scholarly journals Micro-Fabric Analyzer (MFA): A New Semiautomated ArcGIS-Based Edge Detector for Quantitative Microstructural Analysis of Rock Thin-Sections

2021 ◽  
Vol 10 (2) ◽  
pp. 51 ◽  
Author(s):  
Roberto Visalli ◽  
Gaetano Ortolano ◽  
Gaston Godard ◽  
Rosolino Cirrincione
Keyword(s):  
Physical Properties ◽  
Electron Backscatter Diffraction ◽  
Microstructural Analysis ◽  
Image Features ◽  
Elemental Distribution ◽  
Edge Detector ◽  
Sandstone Sample ◽  
Thin Sections ◽  
X Ray ◽  
Distribution Maps

Micro-Fabric Analyzer (MFA) is a new GIS-based tool for the quantitative extrapolation of rock microstructural features that takes advantage both of the characteristics of the X-ray images and the optical image features. Most of the previously developed edge mineral grain detectors are uniquely based on the physical properties of the X-ray-, electron-, or optical-derived images; not permitting the exploitation of the specific physical properties of each image type at the same time. More advanced techniques, such as 3D microtomography, permit the reconstruction of tridimensional models of mineral fabric arrays, even though adjacent mineral grain boundaries with the same atomic density are often not detectable. Only electron backscatter diffraction (EBSD) allows providing high-performing grain boundary detection that is crystallographically differentiated per mineral phase, even though it is relatively expensive and can be executed only in duly equipped microanalytical laboratories by suitably trained users. Instead, the MFA toolbox allows quantifying fabric parameters subdivided per mineral type starting from a crossed-polarizers high-resolution RGB image, which is useful for identifying the edges of the individual grains characterizing rock fabrics. Then, this image is integrated with a set of micro-X-ray maps, which are useful for the quantitative extrapolation of elemental distribution maps. In addition, all this is achieved by means of low-cost and easy-to-use equipment. We applied the tool on amphibolite, mylonitic-paragneiss, and -tonalite samples to extrapolate the particle fabric on different metamorphic rock types, as well as on the same sandstone sample used for another edge detector, which is useful for comparing the obtained results.

scholarly journals Enhancement of Acetone Gas-Sensing Responses of Tapered WO3 Nanorods through Sputtering Coating with a Thin SnO2 Coverage Layer

Nanomaterials ◽  
2019 ◽  
Vol 9 (6) ◽  
pp. 864 ◽  
Author(s):  
Yuan-Chang Liang ◽  
Yu Chao
Keyword(s):  
Gas Sensing ◽  
Microstructural Analysis ◽  
Xrd Analysis ◽  
Thin Layers ◽  
Elemental Distribution ◽  
Distribution Analysis ◽  
Acetone Vapor ◽  
X Ray Diffraction ◽  
X Ray ◽  
Composite Nanorods

WO3–SnO2 composite nanorods were synthesized by combining hydrothermal growth of tapered tungsten trioxide (WO3) nanorods and sputter deposition of thin SnO2 layers. Crystalline SnO2 coverage layers with thicknesses in the range of 13–34 nm were sputter coated onto WO3 nanorods by controlling the sputtering duration of the SnO2. The X-ray diffraction (XRD) analysis results demonstrated that crystalline hexagonal WO3–tetragonal SnO2 composite nanorods were formed. The microstructural analysis revealed that the SnO2 coverage layers were in a polycrystalline feature. The elemental distribution analysis revealed that the SnO2 thin layers homogeneously covered the surfaces of the hexagonally structured WO3 nanorods. The WO3–SnO2 composite nanorods with the thinnest SnO2 coverage layer showed superior gas-sensing response to 100–1000 ppm acetone vapor compared to other composite nanorods investigated in this study. The substantially improved gas-sensing responses to acetone vapor of the hexagonally structured WO3 nanorods coated with the SnO2 coverage layers are discussed in relation to the thickness of SnO2 coverage layers and the core–shell configuration of the WO3–SnO2 composite nanorods.

scholarly journals Correlation of P-wave velocity with mechanical and physical properties of limestone with statistical analysis

