Synthesis of Aluminum-Matrix Alloys with Al-Zr-W by Metallothermy of Oxides

2018 ◽  
Vol 284 ◽  
pp. 465-469 ◽  
Author(s):  
V.V. Gostishchev ◽  
E.D. Kim ◽  
Ernst H. Ri
Keyword(s):  
Aluminum Matrix ◽  
Zirconium Alloys ◽  
Melting Process ◽  
Thermal Reduction ◽  
Element Analysis ◽  
Tungsten Oxides ◽  
Furnace Process ◽  
X Ray ◽  
Initial Charge ◽  
Refractory Metal Alloys

The article presents the results of obtaining complex-alloyed aluminum-zirconium alloys by aluminothermy of initial metal oxides. Aluminum-matrix Al-Zr-W alloys have been obtained by a metal-thermal reduction with an excessive amount of aluminum in the initial charge of zirconium and tungsten oxides. The process of synthesis is presented as partial reduction reactions of zirconium, tungsten and synthesis of intermetallic compounds. It is shown that thermodynamic parameters of the reactions are favorable for the process of formation of refractory metal alloys. It is found that the temperature reached during the melting process makes it possible to obtain intermetallids and to synthesize alloys at the out-of-furnace process in the form of a compact ingot. The composition of the alloys obtained has been determined by an X-ray phase and an element analysis. It is established that the alloys have a composite structure: intermetallides Al3Zr and Al4W are distributed in the aluminum matrix.

Computer programs for the calculation of x-ray intensities emitted by elements in multi-layer structures

1990 ◽  
Vol 48 (2) ◽  
pp. 216-217
Author(s):  
G.F. Bastin ◽  
H.J.M. Heijligers ◽  
J.M. Dijkstra
Keyword(s):  
Software Package ◽  
Light Element ◽  
Matrix Correction ◽  
Excellent Performance ◽  
Element Analysis ◽  
X Ray ◽  
Know How ◽  
Accurate Knowledge ◽  
Layer Structures ◽  
Bulk Matrix

For the calculation of X-ray intensities emitted by elements present in multi-layer systems it is vital to have an accurate knowledge of the x-ray ionization vs. mass-depth (ϕ(ρz)) curves as a function of accelerating voltage and atomic number of films and substrate. Once this knowledge is available the way is open to the analysis of thin films in which both the thicknesses as well as the compositions can usually be determined simultaneously.Our bulk matrix correction “PROZA” with its proven excellent performance for a wide variety of applications (e.g., ultra-light element analysis, extremes in accelerating voltage) has been used as the basis for the development of the software package discussed here. The PROZA program is based on our own modifications of the surface-centred Gaussian ϕ(ρz) model, originally introduced by Packwood and Brown. For its extension towards thin film applications it is required to know how the 4 Gaussian parameters α, β, γ and ϕ(o) for each element in each of the films are affected by the film thickness and the presence of other layers and the substrate.

An improved interference correction for trace element analysis

1992 ◽  
Vol 50 (2) ◽  
pp. 1646-1647
Author(s):  
John J. Donovan ◽  
Donald A. Snyder ◽  
Mark L. Rivers
Keyword(s):  
Trace Element Analysis ◽  
Accurate Estimate ◽  
Simple Expression ◽  
Standard Reference Materials ◽  
Characteristic Line ◽  
Analytical Line ◽  
Element Analysis ◽  
Electron Probe Analysis ◽  
Calculated Concentration ◽  
X Ray

We present a simple expression for the quantitative treatment of interference corrections in x-ray analysis. WDS electron probe analysis of standard reference materials illustrate the success of the technique.For the analytical line of wavelength λ of any element A which lies near or on any characteristic line of another element B, the observed x-ray counts at We use to denote x-ray counts excited by element i in matrix j (u=unknown; s=analytical standard; ŝ=interference standard) at the wavelength of the analytical line of A, λA (Fig. 1). Quantitative analysis of A requires an accurate estimate of These counts can be estimated from the ZAF calculated concentration of B in the unknown C,Bu measured counts at λA in an interference standard of known concentration of B (and containing no A), and ZAF correction parameters for the matrices of both the unknown and the interference standard at It can be shown that:

Texture Evolution Under Fast Heating and Cooling Rates of Zirconium Alloys Studied In-Situ by Synchrotron X-Ray Diffraction

2020 ◽  
Author(s):  
Chi-Toan Nguyen ◽  
Alistair Garner ◽  
Javier Romero ◽  
Antoine Ambard ◽  
Michael Preuss ◽  
...  
Keyword(s):  
Texture Evolution ◽  
Zirconium Alloys ◽  
X Ray Diffraction ◽  
Fast Heating ◽  
Cooling Rates ◽  
X Ray ◽  
Heating And Cooling

scholarly journals Geochemistry and Mineralogy of Ice-Dammed Lake Sediments of the Lębork Deposit

2021 ◽  
Author(s):  
Radosław Rogoziński ◽  
Alina Maciejewska
Keyword(s):  
Chemical Composition ◽  
Lake Sediments ◽  
Inductively Coupled Plasma ◽  
Mineralogical Composition ◽  
Raw Material ◽  
Element Analysis ◽  
X Ray ◽  
Dominant Component ◽  
Clay Deposits ◽  
Dammed Lake

