Nanostructure and mechanical properties of WC–SiC thin films

2002 ◽  
Vol 17 (12) ◽  
pp. 3163-3167 ◽  
Author(s):  
Jose L. Endrino ◽  
James E. Krzanowski
Keyword(s):  
Thin Films ◽  
Mechanical Properties ◽  
Photoelectron Spectroscopy ◽  
Nanocrystalline Structure ◽  
Amorphous Structure ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Hardness Increase ◽  
Carbide Content

The mechanical properties of WC–SiC thin films deposited by dual radio frequency magnetron sputtering were investigated. The films were characterized by x-ray photoelectron spectroscopy, x-ray diffraction (XRD), and transmission electron microscopy (TEM) to evaluate the details of the microstructure and degree of amorphization. The results indicate that small additions of SiC (<25%) can significantly increase hardness compared to a pure WC film, but higher SiC contents do not strongly affect hardness. XRD studies show the SiC had a disordering effect. TEM results showed that WC films had coarse porous structure, but films with a low silicon carbide content (approximately 10 to 25 at%) had a denser nanocrystalline structure. Samples with greater than 25% SiC were amorphous. The initial hardness increase at lower SiC contents correlated well with the observed densification, but the transition to an amorphous structure did not strongly affect hardness.

Limitations to the use of Sb as a Surfactant During SiGe MBE

1998 ◽  
Vol 533 ◽  
Author(s):  
Glenn G. Jernigan ◽  
Conrad L. Silvestre ◽  
Mohammad Fatemi ◽  
Mark E. Twigg ◽  
Phillip E. Thompson
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
Quantum Well ◽  
Photoelectron Spectroscopy ◽  
Surface Coverage ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Alloy Concentration

AbstractThe use of Sb as a surfactant in suppressing Ge segregation during SiGe alloy growth was investigated as a function of Sb surface coverage, Ge alloy concentration, and alloy thickness using xray photoelectron spectroscopy, x-ray diffraction, and transmission electron microscopy. Unlike previous studies where Sb was found to completely quench Ge segregation into a Si capping layer, we find that Sb can not completely prevent Ge segregation while Si and Ge are being co-deposited. This results in the production of a non-square quantum well with missing Ge at the beginning and extra Ge at the end of the alloy. We also found that Sb does not relieve strain in thin films but does result in compositional or strain variations within thick alloy layers.

Green preparation of carbon dots for Hg2+ detection and cell imaging

2020 ◽  
Vol 10 (11) ◽  
pp. 1777-1787
Author(s):  
Yadian Xie ◽  
Shanshan Wang ◽  
Ning Fu ◽  
Yan Yang ◽  
Xingliang Liu ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Carbon Dots ◽  
High Sensitivity ◽  
Amorphous Structure ◽  
X Ray Diffraction ◽  
X Ray ◽  
Carbon And Nitrogen ◽  
Transmission Electron ◽  
Sensitivity And Selectivity ◽  
Ft Ir

Carbon dots (CDs) also nitrogen-doped CDs (N-CDs) were produced by green hydrothermal synthesis using Pea and ethanediamine as the carbon and nitrogen source, separately. Transmission electron microscopy (TEM) images displayed that the prepared CDs and N-CDs were well dispersed, had a spherical morphology. X-ray diffraction (XRD) figures of CDs and N-CDs presented a graphitic amorphous structure. Fourier transform infrared spectroscopy (FT-IR) verified that CDs and N-CDs carried many different hydrophilic groups (for example hydroxyl, carboxyl/carbonyl, amide, amino groups) on the surface, X-ray photoelectron spectroscopy (XPS) together verified this result. However, the optical properties and fluorescence quantum yield for N-CDs were obviously superior to those of CDs. Furthermore, the prepared N-CDs displayed outstanding advantages including low toxicity, satisfactory biocompatibility, and excellent chemical stability. More prominently, the prepared N-CDs could detect Hg2+ ions with high sensitivity and selectivity in both water samples and HeLa cells.

