scholarly journals Микроструктура переходных границ в многослойных Мо/Ве-системах

2020 ◽  
Vol 90 (11) ◽  
pp. 1884
Author(s):  
Р.М. Смертин ◽  
В.Н. Полковников ◽  
Н.Н. Салащенко ◽  
Н.И. Чхало ◽  
П.А. Юнин ◽  
...  

The microstructure of Mo / Be multilayer periodic systems was studied by X-ray reflectivity and diffractometry and EXAFS spectroscopy. It was found that in the Mo / Be system, mixed zones of different compositions form at the boundaries. At the Mo-on-Be border, there is a mixed zone, similar in composition to MoBe22, and at the Be-on-Mo border, with MoBe2. As a result of thermal annealing for one hour, the structure of the transition boundaries in the multilayer system remains stable. With further annealing, diffusion processes occur that lead to the formation of another compound at the interface — MoBe2, instead of MoBe22, however, the period of the structure remains unchanged. This behavior explains the increase in the reflection coefficient of Mo / Be mirrors after annealing for one hour and a further decrease in the reflection coefficient with a longer annealing time.

2019 ◽  
Vol 89 (11) ◽  
pp. 1783
Author(s):  
Р.М. Смертин ◽  
С.А. Гарахин ◽  
C.Ю. Зуев ◽  
А.Н. Нечай ◽  
Н.В. Полковников ◽  
...  

AbstractThe influence of thermal action on X-ray optics performance and structure of films and transition regions in multilayer Mo/Be mirrors optimized for a reflection maximum in the interval 11.2–11.4 nm at normal incidence has been considered. The annealing temperature reached 300°C and the annealing time was 1 and 4 h. It has been shown that after thermal annealing in vacuum for 1 h at 300°C, the reflection coefficient rises; however, when the annealing time grows to 4 h, it drops. Grains in molybdenum films become finer, and the profiles of transition regions change from exponential to linear. The period of multilayer mirrors has remained the same under all annealing conditions.


2007 ◽  
Vol 1027 ◽  
Author(s):  
Do Young Noh ◽  
Ki-Hyun Ryu ◽  
Hyon Chol Kang

AbstractThe transformation of Au thin films grown on sapphire (0001) substrates into nano crystals during thermal annealing was investigated by in situ synchrotron x-ray scattering and ex situ atomic force microscopy (AFM). By monitoring the Au(111) Bragg reflection and the low Q reflectivity and comparing them with ex situ AFM images, we found that polygonal-shape holes were nucleated and grow initially. As the holes grow larger and contact each other, their boundary turns into Au nano crystals. The Au nano crystals have a well-defined (111) flat top surface and facets in the in-plane direction.


1986 ◽  
Vol 74 ◽  
Author(s):  
A. Katz ◽  
Y. KOMEM

AbstractThe effect of Rapid Thermal Annealing on phase formation and diffusion processes in the Ni(30 nm) /Al(10 nm)/Si system was studied and coxpared to a Ni(30 nm)/Si reference system. Heat treatments were carried out at temperatures between 400°C and 900°C for 2 seconds.The results obtained by means of TEM, AES and XRD indicated that the Ni/Al/Si system underwent a local melting in the intermediate Al layer at the Al/Si eutectic temperature (577°C). This reaction, due to the rapid melting process, resulted in formation of a unique layered-structure composed of a columnar polycrystalline layer (60 nm thick) of Ni2Si and NiSi adjacent to the Si substrate with relatively smooth interface and an outer layer of two separate polycrystalline films (both about 10 m thick) of Al3Ni (inside) and Ni(Al0.5Si0.5 ) (outside). Under the same rapid thermal processing conditions the Ni/Si reference system underwent a solid state reaction which resulted in the formation of a polycrystalline layer (60 nm thick) composed of Ni2Si and NiSi as well as NiSi2.


2012 ◽  
Vol 158 (3) ◽  
pp. 393-402 ◽  
Author(s):  
Perrine Pivette ◽  
Vincent Faivre ◽  
Lucia Mancini ◽  
Claire Gueutin ◽  
Georges Daste ◽  
...  

2021 ◽  
Vol ahead-of-print (ahead-of-print) ◽  
Author(s):  
Juanping Xu ◽  
Jinxu Li ◽  
Zheng Wang ◽  
Hao Fu ◽  
Ming Wu

Purpose The purpose of this paper is to investigate the effect of the soft annealing time on the microstructure and hydrogen embrittlement (HE) of Fe-0.22C-11.54Mn-2.05Al steels. Design/methodology/approach Steels A and B with different morphologies were prepared by cold rolling after warm rolling, long/short softening annealing and finally annealing at 700 °C for 30 min. Uncharged and charged samples were subjected to tensile, and HE behavior was studied by electron backscattered diffraction, scanning electron microscopy and X-ray diffraction. Findings The two samples exhibited similar tensile strengths. The homogeneous equiaxed microstructure of steel B was found to be more conducive to relieve its HE sensitivity. Steel A exhibited bimodal-grained microstructures – blocky and lath. The formation of crack in the blocky grains of steel A resulted in a significant reduction in its plasticity and tensile strength. Originality/value The high HE susceptibility of steel A is mainly connected with the inhomogeneity of martensite transformation.


2013 ◽  
Vol 48 (18) ◽  
pp. 6357-6366 ◽  
Author(s):  
C. Demaria ◽  
P. Benzi ◽  
A. Arrais ◽  
E. Bottizzo ◽  
P. Antoniotti ◽  
...  

1991 ◽  
Vol 69 (3-4) ◽  
pp. 451-455 ◽  
Author(s):  
H. Lafontaine ◽  
J. F. Currie ◽  
S. Boily ◽  
M. Chaker ◽  
H. Pépin

Tungsten thin films are deposited with a triode sputtering system in order to obtain an absorbing layer for X-ray masks. The mechanical stress is studied as a function of different pressure and RF power conditions during deposition. Rapid thermal annealing at different temperatures and durations is performed in order to produce films under low compressive stress. We observe that the stress changes occur over the time scale of seconds at the annealing temperature and that the corresponding activation energies are low (60 meV). Grain growth in a preferred orientation explains the observed changes in stress. The magnitude in the change of stress is in good agreement with a model proposed by Hoffman et al. relating the stress to grain size and grain boundary dimensions. [Journal translation]


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