scholarly journals NANOSCALE DIAGNOSTICS OF THE «CHICKEN WIRE» STRUCTURE ON THE ELECTRON IMAGE OF MICROCHANNEL PLATES EXPOSED TO PHOTOELECTRON SCRUBBING

2018 ◽  
pp. 550-556
Author(s):  
V.I. Savenko ◽  
◽  
D.G. Samkanashvili ◽  
◽  
◽  
...  
Keyword(s):  
Microchannel Plates ◽  
Electron Image

The 'well-known' theory of electron image formation

1983 ◽  
Vol 41 ◽  
pp. 288-289
Author(s):  
M.A. O'Keefe ◽  
W.O. Saxton
Keyword(s):  
Image Processing ◽  
Image Formation ◽  
Source Profiles ◽  
Electron Image

A recent paper by Kirkland on nonlinear electron image processing, referring to a relatively new textbook, highlights the persistence in the literature of calculations based on incomplete and/or incorrect models of electron imageing, notwithstanding the various papers which have recently pointed out the correct forms of the appropriate equations. Since at least part of the problem can be traced to underlying assumptions about the illumination coherence conditions, we attempt to clarify both the assumptions and the corresponding equations in this paper, illustrating the effects of an incorrect theory by means of images calculated in different ways.The first point to be made clear concerning the illumination coherence conditions is that (except for very thin specimens) it is insufficient simply to know the source profiles present, i.e. the ranges of different directions and energies (focus levels) present in the source; we must also know in general whether the various illumination components are coherent or incoherent with respect to one another.

Electron Microscopy in Molecular Biology

1967 ◽  
Vol 25 ◽  
pp. 2-3
Author(s):  
Cecil E. Hall
Keyword(s):  
Electron Microscopy ◽  
Molecular Biology ◽  
Noise Level ◽  
Molecular Structures ◽  
Material Structure ◽  
The Arts ◽  
Shadow Casting ◽  
Electron Image ◽  
High Degree ◽  
Very High

The visualization of organic macromolecules such as proteins, nucleic acids, viruses and virus components has reached its high degree of effectiveness owing to refinements and reliability of instruments and to the invention of methods for enhancing the structure of these materials within the electron image. The latter techniques have been most important because what can be seen depends upon the molecular and atomic character of the object as modified which is rarely evident in the pristine material. Structure may thus be displayed by the arts of positive and negative staining, shadow casting, replication and other techniques. Enhancement of contrast, which delineates bounds of isolated macromolecules has been effected progressively over the years as illustrated in Figs. 1, 2, 3 and 4 by these methods. We now look to the future wondering what other visions are waiting to be seen. The instrument designers will need to exact from the arts of fabrication the performance that theory has prescribed as well as methods for phase and interference contrast with explorations of the potentialities of very high and very low voltages. Chemistry must play an increasingly important part in future progress by providing specific stain molecules of high visibility, substrates of vanishing “noise” level and means for preservation of molecular structures that usually exist in a solvated condition.

Resolution of a Transmitted Electron Image Formed by A Scanning Electron Microscope

1970 ◽  
Vol 28 ◽  
pp. 386-387
Author(s):  
S. Takashima ◽  
H. Hashimoto ◽  
S. Kimoto
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Objective Lens ◽  
Specimen Thickness ◽  
Probe Diameter ◽  
Transmission Electron ◽  
Electron Image ◽  
Conventional Transmission Electron Microscope ◽  
Scanning Electron

The resolution of a conventional transmission electron microscope (TEM) deteriorates as the specimen thickness increases, because chromatic aberration of the objective lens is caused by the energy loss of electrons). In the case of a scanning electron microscope (SEM), chromatic aberration does not exist as the restrictive factor for the resolution of the transmitted electron image, for the SEM has no imageforming lens. It is not sure, however, that the equal resolution to the probe diameter can be obtained in the case of a thick specimen. To study the relation between the specimen thickness and the resolution of the trans-mitted electron image obtained by the SEM, the following experiment was carried out.

