scholarly journals Incorporation of Cd-Doping in SnO2

Crystals ◽  
2020 ◽  
Vol 10 (1) ◽  
pp. 35 ◽  
Author(s):  
J. Schell ◽  
T. T. Dang ◽  
A. W. Carbonari
Keyword(s):  
Annealing Temperature ◽  
Sol Gel ◽  
Local Information ◽  
X Ray ◽  
Angular Correlations ◽  
Cd Doping ◽  
Local Environments ◽  
Time Differential ◽  
Properties Of Materials ◽  
Sno2 Lattice

Tuning the electrical properties of materials by controlling their doping content has been utilized for decades in semiconducting oxides. Here, an atomistic view is successfully employed to obtain local information on the charge distribution and point defects in Cd-doped SnO2. We present a study that uses the time-differential perturbed gamma–gamma angular correlations (TDPAC) method in samples prepared by using a sol–gel approach. The hyperfine field parameters are presented as functions of the annealing temperature in pellet samples to show the evolution of incorporating Cd dopants into the crystal lattice. Additionally, the system was characterized with X-ray fluorescence, electron dispersive spectroscopy, and scanning electron microscopy after the probe nuclei 111In(111Cd) decayed. The TDPAC results reveal that the probe ions were incorporated into two different local environments of the SnO2 lattice at temperatures up to 973 K for cation substitutional sites.

Effect of Annealing temperature on the Structural and Magnetic Properties of TbxY3-xFe5O12(x = 0.0, 1.0, 2.0) Thin Films Prepared by Sol-Gel Process

2012 ◽  
Vol 501 ◽  
pp. 236-241 ◽  
Author(s):  
Ftema W. Aldbea ◽  
Noor Bahyah Ibrahim ◽  
Mustafa Hj. Abdullah ◽  
Ramadan E. Shaiboub
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Room Temperature ◽  
Annealing Temperature ◽  
Sol Gel ◽  
Vibrating Sample Magnetometer ◽  
X Ray ◽  
Garnet Phase ◽  
Sol Gel Process ◽  
Amorphous Structures

Thin films nanoparticles TbxY3-xFe5O12 (x=0.0, 1.0, 2.0) were prepared by the sol-gel process followed by annealing process at various annealing temperatures of 700° C, 800° C and 900° C in air for 2 h. The results obtained from X-ray diffractometer (XRD) show that the films annealed below 900°C exhibit peaks of garnet mixed with small amounts of YFeO3 and Fe2O3. Pure garnet phase has been detected in the films annealed at 900°C. Before annealing the films show amorphous structures. The particles sizes measurement using the field emission scanning electron microscope (FE-SEM) showed that the particles sizes increased as the annealing temperature increased. The magnetic properties were measured at room temperature using the vibrating sample magnetometer (VSM). The saturation magnetization (Ms) of the films also increased with the annealing temperature. However, different behavior of coercivity (Hc) has been observed as the annealing temperature was increased.

Annealing Effects on the Physical and Magnetic Properties of Tb1.5Y1.5Fe5O12 Films Nanoparticles Prepared by Sol-Gel Method

2013 ◽  
Vol 756 ◽  
pp. 91-98 ◽  
Author(s):  
Ftema W. Aldbea ◽  
Noor Bahyah Ibrahim ◽  
Mustafa Hj. Abdullah
Keyword(s):  
Particle Size ◽  
Magnetic Properties ◽  
Annealing Temperature ◽  
Quartz Substrate ◽  
Sol Gel ◽  
Lattice Parameter ◽  
Gel Method ◽  
X Ray ◽  
Sol Gel Method ◽  
Iron Garnet

