The Study of Surface Energy, Electrical Properties and Platelet Adhesion Behavior of a-C/a-CN Films Synthesized by PIII-D

2007 ◽  
Vol 330-332 ◽  
pp. 573-576
Author(s):  
Feng Wen ◽  
Nan Huang ◽  
Hong Sun ◽  
An Sha Zhao ◽  
Jin Wang ◽  
...  

Amorphous carbon (a-C) and carbon nitrogen (a-CN) films were synthesized using plasma immersion ion implantation and deposition (PIII-D) under different N2 flow at room temperature (R.T.). Lifshitz-van der Waals/acid-base approach (LW-AB) was introduced in order to study films’ surface energy deeply. The results showed that the capability of the surface of the film on receive electron changed with N2 flow, which effected platelet adhesion of film strongly. Hall effects tests were employed to characterize the electrical properties of the films. The results showed that the as-deposited films exhibited n-type semiconductor characteristic, and carrier concentration of the films decreased with N2 flow increasing. Raman spectra with 514nm laser-source were employed to analyze the structural of the films.

Author(s):  
Mumtaz A. Dinno ◽  
Manuel Schwartz ◽  
Beverly Giammara

Capers and White made an extensive study of the growth of tellurium thin films deposited on different substrate materials but did not measure the electrical properties of the deposited films. Berryman studied the effects of film thickness, deposition rate, and substrate temperature on the electrical properties but there is no evidence that these results were correlated with structural studies. Dutton presented a method for growing large grains using a gold monolayer as nucleation sites and for these special films related electron transport properties with structure. The present study undertakes the determination of conductivity over a range of thicknesses extending from 350 Å to 2800 Å on a substrate initially at room temperature, for both annealed and nonannealed films. In addition, some work was done with quenched and heated substrates at 700 Å thickness.


2019 ◽  
Vol 11 (43) ◽  
pp. 40260-40266
Author(s):  
Kentaro Nakamura ◽  
Tsunaki Takahashi ◽  
Takuro Hosomi ◽  
Takehito Seki ◽  
Masaki Kanai ◽  
...  

2020 ◽  
Author(s):  
N. Sasidhar ◽  
T. Chandrashekar ◽  
B. Chethan ◽  
Y. T. Ravikiran ◽  
R. Megha

2016 ◽  
Author(s):  
Eka Nurfani ◽  
Angga Virdian ◽  
Robi Kurniawan ◽  
Shibghatullah Muhammady ◽  
Inge M. Sutjahja ◽  
...  

2011 ◽  
Vol 378-379 ◽  
pp. 663-667 ◽  
Author(s):  
Toempong Phetchakul ◽  
Wittaya Luanatikomkul ◽  
Chana Leepattarapongpan ◽  
E. Chaowicharat ◽  
Putapon Pengpad ◽  
...  

This paper presents the simulation model of Dual Magnetodiode and Dual Schottky Magnetodiode using Sentaurus TCAD to simulate the virtual structure of magneto device and apply Hall Effect to measure magnetic field response of the device. Firstly, we use the program to simulate the magnetodiode with p-type semiconductor and aluminum anode and measure electrical properties and magnetic field sensitivity. Simulation results show that sensitivity of Dual Schottky magnetodiode is higher than that of Dual magnetodiode.


2002 ◽  
Vol 750 ◽  
Author(s):  
Yoshifumi Aoi ◽  
Kojiro Ono ◽  
Kunio Sakurada ◽  
Eiji Kamijo

ABSTRACTAmorphous CNx thin films were deposited by pulsed laser deposition (PLD) combined with a nitrogen rf radical beam source which supplies active nitrogen species to the growing film surface. The deposited films were characterized by X-ray photoelectron spectroscopy (XPS), Raman scattering, and Fourier transform infrared (FTIR) spectroscopy. Nitrogen content of the deposited films increased with increasing rf input power and N2 pressure in the PLD chamber. The maximum N/C ratio 0.23 was obtained at 400 W of rf input power and 1.3 Pa. XPS N 1s spectra shows the existence of several bonding structures in the deposited films. Electrical properties of the deposited films were investigated. The electrical conductivity decreased with increasing N/C atomic ratio. Temperature dependence of electrical conductivity measurements indicated that electronic conduction occurred by variable-range hopping between p electron localized states.


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