Microstructures of two-phase Ti–Cr alloys containing the TiCr2 Laves phase intermetallic

1997 ◽  
Vol 12 (6) ◽  
pp. 1472-1480 ◽  
Author(s):  
Katherine C. Chen ◽  
Samuel M. Allen ◽  
James D. Livingston
Keyword(s):  
Laves Phase ◽  
X Ray Diffraction ◽  
Orientation Relationships ◽  
Phase Growth ◽  
Two Phase ◽  
X Ray ◽  
Lattice Constants ◽  
Annealing Temperatures ◽  
Transmission Electron ◽  
Phase Intermetallic

Microstructures of two-phase Ti–Cr alloys (Ti-rich bcc + TiCr2 and Cr-rich bcc + TiCr2) are analyzed. A variety of TiCr2 precipitate morphologies is encountered with different nominal alloy compositions and annealing temperatures. Lattice constants and crystal structures are determined by x-ray diffraction (XRD) and transmission electron microscopy (TEM). Orientation relationships between the beta bcc solid solution and C15 TiCr2 Laves phase are understood in terms of geometrical packing, and are consistent with a Laves phase growth mechanism involving twinning.

Orientation Relationships in the System Nb-NbCr2

1997 ◽  
Vol 3 (S2) ◽  
pp. 707-708
Author(s):  
P. G. Kotula ◽  
K. C. Chen ◽  
D. J. Thoma ◽  
F. Chu ◽  
T. E. Mitchell
Keyword(s):  
Microstructural Characterization ◽  
Laves Phase ◽  
Orientation Relationships ◽  
Ion Milling ◽  
Two Phase ◽  
Laves Phases ◽  
Arc Melting ◽  
Transmission Electron ◽  
Structural Applications ◽  
Two Phases

Laves-phase intermetallics are of potential use as high-temperature structural materials. NbCr2-based C15-structured alloys are of particular interest for such applications. by themselves, Laves phases generally have poor ductility and fracture toughness at low temperatures. Two phase alloys (i.e., Laves phase and the ductile bcc phase) are considered more promising for structural applications. The orientation relationships between the two phases can contribute to the mechanical behavior of the material. In this study, observations of two different orientation relationships in a Nb-NbCr2 eutectic are discussed and compared with previous studies of the NbCr2 system, as well as the TiCr2 system.A Nb-NbCr2 eutectic alloy was prepared by arc-melting high-purity alloys followed by annealing at 1400°C for 100 h and then cooling at l°C/min. The complete details of the materials preparation have been given elsewhere. Specimens were prepared for observation in the transmission electron microscope (TEM) by cutting 3 mm discs with a coring saw, followed by dimpling and ion milling. Microstructural characterization was performed with a Philips CM30 TEM operating at 300 kV.

Epitaxial Pd-Doped LaFeO3 Films Grown on (100) SrTiO3 by Pulsed Laser Deposition

2014 ◽  
Vol 936 ◽  
pp. 282-286
Author(s):  
Ying Wen Duan
Keyword(s):  
Pulsed Laser Deposition ◽  
Pulsed Laser ◽  
Film Surface ◽  
Laser Deposition ◽  
Structural Quality ◽  
Deposition Technique ◽  
X Ray Diffraction ◽  
Orientation Relationships ◽  
X Ray ◽  
Transmission Electron

Single-crystalline, epitaxial LaFeO3 films with 5 at. % substitution of Pd on the Fe site are grown on (100) SrTiO3 substrate by pulsed-laser deposition technique. The epitaxial orientation relationships are (110)[001]LFPO||(100)[001]STO. X-ray diffraction and transmission electron microscopy reveal that the LFPO films have high structural quality and an atomically sharp LFPO/STO interface. After reduction treatments of as-grown LFPO films, very little Pd escaped the LFPO lattice onto the film surface, the formed Pd (100) particles are oriented epitaxially, and parallel to the LFPO films surface.

Synthesis of Crystalline C3N4 films and the new C-N Phases

1996 ◽  
Vol 441 ◽  
Author(s):  
Yan Chen ◽  
D. J. Johnson ◽  
R. H. Prince ◽  
Liping Guo ◽  
E. G. Wang
Keyword(s):  
Electron Microscopy ◽  
Vapor Deposition ◽  
Growth Parameters ◽  
Chemical Vapor ◽  
Monoclinic Structure ◽  
X Ray Diffraction ◽  
X Ray ◽  
Lattice Constants ◽  
Transmission Electron ◽  
Hot Filament

AbstractCrystalline C-N films composed of α- and β-C3N4, as well as other C-N phases, have been synthesized via bias-assisted hot-filament chemical vapor deposition using a gas mixture of nitrogen and methane. Scanning electron microscopy(SEM), energy dispersive X-ray (EDX) analysis, X-ray diffraction (XRD) and transmission electron microscopy (TEM) were used to characterize the films. Lattice constants of the α- and β-C3N4 phases obtained coincide very well with the theoretical values. In addition to these phases, two new C-N phases in the films have been identified by TEM and XRD; one having a tetragonal structure with a = 5.65 Å, c = 2.75Å, and the second having a monoclinic structure with a = 5.065 Å, b= 11.5 Å, c = 2.801 Å and β = 96°. Their stoichiometric values and atomic arrangements have not yet been identified. Furthermore, variation in growth parameters, for example methane concentration, bias voltage, etc., can yield preferred growth of different C-N phases.

