scholarly journals VARIABILITY ANALYSIS OF 6T AND 7T SRAM CELL IN SUB-45NM TECHNOLOGY

2011 ◽  
Vol 12 (1) ◽  
pp. 13-30 ◽  
Author(s):  
Aminul Islam ◽  
Mohd. Hasan
Keyword(s):  
Random Access ◽  
Memory Cell ◽  
Static Random Access Memory ◽  
Access Time ◽  
Access Memory ◽  
Static Noise Margin ◽  
Noise Margin ◽  
Sram Cell ◽  
Pvt Variations ◽  
Static Noise

This paper analyses standard 6T and 7T SRAM (static random access memory) cell in light of process, voltage and temperature (PVT) variations to verify their functionality and robustness. The 7T SRAM cell consumes higher hold power due to its extra cell area required for its functionality constraint. It shows 60% improvement in static noise margin (SNM), 71.4% improvement in read static noise margin (RSNM) and 50% improvement in write static noise margin (WSNM). The 6T cell outperforms 7T cell in terms of read access time (TRA) by 13.1%. The write access time (TWA) of 7T cell for writing "1" is 16.6 x longer than that of 6T cell. The 6T cell proves it robustness against PVT variations by exhibiting narrower spread in TRA (by 1.2 x) and Twa (by 3.4x). The 7T cell offers 65.6% saving in read power (RPWR) and 89% saving in write power (WPWR). The RPWR variability indicates that 6T ell is more robust against process variation by 3.9x. The 7T cell shows 1.3x wider write power (WPWR) variability indicating 6T cell's robustness against PVT variations. All the results are based on HSPICE simulation using 32 nm CMOS Berkeley Predictive Technology Model (BPTM).

Design of Low Power with Expanded Noise Margin Subthreshold 12T SRAM Cell for Ultra-Low Power Devices

2020 ◽  
pp. 2150106
Author(s):  
Harekrishna Kumar ◽  
V. K. Tomar
Keyword(s):  
Power Dissipation ◽  
Random Access ◽  
Memory Cell ◽  
Random Access Memory ◽  
Static Random Access Memory ◽  
Access Time ◽  
Access Memory ◽  
Subthreshold Region ◽  
Noise Margin ◽  
Static Noise

In the proposed work, a differential write and single-ended read half-select free 12 transistors static random access memory cell is designed and simulated. The proposed cell has a considerable reduction in power dissipation with better stability and moderate performance. This cell operates in subthreshold region and has a higher value of read static noise margin as compared to conventional six transistors static random access memory cell. A power cut-off technique is utilized between access and pull-up transistors during the write operation. It results in an increase in write static noise margin as compared to all considered cells. In the proposed cell, read and write access time is improved along with a reduction in read/write power dissipation as compared to conventional six transistors static random access memory cell. The bitline leakage current in the proposed cell is reduced which improves the [Formula: see text] ratio of the cell under subthreshold region. The proposed cell occupies less area as compared to considered radiation-hardened design 12 transistors static random access memory cell. The computed electrical quality metric of proposed cell is better among considered static random access memory cells. Process variation analysis of read stability, access time, power dissipation, read current and leakage current has been performed with the help of Monte Carlo simulation at 3,000 points to get more soundness in the results. All characteristics of static random access memory cells are compared at various supply voltages.

scholarly journals Restoration circuits for low power reduce swing of 6T and 8T SRAM cell with improved read and write margins

2021 ◽  
Vol 10 (2) ◽  
pp. 130
Author(s):  
Ram Murti Rawat ◽  
Vinod Kumar
Keyword(s):  
Random Access ◽  
Static Random Access Memory ◽  
Access Memory ◽  
Static Noise Margin ◽  
Noise Margin ◽  
Engineering Level ◽  
Sram Cell ◽  
Improved Stability ◽  
Cell Segment ◽  
Static Noise

<span>This article clarifies about the variables that influence the static noise margin (SNM) of a static random-access memory. Track down the improved stability of proposed 8T SRAM cell which is superior to conventional 6T SRAM cell utilizing Swing Restored circuit with voltages Q and QB bar are peruse and Compose activity. This SRAM cell strategy on the circuit or engineering level is needed to improve read static noise margin (RSNM), write static noise margin (WSNM) and hold static noise margin (HSNM). This article relative investigation of conventional 6T, standard 8T and proposed 8T SRAM cells with improved stability and static noise margin is finished for 180 nm CMOS innovation. This paper is coordinated as follows: Introduction in area 1, The 6T SRAM cell are portrayed in segment 2. In area 3, proposed 8T SRAM cell is portrayed. In area 4, standard 8T SRAM cell. Segment 5 incorporates the simulation and results which give examination of different boundaries of 6T and 8T SRAM cells and segment 6 conclusions.</span>