Terbium –substituted yttrium iron garnet (Tb1.5Y1.5Fe5O12) films nanoparticles were successfully prepared by a sol-gel method. The films were deposited on the quartz substrate using spin coating technique. To study effect of annealing temperature, the annealing process was executed at 700, 800 and 900 °C in air for 2 hours. The X-ray diffraction (XRD) proved that the pure phase of garnet structure was detected for the film annealed at 900 °C. The lattice parameter increased with the increment of annealing temperature and the highest value of 12.35 Å was obtained at 900 °C. Field Emission Scanning Electron Microscope (FE-SEM) results showed that the particle size increased from 43nm to 56nm as annealing temperature increased from 700 to 900°C. The film’s thickness also affected by increasing of annealing temperature and become thin at 900 °C due to densification process occurred at high annealing temperature. The elemental compositions of the Tb1.5Y1.5Fe5O12 film were detected using an Energy Dispersive X-raySpectroscopy (EDX). Magnetic properties at room temperature were measured using a Vibrating Sample Magnetometer (VSM).The saturation magnetization Ms increased with the annealingtemperature and showed a high value of 104emu/cm3, but the coercivity Hc of the film was decreased due to the increment of the particle size. Normal 0 21 false false false MS X-NONE X-NONE MicrosoftInternetExplorer4 Terbium –substituted yttrium iron garnet (Tb1.5Y1.5Fe5O12) films nanoparticles were successfully prepared by a sol-gel method. The films were deposited on the quartz substrate using spin coating technique. To study effect of annealing temperature, the annealing process was executed at 700, 800 and 900°C in air for 2 hours. The X-ray diffraction (XRD) proved that the pure phase of garnet structure was detected for the film annealed at 900 °C. The lattice parameter increased with the increment of annealing temperature and the highest value of 12.35 Å was obtained at 900 °C. Field Emission Scanning Electron Microscope (FE-SEM) results showed that the particle size increased from 43nm to 56nm as annealing temperature increased from 700 to 900 °C. The film’s thickness also affected by increasing of annealing temperature and become thin at 900 °C due to densification process occurred at high annealing temperature. The elemental compositions of the Tb1.5Y1.5Fe5O12 film were detected using an Energy Dispersive X-ray Spectroscopy (EDX). Magnetic properties at room temperature were measured using a Vibrating Sample Magnetometer (VSM).The saturation magnetization Ms increased with the annealing temperature and showed a high value of 104emu/cm3, but the coercivity Hc of the film was decreased due to the increment of the particle size. st1\:*{behavior:url(#ieooui) } /* Style Definitions */ table.MsoNormalTable {mso-style-name:"Table Normal"; mso-tstyle-rowband-size:0; mso-tstyle-colband-size:0; mso-style-noshow:yes; mso-style-priority:99; mso-style-qformat:yes; mso-style-parent:""; mso-padding-alt:0cm 5.4pt 0cm 5.4pt; mso-para-margin:0cm; mso-para-margin-bottom:.0001pt; mso-pagination:widow-orphan; font-size:11.0pt; font-family:"Calibri","sans-serif"; mso-ascii-font-family:Calibri; mso-ascii-theme-font:minor-latin; mso-fareast-font-family:"Times New Roman"; mso-fareast-theme-font:minor-fareast; mso-hansi-font-family:Calibri; mso-hansi-theme-font:minor-latin; mso-bidi-font-family:"Times New Roman"; mso-bidi-theme-font:minor-bidi;}

Synthesis and characterization of MnO2nanowires

2017 ◽  
Vol 31 (02) ◽  
pp. 1750006 ◽  
Author(s):  
Mohammad Hossein Ghorbani ◽  
Abdol Mahmood Davarpanah
Keyword(s):  
Lithium Batteries ◽  
Manganese Oxides ◽  
Room Temperature ◽  
Annealing Temperature ◽  
Sol Gel ◽  
Average Crystallite Size ◽  
X Ray Diffraction ◽  
X Ray ◽  
Xrd Method

Manganese oxides are of more interest to researchers because of their ability as catalysts and lithium batteries. In this research, MnO2nanowires with diameter about 45 nm were synthesized by sol–gel method at room temperature (RT). Effect of increasing the annealing temperature from 400[Formula: see text]C to 600[Formula: see text]C on crystalline structure of nanostructure were studied and average crystallite size was estimated about 22 nm. X-ray Diffraction (XRD) method, Energy-Dispersive X-ray Diffraction (EDXD), Scanning Electron Microscopy (SEM) and Vibrating Sample Magnetometer (VSM) were used to characterize the nanowires of MnO2.