Hardness evolution of Al–Cr–N coatings under thermal load

2008 ◽  
Vol 23 (11) ◽  
pp. 2880-2885 ◽  
Author(s):  
Herbert Willmann ◽  
Paul H. Mayrhofer ◽  
Lars Hultman ◽  
Christian Mitterer
Keyword(s):  
Thermal Load ◽  
Structural Changes ◽  
Single Phase ◽  
Volume Fraction ◽  
X Ray Diffraction ◽  
Scanning Calorimetry ◽  
X Ray ◽  
Al Content ◽  
Annealing Temperatures ◽  
Transmission Electron

Microstructure and hardness evolution of arc-evaporated single-phase cubic Al0.56Cr0.44N and Al0.68Cr0.32N coatings have been investigated after thermal treatment in Ar atmosphere. Based on a combination of differential scanning calorimetry and x-ray diffraction studies, we can conclude that Al0.56Cr0.44N undergoes only small structural changes without any decomposition for annealing temperatures Ta ⩽ 900 °C. Consequently, the hardness decreases only marginally from the as-deposited value of 30.0 ± 1.1 GPa to 29.4 ± 0.9 GPa with Ta increasing to 900 °C, respectively. The film with higher Al content (Al0.68Cr0.32N) exhibits formation of hexagonal (h) AlN at Ta ⩾ 700 °C, which occurs preferably at grain boundaries as identified by analytical transmission electron microscopy. Hence, the hardness increases from the as-deposited value of 30.1 ± 1.3 GPa to 31.6 ± 1.4 GPa with Ta = 725 °C. At higher temperatures, where the size and volume fraction of the h-AlN phase increases, the hardness decreases to 27.5 ± 1.0 GPa with Ta = 900 °C.

THE INVESTIGATION ON STABILITY AND STRUCTURAL PROPERTIES OF COHESION-BASED NANOSTRUCTURES MATERIAL

2013 ◽  
Vol 27 (27) ◽  
pp. 1350153 ◽  
Author(s):  
ALI BAHARI ◽  
REZA GHOLIPUR ◽  
MARYAM DERAKHSHI
Keyword(s):  
Annealing Temperature ◽  
Sol Gel ◽  
Growth Mode ◽  
X Ray Diffraction ◽  
Low Temperature Synthesis ◽  
Temperature Synthesis ◽  
X Ray ◽  
Annealing Temperatures ◽  
Atomic Force ◽  
Transmission Electron

Styrene-doped ZrLaO y nanostructures were obtained by sol–gel method low-temperature synthesis. The nanostructures were characterized by X-ray diffraction (XRD), scanning electron microscope (SEM), atomic force microscope (AFM) and transmission electron microscopy (TEM) techniques. The observation using SEM and TEM revealed that the ring-shaped nanostructures were very uniform. Further characterization using XRD disclosed that the cohesion of the samples was controllable with annealing temperatures in the range of 800–1500°C. Cohesion property was investigated for the samples. The cohesion increased when increasing the annealing temperature. This was linked to the reinforcement of the oxygen bound on the ZrLaO y nanostructures The shape of nanostructures showed a transformation from a ring-shaped growth mode to a hole-surfaced growth mode with increasing annealing temperature. The styrene-doped ZrLaO y nanostructures with controllable crystallinity will have great potential for various applications in fuel, cells, batteries, electronics devices and chemical sensors.

Investigation of Ti3SiC2 MAX Phase Formation onto N-Type 4H-SiC

2012 ◽  
Vol 717-720 ◽  
pp. 845-848 ◽  
Author(s):  
Alexia Drevin-Bazin ◽  
Jean François Barbot ◽  
Thierry Cabioc’h ◽  
Marie France Beaufort
Keyword(s):  
Electron Microscopy ◽  
Room Temperature ◽  
High Vacuum ◽  
Max Phase ◽  
Vacuum System ◽  
X Ray Diffraction ◽  
X Ray ◽  
Annealing Temperatures ◽  
Transmission Electron

In this study, investigations on MAX phase Ti3SiC2 formation to n-type 4H-SiC substrates and its ohmic-behaved are reported. Ti-Al layers were deposited onto SiC substrates at room temperature by magnetron sputtering in high vacuum system. Thermal annealing at 1000°C in Ar atmosphere were performed to allow interdiffusion processes. X-ray diffraction and High Resolution Transmission Electron Microscopy reveal that a Ti3SiC2 contact, in perfect epitaxy with 4H-SiC substrate, is so-obtained. In situ annealing experiment underlines the evolution of Ti-Al contact microstructure versus temperature. The evolution of contact system from Schottky to Ohmic behaved is observed by I-V measurements for annealing temperatures larger than 700°C.

