Effect of the Y2O3 Addition Content on the Structural Properties of ZrO2 Thin Films and Coating Material

2012 ◽  
Vol 443-444 ◽  
pp. 655-659
Author(s):  
Shi Gang Wu ◽  
Hong Ying Zhang ◽  
Jian Da Shao ◽  
Zheng Xiu Fan
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Bulk Material ◽  
Xrd Analysis ◽  
Electron Beam Evaporation ◽  
Coating Material ◽  
Cubic Phase ◽  
Crystallographic Structure ◽  
X Ray Diffraction ◽  
Mole Percent

The influence of addition of Y2O3on the structure of ZrO2thin films and bulk material was studied employing X-ray diffraction (XRD) analysis. The films were prepared by the electron-beam evaporation method. XRD analysis permits the study of the stabilization process. For pure ZrO2thin film and coating material, the crystallographic structure is monoclinic phase; with increasing Y2O3mole percent, the structure of Y2O3stabilized ZrO2(YSZ) material changes from a mixture of monoclinic and cubic phase to a single cubic phase. Furthermore, calculated results of grain size show that YSZ thin film and coating material have the same crystallization trend.

Microstructure and Magnetic Properties of CoFeHfO Rich Nanocrystalline Thin Films Application for High Frequency

2007 ◽  
Vol 558-559 ◽  
pp. 975-978
Author(s):  
L.V. Tho ◽  
K.E. Lee ◽  
Cheol Gi Kim ◽  
Chong Oh Kim ◽  
W.S. Cho
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Magnetic Properties ◽  
Rf Sputtering ◽  
Xrd Analysis ◽  
X Ray Diffraction ◽  
Soft Magnetic ◽  
Electrical And Magnetic Properties ◽  
Transmission Electron ◽  
Nanocrystalline Thin Films

Nanocrystalline CoFeHfO thin films have been fabricated by RF sputtering method. Co52Fe23Hf10O15 thin film is observed, exhibit good magnetic properties with magnetic coercivity (Hc) of 0.18 Oe; anisotropy fild (Hk) of 49 Oe; saturation magnetization (4лMs) of 21 kG, and electrical resistivity (ρ) of 300 01cm. The frequency response of permeability of the film is excellent. The effect of microstructure on the electrical and magnetic properties of thin film was studied using X-ray diffraction (XRD) analysis and conventional transmission electron microscopy (TEM). The results showed that excellent soft magnetic properties were associated with granular nannoscale grains of α-CoFe and α-Co(Fe) phases.

scholarly journals Optical and Structural Investigation of CdSe Quantum Dots Dispersed in PVA Matrix and Photovoltaic Applications

2013 ◽  
Vol 2013 ◽  
pp. 1-6 ◽  
Author(s):  
Pallabi Phukan ◽  
Dulen Saikia
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Quantum Dots ◽  
Hexagonal Wurtzite Structure ◽  
Xrd Analysis ◽  
Cdse Quantum Dots ◽  
X Ray Diffraction ◽  
Morphological Studies ◽  
Transmission Electron ◽  
Particle Size Determination

CdSe quantum dots (QDs) dispersed in polyvinyl alcohol (PVA) matrix with their sizes within the quantum dot regime have been synthesized via a simple heat induced thermolysis technique. The effect of the concentrations of the cadmium source on the optical properties of CdSe/PVA thin films was investigated through UV-Vis absorption spectroscopy. The structural analysis and particle size determination as well as morphological studies of the CdSe/PVA nanocomposite thin films were done with the help of X-ray diffraction (XRD) and transmission electron microscopy (TEM). The XRD analysis reveals that CdSe/PVA nanocomposite thin film has a hexagonal (wurtzite) structure. A prototype thin film solar cell of CdSe/CdTe has been synthesized and its photovoltaic parameters were measured.

