Enabling Cell Aware Diagnosis in a Foundry for Accurate and Efficient Failure Analysis of Cell Internal Defects

2020 ◽  
Author(s):  
Rohan Deshpande ◽  
Gregory Billus ◽  
Nikitha Penmethsa ◽  
Davide Pacifico ◽  
Huaxing Tang ◽  
...  
Keyword(s):  
Failure Analysis ◽  
Turnaround Time ◽  
Internal Layer ◽  
Standard Cell ◽  
Internal Defects ◽  
Standard Cells ◽  
Quick Turnaround ◽  
Random Defects ◽  
Quick Turnaround Time

Abstract Cell aware diagnosis identifies defects within the standard cell as opposed to traditional layout aware diagnosis that identifies the failing standard cell or the area between two standard cells. In a mature technology dominated by random defects, cell aware results pinpoint the cell internal layer drastically reducing the turnaround time for failure analysis. This paper describes a method to enable cell aware diagnosis in a foundry environment, perform a volume diagnosis analysis with RCAD (fail mode pareto) and drive failure analysis with a quick turnaround time for a 14nm customer chip.

scholarly journals Supplier evaluation in industrial power services: a case study in gas-turbine maintenance, repair, and overhaul

2020 ◽  
Vol 202 ◽  
pp. 13002
Author(s):  
Yordian Fachrie ◽  
Arviansyah
Keyword(s):  
Gas Turbine ◽  
Low Cost ◽  
Skill Training ◽  
Operating Cost ◽  
Turnaround Time ◽  
Turbine Engine ◽  
Quick Turnaround ◽  
The Right ◽  
Industrial Gas Turbine ◽  
Quick Turnaround Time

The maintenance is one of the highest costs in a gas-turbine engine, after operating cost with approximately about 14-19 % of the total cost. Some of the operators do not have spare engines, and it will lead to operation shutdown. With the current market, most MRO challenged to provide their costumer to achieve quick turnaround time (TAT) at a low cost without affecting the quality of the product. Since MRO is selling the skill services, it took applied technology, skill training, and experience to deliver quality, which needs high cost. Therefore, MRO needs to collaborate with other parties (original manufacturer or others) to increase its capacity and capability. MRO should concern more for evaluating the vendors to align with the strategies to get quick turnaround time with the right quality product. Supplier selection is the objective of this research by analyzing the selection criteria at Industrial Gas-Turbine maintenance. The highest priority is the vendor effectiveness followed by the quality, cost, risk management. The highest weight is based on the priority of the supplier.

Quick-turnaround-time improvement for product development and transfer to mass production

1998 ◽  
Vol 11 (1) ◽  
pp. 54-62
Author(s):  
H. Koike ◽  
F. Matsuoka ◽  
S. Hohkibara ◽  
E. Fukuda ◽  
K. Tomioka ◽  
...  
Keyword(s):  
Product Development ◽  
Mass Production ◽  
Turnaround Time ◽  
Quick Turnaround ◽  
Quick Turnaround Time

Utility of a pre-optimized kit for random amplified polymorphic DNA in typingCandida albicans

2002 ◽  
Vol 48 (4) ◽  
pp. 369-373 ◽  
Author(s):  
Kathleen M Riederer ◽  
Jambunathan Ramanathan ◽  
Jeff Barczak ◽  
Joseph Baran, Jr. ◽  
Riad Khatib
Keyword(s):  
Candida Albicans ◽  
Genomic Dna ◽  
Reliable Method ◽  
Random Amplified Polymorphic Dna ◽  
Turnaround Time ◽  
Genetic Variations ◽  
Ease Of Use ◽  
Stool Samples ◽  
Quick Turnaround ◽  
Quick Turnaround Time