Nanorods of CoP, CdS, and ZnS

2006 ◽  
Vol 78 (9) ◽  
pp. 1651-1665 ◽  
Author(s):  
P. John Thomas ◽  
Paul Christian ◽  
Steven Daniels ◽  
Yang Li ◽  
Y. S. Wang ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Structural Properties ◽  
Solution Phase ◽  
X Ray Diffraction ◽  
Phase Growth ◽  
Extrinsic Factors ◽  
X Ray ◽  
Transmission Electron

Simple thermolysis routes to CdS, ZnS, and CoP nanorods have been developed in our laboratory. The structural properties of the nanorods obtained were elucidated by means of X-ray diffraction (XRD) and high-resolution transmission electron microscopy (HR-TEM). Arguments and calculations in support of the contention that intrinsic rather than extrinsic factors influence the solution-phase growth of nanorods are presented.

scholarly journals SPICA: stereographic projection for interactive crystallographic analysis

2016 ◽  
Vol 49 (5) ◽  
pp. 1818-1826 ◽  
Author(s):  
X.-Z. Li
Keyword(s):  
Crystal Structure ◽  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Stereographic Projection ◽  
Crystallographic Analysis ◽  
X Ray Diffraction ◽  
Orientation Relationships ◽  
X Ray ◽  
Research Fields ◽  
Transmission Electron

In numerous research fields, especially the applications of electron and X-ray diffraction, stereographic projection represents a powerful tool for researchers. SPICA is a new computer program for stereographic projection in interactive crystallographic analysis, which inherits features from the previous JECP/SP and includes more functions for extensive crystallographic analysis. SPICA provides fully interactive options for users to plot stereograms of crystal directions and crystal planes, traces, and Kikuchi maps for an arbitrary crystal structure; it can be used to explore the orientation relationships between two crystalline phases with a composite stereogram; it is also used to predict the tilt angles of transmission electron microscopy double-tilt and rotation holders in electron diffraction experiments. In addition, various modules are provided for essential crystallographic calculations.

Effect of film composition on the orientation of (Ba,Sr)TiO3 grains in (Ba,Sr)yTiO2+ythin films

1999 ◽  
Vol 14 (12) ◽  
pp. 4657-4666 ◽  
Author(s):  
Debra L. Kaiser ◽  
Mark D. Vaudin ◽  
Lawrence D. Rotter ◽  
John E. Bonevich ◽  
Igor Levin ◽  
...  
Keyword(s):  
Amorphous Phase ◽  
Composition Dependence ◽  
Compressive Strain ◽  
Chemical Vapor ◽  
Growth Conditions ◽  
X Ray Diffraction ◽  
Two Phase ◽  
Film Composition ◽  
X Ray ◽  
Transmission Electron

Thin films of composition (Ba,Sr)yTiO2+y with 0.43 ≤ y ≤; 1.64, were deposited by metalorganic chemical vapor deposition on (100) MgO substrates at various growth conditions. X-ray diffraction and transmission electron microscopy studies showed that the films were composed of epitaxial Ba1–xSrxTiO3 (x ≈0.06) grains and an amorphous phase. The orientation of the tetragonal Ba1–xSrxTiO3 grains (pure a axis, pure c axis, or a mix of the two) was found to be strongly dependent upon film composition. This composition dependence is explained for the majority of the Ti-rich films by an analysis of average strains in the two-phase films, assuming a compressive strain of ≈1% in the amorphous phase.

Evolution of the two-phase microstructure L12 + DO22 in near-eutectoid Ni3(Al,V) alloy

1994 ◽  
Vol 9 (12) ◽  
pp. 3068-3082 ◽  
Author(s):  
L.A. Bendersky ◽  
F.S. Biancaniello ◽  
M.E. Williams
Keyword(s):  
Stage Iv ◽  
High Angle ◽  
X Ray Diffraction ◽  
Two Phase ◽  
Fast Kinetics ◽  
X Ray ◽  
Transmission Electron ◽  
Discontinuous Coarsening ◽  
Fcc Phase ◽  
Kinetics Of

Transmission electron microscopy and powder x-ray diffraction methods have been used to investigate the evolution of two-phase (L12 + DO22) microstructures from the quenched fcc phase of the Ni-5Al-20V (at. %) alloy. The microstructure after annealing in a temperature range from 650 to 900 °C differs from the eutectoid structure which might be expected for the alloy according to the eutectoid-type phase diagram of the Ni3Al-Ni3V section. This structure results from fast kinetics of ordering in the fcc → L12 and fcc → DO22 phase transitions. Four main stages in the microstructural evolution were observed. Stage I is the formation of spheroidal coherent L12 clusters in a disordered fcc matrix. During stage II the L12 clusters transform into cuboidal precipitates, and the fcc matrix orders into three DO22 variants (which may have interfaces that are wetted by thin fcc layers). In stage III accommodation of misfit (elastic energy) between different phases and variants occurs by formation of (110) twins or a single variant of the DO22 phase and tetragonally strained lamellae of the L12 phase. Stage IV is a discontinuous coarsening process in which a coarse incoherent two-phase structure replaces the fine coherent one. Grains of the coarse structure are nucleated on high-angle boundaries of primary fcc or other surfaces. Many of the grains are found twinned.

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