Design of Low Power Half Select Free 10T Static Random-Access Memory Cell

2020 ◽  
pp. 2150073 ◽  
Author(s):  
Ashish Sachdeva ◽  
V. K. Tomar
Keyword(s):  
Random Access ◽  
Memory Cell ◽  
Random Access Memory ◽  
Static Random Access Memory ◽  
Access Time ◽  
Signal To Noise ◽  
Access Memory ◽  
Noise Margin ◽  
Sram Cell ◽  
Power Delay Product

This paper presents a circuit-level technique of designing a low power and half select free 10T Static Random-Access Memory Cell (SRAM). The proposed cell works with single end read operation and differential write operation. The proposed bit-cell is free from half select issue and supports bit interleaving format. The presented 10T cell exhibits 40.75% lower read power consumption in comparison to conventional 6T SRAM cell, attributed to reduction of activity factor during read operation. The loop cutting transistors used in core latch improve write signal-to-noise margin (WSNM) by 14.94% and read decoupled structure improve read signal-to-noise margin (RSNM) by [Formula: see text] as compared to conventional 6T SRAM. In the proposed work, variability analysis of significant design parameters such as read current, stand-by SNM, and read power of the projected 10T SRAM cell is presented and compared with considered topologies. Mean value of hold static noise margin of the cell for 3000 samples is [Formula: see text] times higher than the considered D2p11T cell. The proposed 10T cell shows [Formula: see text] and [Formula: see text] narrower read access time and write access time, respectively, as compared to conventional 6T SRAM cell. Read current to bit-line leakage current ratio of the proposed 10T cell has been investigated and is improved by [Formula: see text] as compared to conventional 6T SRAM cell. The write power delay product and read power delay product of the proposed 10T cell are [Formula: see text] and [Formula: see text] lower than conventional 6T SRAM cell. In this work, cadence virtuoso tool with Generic Process Design Kit (GPDK) 45[Formula: see text]nm technology file has been utilized to carry out simulations.

Design and Analysis of SRAM Cell using Negative Bit-Line Write Assist Technique and Separate Read Port for High-Speed Applications

2021 ◽  
pp. 2150270
Author(s):  
Jitendra Kumar Mishra ◽  
Lakshmi Likhitha Mankali ◽  
Kavindra Kandpal ◽  
Prasanna Kumar Misra ◽  
Manish Goswami
Keyword(s):  
Power Dissipation ◽  
High Speed ◽  
Random Access ◽  
Random Access Memory ◽  
Access Memory ◽  
Static Noise Margin ◽  
Semiconductor Memory ◽  
Noise Margin ◽  
Sram Cell ◽  
Static Noise

The present day electronic gadgets have semiconductor memory devices to store data. The static random access memory (SRAM) is a volatile memory, often preferred over dynamic random access memory (DRAM) due to higher speed and lower power dissipation. However, at scaling down of technology node, the leakage current in SRAM often increases and degrades its performance. To address this, the voltage scaling is preferred which subsequently affects the stability and delay of SRAM. This paper therefore presents a negative bit-line (NBL) write assist circuit which is used for enhancing the write ability while a separate (isolated) read buffer circuit is used for improving the read stability. In addition to this, the proposed design uses a tail (stack) transistor to decrease the overall static power dissipation and also to maintain the hold stability. The comparison of the proposed design has been done with state-of-the-art work in terms of write static noise margin (WSNM), write delay, read static noise margin (RSNM) and other parameters. It has been observed that there is an improvement of 48%, 11%, 19% and 32.4% in WSNM while reduction of 33%, 39%, 48% and 22% in write delay as compared to the conventional 6T SRAM cell, NBL, [Formula: see text] collapse and 9T UV SRAM, respectively.