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Hasan Arman
Keyword(s):  
Physical Properties ◽  
Wave Velocity ◽  
Point Load ◽  
P Wave ◽  
Unit Weight ◽  
Empirical Equations ◽  
Thin Sections ◽  
X Ray ◽  
P Wave Velocity ◽  
Mechanical And Physical Properties

AbstractThis study aims to investigate the correlation between the P-wave velocity (Vp) and the mechanical and the physical properties of the limestone; Vp tests were conducted on over 320 limestone samples. Moreover, the effects of the mineralogical, textural, and chemical composition of limestone were also studied through thin sections, scanning electron microscopy (SEM), X-ray diffraction (XRD), and X-ray fluorescence (XRF). The relationships between the Vp and the uniaxial compressive strength (UCS), point load index (PLI(Is(50)), 2nd cycle of slake durability index (Id2), natural unit weight (γn), specific gravity (Gs(c)), water absorption by weight (WA), and porosity (n) were estimated using representative empirical equations. The empirical equations were validated by Student’s t test that has indicated the existence of strong relationships between the mechanical and physical properties of the intact limestone with Vp; the calculated t-values were higher than the t-critical value. Furthermore, the results of previously available studies were compared with the results of this study in terms of the generated equations for Vp values and the slope of a 1:1 line, which was used to appraise the predicted and measured values. This study demonstrates that the UCS, PLI(Is(50)), Id2, γn, Gs(c), WA, and n values of an intact limestone can be predicted by using Vp, which is fast, easy, economical and nondestructive test.

Localisation of aluminium in root apex cells of two Australian perennial grasses by X-ray microanalysis

1998 ◽  
Vol 25 (4) ◽  
pp. 427 ◽  
Author(s):  
Simon A. Crawford ◽  
Alan T. Marshall ◽  
Sabine Wilkens
Keyword(s):  
Significant Positive Correlation ◽  
Root Apex ◽  
Root Cap ◽  
Perennial Grasses ◽  
Elemental Distribution ◽  
X Ray ◽  
Positive Correlation ◽  
Distribution Maps ◽  
Meristematic Cells ◽  
Root Apices

To determine if an increased aluminium (Al) sensitivity is the result of greater accumulation of Al in root apices, the quantity and distribution of Al in root apex cells of Danthonia linkii Kunth and Microlaena stipoides (Labill.) R.Br. was investigated by X-ray microanalysis. Seedlings were grown in nutrient solution with 0, 185 and 370 µM total Al for 24 h after which the terminal 5 mm of the roots were excised, rapidly frozen and embedded using freeze-substitution. Elemental distribution maps of root apices showed that Al had accumulated in the nuclei of root cap and meristematic cells in Al-stressed roots of D. linkii but not in M. stipoides. Al appeared to be co-localised with phosphorous (P) in the nuclei of these cells. Quantitation of Al revealed that Al-stressed root apex cells of D. linkiiaccumulated significantly more Al than M. stipoides. Exposure of D. linkii roots to Al resulted in substantial increases in the P content of root apex cells, and a significant positive correlation was found between Al and P in both root cap and meristematic cells. Analysis of intracellular structures showed that the majority of Al had accumulated in the nuclei of cells. A significant positive correlation was found between Al and P in the nuclei, but not in the cytoplasm or cell walls. No positive correlation was found between Al and P in root apex cells of M. stipoides.

The Occurrence of a Peripheral Coarse Grain Zone (PCGZ) in Extruded Bars of AA 7108

2021 ◽  
Vol 1016 ◽  
pp. 1141-1146
Author(s):  
Saul Hissaci de Souza ◽  
Ronald Lesley Plaut ◽  
Nelson Batista de Lima ◽  
Rene Ramos de Oliveira ◽  
Angelo Fernando Padilha
Keyword(s):  
Electron Backscatter Diffraction ◽  
Microstructural Analysis ◽  
Polarized Light ◽  
Coarse Grain ◽  
X Ray Diffraction ◽  
Rectangular Section ◽  
X Ray ◽  
Analysis Techniques ◽  
Coarse Grains ◽  
Backscatter Diffraction