The location and effects of Si in (Ti1–xSix)Ny thin films

2009 ◽  
Vol 24 (8) ◽  
pp. 2483-2498 ◽  
Author(s):  
Axel Flink ◽  
Manfred Beckers ◽  
Jacob Sjölén ◽  
Tommy Larsson ◽  
Slawomir Braun ◽  
...  
Keyword(s):  
Thin Films ◽  
Grain Boundaries ◽  
Photoelectron Spectroscopy ◽  
Single Phase ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Arc Evaporation ◽  
Annealing Experiments ◽  
Tissue Phase

(Ti1–xSix)Ny (0 ≤ x ≤ 0.20; 0.99 ≤ y(x) ≤ 1.13) thin films deposited by arc evaporation have been investigated by analytical transmission electron microscopy, x-ray diffraction, x-ray photoelectron spectroscopy, and nanoindentation. Films with x ≤ 0.09 are single-phase cubic (Ti,Si)N solid solutions with a dense columnar microstructure. Films with x > 0.09 have a featherlike microstructure consisting of cubic TiN:Si nanocrystallite bundles separated by metastable SiNz with coherent-to-semicoherent interfaces and a dislocation density of as much as 1014 cm−2 is present. The films exhibit retained composition and hardness between 31 and 42 GPa in annealing experiments to 1000 °C due to segregation of SiNz to the grain boundaries. During annealing at 1100–1200 °C, this tissue phase thickens and transforms to amorphous SiNz. At the same time, Si and N diffuse out of the films via the grain boundaries and TiN recrystallize.

scholarly journals S tudies on the phase transitions and properties of tungsten (VI) oxide nanoparticles by X - Ray diffraction (XRD) and thermal analysis

2017 ◽  
Vol 26 (1) ◽  
Author(s):  
S.F. Abdullah ◽  
S. Radiman ◽  
M.A. Abdul Hamid ◽  
N.B. Ibrahim
Keyword(s):  
Thermal Analysis ◽  
Phase Transitions ◽  
Photoelectron Spectroscopy ◽  
Average Diameter ◽  
Amorphous Structure ◽  
X Ray Diffraction ◽  
X Ray ◽  
Calcination Temperatures ◽  
Transmission Electron ◽  
Scherrer Formula

Tungsten (VI) oxide, WO3nanoparticles were synthesized by colloidal gas aphrons(CGAs) technique.The resultant WO3nanoparticleswere characterized by thermogravimetric-differential thermal analysis (TG-DTA) and X-Ray diffraction (XRD) measurements in order to determine the phase transitions, the crystallinity and the size of theWO3nanoparticles. As a comparison, transmission electron microscope (TEM) was used to investigate the size of the WO3nanoparticles. The result from XRD and DTA show that the formation of polymorphsWO3nanoparticles have the following sequence: orthorhombic (b-WO3)®monoclinic (g-WO3) ®triclinic (d-WO3) ®monoclinic (e-WO3) with respect to the calcination temperature of 400, 500, 600 and 700°C. No diffraction peaks were found in the X-Ray diffraction measurements for the sample heat treated at 300°C (as-prepared), suggesting that an amorphous structure was obtained at this temperature whereas the crystallinity had been obtained by the other samples of theWO3nanoparticles at the calcination temperatures of 400, 500, 600 and 700°C. It is also found that the X-Ray diffraction measurements produced an average diameter of (30 ±5), (50 ±5), (150 ±10) and (200 ±10) nm at calcination temperatures of 400, 500, 600 and 700°C respectively by using Debye-Scherrer formula. The TG curve revealed that the WO3nanoparticles is purely anhydrous since the weight loss is insignificant (0.3 –1.4) % from 30 until 600°C for the WO3nanoparticles calcined at 400°C. Finally, the composition and the purity of the WO3nanoparticleshave been examined by X-Ray photoelectron spectroscopy (XPS). Theresults indicate no significant changes to the composition and the purity of the WO3nanoparticle produced due to the temperature variations 

scholarly journals Influence of the Double Bond LDH Clay on the Exfoliation / Intercalation Mechanism of Polyacrylamide Nanocomposite Hydrogels

2018 ◽  
Vol 55 (3) ◽  
pp. 263-268
Author(s):  
Ionut Cristian Radu ◽  
Eugeniu Vasile ◽  
Celina Maria Damian ◽  
Horia Iovu ◽  
Paul Octavian Stanescu ◽  
...  
Keyword(s):  
Mechanical Properties ◽  
Photoelectron Spectroscopy ◽  
Biomedical Applications ◽  
X Ray Diffraction ◽  
X Ray ◽  
Nanocomposite Hydrogels ◽  
Transmission Electron ◽  
Double Hydroxides ◽  
Classical Cross ◽  
Chemical Cross Linking

