scholarly journals Homeopathy emerging as nanomedicine

2021 ◽  
Vol 10 (37) ◽  
pp. 299-310
Author(s):  
Rajendra Prakash Upadhyay ◽  
Chaturbhuja Nayak
Keyword(s):  
Electron Microscope ◽  
Single Molecule ◽  
Trace Element Analysis ◽  
Interfacial Water ◽  
Element Analysis ◽  
X Ray ◽  
Transmission Electron ◽  
Crystalline Nature ◽  
Characteristic Process ◽  
Empirical System

Background: Homeopathy is a time-tested two-century old empirical system of healing. Homeopathic medicines are prepared through a characteristic process known as potentization, where serial dilutions are performed with strong strokes at each step of dilution. Homeopathy is controversial because most medicines do not contain one single molecule of the corresponding starting-substance. Aim: To investigate a possible nanoscience mechanism of action of homeopathic medicines. Methodology: Ultra-pure samples were prepared and were examined under scanning (SEM) and transmission electron microscope (TEM) along with selected area nanodiffraction (SAD) and energy-dispersive X-ray analysis (EDX). Also trace element analysis (TEA) for silicon was performed. Results: Homeopathic medicines showed not to be ‘nothing’, but exhibited nanoparticles and conglomerates of them, which had crystalline nature and were rich in silicon. Conclusions: During the violent strokes involved in potentization, information arising from the serially diluted starting-substance might be encrypted by epitaxy on silicon-rich crystalline nanoparticles present in the resulting homeopathic medicine. The ‘size’ of the information encrypted on nanoparticles might vary together with the degree of dilution. As homeopathic medicines exhibit healing effects, these nanoparticles along with the interfacial water on their surface might carry this information - which biological systems are able to identify - to the target. As various forms of silica are known to interact with proteins and cells of the immune system, homeopathy might represent a nanomedicine system. Possible confirmation, however, requires further research in materials and interfacial water.

X-ray microanalysis of thin specimens in the transmission electron microscope at voltages up to 1000 Kv.

1978 ◽  
Vol 36 (1) ◽  
pp. 540-541
Author(s):  
G. Cliff ◽  
M.J. Nasir ◽  
G.W. Lorimer ◽  
N. Ridley
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Weight Fraction ◽  
Present Series ◽  
Constant Independent ◽  
X Ray ◽  
Transmission Electron ◽  
Series Of Experiments ◽  
Image Position ◽  
X Ray Absorption

In a specimen which is transmission thin to 100 kV electrons - a sample in which X-ray absorption is so insignificant that it can be neglected and where fluorescence effects can generally be ignored (1,2) - a ratio of characteristic X-ray intensities, I1/I2 can be converted into a weight fraction ratio, C1/C2, using the equationwhere k12 is, at a given voltage, a constant independent of composition or thickness, k12 values can be determined experimentally from thin standards (3) or calculated (4,6). Both experimental and calculated k12 values have been obtained for K(11<Z>19),kα(Z>19) and some Lα radiation (3,6) at 100 kV. The object of the present series of experiments was to experimentally determine k12 values at voltages between 200 and 1000 kV and to compare these with calculated values.The experiments were carried out on an AEI-EM7 HVEM fitted with an energy dispersive X-ray detector.

Aspects of microanalysis in a transmission electron microscope

1978 ◽  
Vol 36 (1) ◽  
pp. 510-511
Author(s):  
R. Sinclair ◽  
B.E. Jacobson
Keyword(s):  
Grain Size ◽  
Electron Beam ◽  
Electron Microscope ◽  
Chemical Analysis ◽  
Transmission Electron Microscope ◽  
Vapor Deposition ◽  
Critical Currents ◽  
X Ray ◽  
Fine Grain ◽  
Transmission Electron

INTRODUCTIONThe prospect of performing chemical analysis of thin specimens at any desired level of resolution is particularly appealing to the materials scientist. Commercial TEM-based systems are now available which virtually provide this capability. The purpose of this contribution is to illustrate its application to problems which would have been intractable until recently, pointing out some current limitations.X-RAY ANALYSISIn an attempt to fabricate superconducting materials with high critical currents and temperature, thin Nb3Sn films have been prepared by electron beam vapor deposition [1]. Fine-grain size material is desirable which may be achieved by codeposition with small amounts of Al2O3 . Figure 1 shows the STEM microstructure, with large (∽ 200 Å dia) voids present at the grain boundaries. Higher quality TEM micrographs (e.g. fig. 2) reveal the presence of small voids within the grains which are absent in pure Nb3Sn prepared under identical conditions. The X-ray spectrum from large (∽ lμ dia) or small (∽100 Ǻ dia) areas within the grains indicates only small amounts of A1 (fig.3).