Industrial-scale extruded profiles of AA 7108 with a rectangular section (25.60 mm x 15.95 mm) were used in this investigation. Some complementary microstructural analysis techniques, such as polarized light microscopy, EBSD (Electron Backscatter Diffraction) and X-ray diffraction were used to characterize the microstructure, focusing on the PCG zone. It was observed that the extruded profiles presented a totally recrystallized microstructure and a 300 μm layer of peripheral coarse grains. Additionally, the results showed that the PCGZ predominant grain orientation {311} <110> differs from the texture below the PCGZ (Goss and Cube components).

scholarly journals Evolution Of Precipitate Morphology During Extrusion In Mg ZK60A Alloy

2015 ◽  
Vol 60 (2) ◽  
pp. 1423-1426 ◽  
Author(s):  
J. Park ◽  
K.H. Jung ◽  
G.A. Lee ◽  
M. Kawasaki ◽  
B. Ahn
Keyword(s):  
Electron Backscatter Diffraction ◽  
Microstructural Analysis ◽  
Extrusion Process ◽  
Formation Mechanisms ◽  
Precipitate Morphology ◽  
X Ray ◽  
Transmission Electron ◽  
Electron Backscatter ◽  
Backscatter Diffraction ◽  
Evolution Of Precipitates

Abstract In this study, a continuously casted ZK60A magnesium alloy (Mg-Zn-Zr) was extruded in two different extrusion ratios, 6:1 and 10:1. The evolution of precipitates was investigated on the two extruded materials and compared with that of as-casted material. The microstructural analysis was performed by electron backscatter diffraction and transmission electron microscopy, and the compositional information was obtained using energy-dispersive X-ray spectroscopy. Several distinct morphologies of precipitates were observed, such as dot, rod, and disk shaped. The formation mechanisms of those precipitates were discussed with respect to the heat and strain during the extrusion process.

scholarly journals Comprehensive Comparison of Various Techniques for the Analysis of Elemental Distributions in Thin Films

2011 ◽  
Vol 17 (5) ◽  
pp. 728-751 ◽  
Author(s):  
D. Abou-Ras ◽  
R. Caballero ◽  
C.-H. Fischer ◽  
C.A. Kaufmann ◽  
I. Lauermann ◽  
...  
Keyword(s):  
Thin Films ◽  
Electron Microscope ◽  
Glow Discharge ◽  
Auger Electron ◽  
Rutherford Backscattering Spectrometry ◽  
Electron Backscatter Diffraction ◽  
Grazing Incidence ◽  
Elemental Distribution ◽  
Elastic Recoil ◽  
X Ray

AbstractThe present work shows results on elemental distribution analyses in Cu(In,Ga)Se2 thin films for solar cells performed by use of wavelength-dispersive and energy-dispersive X-ray spectrometry (EDX) in a scanning electron microscope, EDX in a transmission electron microscope, X-ray photoelectron, angle-dependent soft X-ray emission, secondary ion-mass (SIMS), time-of-flight SIMS, sputtered neutral mass, glow-discharge optical emission and glow-discharge mass, Auger electron, and Rutherford backscattering spectrometry, by use of scanning Auger electron microscopy, Raman depth profiling, and Raman mapping, as well as by use of elastic recoil detection analysis, grazing-incidence X-ray and electron backscatter diffraction, and grazing-incidence X-ray fluorescence analysis. The Cu(In,Ga)Se2 thin films used for the present comparison were produced during the same identical deposition run and exhibit thicknesses of about 2 μm. The analysis techniques were compared with respect to their spatial and depth resolutions, measuring speeds, availabilities, and detection limits.

