A Position-Sensitive, Single-Photon Detector with Enhanced NIR Response

2011 ◽  
Author(s):  
Franco Stellari ◽  
Peilin Song ◽  
Alan J. Weger ◽  
Tomonori Nakamura ◽  
Stanley Kim ◽  
...  
Keyword(s):  
Near Infrared ◽  
Low Voltage ◽  
Supply Voltage ◽  
Single Photon ◽  
Single Photon Detector ◽  
Power Supply Voltage ◽  
Time Resolved ◽  
Two Generations ◽  
Advanced Analysis ◽  
Position Sensitive

Abstract In this paper, we evaluate a novel, position-sensitive, singlephoton detector with enhanced Near InfraRed (NIR) sensitivity [1-3] for taking 2D Time Resolved Emission (TRE), also known as Picosecond Imaging for Circuit Analysis (PICA), in future low voltage SOI technologies. In particular, we will investigate and quantify the sensitivity of two generations (Gen. I and Gen. II) of PICA cameras by Hamamatsu Photonics as a function of the power supply voltage on an IBM 45 nm SOI test chip. Additionally, we will compare the results to the performance obtained with an InGaAs Single Photon Avalanche Diode (SPAD) from DCG Systems [4]. Finally we will show a case study and an advanced analysis and localization technique that takes advantage of the 2D capability of the camera.

Ultra-Low Voltage Time-Resolved Emission Measurements from 32 nm SOI CMOS Integrated Circuits

2014 ◽  
Author(s):  
Andrea Bahgat Shehata ◽  
Franco Stellari ◽  
Alan Weger ◽  
Peilin Song ◽  
Vikas Anant ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Low Voltage ◽  
Supply Voltage ◽  
Single Photon ◽  
Photon Detector ◽  
Single Photon Detector ◽  
Time Resolved ◽  
Threshold Voltages ◽  
Two Generations ◽  
Superconducting Nanowire

Abstract This work presents a comparison of two generations of Superconducting nanowire Single-Photon Detector (SnSPD) prototypes used for Time-Resolved Emission (TRE) measurements from VLSI chips. The performance of the systems is compared in order to understand the figures of merit that a single-photon detector should have to enable the acquisition of time resolved emission waveforms for ultra-low voltage applications. We will show that measurements down to a new World record low 0.4 V supply voltage were made possible by a careful optimization of the detector front-end electronics. We also characterized the emission from devices with different threshold voltages in order to understand how the emission contributions depend on this parameter and how this affects the resulting waveform SNR.

A Superconducting Nanowire Single-Photon Detector (SnSPD) System for Ultra Low Voltage Time-Resolved Emission (TRE) Measurements of VLSI Circuits

2013 ◽  
Author(s):  
Franco Stellari ◽  
Alan J. Weger ◽  
Seongwon Kim ◽  
Dzmitry Maliuk ◽  
Peilin Song ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Low Voltage ◽  
Supply Voltage ◽  
Single Photon ◽  
Vlsi Circuits ◽  
Photon Detector ◽  
Single Photon Detector ◽  
Time Resolved ◽  
Superconducting Nanowire ◽  
Emission Light

Abstract In this paper, we present a Superconducting Nanowire Single Photon Detector (SnSPD) system and its application to ultra low voltage Time-Resolved Emission (TRE) measurements (also known as Picosecond Imaging Circuit Analysis, PICA) of scaled VLSI circuits. The 9 µm-diameter detector is housed in a closed loop cryostat and fiber coupled to an existing Emiscope III tool for collecting spontaneous emission light from the backside of integrated circuits (ICs) down to a world record 0.5 V supply voltage in a few minutes.

Time-Resolved Optical Measurements from 0.13μm CMOS Technology Microprocessor Using a Superconducting Single-Photon Detector

2003 ◽  
Author(s):  
Franco Stellari ◽  
Peilin Song ◽  
Alan J. Weger ◽  
Moyra K. McManus
Keyword(s):  
Low Voltage ◽  
Supply Voltage ◽  
Single Photon ◽  
Cmos Technology ◽  
Optical Measurements ◽  
Acquisition Time ◽  
Photon Detector ◽  
Single Photon Detector ◽  
Time Resolved ◽  
The One

Abstract In this paper we examine the use of the Superconducting Single-Photon Detector (SSPD) [1] for extracting electrical waveforms on an IBM microprocessor fabricated in a 0.13µm technology with 1.2V nominal supply voltage. Although the detector used in our experiments is prototype version of the one discussed in [1] demonstrating lower performance, we will show that it provides a significant reduction in acquisition time for the collection of optical waveforms, thus maintaining the usability of the PICA technique for present and future low voltage technologies.