AbstractVarved clay deposits from ice-dammed lakes are a particularly important and broadly applied raw material used for the production of high-quality ceramics (red bricks, roof tiles, etc.), but the mineralogy and geochemistry of these sediments are not fully understood. The aim of the present study was to determine the chemical and mineralogical composition of ice-dammed lake sediments of the Lębork deposit. Major-element analysis of the compositions of selected samples from the ice-dammed lake clays was performed by X-ray fluorescence (XRF) and trace elements were determined by inductively coupled plasma-mass spectrometry. The mineralogical composition of clay samples was determined by X-ray diffraction (XRD). Analyses of the chemical composition of the ice-dammed lake clays of the Lębork deposit showed that the dominant component was SiO2 with a mean content of 56.13 wt.%; the second most abundant component was Al2O3, with a mean content for the entire deposit of 11.61 wt.%. Analysis by ICP-MS indicated the presence of rare earth elements (REE), e.g. cerium, neodymium, lanthanum, and praseodymium; their mean contents are: 56.9, 27.0, 26.3, and 7.3 ppm, respectively. Mineralogical analysis of the varved clays identified quartz, muscovite, calcite, and clay minerals – illite, kaolinite, and montmorillonite. The material filling the Lębork basin is characterized by small lateral and vertical variability in chemical composition. The results of the present study may be of considerable importance in determining the parent igneous, metamorphic, and sedimentary rocks, the weathering products of which supplied material to the ice-dammed lake, as well as in determining the mechanisms and character of the sedimentation process itself.

Improvement of the Detection Sensitivity of Edxrf Trace Element Analysis by Means of Efficient X-Ray Focusing Based on Strongly Curved Hopg Crystals

1995 ◽  
Vol 39 ◽  
pp. 109-117
Author(s):  
Burkhard Beckhoff ◽  
Birgit Kanngießer
Keyword(s):  
High Intensity ◽  
Focal Plane ◽  
Bragg Reflection ◽  
Pyrolytic Graphite ◽  
Trace Element Analysis ◽  
Detection Sensitivity ◽  
Element Analysis ◽  
X Ray ◽  
Wide Range ◽  
Very High

X-ray focusing based on Bragg reflection at curved crystals allows collection of a large solid angle of incident radiation, monochromatization of this radiation, and condensation of the beam reflected at the crystal into a small spatial cross-section in a pre-selected focal plane. Thus, for the Bragg reflected radiation, one can achieve higher intensities than for the radiation passing directly to the same small area in the focal plane. In that case one can profit considerably from X-ray focusing in an EDXRF arrangement. The 00 2 reflection at Highly Oriented Pyrolytic Graphite (HOPG) crystals offers a very high intensity of the Bragg reflected beam for a wide range of photon energies. Furthermore, curvature radii smaller than 10 mm can be achieved for HOPG crystals ensuring efficient X-ray focusing in EDXRF applications. For the trace analysis of very small amounts of specimen material deposited on small areas of thin-filter backings, HOPG based X-ray focusing may be used to achieve a very high intensity of monochromatic excitation radiation.

scholarly journals Redox-driven atomic-scale changes in mixed catalysts: VOX/WOX/α-TiO2 (110)

RSC Advances ◽  
2014 ◽  
Vol 4 (110) ◽  
pp. 64608-64616 ◽  
Author(s):  
Z. Feng ◽  
M. E. McBriarty ◽  
A. U. Mane ◽  
J. Lu ◽  
P. C. Stair ◽  
...  
Keyword(s):  
Single Crystal ◽  
Crystal Surface ◽  
Oxide Catalysts ◽  
Atomic Scale ◽  
Redox Behavior ◽  
Single Crystal Surface ◽  
Tungsten Oxides ◽  
Mixed Monolayer ◽  
X Ray

X-ray study of vanadium–tungsten mixed-monolayer-oxide catalysts grown on the rutile α-TiO2 (110) single crystal surface shows redox behavior not observed for lone supported vanadium or tungsten oxides.

Microstructure and wear resistance of Cuss-toughened Cr5Si3/CrSi metal silicide alloys

2005 ◽  
Vol 20 (5) ◽  
pp. 1122-1130 ◽  
Author(s):  
Y.X. Yin ◽  
H.M. Wang
Keyword(s):  
Solid Solution ◽  
Wear Resistance ◽  
Sliding Wear ◽  
Room Temperature ◽  
Wear Test ◽  
Melting Process ◽  
Dry Sliding Wear ◽  
Metal Silicide ◽  
X Ray Diffraction ◽  
X Ray

Wear-resistant Cu-based solid-solution-toughened Cr5Si3/CrSi metal silicide alloy with a microstructure consisting of predominantly the dual-phase primary dendrites with a Cr5Si3 core encapsulated by CrSi phase and a small amount of interdendritic Cu-based solid solution (Cuss) was designed and fabricated by the laser melting process using Cr–Si–Cu elemental powder blends as the precursor materials. The microstructure of the Cuss-toughened Cr5Si3/CrSi metal silicide alloy was characterized by optical microscopy, powder x-ray diffraction, and energy dispersive spectroscopy. The Cuss-toughened silicide alloys have excellent wear resistance and low coefficient of friction under room temperature dry sliding wear test conditions with hardened 0.45% C carbon steel as the sliding–mating counterpart.

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