Aperture transmission measurements for characterization of focusing of subterahertz radiation

2016 ◽  
Vol 33 (7) ◽  
pp. 1456
Author(s):  
Osamu Morikawa ◽  
Kohji Yamamoto ◽  
Kazuyoshi Kurihara ◽  
Masahiko Tani ◽  
Fumiyoshi Kuwashima ◽  
...  
Keyword(s):  
Transmission Measurements ◽  
Subterahertz Radiation

scholarly journals Terahertz characterization of two-dimensional low-conductive layers enabled by metal gratings

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Prashanth Gopalan ◽  
Yunshan Wang ◽  
Berardi Sensale-Rodriguez
Keyword(s):  
Optical Transmission ◽  
Terahertz Spectroscopy ◽  
Design Guidelines ◽  
Two Dimensional ◽  
Highly Sensitive ◽  
Transmission Measurements ◽  
Metal Gratings ◽  
Low Sensitivity ◽  
Non Destructive

AbstractWhile terahertz spectroscopy can provide valuable information regarding the charge transport properties in semiconductors, its application for the characterization of low-conductive two-dimensional layers, i.e., σs <  < 1 mS, remains elusive. This is primarily due to the low sensitivity of direct transmission measurements to such small sheet conductivity levels. In this work, we discuss harnessing the extraordinary optical transmission through gratings consisting of metallic stripes to characterize such low-conductive two-dimensional layers. We analyze the geometric tradeoffs in these structures and provide physical insights, ultimately leading to general design guidelines for experiments enabling non-contact, non-destructive, highly sensitive characterization of such layers.

Characterization of thin film CCD filters on board the German astronomy satellite ABRIXAS by soft x-ray transmission measurements

1999 ◽  
Author(s):  
K.-H. Stephan ◽  
H. Bräuninger ◽  
F. Haberl ◽  
P. Predehl ◽  
H. J. Maier ◽  
...  
Keyword(s):  
Thin Film ◽  
X Ray ◽  
Transmission Measurements

Optical and Electrical Characterizations of Nanoscale Robust 3C-SiC Membrane for UV Sensing Applications

2018 ◽  
Vol 775 ◽  
pp. 278-282
Author(s):  
A.R.M. Foisal ◽  
T. Dinh ◽  
A. Iacopi ◽  
L. Hold ◽  
E.W. Streed ◽  
...  
Keyword(s):  
Uv Light ◽  
Optical Characterization ◽  
Considerable Change ◽  
Electrical Contacts ◽  
Si Substrate ◽  
Uv Illumination ◽  
Sensing Applications ◽  
Transmission Measurements ◽  
Electrical Characterizations

This paper presents the fabrication and optical characterization of an ultrathin 3C-SiC membrane for UV light detection. SiC nanoscale film was grown on Si substrate and subsequently released to form a robust membrane with a high aspect ratio of about 5000. Transmission measurements were performed to determine the thickness of the film with a high accuracy of 98%. We also employed a simple and highly effective direct wirebonding technique to form electrical contacts to the SiC membrane. The considerable change in the photocurrent of the SiC membrane was observed under UV illumination, indicating the potential of using 3C-SiC membranes for UV detection.

Characterization of Silicone Rubber Reinforced with Conductive Powder

2011 ◽  
Vol 378-379 ◽  
pp. 535-538
Author(s):  
Elena Valentina Stoian
Keyword(s):  
Electromagnetic Field ◽  
Human Factor ◽  
Shielding Effectiveness ◽  
Micro Particles ◽  
Conductive Fillers ◽  
Transmission Measurements ◽  
Common Problems ◽  
Silicone Rubbers ◽  
Conductive Plastics

Conductive plastics are attracting more and more interest in electronics due to their light weight and inability to rust, which are common problems associated with metals. In this work silicone rubbers reinforced with conductive fillers have been fabricated for use in various applications in electronics, telecommunications, and electronics enclosures, or to protect human factor, namely protective clothing. This paper presents the results of experimental determinations concerning electromagnetic field attenuation in materials containing micro-particles of nanocarbon in their structure. To know the effect of shielding effectiveness of electromagnetic field electromagnetic absorbents were performed by transmission measurements of attenuation in the frequency range 1-18 GHz. The goal of present paper consits in the realization a composit material with polymeric matrix. The materials were characterized by transmision diminishing carried out, relative permittivity, compression test and electrical conductivity.

Ultrasonic transmission measurements in the characterization of viscoelasticity utilizing polymeric waveguides

2016 ◽  
Vol 27 (10) ◽  
pp. 105601 ◽  
Author(s):  
Fabian Bause ◽  
Jens Rautenberg ◽  
Nadine Feldmann ◽  
Manuel Webersen ◽  
Leander Claes ◽  
...  
Keyword(s):  
Transmission Measurements

Characterization of Sol-Gel Derived (Pb,Ba)(Zr,Ti,Nb)O3 Thin Films for Optical Waveguide Development

1994 ◽  
Vol 343 ◽  
Author(s):  
P. F. Baude ◽  
J. S. Wright ◽  
C. Ye ◽  
L. F. Francis ◽  
D. L. Polla
Keyword(s):  
Thin Films ◽  
Sol Gel ◽  
Silicon Substrates ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sapphire Substrates ◽  
Solution Preparation ◽  
Transmission Measurements ◽  
Gel Technique

ABSTRACT(PbBa)(ZrTiNb)03 thin films and powders have been prepared using the sol-gel technique. Solutions were synthesized in 2-methoxyethanol based upon our previous PZT solution preparation. Three different approaches were used for incorporating barium into PZT alkoxide solutions. Thermal analysis and x-ray diffraction results indicated that barium methoxypropoxide gave the best results. PBZTN (71% Pb and 71% Zr) was deposited onto sapphire substrates as well as oxidized silicon substrates. Optical transmission measurements showed greater than 80% transmission for wavelengths longer than 400 nm. Films with thickness of 3000 Å on sapphire exhibited a refractive index of 2.19 at λ=633 nm.

X-ray Microprobe Studies of Materials Problems Related to Microelectromechanical Systems (MEMS) Structures

1999 ◽  
Vol 605 ◽  
Author(s):  
N. Mölders ◽  
P.J. Schilling ◽  
J. Göttert ◽  
H.O. Moser ◽  
V. Saile
Keyword(s):  
Microelectromechanical Systems ◽  
Mems Devices ◽  
X Ray ◽  
Spatially Resolved ◽  
Fluorescence Measurements ◽  
Transmission Measurements ◽  
Properties Of Materials ◽  
Materials Used ◽  
Micro Systems

AbstractThe understanding of the physical, chemical and mechanical properties of materials used in micro-electromechanical systems (MEMS) is essential for the successful application. For the characterization of such materials, it is often necessary to utilize a probe which can gather information on the same scale as the devices themselves. Based on these needs, x-ray microprobe analysis has been employed to perform spatially resolved measurements on several problems related to the fabrication of MEMS devices. These include spatially resolved transmission measurements of the homogeneity of transmitted flux through a graphite mask, micro-fluorescence measurements to assess elemental distributions, and micro-XANES measurements to follow the breakdown of new sulfone-based x-ray resists. These studies demonstrate the value of such an instrument in the characterization of micro-systems.

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