Photocatalytic Activity of Bilayer TiO2/ZnO and ZnO TiO2 Thin Films

2020 ◽  
Vol 1010 ◽  
pp. 411-417
Author(s):  
Rosniza Hussin ◽  
Nur Syahraain Zulkiflee ◽  
Zakiah Kamdi ◽  
Ainun Rahmahwati Ainuddin ◽  
Zawati Harun ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Photocatalytic Activity ◽  
Reaction Rate ◽  
Electronic Devices ◽  
Xrd Analysis ◽  
Optical Coatings ◽  
X Ray Diffraction ◽  
X Ray ◽  
Zno Crystal

Thin film is a thin material that is resulting from the condensation of species through the deposition of atoms on the substrate. Thin films are usually used in the production of electronic devices, optical coatings, solar cells, and for decorative items. The bilayer of TiO2/ZnO and ZnO TiO2 thin films have some advantages such as can enhance the surface state and surface atomic mobility, which are useful for improving the photocatalytic activity. The motivation to a used double layer of ZnO and TiO2 is to enhance the properties and photocatalytic activity using the different deposition temperature between the layers. The structural of ZnO/TiO2 thin films were studied using X-Ray diffraction (XRD). Field Emission Scanning Electron Microscope (FESEM) was used to determine the surface morphology of ZnO/TiO2 thin films. The photocatalytic activity of ZnO/TiO2 thin films was analysed using the photodegradation of methylene blue (MB) solution. The XRD analysis revealed that highest anatase crystalline phase for TiO2 growth with orientation (1 0 1), while the ZnO crystal phase, zincite occurred at the highest intensity with (1 0 1) orientation.. The bilayer TiO2/ZnO thin film had the highest reaction rate, K, which is 0.0972 h-1 for photocatalytic activity. The characteristics of bilayer TiO2/ZnO and ZnO/TiO2 thin-film is strongly influenced by the calcination temperature and the presence and combination between the two types of materials.

Solid acetone structure dependence on pressure: a new fibre textured thin film crystallographic structure studied by grazing-incidence X-ray diffraction

CrystEngComm ◽  
2016 ◽  
Vol 18 (42) ◽  
pp. 8220-8228
Author(s):  
P. Ferrer ◽  
I. da Silva ◽  
I. Puente-Orench
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Grazing Incidence ◽  
Vapour Phase ◽  
Crystallographic Structure ◽  
X Ray Diffraction ◽  
Structure Dependence ◽  
X Ray

Acetone thin films were crystallized directly from its vapour phase under UHV conditions at 120 K on two different substrates and studied them using GI-XRD.

Synthesis and Properties of SnS Thin Films by Chemical Bath Deposition

2012 ◽  
Vol 509 ◽  
pp. 333-338 ◽  
Author(s):  
Dong Lin Xia ◽  
Jun Xu ◽  
Wen Qing Shi ◽  
Pan Lei ◽  
Xiu Jian Zhao
Keyword(s):  
Thin Films ◽  
Chemical Bath Deposition ◽  
Precursor Solution ◽  
Xrd Analysis ◽  
Crystallographic Structure ◽  
X Ray Diffraction ◽  
Buffer Solution ◽  
Chloride Dihydrate ◽  
Structure Morphology ◽  
Sns Thin Films

Tin sulphide (SnS) thin films have been deposited on glass substrate by chemical bath deposition. The precursor solution was prepared from tin (II) chloride dihydrate, thioacetamide. Triethanolamine, ammonia and ammonium chloride were used as complexant, solvent and buffer solution, respectively. The crystallographic structure, morphology and optical properties were characterized by X-ray diffraction (XRD), scanning electron microscopy and UV-Vis spectrophotometer. XRD analysis shows that SnS thin films were polycrystalline and had orthorhombic structure, and SEM micrographs reveal that SnS thin films were densely packed surface coverage and consists of large flowerlike grains. SnS thin films with the optical bandgap of 1.3 eV were achieved at 300 °C.

Stress and elastic-constant analysis by X-ray diffraction in thin films

2003 ◽  
Vol 36 (3) ◽  
pp. 869-879 ◽  
Author(s):  
F. Badawi ◽  
P. Villain
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Residual Stresses ◽  
Elastic Constants ◽  
Thermal Stresses ◽  
Bulk Material ◽  
Poisson Ratio ◽  
Young Modulus ◽  
X Ray Diffraction ◽  
X Ray

Residual stresses influence most physical properties of thin films and are closely related to their microstructure. Among the most widely used methods, X-ray diffraction is the only one allowing the determination of both the mechanical and microstructural state of each diffracting phase. Diffracting planes are used as a strain gauge to measure elastic strains in one or several directions of the diffraction vector. Important information on the thin-film microstructure may also be extracted from the width of the diffraction peaks: in particular, the deconvolution of these peaks allows values of coherently diffracting domain size and microdistortions to be obtained. The genesis of residual stresses in thin films results from multiple mechanisms. Stresses may be divided into three major types: epitaxic stresses, thermal stresses and intrinsic stresses. Diffraction methods require the knowledge of the thin-film elastic constants, which may differ from the bulk-material values as a result of the particular microstructure. Combining an X-ray diffractometer with a tensile tester, it is possible to determine X-ray elastic constants of each diffracting phase in a thin-film/substrate system, in particular the Poisson ratio and the Young modulus. It is important to notice that numerous difficulties relative to the application of diffraction methods may arise in the case of thin films.

