A New Determination of the π- Rest Mass

1976 ◽  
Vol 31 (10) ◽  
pp. 1150-1154
Author(s):  
A. Brandão d'Oliveira ◽  
H. Daniel ◽  
T. von Egidy ◽  
F. J. Hartmann
Keyword(s):  
Rest Mass ◽  
X Ray ◽  
Upper Limit ◽  
Pionic Atoms

Abstract The π- rest mass has been determined from measurements of X-ray transitions in pionic atoms, using muonic transitions for the calibration, to be mπ-= 139.571 ± 0.010 MeV. A new upper limit for the μ-neutrino rest mass was deduced: mv<0.78 MeV at 90 per cent confidence.

scholarly journals X-Ray Determination of the Black-Hole Mass in Cygnus X-1

1998 ◽  
Vol 188 ◽  
pp. 388-389
Author(s):  
A. Kubota ◽  
K. Makishima ◽  
T. Dotani ◽  
H. Inoue ◽  
K. Mitsuda ◽  
...  
Keyword(s):  
Black Hole ◽  
Compact Object ◽  
Optical Observations ◽  
Black Hole Mass ◽  
X Ray ◽  
Upper Limit ◽  
Supergiant Star ◽  
X Ray Binaries ◽  
Two Bodies

About 10 X-ray binaries in our Galaxy and LMC/SMC are considered to contain black hole candidates (BHCs). Among these objects, Cyg X-1 was identified as the first BHC, and it has led BHCs for more than 25 years(Oda 1977, Liang and Nolan 1984). It is a binary system composed of normal blue supergiant star and the X-ray emitting compact object. The orbital kinematics derived from optical observations indicates that the compact object is heavier than ~ 4.8 M⊙ (Herrero 1995), which well exceeds the upper limit mass for a neutron star(Kalogora 1996), where we assume the system consists of only two bodies. This has been the basis for BHC of Cyg X-1.

Recent advances in X-ray astronomy

1967 ◽  
Vol 31 ◽  
pp. 439-453
Author(s):  
B. B. Rossi
Keyword(s):  
Accurate Determination ◽  
Angular Size ◽  
The State ◽  
Spectral Information ◽  
X Ray ◽  
Upper Limit ◽  
Recent Advances ◽  
Visible Object

In a review written in December 1965, the author of this report has summarized the state of observational X-ray astronomy at that time. Further data that have become available since then have produced important advances in several directions. New sources have been discovered, some of which have been tentatively identified with known galactic or extra-galactic objects. Evidence has been presented for variability of the X-ray flux received from at least one of the sources. New spectral information has been obtained. New observations of the strong X-ray source in Scorpius, Sco X-1, have greatly reduced the previous upper limit for its angular size and have provided a much more accurate determination of its celestial coordinates. This determination has led to the identification of Sco X-1 with a faint visible object whose peculiar properties had, until then, escaped the attention of astronomers.

Messung des 3H-Betaspektrums und Bestimmung der Obergrenze für die Ruhemasse des elektronischen Antineutrinos / Measurement of the H3-Betaspectrum and Determination of an Upper Limit for the Electronic Antineutrino Rest Mass

1974 ◽  
Vol 29 (2) ◽  
pp. 261-274
Author(s):  
B. Röde
Keyword(s):  
High Resolution ◽  
Proportional Counter ◽  
Rest Mass ◽  
Magnetic Spectrometer ◽  
Theoretical Expression ◽  
Energy Losses ◽  
Upper Limit

The β-spectrum of tritium has been measured with the Heidelberg (π/2)√13 high resolution magnetic spectrometer. A new almost backscatter free source technique and a special proportional counter were developed. Special attention is paid to the problem of energy losses of the electrons in the source layer to get a theoretical expression for correcting the measured spectra in a physically meaningful way. On the basis of the Wilcoxon ranktest an upper limit of 8 6 eV at 90 per cent confidence was obtained for the antineutrino rest mass.

Lateral resolution of the electron microbeam analysis

1978 ◽  
Vol 36 (1) ◽  
pp. 542-543
Author(s):  
H.J. Dudek
Keyword(s):  
Quantitative Analysis ◽  
Depth Resolution ◽  
Lateral Resolution ◽  
Cylindrical Particle ◽  
Correction Procedure ◽  
X Ray ◽  
Element Concentrations ◽  
Microbeam Analysis ◽  
The Matrix

The chemical inhomogenities in modern materials such as fibers, phases and inclusions, often have diameters in the region of one micrometer. Using electron microbeam analysis for the determination of the element concentrations one has to know the smallest possible diameter of such regions for a given accuracy of the quantitative analysis.In th is paper the correction procedure for the quantitative electron microbeam analysis is extended to a spacial problem to determine the smallest possible measurements of a cylindrical particle P of high D (depth resolution) and diameter L (lateral resolution) embeded in a matrix M and which has to be analysed quantitative with the accuracy q. The mathematical accounts lead to the following form of the characteristic x-ray intens ity of the element i of a particle P embeded in the matrix M in relation to the intensity of a standard S

