scholarly journals Grain-Scale Anisotropic Analysis of Steady-State Creep in Oligocrystalline SAC Solder Joints

Materials ◽  
2021 ◽  
Vol 14 (20) ◽  
pp. 5973
Author(s):  
Qian Jiang ◽  
Abhishek Nitin Deshpande ◽  
Abhijit Dasgupta

Heterogeneous integration is leading to unprecedented miniaturization of solder joints, often with thousands of joints within a single package. The thermomechanical behavior of such SAC solder joints is critically important to assembly performance and reliability, but can be difficult to predict due to the significant joint-to-joint variability caused by the stochastic variability of the arrangement of a few highly-anisotropic grains in each joint. This study relies on grain-scale testing to characterize the mechanical behavior of such oligocrystalline solder joints, while a grain-scale modeling approach has been developed to assess the effect of microstructure that lacks statistical homogeneity. The contribution of the grain boundaries is modeled with isotropic cohesive elements and identified by an inverse iterative method that extracts material properties by comparing simulation with experimental measurements. The properties are extracted from the results of one test and validated by verifying reasonable agreement with test results from a different specimen. Equivalent creep strain heterogeneity within the same specimen and between different specimens are compared to assess typical variability due to the variability of microstructure.

Author(s):  
Md Hasnine ◽  
Jeffrey C. Suhling ◽  
Barton C. Prorok ◽  
Michael J. Bozack ◽  
Pradeep Lall

In the current study, we have extended our previous work on nanoindentation of joints to examine a full test matrix of SAC solder alloys. The effects of silver content on SAC solder aging has been evaluated by testing joints from SACN05 (SAC105, SAC205, SAC305, and SAC405) test boards assembled with the same reflow profile. In all cases, the tested joints were extracted from 14 × 14 mm PBGA assemblies (0.8 mm ball pitch, 0.46 mm ball diameter) that are part of the iNEMI Characterization of Pb-Free Alloy Alternatives Project (16 different solder joint alloys available). After extraction, the joints were subjected to various aging conditions (0 to 12 months of aging at T = 125 C), and then tested via nanoindentation techniques to evaluate the stress-strain and creep behavior of the four aged SAC solder alloy materials at the joint scale. The observed aging effects in the SACN05 solder joints have been quantified and correlated with the magnitudes observed in tensile testing of miniature bulk specimens performed in prior studies. The results show that the aging induced degradations of the mechanical properties (modulus, hardness) in the SAC joints were of similar order (30–40%) as those seen previously in the testing of larger “bulk” uniaxial solder specimens. The creep rates of the various tested SACN05 joints were found to increase by 8–50X due to aging. These degradations, while significant, were much less than those observed in larger bulk solder uniaxial tensile specimens with several hundred grains, where the increases ranged from 200X to 10000X for the various SACN05 alloys. Additional testing has been performed on very small tensile specimens with approximately 10 grains, and the aging-induced creep rate degradations found in these specimens were on the same order of magnitude as those observed in the single grain joints. Thus, the lack of the grain boundary sliding creep mechanism in the single grain joints is an important factor in avoiding the extremely large creep rate degradations (up to 10,000X) occurring in larger bulk SAC samples. All of the aging effects observed in the SACN05 joints were found to be exacerbated as the silver content in the alloy was reduced. In addition, the test results for all of the alloys show that the elastic, plastic, and creep properties of the solder joints and their sensitivities to aging are highly dependent on the crystal orientation. Due to the variety of crystal orientations realized during solidification, it was important to identify the grain structure and crystal orientations in the tested joints. Cross-polarized light microscopy and Electron Back Scattered Diffraction (EBSD) techniques have been utilized for this purpose. The test results show that the elastic, plastic, and creep properties of the solder joints and their sensitivities to aging are highly dependent on the crystal orientation. In addition, an approach has been developed to predict tensile creep strain rates for low stress levels using nanoindentation creep data measured at very high compressive stress levels.


2018 ◽  
Vol 15 (4) ◽  
pp. 148-162 ◽  
Author(s):  
John Lau ◽  
Ming Li ◽  
Yang Lei ◽  
Margie Li ◽  
Iris Xu ◽  
...  

Abstract In this study, the reliability (thermal cycling and shock) performances of a fan-out wafer-level system-in-package (SiP) or heterogeneous integration with one large chip (5 × 5 mm), three small chips (3 ×3 mm), and four capacitors (0402) embedded in an epoxy molding compound package (10 × 10 mm) with two redistribution layers (RDLs) are experimentally determined. Emphasis is placed on the estimation of the Weibull life distribution, characteristic life, and failure rate of the solder joint and RDL of this package. The fan-out wafer-level packaging is assembled on a printed circuit board (PCB) with more than 400 (Sn3wt%Ag0.5wt%Cu) solder joints. It is a six-layer PCB. The sample sizes for the thermal cycling test and shock test are, respectively, equal to 60 and 24. The failure location and modes of the thermal cycling test and shock test of the fan-out wafer-level SiP solder joints and RDLs are provided and discussed. 3-D nonlinear finite element models are also constructed and analyzed for the fan-out heterogeneous integration package during thermal cycling and shock conditions. The simulation results are correlated to the experimental results. Finally, recommendations on improving the fan-out wafer-level SiP solder joints and RDLs under thermal and shock conditions are provided.


2013 ◽  
Vol 25 (4) ◽  
pp. 195-208 ◽  
Author(s):  
Krystyna Bukat ◽  
Janusz Sitek ◽  
Marek Koscielski ◽  
Wojciech Niedzwiedz ◽  
Anna Mlozniak ◽  
...  

2013 ◽  
Vol 53 (5) ◽  
pp. 741-747 ◽  
Author(s):  
Shoho Ishikawa ◽  
Hironori Tohmyoh ◽  
Satoshi Watanabe ◽  
Tomonori Nishimura ◽  
Yoshikatsu Nakano

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