The paper focuses on the obtaining of novel nanocomposite hydrogels based on polyacrylamide and layered double hydroxides (LDHs) modified with double bonds. The modification of LDH clay was investigated by FTIR, X-ray photoelectron spectroscopy (XPS) and X-ray diffraction (XRD) analyses. Mechanical properties of the nanocomposite hydrogels were employed by compression and rheological measurements. The formation of exfoliated and intercalated structures was evidenced in transmission electron microscopy (TEM). Chemical cross-linking of hydrogels using both classical cross-linker and modified clay was an efficient method to improve the mechanical properties of novel nanocomposite hydrogels. These hydrogels with improved mechanical properties could be further tested for biomedical applications such as tissue engineering.

scholarly journals Studies on the phase transitions and properties of tungsten (VI) oxide nanoparticles by X-Ray diffraction (XRD) and thermal analysis

2017 ◽  
Vol 26 (1) ◽  
pp. 13-20 ◽  
Author(s):  
S.F. Abdullah ◽  
S. Radiman ◽  
M.A. Abdul Hamid ◽  
N.B, Ibrahim
Keyword(s):  
Thermal Analysis ◽  
Phase Transitions ◽  
Photoelectron Spectroscopy ◽  
Average Diameter ◽  
Amorphous Structure ◽  
X Ray Diffraction ◽  
X Ray ◽  
Calcination Temperatures ◽  
Transmission Electron ◽  
Scherrer Formula

Tungsten (VI) oxide, WO3 nanoparticles were synthesized by colloidal gas aphrons (CGAs) technique.  The resultant WO3 nanoparticles were characterized by thermogravimetric-differential thermal analysis (TG-DTA) and X-Ray diffraction (XRD) measurements in order to determine the phase transitions, the crystallinity and the size of the WO3 nanoparticles. As a comparison, transmission electron microscope (TEM) was used to investigate the size of the WO3 nanoparticles.  The result from XRD and DTA show that the formation of  polymorphs WO3 nanoparticles have the following sequence: orthorhombic (bWO3) ® monoclinic (g-WO3) ® triclinic (d-WO3) ® monoclinic (e-WO3) with respect to the calcination temperature of 400, 500, 600 and 700°C.  No diffraction  peaks were found in the X-Ray diffraction measurements for the sample heat treated at 300°C (as-prepared), suggesting that an amorphous structure was  obtained at this temperature whereas the crystallinity had been obtained by the other samples of the WO3 nanoparticles at the calcination temperatures of 400, 500, 600 and 700°C.  It is also found that the X-Ray diffraction measurements produced an average diameter of (30 ± 5), (50 ± 5), (150 ± 10) and (200 ± 10) nm at calcination temperatures of 400, 500, 600 and 700°C respectively by using  Debye-Scherrer formula.  The TG curve revealed that the WO3 nanoparticles is purely anhydrous since the weight loss is insignificant (0.3 – 1.4) % from 30 until  600°C for the WO3 nanoparticles calcined at 400°C.  Finally, the composition and the purity of the WO3 nanoparticles have been examined by X-Ray photoelectron spectroscopy (XPS).  The results indicate no significant changes to the composition and the purity of the WO3 nanoparticles produced due to the  temperature variations.                                             

Effect of Sputtering Input Power of Co on Structure and Magnetic Properties of Fe-Co-N Thin Films

2009 ◽  
Vol 79-82 ◽  
pp. 635-638 ◽  
Author(s):  
Xin Wang ◽  
Hui Jia ◽  
Wei Tao Zheng ◽  
Wei Xu ◽  
Bei Hong Long
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Photoelectron Spectroscopy ◽  
Quantum Interference ◽  
Input Power ◽  
Superconducting Quantum Interference Device ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Composition Structure

Fe-Co-N thin films with various Co content were synthesized on Si (111) substrate using facing-target magnetron sputtering by changing sputtering input power on Co target. During deposition, the input power on Fe target was kept at 160 W. The composition, structure, and magnetic properties were examined by X-ray photoelectron spectroscopy, X-ray diffraction (XRD), transmission electron microscopy (TEM), and superconducting quantum interference device. XRD and TEM investigations showed that at lower input power of 11.2 W on Co target, the phases in the film were -(Fe,Co)4N and Co3N. Increasing sputtering input power, the content of Co in the film increased. At input power of 14 W, film contained -(Fe,Co)8N phase was produced which exhibited higher saturation magnetization (252.85 Am2/kg) and lower value of coercivity (3.66 kAm-1), corresponded to the 12% content of Co in the film.