Microstrain distributions in polycrystalline thin films measured by X-ray microdiffraction

2016 ◽  
Vol 49 (2) ◽  
pp. 632-635 ◽  
Author(s):  
N. Schäfer ◽  
G. A. Chahine ◽  
A. J. Wilkinson ◽  
T. Schmid ◽  
T. Rissom ◽  
...  
Keyword(s):  
Thin Films ◽  
Solar Cell ◽  
High Resolution ◽  
Electron Backscatter Diffraction ◽  
Model System ◽  
X Ray ◽  
Distribution Maps ◽  
Polycrystalline Thin Films ◽  
Electron Backscatter ◽  
Backscatter Diffraction

Microstrain distributions were acquired in functional thin films by high-resolution X-ray microdiffraction measurements, using polycrystalline CuInSe2 thin films as a model system. This technique not only provides spatial resolutions at the submicrometre scale but also allows for analysis of thin films buried within a complete solar-cell stack. The microstrain values within individual CuInSe2 grains were determined to be of the order of 10−4. These values confirmed corresponding microstrain distribution maps obtained on the same CuInSe2 layer by electron backscatter diffraction and Raman microspectroscopy.

scholarly journals Automated mineralogy based on micro-energy-dispersive X-ray fluorescence microscopy (µ-EDXRF) applied to plutonic rock thin sections in comparison to a mineral liberation analyzer

2017 ◽  
Vol 6 (2) ◽  
pp. 429-437 ◽  
Author(s):  
Wilhelm Nikonow ◽  
Dieter Rammlmair
Keyword(s):  
Supervised Classification ◽  
Energy Dispersive ◽  
Chemical Information ◽  
Spectral Angle Mapper ◽  
Thin Sections ◽  
Mineral Distribution ◽  
X Ray ◽  
Distribution Maps ◽  
Mineral Liberation ◽  
Automated Mineralogy

Abstract. Recent developments in the application of micro-energy-dispersive X-ray fluorescence spectrometry mapping (µ-EDXRF) have opened up new opportunities for fast geoscientific analyses. Acquiring spatially resolved spectral and chemical information non-destructively for large samples of up to 20 cm length provides valuable information for geoscientific interpretation. Using supervised classification of the spectral information, mineral distribution maps can be obtained. In this work, thin sections of plutonic rocks are analyzed by µ-EDXRF and classified using the supervised classification algorithm spectral angle mapper (SAM). Based on the mineral distribution maps, it is possible to obtain quantitative mineral information, i.e., to calculate the modal mineralogy, search and locate minerals of interest, and perform image analysis. The results are compared to automated mineralogy obtained from the mineral liberation analyzer (MLA) of a scanning electron microscope (SEM) and show good accordance, revealing variation resulting mostly from the limit of spatial resolution of the µ-EDXRF instrument. Taking into account the little time needed for sample preparation and measurement, this method seems suitable for fast sample overviews with valuable chemical, mineralogical and textural information. Additionally, it enables the researcher to make better and more targeted decisions for subsequent analyses.

scholarly journals Max Ernst’s Woman, Old Man, and Flower (1923–24): Four Paintings in One Revealed by Technical Imaging

Heritage ◽  
2021 ◽  
Vol 4 (3) ◽  
pp. 2224-2236
Author(s):  
Ana Martins ◽  
Ellen Davis ◽  
Talia Kwartler
Keyword(s):  
Transitional Period ◽  
Insertion Mutation ◽  
Elemental Distribution ◽  
Technical Literature ◽  
Intermediate Composition ◽  
X Ray ◽  
Distribution Maps ◽  
Final Composition

Examining the painting Woman, Old Man, and Flower (1923–24) by Max Ernst with macro-X-ray fluorescence scanning (MA-XRF), X-ray radiography (XRR) as well as photography under ultraviolet (UVF), infrared reflected (IRR) and transmitted (IRT) illumination revealed the existence and sequence of three distinct paintings concealed under the final composition. The study confirmed a known and previously documented intermediate composition and uncovered two additional states: a very first state exposed by XRR, and a third state revealed in the elemental distribution maps obtained by MA-XRF. The complimentary images document the insertion, mutation, and concealing of several human and anthropomorphic subjects across the four layers, expanding our understanding of the painting and of Ernst’s collage-like pictorial development. In addition, a list of pigments is proposed based on the elemental information provided by MA-XRF, contributing to the technical literature devoted to the materials of Ernst’s paintings during the transitional period between Dada and Surrealism.

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