EFFECT OF ANNEALING ON THE PROPERTIES OF VANADIUM PENTOXIDE FILMS PREPARED BY SOL–GEL METHOD

2014 ◽  
Vol 21 (02) ◽  
pp. 1450027 ◽  
Author(s):  
YAQIANG LIU ◽  
XUELIAN DU ◽  
XUEQIN LIU
Keyword(s):  
Vanadium Pentoxide ◽  
Annealing Temperature ◽  
Substrate Surface ◽  
Sol Gel ◽  
Amorphous Structure ◽  
Spectral Transmittance ◽  
X Ray Diffraction ◽  
X Ray ◽  
Tauc Plot ◽  
Silicon Substrate Surface

The vanadium pentoxide ( V 2 O 5) films were obtained by using sol–gel procedure and then were annealed at different temperature in air. The effect of different annealing temperatures on the composition, the microstructure, the surface morphology and the optical properties of the films were characterized by methods such as by X-ray diffraction, Raman spectroscopy, scanning electron microscopy and spectral transmittance. The results revealed that the film annealed at 150°C has amorphous structure and dense with a smooth surface and the films annealed at 300°C and 450°C have a polycrystalline V 2 O 5 structure with preferred growth orientation along (001) planes, the c-axis and perpendicular to the silicon substrate surface. From the spectral transmittance we determined the absorption edge using the Tauc plot. The results indicated that optical bandgap of V 2 O 5 thin films decreased with annealing temperature.

Dielectric Properties of Sol-Gel Derived MgAl2O4 Thin Films

2012 ◽  
Vol 151 ◽  
pp. 314-318
Author(s):  
Ching Fang Tseng ◽  
Cheng Hsing Hsu ◽  
Chun Hung Lai
Keyword(s):  
Thin Films ◽  
Annealing Temperature ◽  
Sol Gel ◽  
Dissipation Factor ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Preheating Temperature ◽  
Surface Morphologies

This paper describes microstructure characteristics of MgAl2O4 thin films were deposited by sol-gel method with various preheating temperatures and annealing temperatures. Particular attention will be paid to the effects of a thermal treatment in air ambient on the physical properties. The annealed films were characterized using X-ray diffraction. The surface morphologies of treatment film were examined by scanning electron microscopy and atomic force microscopy. At a preheating temperature of 300oC and an annealing temperature of 700oC, the MgAl2O4 films with 9 μm thickness possess a dielectric constant of 9 at 1 kHz and a dissipation factor of 0.18 at 1 kHz.

SiO2ZrO2 Thin Films as Low Temperature NO2 and O3 Sensors

2015 ◽  
Vol 1088 ◽  
pp. 81-85 ◽  
Author(s):  
T.N. Myasoedova ◽  
Victor V. Petrov ◽  
Nina K. Plugotarenko ◽  
Dmitriy V. Sergeenko ◽  
Galina Yalovega ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Scanning Electron Microscopy ◽  
Low Temperature ◽  
Annealing Temperature ◽  
Sol Gel ◽  
X Ray Diffraction ◽  
X Ray ◽  
Operating Temperatures ◽  
Scanning Electron

Thin SiO2ZrO2films were prepared, up to 0.2 μm thick, by means of the sol–gel technology and characterized by a Scanning electron microscopy and X-ray diffraction. It is shown the presence of monoclinic, cubic and tetragonal phases of ZrO2in the SiO2matrix. The crystallites sizes depend on the annealing temperature of the film and amount to 35 and 56 nm for the films annealed at 773 and 973 K, respectively. The films resistance is rather sensitive to the presence of NO2and O3impurity in air at lower operating temperatures in the range of 30-60°C.

FABRICATION AND CHARACTERIZATION OF AQUEOUS SOL–GEL-DERIVED LaFeO3 THIN FILMS

2000 ◽  
Vol 14 (22n23) ◽  
pp. 801-808 ◽  
Author(s):  
M. RAJENDRAN ◽  
M. GHANASHYAM KRISHNA ◽  
A. K. BHATTACHARYA
Keyword(s):  
Thin Films ◽  
Single Phase ◽  
Annealing Temperature ◽  
Sol Gel ◽  
Average Particle Size ◽  
Optical Transmittance ◽  
Dip Coating ◽  
Correlation Spectroscopy ◽  
Average Particle ◽  
X Ray