Edge Penetration Effects in the Low-Loss Electron Image in the SEM

1988 ◽  
Vol 46 ◽  
pp. 202-203
Author(s):  
Oliver C. Wells
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Beam Energy ◽  
Secondary Electron ◽  
Sharp Edge ◽  
Beam Diameter ◽  
Low Loss ◽  
Additional Information ◽  
Electron Image ◽  
Scanning Electron

The low-loss electron (LLE) image in the scanning electron microscope (SEM) is useful for the study of uncoated photoresist and some other poorly conducting specimens because it is less sensitive to specimen charging than is the secondary electron (SE) image. A second advantage can arise from a significant reduction in the width of the “penetration fringe” close to a sharp edge. Although both of these problems can also be solved by operating with a beam energy of about 1 keV, the LLE image has the advantage that it permits the use of a higher beam energy and therefore (for a given SEM) a smaller beam diameter. It is an additional attraction of the LLE image that it can be obtained simultaneously with the SE image, and this gives additional information in many cases. This paper shows the reduction in penetration effects given by the use of the LLE image.

The DQE of an electron image recording system

1978 ◽  
Vol 36 (1) ◽  
pp. 100-101
Author(s):  
K.-H. Herrmann ◽  
D. Krahl ◽  
H.-P Rust
Keyword(s):  
Primary Electron ◽  
Ideal Case ◽  
Image Recording ◽  
Main Requirement ◽  
High Detection ◽  
Electron Image ◽  
Video Amplifier ◽  
Detection Quantum Efficiency ◽  
Selection Of ◽  
The Ideal

The high detection quantum efficiency (DQE) is the main requirement for an imagerecording system used in electron microscopy of radiation-sensitive specimens. An electronic TV system of the type shown in Fig. 1 fulfills these conditions and can be used for either analog or digital image storage and processing [1], Several sources of noise may reduce the DQE, and therefore a careful selection of various elements is imperative.The noise of target and of video amplifier can be neglected when the converter stages produce sufficient target electrons per incident primary electron. The required gain depends on the type of the tube and also on the type of the signal processing chosen. For EBS tubes, for example, it exceeds 10. The ideal case, in which all impinging electrons create uniform charge peaks at the target, is not obtainable for several reasons, and these will be discussed as they relate to a system with a scintillator, fiber-optic and photo-cathode combination as the first stage.

A light optical diffractometer for electron microscopical images operating in line

1978 ◽  
Vol 36 (1) ◽  
pp. 86-87
Author(s):  
P. Bonhomme ◽  
A. Beorchia
Keyword(s):  
Electron Microscopy ◽  
Electron Transfer ◽  
Electron Microscope ◽  
Image Converter ◽  
Coherent Light ◽  
Spatial Filters ◽  
Electron Image ◽  
Electron Microscopical ◽  
Working Parameters ◽  
Amorphous Part

We have already described (1.2.3) a device using a pockel's effect light valve as a microscopical electron image converter. This converter can be read out with incoherent or coherent light. In the last case we can set in line with the converter an optical diffractometer. Now, electron microscopy developments have pointed out different advantages of diffractometry. Indeed diffractogram of an image of a thin amorphous part of a specimen gives information about electron transfer function and a single look at a diffractogram informs on focus, drift, residual astigmatism, and after standardizing, on periods resolved (4.5.6). These informations are obvious from diffractogram but are usualy obtained from a micrograph, so that a correction of electron microscope parameters cannot be realized before recording the micrograph. Diffractometer allows also processing of images by setting spatial filters in diffractogram plane (7) or by reconstruction of Fraunhofer image (8). Using Electrotitus read out with coherent light and fitted to a diffractometer; all these possibilities may be realized in pseudoreal time, so that working parameters may be optimally adjusted before recording a micrograph or before processing an image.

Cellulose Acetate Reverse Osmosis Membrane Structure

1972 ◽  
Vol 30 ◽  
pp. 528-529
Author(s):  
H. K. Plummer ◽  
E. Eichen ◽  
C. D. Melvin
Keyword(s):  
Cellulose Acetate ◽  
Reverse Osmosis ◽  
Membrane Structure ◽  
Freeze Drying ◽  
Dense Layer ◽  
Water Removal ◽  
Reverse Osmosis Membrane ◽  
Correct Interpretation ◽  
Electron Image ◽  
Scanning Electron

Much of the work reported in the literature on cellulose acetate reverse osmosis membranes has raised new and important questions with regard to the dense or “active” layer of these membranes. Several thickness values and structures have been attributed to the dense layer. To ensure the correct interpretation of the cellulose acetate structure thirteen different preparative techniques have been used in this investigation. These thirteen methods included various combinations of water substitution, freeze drying, freeze sectioning, fracturing, embedding, and microtomy techniques with both transmission and scanning electron microscope observations.It was observed that several factors can cause a distortion of the structure during sample preparation. The most obvious problem of water removal can cause swelling, shrinking, and folds. Improper removal of embedding materials, when used, can cause a loss of electron image contrast and, or structure which could hinder interpretation.

