Optical and Mechanical Properties of Silver Film on Glass Substrate

2010 ◽  
Vol 97-101 ◽  
pp. 1412-1415 ◽  
Author(s):  
Shiuh Chuan Her ◽  
Yi Hsia Wang
Keyword(s):  
Thin Film ◽  
Glass Substrate ◽  
Silver Film ◽  
Wavelength Region ◽  
Surface Topology ◽  
Silver Films ◽  
Atomic Force ◽  
Environmental Test ◽  
Optical And Mechanical Properties ◽  
Measured Hardness

Silver films were prepared on the glass substrate by electron-beam vapor deposition. The reflectivity of the Ag thin film was measured by a Perkin-Elmer Lambda spectrophotometer in the wavelength region of 450-680 nm. The experimental measurements of reflectivity were validated with the numerical results using the Essential Macleod software. The surface topology and microstructure of the film were examined by means of atomic force microscope (AFM). The effects of the thermal and humidity on the reflectivity of the Ag film were examined by the environmental test. Nanoindentation tests were employed to determine the hardness of the film. The measured hardness of the Ag thin film was found to depend on the penetration depth.

Optical and Mechanical Properties of Aluminum Film Deposited on Glass Substrate

2010 ◽  
Vol 297-301 ◽  
pp. 444-449 ◽  
Author(s):  
Shiuh Chuan Her ◽  
Yi Hsia Wang
Keyword(s):  
Wavelength Region ◽  
Aluminum Film ◽  
Surface Topology ◽  
Aluminum Films ◽  
Glass Substrates ◽  
Atomic Force ◽  
Environmental Test ◽  
Optical Applications ◽  
Optical And Mechanical Properties ◽  
Al Thin Film

The aluminum film with high reflectivity and low absorption in the visible wavelength region has been widely used in optical applications. In this investigation, aluminum films were prepared on glass substrates by electron-beam vapor deposition. The reflectivity of the Al thin film was measured by a Perkin-Elmer Lambda spectrophotometer in the wavelength region of 450-680 nm. The experimental measurements of reflectivity were validated with the numerical results using the Essential Macleod software. The surface topology and microstructure of the film were examined by means of atomic force microscope (AFM). The effects of the temperature and humidity on the reflectivity of the Al film were examined by the environmental test. Nanoindentation tests were employed to determine the hardness and Young’s modulus of the film. The measured hardness of the Al thin films were found to depend on the penetration depth.

Production of Transparent Heat Windows of TiO2/Ag/TiO2, and Investigation of their Nanostructures

2011 ◽  
Vol 110-116 ◽  
pp. 3856-3859
Author(s):  
Mohammad Reza Behforooz ◽  
Haleh Kangarloo
Keyword(s):  
Atomic Force Microscope ◽  
Glass Substrate ◽  
Silver Film ◽  
High Vacuum ◽  
Vertical Deposition ◽  
Spectrophotometric Methods ◽  
Atomic Force ◽  
Least Energy ◽  
Deposition Angle ◽  
Deposition Conditions

Using the resistive heated method, TiO2/Ag/TiO2thin files (Transparent heat windows) in vertical deposition angle were deposited on SiO2substrate, in high vacuum (HV) condition and 100°c. The thickness of TiO2on glass substrate was 50°A, Silver film 125°A and 225°A and the upper layer TiO2with 115°A. All other deposition conditions were same for both samples .Atomic force microscope (AFM), and spectrophotometric methods were used to study the nanostructures of these samples in the range of FTIR. The purpose of this work is to find and produce the structure with the least energy waste.

Characteristics of Silver Films Deposited on the Surface of PET Fabric

2011 ◽  
Vol 239-242 ◽  
pp. 2356-2360 ◽  
Author(s):  
Ling Ling Meng ◽  
Xin Min Huang ◽  
Qu Fu Wei
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Room Temperature ◽  
Woven Fabric ◽  
Silver Films ◽  
Pet Fabric ◽  
Technical Parameters ◽  
Atomic Force ◽  
Sputtering Power ◽  
Silver Thin Film

PET(polyester) plain woven fabric deposited with nano-structured silver thin film was prepared by RF (radio frequency) magnetron sputtering at room temperature. The effect of different sputtering technical parameters on the morphology and particle diameters of the nano-structured silver thin film was characterized by AFM(atomic force microscope)and the conductivities of silver thin films were also analyzed under different sputtering technical parameters. The results indicated that the nanoparticles size of sliver thin films increased with higher sputtering power, the conductivity of sliver thin films was first decreased and then markedly enhanced; The nanoparticles size of sliver thin films decreased with higher gas pressure, the conductivity was markedly decreased; The nanoparticles size of sliver thin films increased with longer sputtering time, the conductivity was markedly enhanced, The best conductivity was achieved at the sputtering time of 15min.

scholarly journals HiPIMS and DC Magnetron Sputter-Coated Silver Films for High-Temperature Durable Reflectors