Thickness and composition determinations from T.E.M. specimens using both x-ray and backscattered electron data

1984 ◽  
Vol 42 ◽  
pp. 576-577
Author(s):  
M.D. Ball ◽  
H. Lagace ◽  
M.C. Thornton
Keyword(s):  
Electron Microscope ◽  
Atomic Number ◽  
Transmission Electron Microscope ◽  
Convenient Method ◽  
Flow Chart ◽  
X Ray ◽  
Intensity Measurements ◽  
Transmission Electron ◽  
Electron Intensity ◽  
Backscattered Electron

The backscattered electron coefficient η for transmission electron microscope specimens depends on both the atomic number Z and the thickness t. Hence for specimens of known atomic number, the thickness can be determined from backscattered electron coefficient measurements. This work describes a simple and convenient method of estimating the thickness and the corrected composition of areas of uncertain atomic number by combining x-ray microanalysis and backscattered electron intensity measurements.The method is best described in terms of the flow chart shown In Figure 1. Having selected a feature of interest, x-ray microanalysis data is recorded and used to estimate the composition. At this stage thickness corrections for absorption and fluorescence are not performed.

An improved interference correction for trace element analysis

1992 ◽  
Vol 50 (2) ◽  
pp. 1646-1647
Author(s):  
John J. Donovan ◽  
Donald A. Snyder ◽  
Mark L. Rivers
Keyword(s):  
Trace Element Analysis ◽  
Accurate Estimate ◽  
Simple Expression ◽  
Standard Reference Materials ◽  
Characteristic Line ◽  
Analytical Line ◽  
Element Analysis ◽  
Electron Probe Analysis ◽  
Calculated Concentration ◽  
X Ray

We present a simple expression for the quantitative treatment of interference corrections in x-ray analysis. WDS electron probe analysis of standard reference materials illustrate the success of the technique.For the analytical line of wavelength λ of any element A which lies near or on any characteristic line of another element B, the observed x-ray counts at We use to denote x-ray counts excited by element i in matrix j (u=unknown; s=analytical standard; ŝ=interference standard) at the wavelength of the analytical line of A, λA (Fig. 1). Quantitative analysis of A requires an accurate estimate of These counts can be estimated from the ZAF calculated concentration of B in the unknown C,Bu measured counts at λA in an interference standard of known concentration of B (and containing no A), and ZAF correction parameters for the matrices of both the unknown and the interference standard at It can be shown that:

High Spatial Resolution Compositional Analysis at Interfaces

1980 ◽  
Vol 38 ◽  
pp. 356-359
Author(s):  
John B. Vander Sande ◽  
Thomas F. Kelly ◽  
Douglas Imeson
Keyword(s):  
Electron Microscope ◽  
High Spatial Resolution ◽  
Compositional Analysis ◽  
Scanning Transmission Electron Microscope ◽  
Thin Specimen ◽  
X Ray ◽  
Volume Of Interest ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Electron Energy Loss

In the scanning transmission electron microscope (STEM) a fine probe of electrons is scanned across the thin specimen, or the probe is stationarily placed on a volume of interest, and various products of the electron-specimen interaction are then collected and used for image formation or microanalysis. The microanalysis modes usually employed in STEM include, but are not restricted to, energy dispersive X-ray analysis, electron energy loss spectroscopy, and microdiffraction.

Luminescent Properties of Gd2MoO6:Eu3+ Nanophosphor for WLEDs

2021 ◽  
Author(s):  
Yan Chen ◽  
Yuemei Lan ◽  
Dong Wang ◽  
Guoxing Zhang ◽  
Wenlong Peng ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Fluorescence Spectra ◽  
Solvothermal Method ◽  
Luminescent Properties ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron

A series of Gd2-xMoO6:xEu3+(x=0.18-0.38) nanophosphors were synthesized by the solvothermal method. The properties of this nanophosphor were characterized by x-ray diffraction (XRD), transmission electron microscope (TEM), fluorescence spectra and diffuse...

