inserted into the microscope and onto a cryostage that was operated at ambient temperature. Thick and thin sections of the larvae were evaluated and photographed in the SEM at different accelerating voltages. Figs. 4 and 5 have undergone contrast conversion so that the images would resemble transmitted electron micrographs obtained with a TEM.

A High Resolution Study of Alumina Supported Iridium Catalysts

1980 ◽  
Vol 38 ◽  
pp. 202-203
Author(s):  
C. Stoeckert ◽  
B. Etherton ◽  
M. Beer ◽  
J. Gryder
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Metal Particles ◽  
Optical Transfer Function ◽  
Particle Sizes ◽  
Iridium Catalysts ◽  
Transmission Electron ◽  
Optical Transfer ◽  
Conventional Transmission Electron Microscope ◽  
Resolution Study

The interpretation of the activity of catalysts requires information about the sizes of the metal particles, since this has implications for the number of surface atoms available for reaction. To determine the particle dimensions we used a high resolution STEM1. Such an instrument with its simple optical transfer function is far more suitable than a conventional transmission electron microscope for the establishment of particle sizes. We report here our study on the size and number distribution of Ir particles supported on Al2O3 and also examine simple geometric models for the shape of Ir particles.

scholarly journals The Endoplasmic Reticulum and the Golgi Structures in Maize Root Cells

1959 ◽  
Vol 5 (3) ◽  
pp. 501-506 ◽  
Author(s):  
W. Gordon Whaley ◽  
Hilton H. Mollenhauer ◽  
Joyce E. Kephart
Keyword(s):  
Endoplasmic Reticulum ◽  
Cell Wall ◽  
Electron Microscope ◽  
Nuclear Envelope ◽  
Epoxy Resin ◽  
Maize Root ◽  
Root Tips ◽  
Animal Cells ◽  
Root Cells ◽  
Vesicular Structure

Maize root tips were fixed in potassium permanganate, embedded in epoxy resin, sectioned to show silver interference color, and studied with the electron microscope. All the cells were seen to contain an endoplasmic reticulum and apparently independent Golgi structures. The endoplasmic reticulum is demonstrated as a membrane-bounded, vesicular structure comparable in many aspects to that of several types of animal cells. With the treatment used here the membranes appear smooth surfaced. The endoplasmic reticulum is continuous with the nuclear envelope and, by contact at least, with structures passing through the cell wall. The nuclear envelope is characterized by discontinuities, as previously reported for animal cells. The reticula of adjacent cells seem to be in contact at or through the plasmodesmata. Because of these contacts the endoplasmic reticulum of a given cell appears to be part of an intercellular system. The Golgi structures appear as stacks of platelet-vesicles which apparently may, under certain conditions, produce small vesicles around their edges. Their form changes markedly with development of the cell.

Effect of Aging Treatment on Damping Capacity in Mncunife Alloy

2012 ◽  
Vol 246-247 ◽  
pp. 1158-1162
Author(s):  
Xu Fu ◽  
Ning Li ◽  
Yu Hua Wen ◽  
Jing Teng ◽  
Ying Zhang
Keyword(s):  
Electron Microscope ◽  
Aging Treatment ◽  
Damping Capacity ◽  
Torsion Pendulum ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Higher Temperature ◽  
Lower Temperature ◽  
The Relationship

M2052 alloys with various aging treatments are obtained in order to investigate the relationship between aging treatment and damping capacity by the torsion pendulum, X-Ray Diffraction (XRD) and Transmission Electron Microscope (TEM) methods. The results show that M2052 can obtain high damping capacity (δ>0.2) when aged at a range from 400°C to 450°C, and the damping capacity after aged at a lower temperature is higher than that aged at a higher temperature for the maximum values. TEM and XRD results show that fcc-fct transformation occurs after aging treatment. The volumes of fct structures are one of reason to affect the damping capacity in M2052 alloy. The better understanding aging treatment could promote the applications of M2052 alloy.

scholarly journals Effect of Nanoparticles Surface Charge on the Arabidopsis thaliana (L.) Roots Development and Their Movement into the Root Cells and Protoplasts

2019 ◽  
Vol 20 (7) ◽  
pp. 1650 ◽  
Author(s):  
Anna Milewska-Hendel ◽  
Maciej Zubko ◽  
Danuta Stróż ◽  
Ewa Kurczyńska
Keyword(s):  
Arabidopsis Thaliana ◽  
Cell Wall ◽  
Surface Charge ◽  
Physical Barrier ◽  
Root Cells ◽  
Plant Body ◽  
Transmission Electron ◽  
A Cell ◽  
Living Organisms ◽  
Positively Charged

Increasing usage of gold nanoparticles (AuNPs) in different industrial areas inevitably leads to their release into the environment. Thus, living organisms, including plants, may be exposed to a direct contact with nanoparticles (NPs). Despite the growing amount of research on this topic, our knowledge about NPs uptake by plants and their influence on different developmental processes is still insufficient. The first physical barrier for NPs penetration to the plant body is a cell wall which protects cytoplasm from external factors and environmental stresses. The absence of a cell wall may facilitate the internalization of various particles including NPs. Our studies have shown that AuNPs, independently of their surface charge, did not cross the cell wall of Arabidopsis thaliana (L.) roots. However, the research carried out with using light and transmission electron microscope revealed that AuNPs with different surface charge caused diverse changes in the root’s histology and ultrastructure. Therefore, we verified whether this is only the wall which protects cells against particles penetration and for this purpose we used protoplasts culture. It has been shown that plasma membrane (PM) is not a barrier for positively charged (+) AuNPs and negatively charged (−) AuNPs, which passage to the cell.

A Simple Method of the Electric/Magnetic Field Observation by a Conventional Transmission Electron Microscope

2005 ◽  
Vol 475-479 ◽  
pp. 4029-4034 ◽  
Author(s):  
Katsuhiro Sasaki ◽  
Hiroyasu Saka
Keyword(s):  
Magnetic Field ◽  
Electron Microscope ◽  
Field Distribution ◽  
Transmission Electron Microscope ◽  
Electrostatic Field ◽  
Field Observation ◽  
Simple Method ◽  
Transmission Electron ◽  
Novel Method ◽  
Conventional Transmission Electron Microscope

A novel method to observe the electrostatic field distribution with a conventional transmission electron microscope has been developed. The method allows measurements of a potential difference less than 1V/µm. This method can be performed in any kind of conventional transmission electron microscope and applied to the observation of the electric/magnetic field at the level of a specimen.

Microstructural Evolution and Stress Relaxation in Sputtered Tungsten Films

1993 ◽  
Vol 318 ◽  
Author(s):  
F. M. Ross ◽  
R. R. Kola ◽  
R. Hull ◽  
J. C. Bean
Keyword(s):  
Electron Microscope ◽  
Stress Relaxation ◽  
Microstructural Evolution ◽  
Transmission Electron Microscope ◽  
Specimen Geometry ◽  
Β Phase ◽  
Transmission Electron ◽  
The Relationship

ABSTRACTWe have investigated the relationship between microstructure and stress in very thin sputtered W films. We discuss features of the microstructure, in particular the presence of voids in compressively stressed films, in terms of the evolution of the structure from a metastable β-phase. By developing a novel specimen geometry for the transmission electron microscope (TEM), we present dynamic observations of the β-W→α-W transformation.

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