Coatings ◽  
2019 ◽  
Vol 9 (10) ◽  
pp. 593 ◽  
Author(s):  
Gledhill ◽  
Steyer ◽  
Weiss ◽  
Hildebrandt
Keyword(s):  
Thin Film ◽  
High Temperature ◽  
Magnetron Sputtering ◽  
Power Density ◽  
Power Plants ◽  
Silver Film ◽  
Thermal Power ◽  
Average Power ◽  
Film System ◽  
Silver Films

High-temperature durable mirrors based on a protected silver sputter coating are attractive for secondary reflector applications in concentrated solar thermal power plants. In this paper, silver films are deposited by high-power impulse magnetron sputtering (HiPIMS) and standard direct current (DC) magnetron sputtering, either as exposed discretely deposited films or in-sequence-deposited thin film systems, where the silver is protected and embedded between adhesion and barrier layers. The unprotected silver films and equivalent protected silver thin film systems are compared and characterized as deposited and after 400 °C oven temperature exposure. The reflectance is measured and grazing incident X-ray diffraction (GIXRD) and scanning electron microscopy (SEM) pictures were taken. The HiPIMS silver film, sputtered with a peak current of 200 A and an approximately equivalent average power density to the DC magnetron sputtered silver, exhibits higher reflectance (and conductivity). Increasing the power density further, yields silver films with lower reflectance, correlating to a reduced grain size. In the protected silver film system, the reflectance does not improve, due to the presence of a less reflective top adhesion layer. The protected film system, with the 200 A HiPIMS, is, however, more durable at 400 °C than the DC magnetron sputtered equivalent.

scholarly journals Non-perpendicular incidence angle of cold atmospheric-pressure plasma treatment for fabrication of silver-based surface plasmon resonance biosensor for detection of Escherichia coli in water

2021 ◽  
Author(s):  
Maryam Hosseinpour ◽  
Akbar Zendehnam ◽  
Seyedeh Mehri Hamidi Sangdehi ◽  
Hamidreza Ghomi Marzdashti
Keyword(s):  
Thin Film ◽  
Escherichia Coli ◽  
Glass Substrate ◽  
Silver Film ◽  
Incidence Angle ◽  
Film Surface ◽  
Distilled Water ◽  
Spr Biosensor ◽  
Silver Thin Film ◽  
Perpendicular Incidence

Abstract In this study, for the first time, to our knowledge, a biosensor was produced using cold atmospheric plasma (CAP) treatment of silver thin film surface with non-perpendicular incidence angle for identification of Escherichia coli in the distilled water. Field emission scanning electron microscopy (FESEM) exhibits that before deposition, non-perpendicular CAP treatment of glass surface substrate leads to the production of pinhole-free silver thin film. The results of atomic force microscopy (AFM), and curve fitting show that non-perpendicular CAP treatment of this pinhole-free silver thin film indicates to the appearance of Ag NPs with smaller size and larger surface area compared to untreated silver film deposited on the untreated glass substrate. The silver-based pinhole-free SPR biosensor produced with non-perpendicular CAP treatment of both glass substrate and silver film shows E. coli detection in the distilled water in the range of 104 Colony forming unit (CFU/ml) to 108 CFU/ml with better sensitivity compared to the untreated silver-based SPR biosensor.

A New Scanning Thermal Microprobe

1997 ◽  
Vol 503 ◽  
Author(s):  
Yongxia Zhang ◽  
Yanwei Zhang ◽  
Juliana Blaser ◽  
T. S. Sriiram ◽  
R. B. Marcus
Keyword(s):  
Thin Film ◽  
High Resolution ◽  
Thermal Response ◽  
Temperature Sensing ◽  
Thermal Sensor ◽  
Atomic Force ◽  
Thin Film Thermocouple ◽  
Processing Steps ◽  
Thermocouple Junction

ABSTRACTA thermal microprobe has been designed and built for high resolution temperature sensing. The thermal sensor is a thin-film thermocouple junction at the tip of an Atomic Force Microprobe (AFM) silicon probe needle. Only wafer-stage processing steps are used for the fabrication. The thermal response over the range 25–s 4.5–rovolts per degree C and is linear.

Optical Properties of Sputtered Silver Granular Films

2005 ◽  
Vol 480-481 ◽  
pp. 287-292 ◽  
Author(s):  
S.E. Paje ◽  
F. Teran ◽  
J.M. Riveiro ◽  
J. Llopis ◽  
M.A. García ◽  
...  
Keyword(s):  
Silver Nanoparticles ◽  
Optical Properties ◽  
Optical Absorption ◽  
Surface Morphology ◽  
Silver Clusters ◽  
Plasmon Excitation ◽  
Granular Films ◽  
Silver Films ◽  
Atomic Force ◽  
Atomic Force Micrographs

In this research we study optical absorption and morphology of silver films prepared with a sputtering method. Silver granular films are obtained on a glass substrate for films with thickness smaller than about 60 Å. Superficial silver clusters of around 100 nm in diameter are clearly seen in the atomic force micrographs. The absorption of these samples are characterized by plasmon excitation in the 450-650 nm spectral range, which differs from the known excitation of silver nanoparticles fabricated by different techniques. The optical absorption of silver granular films depend on sputtering conditions like substrate temperature or deposition rate and correlates with the surface morphology.

Sign in / Sign up

Export Citation Format

Share Document