Improvement of the Detection Sensitivity of Edxrf Trace Element Analysis by Means of Efficient X-Ray Focusing Based on Strongly Curved Hopg Crystals

1995 ◽  
Vol 39 ◽  
pp. 109-117
Author(s):  
Burkhard Beckhoff ◽  
Birgit Kanngießer
Keyword(s):  
High Intensity ◽  
Focal Plane ◽  
Bragg Reflection ◽  
Pyrolytic Graphite ◽  
Trace Element Analysis ◽  
Detection Sensitivity ◽  
Element Analysis ◽  
X Ray ◽  
Wide Range ◽  
Very High

X-ray focusing based on Bragg reflection at curved crystals allows collection of a large solid angle of incident radiation, monochromatization of this radiation, and condensation of the beam reflected at the crystal into a small spatial cross-section in a pre-selected focal plane. Thus, for the Bragg reflected radiation, one can achieve higher intensities than for the radiation passing directly to the same small area in the focal plane. In that case one can profit considerably from X-ray focusing in an EDXRF arrangement. The 00 2 reflection at Highly Oriented Pyrolytic Graphite (HOPG) crystals offers a very high intensity of the Bragg reflected beam for a wide range of photon energies. Furthermore, curvature radii smaller than 10 mm can be achieved for HOPG crystals ensuring efficient X-ray focusing in EDXRF applications. For the trace analysis of very small amounts of specimen material deposited on small areas of thin-filter backings, HOPG based X-ray focusing may be used to achieve a very high intensity of monochromatic excitation radiation.

Formation of Graphite Encapsulated Nickel Nanoparticles by Ball Milling and Annealing of Expanded Graphite with Nickel

2011 ◽  
Vol 80-81 ◽  
pp. 217-220 ◽  
Author(s):  
Xue Qing Yue ◽  
Hai Jun Fu ◽  
Da Jun Li
Keyword(s):  
Electron Microscope ◽  
Ball Milling ◽  
Transmission Electron Microscope ◽  
Nickel Nanoparticles ◽  
Size Range ◽  
Expanded Graphite ◽  
X Ray Diffraction ◽  
X Ray ◽  
Nickel Powders ◽  
Transmission Electron

Graphite encapsulated nickel nanoparticles were prepared by ball milling andsubsequently annealing a mixture of expanded graphite with nickel powders. The products were characterized by transmission electron microscope and X-ray diffraction. The formation mechanism of the products was discussed. Results show that the products have a size range of 20-150 nm. The graphite and nickel in the products all exhibit a high crystallinity.

Microtexture of shock reaction products of niobium and silica mixtures

1999 ◽  
Vol 14 (7) ◽  
pp. 3169-3174 ◽  
Author(s):  
Reiko Murao ◽  
Masae Kikuchi ◽  
Kiyoto Fukuoka ◽  
Eiji Aoyagi ◽  
Toshiyuki Atou ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Shock Compression ◽  
Pressure Range ◽  
Reaction Products ◽  
Small Particles ◽  
Powder Mixtures ◽  
X Ray ◽  
Transmission Electron

Shock compression experiments on powder mixtures of niobium metal and quartz were conducted for the pressure range of 30–40 GPa by a 25-mm single-stage propellant gun. Chemical reaction occurred above 35 GPa, and products were found to be mainly so-called “Cu3Au-type” Nb3Si, which contained a small amount of oxygen. Microtextures of the specimen were examined by scanning and transmission electron microscopy. A field-emission transmission electron microscope was used for energy-dispersive x-ray analysis of microtextures in small particles found in the SiO2 matrix, and various species with different Nb/Si ratio and oxygen content were shown to be produced through the nonequilibrium process of shock compression.

X-ray microanalysis of intracellular ions in the anaerobic halophilic eubacterium Haloanaerobium praevalens

1997 ◽  
Vol 43 (6) ◽  
pp. 588-592 ◽  
Author(s):  
Aharon Oren ◽  
Mikal Heldal ◽  
Svein Norland
Keyword(s):  
Electron Microscope ◽  
High Variability ◽  
Sodium Potassium ◽  
X Ray ◽  
Ion Concentrations ◽  
Major Cation ◽  
Transmission Electron ◽  
Intracellular Ion Concentrations ◽  
Intracellular Ions ◽  
Chloride Concentrations

The intracellular concentrations of Na+, K+, and Cl− of the anaerobic halophilic eubacterium Haloanaerobium praevalens were assayed by means of X-ray microanalysis with the transmission electron microscope. Apparent intracellular cation concentrations between 1.22 and 1.91 M and chloride concentrations of 0.93–1.57 M were measured in cells growing exponentially in 2.6 M total salts. In exponentially growing cells, K+ was the major cation (70% of the cation sum). Stationary phase cells showed a high variability among individual cells, some of the cells containing higher Na+ than K+ concentrations.Key words: Haloanaerobium praevalens, intracellular ion concentrations, sodium, potassium, X-ray microanalysis.

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