Sem and X-Ray Analysis of Renal and Biliary Calculi

1976 ◽  
Vol 34 ◽  
pp. 306-307
Author(s):  
R. J. Narconis ◽  
G. L. Johnson
Keyword(s):  
Chemical Constituents ◽  
Natural State ◽  
X Ray Diffraction ◽  
Chemical Methods ◽  
X Ray ◽  
Additional Dimension ◽  
Biliary Calculi ◽  
Calculus Formation ◽  
Scanning Electron

Analysis of the constituents of renal and biliary calculi may be of help in the management of patients with calculous disease. Several methods of analysis are available for identifying these constituents. Most common are chemical methods, optical crystallography, x-ray diffraction, and infrared spectroscopy. The application of a SEM with x-ray analysis capabilities should be considered as an additional alternative.A scanning electron microscope equipped with an x-ray “mapping” attachment offers an additional dimension in its ability to locate elemental constituents geographically, and thus, provide a clue in determination of possible metabolic etiology in calculus formation. The ability of this method to give an undisturbed view of adjacent layers of elements in their natural state is of advantage in determining the sequence of formation of subsequent layers of chemical constituents.

Preparation And elemental analysis of ancient fibers

1987 ◽  
Vol 45 ◽  
pp. 410-411
Author(s):  
Allen Angel ◽  
Kathryn A. Jakes
Keyword(s):  
Cross Sections ◽  
Physical Structure ◽  
Energy Dispersive ◽  
Archaeological Sites ◽  
X Ray ◽  
Long Term Storage ◽  
Backscattered Electron ◽  
Electron Imaging

Fabrics recovered from archaeological sites often are so badly degraded that fiber identification based on physical morphology is difficult. Although diagenetic changes may be viewed as destructive to factors necessary for the discernment of fiber information, changes occurring during any stage of a fiber's lifetime leave a record within the fiber's chemical and physical structure. These alterations may offer valuable clues to understanding the conditions of the fiber's growth, fiber preparation and fabric processing technology and conditions of burial or long term storage (1).Energy dispersive spectrometry has been reported to be suitable for determination of mordant treatment on historic fibers (2,3) and has been used to characterize metal wrapping of combination yarns (4,5). In this study, a technique is developed which provides fractured cross sections of fibers for x-ray analysis and elemental mapping. In addition, backscattered electron imaging (BSI) and energy dispersive x-ray microanalysis (EDS) are utilized to correlate elements to their distribution in fibers.

Determination of Stoichiometry of GaAs Component in (Gaas)Ge Epitaxially Grown Thin Films by Electron Microprobe X-Ray Analysis

1990 ◽  
Vol 48 (2) ◽  
pp. 264-265
Author(s):  
D. R. Liu ◽  
S. S. Shinozaki ◽  
R. J. Baird
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Compound Semiconductors ◽  
Energy Dispersive Analysis ◽  
X Ray ◽  
Metastable Alloys ◽  
Lower Voltage

The epitaxially grown (GaAs)Ge thin film has been arousing much interest because it is one of metastable alloys of III-V compound semiconductors with germanium and a possible candidate in optoelectronic applications. It is important to be able to accurately determine the composition of the film, particularly whether or not the GaAs component is in stoichiometry, but x-ray energy dispersive analysis (EDS) cannot meet this need. The thickness of the film is usually about 0.5-1.5 μm. If Kα peaks are used for quantification, the accelerating voltage must be more than 10 kV in order for these peaks to be excited. Under this voltage, the generation depth of x-ray photons approaches 1 μm, as evidenced by a Monte Carlo simulation and actual x-ray intensity measurement as discussed below. If a lower voltage is used to reduce the generation depth, their L peaks have to be used. But these L peaks actually are merged as one big hump simply because the atomic numbers of these three elements are relatively small and close together, and the EDS energy resolution is limited.

Polarity Determination in Sphalerite and Wurtzite Structures

1990 ◽  
Vol 48 (2) ◽  
pp. 500-501
Author(s):  
Stuart McKernan ◽  
C. Barry Carter
Keyword(s):  
Opposite Polarity ◽  
Single Domain ◽  
Polar Material ◽  
Electron Microscopic ◽  
Dynamical Interaction ◽  
X Ray ◽  
Polarity Determination ◽  
The Absolute ◽  
Microscopic Techniques

The determination of the absolute polarity of a polar material is often crucial to the understanding of the defects which occur in such materials. Several methods exist by which this determination may be performed. In bulk, single-domain specimens, macroscopic techniques may be used, such as the different etching behavior, using the appropriate etchant, of surfaces with opposite polarity. X-ray measurements under conditions where Friedel’s law (which means that the intensity of reflections from planes of opposite polarity are indistinguishable) breaks down can also be used to determine the absolute polarity of bulk, single-domain specimens. On the microscopic scale, and particularly where antiphase boundaries (APBs), which separate regions of opposite polarity exist, electron microscopic techniques must be employed. Two techniques are commonly practised; the first [1], involves the dynamical interaction of hoLz lines which interfere constructively or destructively with the zero order reflection, depending on the crystal polarity. The crystal polarity can therefore be directly deduced from the relative intensity of these interactions.

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