Contrast in Scanning Images of Thin Crystals

1972 ◽  
Vol 30 ◽  
pp. 520-521
Author(s):  
S. Kimoto ◽  
H. Hashimoto ◽  
S. Takashima ◽  
R. M. Stern ◽  
T. Ichinokawa
Keyword(s):  
Crystal Surface ◽  
Solid Angle ◽  
Incident Angle ◽  
Intensity Variation ◽  
Lattice Defects ◽  
Scanning Microscope ◽  
Electron Detector ◽  
Backscattered Electrons ◽  
Electron Image ◽  
Backscattered Electron

The most well known application of the scanning microscope to the crystals is known as Coates pattern. The contrast of this image depends on the variation of the incident angle of the beam to the crystal surface. The defect in the crystal surface causes to make contrast in normal scanning image with constant incident angle. The intensity variation of the backscattered electrons in the scanning microscopy was calculated for the defect in the crystals by Clarke and Howie. Clarke also observed the defect using a scanning microscope.This paper reports the observation of lattice defects appears in thin crystals through backscattered, secondary and transmitted electron image. As a backscattered electron detector, a p-n junction detector of 0.9 π solid angle has been prepared for JSM-50A. The gain of the detector itself is 1.2 x 104 at 50 kV and the gain of additional AC amplifier using band width 100 Hz ∼ 10 kHz is 106.

Study of the resistor material of an automotive spark plug by use of the charge-up effect along with elemental mapping in an electron microprobe

1991 ◽  
Vol 49 ◽  
pp. 742-743
Author(s):  
D. R. Liu ◽  
S. S. Shinozaki ◽  
J. S. Park ◽  
B. N. Juterbock
Keyword(s):  
Electron Microprobe ◽  
Present Report ◽  
Coated Sample ◽  
Valuable Insight ◽  
Elemental Mapping ◽  
Spark Plug ◽  
Carbon Coated ◽  
Electron Image ◽  
Electron Imaging ◽  
Insight Into

The electric and thermal properties of the resistor material in an automotive spark plug should be stable during its service lifetime. Containing many elements and many phases, this material has a very complex microstructure. Elemental mapping with an electron microprobe can reveal the distribution of all relevant elements throughout the sample. In this work, it is demonstrated that the charge-up effect, which would distort an electron image and, therefore, is normally to be avoided in an electron imaging work, could be used to advantage to reveal conductive and resistive zones in a sample. Its combination with elemental mapping can provide valuable insight into the underlying conductivity mechanism of the resistor.This work was performed in a CAMECA SX-50 microprobe. The spark plug used in the present report was a commercial product taken from the shelf. It was sectioned to expose the cross section of the resistor. The resistor was known not to contain the precious metal Au as checked on the carbon coated sample. The sample was then stripped of carbon coating and re-coated with Au.

Designing high-resolution slow scan CCD-based TEM camera systems

1992 ◽  
Vol 50 (2) ◽  
pp. 946-947
Author(s):  
James F. Mancuso ◽  
William B. Maxwell ◽  
Russell E. Camp ◽  
Mark H. Ellisman
Keyword(s):  
Fiber Optics ◽  
Ccd Camera ◽  
High Energy ◽  
Phosphor Layer ◽  
X Ray ◽  
Light Production ◽  
Camera Systems ◽  
X Ray Imaging ◽  
Electron Image ◽  
Scintillating Fiber

The imaging requirements for 1000 line CCD camera systems include resolution, sensitivity, and field of view. In electronic camera systems these characteristics are determined primarily by the performance of the electro-optic interface. This component converts the electron image into a light image which is ultimately received by a camera sensor.Light production in the interface occurs when high energy electrons strike a phosphor or scintillator. Resolution is limited by electron scattering and absorption. For a constant resolution, more energy deposition occurs in denser phosphors (Figure 1). In this respect, high density x-ray phosphors such as Gd2O2S are better than ZnS based cathode ray tube phosphors. Scintillating fiber optics can be used instead of a discrete phosphor layer. The resolution of scintillating fiber optics that are used in x-ray imaging exceed 20 1p/mm and can be made very large. An example of a digital TEM image using a scintillating fiber optic plate is shown in Figure 2.

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