Investigation of the interface reactions of Ti thin films with AlN substrate

1997 ◽  
Vol 12 (3) ◽  
pp. 846-851 ◽  
Author(s):  
Xiangjun He ◽  
Si-Ze Yang ◽  
Kun Tao ◽  
Yudian Fan
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Rutherford Backscattering Spectrometry ◽  
Ion Beam ◽  
Reaction Products ◽  
X Ray Diffraction ◽  
X Ray ◽  
Interface Reactions ◽  
Transmission Electron ◽  
Argon Ion Bombardment

Pure bulk AlN substrates were prepared by hot-pressing to eliminate the influence of an aid-sintering substance on the interface reactions. AlN thin films were deposited on Si(111) substrates to decrease the influence of charging on the analysis of metal/AlN interfaces with x-ray photoelectron spectroscopy (XPS). Thin films of titanium were deposited on bulk AlN substrates by e-gun evaporation and ion beam assisted deposition (IBAD) and deposited on AlN films in situ by e-gun evaporation. Solid-state reaction products and reaction mechanism of the Ti/AlN system annealed at various temperatures and under IBAD were investigated by XPS, transmission electron microscopy (TEM), x-ray diffraction (XRD), and Rutherford backscattering spectrometry (RBS). Ti reacted with AlN to form a laminated structure in the temperature range of 600 °C to 800 °C. The TiAl3 phase was formed adjacent to the AlN substrate, TiN, and Ti4N3−x as well as Ti2N were formed above the TiAl3 layer at the interface. Argon ion bombardment during Ti evaporation promoted the interface reactions. No reaction products were detected for the sample as-deposited by evaporation. However, XPS depth profile of the Ti/AlN/Si sample showed that Ti–N binding existed at the interface between the AlN thin films and the Ti thin films.

Formation of the YBa2Cu2NbOy phase in thin films

2009 ◽  
Vol 24 (1) ◽  
pp. 212-216
Author(s):  
Srinivas Sathiraju ◽  
Paul N. Barnes ◽  
Robert A. Wheeler
Keyword(s):  
Thin Films ◽  
Raman Spectroscopy ◽  
Photoelectron Spectroscopy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Micro Raman Spectroscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
New Phase

We report the systematic substitution of Nb at the Cu1 site of YBa2Cu3Oy in thin films to form a new phase of YBa2Cu2NbO8. These films were deposited on SrTiO3(100) crystals using pulsed laser deposition and deposited at an optimal temperature of 850 °C. Films were characterized using x-ray diffraction (XRD), atomic force microscopy, x-ray photoelectron spectroscopy (XPS), micro-Raman spectroscopy, and transmission electron microscopy. XRD of these films indicate c-axis oriented YBa2Cu2NbOy formation. XPS and micro-Raman spectroscopy analysis suggests Cu exists in the +2 state.

Spectroscopic study of La2O3 thin films deposited by indigenously developed plasma-enhanced atomic layer deposition system

2018 ◽  
Vol 32 (19) ◽  
pp. 1840074 ◽  
Author(s):  
Viral Barhate ◽  
Khushabu Agrawal ◽  
Vilas Patil ◽  
Sumit Patil ◽  
Ashok Mahajan
Keyword(s):  
Thin Films ◽  
Atomic Layer Deposition ◽  
Spectroscopic Study ◽  
Photoelectron Spectroscopy ◽  
Atomic Layer ◽  
X Ray Diffraction ◽  
Cross Sectional ◽  
X Ray ◽  
Transmission Electron ◽  
Layer Deposition

The spectroscopic study of La2O3 thin films deposited over Si and SiC at low RF power of 25 W by using indigenously developed plasma-enhanced atomic layer deposition (IDPEALD) system has been investigated. The tris (cyclopentadienyl) lanthanum (III) and O2 plasma were used as a source precursor of lanthanum and oxygen, respectively. The [Formula: see text]1.2 nm thick La2O3 over SiC and Si has been formed based on our recipe confirmed by means of cross-sectional transmission electron microscopy. The structural characterization of deposited films was performed by means of X-ray photoelectron Spectroscopy (XPS) and X-ray Diffraction (XRD). The XPS result confirms the formation of 3[Formula: see text] oxidation state of the lanthania. The XRD results reveals that, deposited La2O3 films deposited on SiC are amorphous in nature compare to that of films on Si. The AFM micrograph shows the lowest roughness of 0.26 nm for 30 cycles of La2O3 thin films.

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