Microraman Spectroscopy and X-Ray Diffraction Studies of Ti-W-O Thin Films

1996 ◽  
Vol 441 ◽  
Author(s):  
Luigi Sangaletti ◽  
Elza Bontempi ◽  
Laura E. Depero ◽  
P. Galinetto ◽  
Silvio Groppelli ◽  
...  
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Thin Films ◽  
Scanning Electron Microscopy ◽  
Cubic Phase ◽  
X Ray Diffraction ◽  
X Ray ◽  
Different Temperatures ◽  
Microraman Spectroscopy ◽  
Scanning Electron

AbstractThin films of the Ti-W-O system grown by r.f. reactive sputtering from a Ti-W (10%–90% weight) target have been studied by Raman and microraman spectroscopy, X-ray diffraction and scanning electron microscopy with the aim to investigate their microstructural and morphological properties. To this purpose, the kinetics of structural transformations at different temperatures (600 °C, and 800 °C) have been studied, and the effect of Ti on the WO3 lattice has been singled out. The results show that annealing at different temperatures induces a microstructural evolution from the amorphous phase of the as-deposited thin film to WO3 crystalline phases via an intermediate cubic disordered phase of WO3. The effect of Ti on this cubic phase and on the thin film morphology is also investigated with the aid of microraman and scanning electron microscopy analysis. The results show that two distinct phases arise upon long annealing treatments; namely, small crystallites belonging to the WO3 monoclinic phase are dispersed on a layer composed of a disordered cubic WO3 phase with a high Ti content.

Palladium Nanowire Thin Films via Template Growth

2003 ◽  
Vol 775 ◽  
Author(s):  
Donghai Wang ◽  
David T. Johnson ◽  
Byron F. McCaughey ◽  
J. Eric Hampsey ◽  
Jibao He ◽  
...  
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Thin Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Conductive Substrate ◽  
Palladium Nanowires ◽  
Efficient Route ◽  
Silica Thin Film

AbstractPalladium nanowires have been electrodeposited into mesoporous silica thin film templates. Palladium continually grows and fills silica mesopores starting from a bottom conductive substrate, providing a ready and efficient route to fabricate a macroscopic palladium nanowire thin films for potentially use in fuel cells, electrodes, sensors, and other applications. X-ray diffraction (XRD) and transmission electron microscopy (TEM) indicate it is possible to create different nanowire morphology such as bundles and swirling mesostructure based on the template pore structure.

scholarly journals High Pressure X-ray Diffraction as a Tool for Designing Doped Ceria Thin Films Electrolytes

Coatings ◽  
2021 ◽  
Vol 11 (6) ◽  
pp. 724
Author(s):  
Sara Massardo ◽  
Alessandro Cingolani ◽  
Cristina Artini
Keyword(s):  
Thin Films ◽  
High Pressure ◽  
Rare Earth ◽  
Ionic Conductivity ◽  
Bulk Material ◽  
Threshold Temperature ◽  
Doped Ceria ◽  
X Ray Diffraction ◽  
X Ray ◽  
Rare Earth Doped

Rare earth-doped ceria thin films are currently thoroughly studied to be used in miniaturized solid oxide cells, memristive devices and gas sensors. The employment in such different application fields derives from the most remarkable property of this material, namely ionic conductivity, occurring through the mobility of oxygen ions above a certain threshold temperature. This feature is in turn limited by the association of defects, which hinders the movement of ions through the lattice. In addition to these issues, ionic conductivity in thin films is dominated by the presence of the film/substrate interface, where a strain can arise as a consequence of lattice mismatch. A tensile strain, in particular, when not released through the occurrence of dislocations, enhances ionic conduction through the reduction of activation energy. Within this complex framework, high pressure X-ray diffraction investigations performed on the bulk material are of great help in estimating the bulk modulus of the material, and hence its compressibility, namely its tolerance toward the application of a compressive/tensile stress. In this review, an overview is given about the correlation between structure and transport properties in rare earth-doped ceria films, and the role of high pressure X-ray diffraction studies in the selection of the most proper compositions for the design of thin films.

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