Analysis of the carbon transport near the growth interface with respect to the rotational speed of the seed crystal during top-seeded solution growth of SiC

2016 ◽  
Vol 55 (12) ◽  
pp. 125601 ◽  
Author(s):  
Tomonori Umezaki ◽  
Daiki Koike ◽  
Shunta Harada ◽  
Toru Ujihara
2015 ◽  
Vol 821-823 ◽  
pp. 31-34 ◽  
Author(s):  
Tomonori Umezaki ◽  
Daiki Koike ◽  
S. Harada ◽  
Toru Ujihara

The solution growth of SiC on an off-axis seed is effective on the reduction of threading dislocations. We proposed a novel method to grow a SiC crystal on an off-axis seed by top-seeded solution growth (TSSG). In our previous study, a unidirectional solution flow above a seed crystal is effective to suppress surface roughness in the growth on the off-axis seed. However, it is difficult to apply the unidirectional flow in an axisymmetric TSSG set-up. In this study, the unidirectional flow could be achieved by shifting the rotational axis away from the center of the seed crystal. As a result, the smooth surface was obtained in the wider area where the solution flow direction was opposite to the step-flow direction.


2019 ◽  
Vol 963 ◽  
pp. 75-79 ◽  
Author(s):  
Kotaro Kawaguchi ◽  
Kazuaki Seki ◽  
Kazuhiko Kusunoki

We investigated the effect of a melt-back process on the quality of the grown crystal in 4H-SiC solution growth. In our experiments, the crystal was grown by top-seeded solution growth (TSSG) method with and without melt-back, following which the quality of the obtained crystals was compared. When solution growth was carried out without melt-back, solvent inclusions and a different polytype were observed. When molten KOH etching was conducted, the dislocation density in the crystals at the early stage of growth became much higher than that in a seed crystal. Solvent inclusions, a different polytype, and an increase in dislocations were suppressed when solution growth was performed with melt-back. It was confirmed that melt-back is necessary to prevent the deterioration of crystal quality at the early stage of solution growth.


2014 ◽  
Vol 778-780 ◽  
pp. 79-82 ◽  
Author(s):  
Kazuhiko Kusunoki ◽  
Kazuhito Kamei ◽  
Nobuhiro Okada ◽  
Koji Moriguchi ◽  
Hiroshi Kaido ◽  
...  

We performed top-seeded solution growth of 4H-SiC for obtaining longer length crystal. Si-Cr and Si-Ti melts were used as solvents. Meniscus formation technique was applied to the present study. Special attention was paid to improve the process stability during long-term growth. One of major technological problems in the solution growth is that the precipitation of polycrystalline SiC which hiders the stable single crystal growth. Another problem is the fluctuation of supersaturation at the growth interface during the growth. Through the optimization of growth process conditions, we have successfully grown 4H-SiC single crystals up to 14 mm long with three-inch-diameter, and evaluated their crystalline quality.


2012 ◽  
Vol 717-720 ◽  
pp. 61-64 ◽  
Author(s):  
Hironori Daikoku ◽  
M. Kado ◽  
H. Sakamoto ◽  
Hiroshi Suzuki ◽  
T. Bessho ◽  
...  

We have grown high-quality long cylindrical (12 mm thick) 4H-SiC bulk crystals by the meniscus formation technique, which was first applied for the solution growth of bulk SiC. It enabled long-term growth by suppressing parasitic reactions such as polycrystal precipitation around the seed crystal. In addition, we could control the growth angle from −22° to 61° by adjusting the meniscus height. The thickness of the grown cylindrical crystals was 12 mm, which is the largest reported until now, and corresponded to a growth rate of 0.6 mm/h. Smooth morphology growth was maintained on the (000-1) C-face. In cross-sectional transmission optical microscopy images, few solvent inclusions and voids were observed. XRD measurements revealed that the FWHM values of the grown crystals were almost the same as those of the seed crystal.


2006 ◽  
Vol 527-529 ◽  
pp. 119-122 ◽  
Author(s):  
Kazuhiko Kusunoki ◽  
Kazuhito Kamei ◽  
Nobuhiro Okada ◽  
Nobuyoshi Yashiro ◽  
Akihiro Yauchi ◽  
...  

We performed solution growth of SiC single crystals from Si-Ti-C ternary solution using the accelerated crucible rotation technique (ACRT). It was confirmed that the growth rate exceeding 200 μm/hr was achievable by several ACRT conditions. This high growth rate might be due to the enhancement of the carbon transport from the graphite crucible to the growth interface using the ACRT. Moreover, the incorporation of inclusions of the Si-Ti solvent in the grown crystal was significantly suppressed by using the ACRT. It was thought that the intensive convection near the growth interface resulted in not only the marked increase of SiC growth rate but also the superior homogeneity in the surface morphology. It was concluded that faster stable growth can be accomplished in the SiC solution growth using the ACRT.


2015 ◽  
Vol 821-823 ◽  
pp. 18-21 ◽  
Author(s):  
Daiki Koike ◽  
Tomonori Umezaki ◽  
Kenta Murayama ◽  
Kenta Aoyagi ◽  
S. Harada ◽  
...  

We achieved the convex growth interface shape in top-seeded solution growth of SiC applying non-axisymmetric solution convection induced by non-axisymmetric temperature distribution. The detailed solution flow, temperature distribution and carbon concentration distribution were calculated by 3-dimensional numerical analysis. In the present case, the solution flow below the crystal was unidirectional and the supersaturation was increased along the solution flow direction. By the rotation of the crystal in the unidirectional flow and the temperature distribution, we successfully obtained the crystal with the convex growth interface shape.


Crystals ◽  
2019 ◽  
Vol 9 (12) ◽  
pp. 653 ◽  
Author(s):  
Botao Liu ◽  
Yue Yu ◽  
Xia Tang ◽  
Bing Gao

The growth interface instability of large-size SiC growth in top-seeded solution growth (TSSG) is a bottleneck for industrial production. The authors have previously simulated the growth of 4-inch SiC crystals and found that the interface instability in TSSG was greatly affected by the flow field. According to our simulation of the flow field, we proposed a new stepped structure that greatly improved the interface stability of large-size crystal growth. This stepped structure provides a good reference for the growth of large-sized SiC crystals by TSSG in the future.


2014 ◽  
Vol 778-780 ◽  
pp. 63-66 ◽  
Author(s):  
Tomonori Umezaki ◽  
Daiki Koike ◽  
Atsushi Horio ◽  
S. Harada ◽  
Toru Ujihara

We studied the effect of rotation speed of seed crystal on the growth rate during the solution growth of SiC. The growth rate increased with increasing rotation speed of the seed crystal. The increase in the growth rate was observed in relatively wide range of carbon concentration. According to the numerical simulation, the carbon concentration gradient near the growth interface under 150 rpm condition is larger than 20 rpm (ACRT) condition. This indicates that increase in the growth rate is caused by the increase in the carbon concentration gradient of the diffusion layer.


Author(s):  
Shijia Sun ◽  
Qi Wei ◽  
Bing-Xuan Li ◽  
Xingjun Shi ◽  
feifei yuan ◽  
...  

The pure and Nd3+-doped YMgB5O10 (YMB, Nd:YMB) crystals were grown successfully by the top-seeded solution growth method with composite fluxes Li2O-B2O3-LiF. The systematic investigation of crystal structure, transmission spectrum, band...


1986 ◽  
Vol 78 (3) ◽  
pp. 567-570 ◽  
Author(s):  
T. Inoue ◽  
H. Komatsu ◽  
M. Shimizu ◽  
S. Tsunekawa ◽  
H. Takei

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