Design of a Stable Low Power 11-T Static Random Access Memory Cell

2020 ◽  
Vol 29 (13) ◽  
pp. 2050206 ◽  
Author(s):  
Ashish Sachdeva ◽  
V. K. Tomar
Keyword(s):  
Random Access ◽  
Memory Cell ◽  
Random Access Memory ◽  
Static Random Access Memory ◽  
Signal To Noise ◽  
Access Memory ◽  
Noise Margin ◽  
Sram Cell ◽  
Variation Tolerance ◽  
Read Signal

In this paper, a 11-T static random-access memory (SRAM) cell has been examined that shows a fair reduction in read power dissipation while upholding the stability and moderate performance. In the presented work, parametric variability analysis of various design metrices such as signal to noise margin, read current and read power of the Proposed 11T cell are presented and compared with few considered topologies. The Proposed cell offers single ended write operation and differential read operation. The improvement in read signal to noise margin and write signal to noise margin with respect to conventional 6T SRAM is 10.63% and 33.09%, respectively even when the write operation is single ended. Mean hold static noise margin of the cell for 3000 samples is [Formula: see text] times higher than considered D2p11T cell. Sensitivity analysis of data retention voltage (DRV) with respect to temperature variations is also investigated and compared with considered topologies. DRV variation with temperature is least in FF process corner. In comparison to conventional 6T SRAM cell, the write and read delay of Proposed 11T cell gets improved by [Formula: see text] and 1.64%, respectively. Proposed 11T topology consumes least read energy in comparison with considered topologies. In comparison with another considered 11T topology, i.e., D2p11T cell, Proposed cell consumes 13.11% lesser area. Process variation tolerance with Monte Carlo simulation for read current and read power has been investigated using Cadence virtuoso tool with GPDK 45-nm technology.

A 32 nm Read Disturb-free 11T SRAM Cell with Improved Write Ability

2019 ◽  
Vol 29 (05) ◽  
pp. 2050067
Author(s):  
S. R. Mansore ◽  
R. S. Gamad ◽  
D. K. Mishra
Keyword(s):  
High Performance ◽  
Model Simulation ◽  
Random Access ◽  
Leakage Power ◽  
Access Memory ◽  
Static Noise Margin ◽  
Noise Margin ◽  
Sram Cell ◽  
Operation Characteristics ◽  
Static Noise

Data stability, write ability and leakage power are major concerns in submicron static random access memory (SRAM) cell design. This paper presents an 11T SRAM cell with differential write and single-ended read. Proposed cell offers improved write ability by interrupting its ground connection during write operation. Separate read buffer provides disturb-free read operation. Characteristics are obtained from HSPICE simulation using 32[Formula: see text]nm high-performance predictive technology model. Simulation results show that the proposed cell achieves 4.5[Formula: see text] and 1.06[Formula: see text] higher read static noise margin (RSNM) as compared to conventional 6T (C6T) and PNN-based 10T cells, respectively, at 0.4[Formula: see text]V. Write static noise margin (WSNM) of the proposed design is 1.65[Formula: see text], 1.71[Formula: see text] and 1.77[Formula: see text] larger as compared to those of C6T, PPN-based 10T and PNN-based 10T cells, respectively, at 0.4V. Write “1” delay of the proposed cell is 0.108[Formula: see text] and 0.81[Formula: see text] as those of PPN10T and PNN10T cells, respectively. Proposed circuit consumes 1.40[Formula: see text] lesser read power as compared to PPN10T cell at 0.4[Formula: see text]V. Leakage power of the proposed cell is 0.35[Formula: see text] of C6T cell at 0.4[Formula: see text]V. Proposed 11T cell occupies 1.65[Formula: see text] larger area as compared to that of conventional 6T.

scholarly journals A Novel concept on 8-Transistor Dynamic Feedback Control on Static RAM Cell Array

2018 ◽  
Vol 7 (2.20) ◽  
pp. 109
Author(s):  
S Renukarani ◽  
Bhavana Godavarthi ◽  
SK Bia Roshini ◽  
Mohammad Khadir
Keyword(s):  
Dynamic Control ◽  
Random Access ◽  
Memory Cell ◽  
Dynamic Feedback ◽  
Cell Array ◽  
Static Noise Margin ◽  
Noise Margin ◽  
Sram Cell ◽  
Static Ram ◽  
Static Noise

A novel idea of 8-Transistor (8T) static random access memory cell with enhanced information stability, sub threshold operation may be outlined. Those prescribed novel built single-ended for dynamic control 8 transistors static RAM (SRAM) cell enhances the static noise margin (SNM) to grater low energy supply. The suggested 8T takes less read and write power supply compared to 6T. Those suggested 8T need higher static noise margin than that from 6T. The portable microprocessor chips need ultralow energy consuming circuits on use battery to more drawn out span. The power utilization might be minimized utilizing non-conventional gadget structures, new circuit topologies, and upgrading the architecture. Although, voltage scaling require of the operation completed over sub threshold for low power consumption, and there will be an inconvenience from exponential decrease in execution. However, to sub threshold regime, that data stability of SRAM cell might a chance to be a amazing issue and worsens for those scaling from claming MOSFET ought to sub-nanometer engineering technology.  

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