The utility of a pre-optimized kit for random amplified polymorphic DNA (RAPD) was assessed in typing diverse strains of Candida albicans from epidemiologically unrelated inpatients (interpatient analysis) and in detecting clonal variations that maybe present within individual patient isolates (intrapatient analysis). Stool samples from inpatients were cultured on Inhibitory Mold agar. Nine individual colonies from all patients with [Formula: see text]9 colonies of C. albicans (n = 18) were selected, frozen, and karyotyped using CHEF genomic DNA plug kits and CHEF-DRIII. Each of the selected colonies was then analyzed by RAPD, utilizing the selected kit, with 6 primers. Interpatient analysis revealed 9 karyotypes and 17 RAPD composites. RAPD discrimination was significantly better (p < 0.001). Intrapatient analysis revealed 34 (21%) and 33 (20.4%) variants among 162 colonies tested by RAPD and karyotyping, respectively. The results were discordant in 25 variants, all with differences of 1–3 bands. These results illustrate that this pre-optimized kit for RAPD provides excellent discrimination of genetically unrelated strains. Its performance in delineating subtle clonal differences was comparable with karyotyping; both methods failed to detect all minor genetic variations. The ease of use and quick turnaround time of this kit offer a practical and reliable method for typing diverse strains of C. albicans, but may be inadequate for assessing microevolution.Key words: Candida albicans, karyotyping, RAPD.

Device Selection for Failure Analysis of Chain Fails Using Diagnosis Driven Yield Analysis

2011 ◽  
Author(s):  
Chris Schuermyer ◽  
Brady Benware ◽  
Graham Rhodes ◽  
Davide Appello ◽  
Vincenzo Tancorre ◽  
...  
Keyword(s):  
Failure Analysis ◽  
Case Studies ◽  
Yield Analysis ◽  
Analysis Methodology ◽  
Device Selection ◽  
Selection For ◽  
Random Defects

Abstract This work presents the first application of a diagnosis driven approach for identifying systematic chain fail defects in order to reduce the time spent in failure analysis. The zonal analysis methodology that is applied separates devices into systematic and random populations of chain fails in order to prevent submitting random defects for failure analysis. Two silicon case studies are presented to validate the production worthiness of diagnosis driven yield analysis for chain fails. The defects uncovered in these case studies are very subtle and would be difficult to identify with any other methodology.

Advancement in Data Engineering and Feature Processing Workflow by Using Deep Learning Techniques for the Automation of ESP Failure Root Cause Analyses

2021 ◽  
Author(s):  
Saniya Karnik ◽  
Navya Yenuganti ◽  
Bonang Firmansyah Jusri ◽  
Supriya Gupta ◽  
Prasanna Nirgudkar ◽  
...  
Keyword(s):  
Deep Learning ◽  
Failure Analysis ◽  
Language Processing ◽  
Turnaround Time ◽  
Process Efficiency ◽  
Root Cause ◽  
Feature Processing ◽  
Learning Techniques ◽  
Electrical Submersible Pump ◽  
Root Cause Identification

Abstract Today, Electrical Submersible Pump (ESP) failure analysis is a tedious, human-intensive, and time-consuming activity involving dismantle, inspection, and failure analysis (DIFA) for each failure. This paper presents a novel artificial intelligence workflow using an ensemble of machine learning (ML) algorithms coupled with natural language processing (NLP) and deep learning (DL). The algorithms outlined in this paper bring together structured and unstructured data across equipment, production, operations, and failure reports to automate root cause identification and analysis post breakdown. This process will result in reduced turnaround time (TAT) and human effort thus drastically improving process efficiency.

Evaluation of two point of care technologies for measuring monoclonal antibody therapeutic-A concentrations in blood

Bioanalysis ◽  
2020 ◽  
Vol 12 (20) ◽  
pp. 1449-1458
Author(s):  
Saloumeh K Fischer ◽  
Kathi Williams ◽  
Ian Harmon ◽  
Bryan Bothwell ◽  
Hua Xu ◽  
...  
Keyword(s):  
Monoclonal Antibody ◽  
Real Time ◽  
Point Of Care ◽  
Turnaround Time ◽  
Monitoring Methods ◽  
Sample Collection ◽  
Time Data ◽  
Serum Samples ◽  
Quick Turnaround Time

Aim: Current blood monitoring methods require sample collection and testing at a central lab, which can take days. Point of care (POC) devices with quick turnaround time can provide an alternative with faster results, allowing for real-time data leading to better treatment decisions for patients. Results/Methodology: An assay to measure monoclonal antibody therapeutic-A was developed on two POC devices. Data generated using 75 serum samples (65 clinical & ten spiked samples) show correlative results to the data generated using Gyrolab technology. Conclusion: This case study uses a monoclonal antibody therapeutic-A concentration assay as an example to demonstrate the potential of POC technologies as a viable alternative to central lab testing with quick results allowing for real-time decision-making.