A novel all-inorganic aqueous sol–gel process has been developed to fabricate LaFeO3 thin films by dip-coating. Stable, positively charged colloidal sol particles of hydrous lanthanum ferrite with an average particle size (Z av ) of 7 nm were prepared and coated onto quartz plates under controlled conditions. The sols have been characterized using photon correlation spectroscopy (PCS) for Z av and size distribution. The redispersible gel was characterized by thermogravimetric and differential thermal analysis (TG-DTA) and also by isothermal heating followed by X-ray diffraction to identify the reaction sequence to form LaFeO 3. The sol–gel films as deposited were X-ray amorphous on heating up to 500°C, partially crystalline at 600°C, fully crystalline and single phase at 650°C and above. These films were continuous, polycrystalline, single phase, had uniform thickness in the range between 180 to 1000 nm, depending on deposition conditions, and showed about 80% optical transmittance. The optical band gap varied from 2.7 to 3.3 eV as a function of the annealing temperature. The refractive index increased with increase in annealing temperature from 1.55 at 500°C to 1.86 at 800°C.

Synthesis and Characterization of SiO2@Y2MoO6:Eu3+ Core–Shell Structured Spherical Phosphors by Sol–Gel Process

2016 ◽  
Vol 16 (4) ◽  
pp. 3914-3920 ◽  
Author(s):  
G. Z Li ◽  
F. H Liu ◽  
Z. S Chu ◽  
D. M Wu ◽  
L. B Yang ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Annealing Temperature ◽  
Uv Light ◽  
Sol Gel ◽  
Spherical Shape ◽  
Core Shell ◽  
X Ray ◽  
Transmission Electron ◽  
Sol Gel Process ◽  
Average Size

SiO2@Y2MoO6:Eu3+ core–shell phosphors were prepared by the sol–gel process. X-ray diffraction (XRD), Fourier transform infrared spectroscopy (FT-IR), field emission scanning electron microscopy (FESEM), energy-dispersive X-ray spectra (EDS), transmission electron microscopy (TEM), photoluminescence (PL) spectra as well as kinetic decays were used to characterize the resulting SiO2@Y2MoO6:Eu3+ core–shell phosphors. The XRD results demonstrated that the Y2MoO6:Eu3+ layers on the SiO2 spheres crystallized after being annealed at 700 °C and the crystallinity increased with raising the annealing temperature. The obtained core–shell phosphors have spherical shape with narrow size distribution (average size ca. 640 nm), non-agglomeration, and smooth surface. The thickness of the Y2MoO6:Eu3+ shells on the SiO2 cores could be easily tailored by varying the number of deposition cycles (70 nm for four deposition cycles). The Eu3+ shows a strong PL emission (dominated by 5D0–7F2 red emission at 614 nm) under the excitation of 347 nm UV light. The PL intensity of Eu3+ increases with increasing the annealing temperature and the number of coating cycles.

THE INVESTIGATION ON STABILITY AND STRUCTURAL PROPERTIES OF COHESION-BASED NANOSTRUCTURES MATERIAL

2013 ◽  
Vol 27 (27) ◽  
pp. 1350153 ◽  
Author(s):  
ALI BAHARI ◽  
REZA GHOLIPUR ◽  
MARYAM DERAKHSHI
Keyword(s):  
Annealing Temperature ◽  
Sol Gel ◽  
Growth Mode ◽  
X Ray Diffraction ◽  
Low Temperature Synthesis ◽  
Temperature Synthesis ◽  
X Ray ◽  
Annealing Temperatures ◽  
Atomic Force ◽  
Transmission Electron

Styrene-doped ZrLaO y nanostructures were obtained by sol–gel method low-temperature synthesis. The nanostructures were characterized by X-ray diffraction (XRD), scanning electron microscope (SEM), atomic force microscope (AFM) and transmission electron microscopy (TEM) techniques. The observation using SEM and TEM revealed that the ring-shaped nanostructures were very uniform. Further characterization using XRD disclosed that the cohesion of the samples was controllable with annealing temperatures in the range of 800–1500°C. Cohesion property was investigated for the samples. The cohesion increased when increasing the annealing temperature. This was linked to the reinforcement of the oxygen bound on the ZrLaO y nanostructures The shape of nanostructures showed a transformation from a ring-shaped growth mode to a hole-surfaced growth mode with increasing annealing temperature. The styrene-doped ZrLaO y nanostructures with controllable crystallinity will have great potential for various applications in fuel, cells, batteries, electronics devices and chemical sensors.

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