Ultra Low Voltage Probing on 45 nm CMOS by Time Resolved Emission (TRE) Technology

2007 ◽  
Author(s):  
Chi-Lin Young ◽  
Paul Ng ◽  
Francisco Contreras ◽  
Radu Ispasoiu ◽  
Jim Vickers ◽  
...  
Keyword(s):  
Low Voltage ◽  
Detection Efficiency ◽  
Supply Voltage ◽  
Operation Condition ◽  
Power Supply Voltage ◽  
Time Resolved ◽  
Practical Operation ◽  
Photon Detection Efficiency ◽  
Optical Probing ◽  
Detector Technology

Abstract Ultra low voltage probing by time resolved emission (TRE) technology below 1.0V is very challenging for micro-processor debug in practical operation condition. This is because the photo-emission rate reduces exponentially as the power supply voltage decreases. In this paper, a novel technology with improved detector in solid immersion lens (SIL) TRE system was demonstrated for low voltage and small node probing. An improved detecting scheme was developed to collect 30% more photon detection efficiency than the previous system. The SIL TRE with low dark noise detector technology has been successfully applied to optical probing for 45nm product debug. The performance gain improvement in strong and weak signal regime has been demonstrated against the current detector technology. It has also demonstrated the capability on probing the ultra low voltage at 0.75 V for sub micron node of 45nm process.

scholarly journals A Versatile Setup for Time-Resolved Functional Near Infrared Spectroscopy Based on Fast-Gated Single-Photon Avalanche Diode and on Four-Wave Mixing Laser

2019 ◽  
Vol 9 (11) ◽  
pp. 2366 ◽  
Author(s):  
Laura Di Sieno ◽  
Alberto Dalla Mora ◽  
Alessandro Torricelli ◽  
Lorenzo Spinelli ◽  
Rebecca Re ◽  
...  
Keyword(s):  
Infrared Spectroscopy ◽  
Near Infrared Spectroscopy ◽  
Near Infrared ◽  
Single Photon ◽  
Wave Mixing ◽  
Functional Near Infrared Spectroscopy ◽  
Time Resolved ◽  
Diffusive Medium ◽  
Spectroscopy System

In this paper, a time-domain fast gated near-infrared spectroscopy system is presented. The system is composed of a fiber-based laser providing two pulsed sources and two fast gated detectors. The system is characterized on phantoms and was tested in vivo, showing how the gating approach can improve the contrast and contrast-to-noise-ratio for detection of absorption perturbation inside a diffusive medium, regardless of source-detector separation.

scholarly journals Low-voltage, low-power and high gain cmosota using active positive feedback with feed forward and FDCM techniques

2002 ◽  
Vol 15 (1) ◽  
pp. 93-101
Author(s):  
Lyes Bouzerara ◽  
Tahar Belaroussi ◽  
Boualem Amirouche
Keyword(s):  
Positive Feedback ◽  
Low Voltage ◽  
Supply Voltage ◽  
Phase Margin ◽  
Current Mirror ◽  
Power Supply Voltage ◽  
Gain Bandwidth ◽  
Frequency Dependent ◽  
Feed Forward ◽  
Current Mirrors

A low voltage, high dc gain and wideband load compensated cas code operational transconductance amplifier (OTA), using an active positive feedback with feed forward technique and frequency-dependent current mirrors (FDCM), is presented and analyzed. Such techniques stand as a powerful method of gain bandwidth and phase margin enhancements. In this paper, a frequency-dependent current mirror, whose input impedance increases with frequency, is used to form the feed forward path at the input of the current mirror with a feed forward capacitor. By using these techniques, the gain bandwidth product of the amplifier is improved from 115 MHz to 194 MHz, the phase margin is also improved from 85? to 95? and the gain is enhanced from 11 dB to 93 dB. This amplifier operates at 2.5 V power supply voltage drives a capacitive load of 1pF and gives a power dissipation of 7 mW. The predicted performance is verified by simulations using HSPICE tool with 0.8 fim CMOS AMS parameters.

scholarly journals High-time-resolved 64-channel single-flux quantum-based address encoder integrated with a multi-pixel superconducting nanowire single-photon detector

2018 ◽  
Vol 26 (22) ◽  
pp. 29045 ◽  
Author(s):  
Shigeyuki Miyajima ◽  
Masahiro Yabuno ◽  
Shigehito Miki ◽  
Taro Yamashita ◽  
Hirotaka Terai
Keyword(s):  
Single Photon ◽  
High Time ◽  
Flux Quantum ◽  
Photon Detector ◽  
Single Photon Detector ◽  
Time Resolved ◽  
Superconducting Nanowire
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