Metallic Contamination Control in Leading-Edge ULSI Manufacturing

2009 ◽  
Vol 145-146 ◽  
pp. 115-121 ◽  
Author(s):  
Ayako Shimazaki ◽  
Hiroki Sakurai ◽  
Masao Iwase ◽  
Reiko Yoshimura ◽  
Tsukasa Tada
Keyword(s):  
Nonvolatile Memory ◽  
Electronic Materials ◽  
Leading Edge ◽  
Cost Effective ◽  
Turnaround Time ◽  
Production Lines ◽  
Contamination Control ◽  
High Productivity ◽  
Device Structures ◽  
Quick Turnaround Time

Contamination control has become a high-centered issue for the fabrication yield, performance and reliability of leading-edge ULSI devices. With the progress of sizing down dimensions in higher-density devices, complicated device structures and various novel electronic materials have been introduced, particularly in the latest devices such as CMOS and nonvolatile memory LSIs (Table I). On the other hand, high productivity is a necessity when you consider QTAT (quick turnaround time) and cost-effective flexible ULSI manufacturing lines. Therefore, effective contamination control coupled with adequate protocol has become essential in such production lines. The point of the protocol is minimization of damage caused by impurity metals diffused from these novel electronic materials [1-5].

scholarly journals 32-bit Kogge-Stone based Hybrid Adder Implemented using Standard Cells of Different Logic Families

2021 ◽  
Vol 23 (09) ◽  
pp. 196-204
Author(s):  
Hema Singaravelan ◽  
◽  
Dr. Kiran V ◽  
Keyword(s):  
Critical Role ◽  
Power Saving ◽  
Cmos Technology ◽  
Standard Cell ◽  
Design Constraints ◽  
Standard Cells

Adders performs a critical role in all computational operations, thereby optimizing them with respect to design constraints for a system is essential. In this paper, standard cells of different logic families, namely- CMOS, Pseudo NMOS, and MGDI, are designed in Cadence Design Suite Virtuoso 6.1.7 in 180nm technology and characterized using Liberate 15.1.3. The standard cell libraries thus created are then applied to 32-bit KSA (Kogge-Stone Adder) and KSA based proposed hybrid adder that are implemented in Verilog, functionally verified on Xilinx Vivado 2020.2 and synthesized on Cadence Genus 15.22. Pseudo NMOS logic shows 14.03% area savings and MGDI offers 54.43% power saving based on area per cell over the traditional CMOS technology. It is also seen that the proposed adder offers a decrease in power and delay by 32.13% and 13.75% over KSA, respectively, in CMOS logic. Further discussions are made and suitable applications for all designs are also discussed.

Application of B-Scan SAT Mode, an Acoustic Cross Section Technique to Analyze Packaged Components beyond Delamination

2020 ◽  
Author(s):  
Srinath Rajaram ◽  
Denise Barrientos ◽  
Nadia Ahmad ◽  
Robert Carpenter ◽  
Eric Barbian
Keyword(s):  
Failure Analysis ◽  
Integrated Circuit ◽  
Turnaround Time ◽  
Destructive Testing ◽  
Cross Sectional ◽  
Root Cause ◽  
Section Technique ◽  
Customer Returns ◽  
Tomography Method ◽  
Non Destructive

Abstract Failure Analysis labs involved in customer returns always face a greater challenge, demand from customer for a faster turnaround time to identify the root cause of the failure. Unfortunately, root cause identification in failure analysis is often performed incompletely or rushing into destructive techniques, leading to poor understanding of the failure mechanism and root-cause, customer dissatisfaction. Scanning Acoustic Tomography (SAT), also called Scanning Acoustic Microscope (SAM) has been adopted by several Failure Analysis labs because it provides reliable non-destructive imaging of package cracks and delamination. The SAM is a vital tool in the effort to analyze molded packages. This paper provides a review of non-destructive testing method used to evaluate Integrated Circuit (IC) package. The case studies discussed in this paper identifies different types of defects and the capabilities of B-Scan (cross-sectional tomography) method employed for defect detection beyond delamination.

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