scholarly journals Scale-dependent roughness parameters for topography analysis

2022 ◽  
Vol 7 ◽  
pp. 100190
Author(s):  
Antoine Sanner ◽  
Wolfram G. Nöhring ◽  
Luke A. Thimons ◽  
Tevis D.B. Jacobs ◽  
Lars Pastewka
Keyword(s):  
Roughness Parameters ◽  
Topography Analysis

scholarly journals Assessing the Functional Properties of TiZr Nanotubular Structures for Biomedical Applications, through Nano-Scratch Tests and Adhesion Force Maps

Molecules ◽  
2021 ◽  
Vol 26 (4) ◽  
pp. 900
Author(s):  
Maria Vardaki ◽  
Aida Pantazi ◽  
Ioana Demetrescu ◽  
Marius Enachescu
Keyword(s):  
Surface Roughness ◽  
Functional Properties ◽  
Bacterial Adhesion ◽  
Biomedical Applications ◽  
Adhesion Force ◽  
Roughness Parameters ◽  
Force Microscopy ◽  
Atomic Force ◽  
The Mean ◽  
Scratch Tests

In this work we present the results of a functional properties assessment via Atomic Force Microscopy (AFM)-based surface morphology, surface roughness, nano-scratch tests and adhesion force maps of TiZr-based nanotubular structures. The nanostructures have been electrochemically prepared in a glycerin + 15 vol.% H2O + 0.2 M NH4F electrolyte. The AFM topography images confirmed the successful preparation of the nanotubular coatings. The Root Mean Square (RMS) and average (Ra) roughness parameters increased after anodizing, while the mean adhesion force value decreased. The prepared nanocoatings exhibited a smaller mean scratch hardness value compared to the un-coated TiZr. However, the mean hardness (H) values of the coatings highlight their potential in having reliable mechanical resistances, which along with the significant increase of the surface roughness parameters, which could help in improving the osseointegration, and also with the important decrease of the mean adhesion force, which could lead to a reduction in bacterial adhesion, are providing the nanostructures with a great potential to be used as a better alternative for Ti implants in dentistry.

scholarly journals Investigation of Side Wall Roughness Effect on Optical Losses in a Multimode Si3N4 Waveguide Formed on a Quartz Substrate

Photonics ◽  
2020 ◽  
Vol 7 (4) ◽  
pp. 104
Author(s):  
Anastasia Yakuhina ◽  
Alexey Kadochkin ◽  
Vyacheslav Svetukhin ◽  
Dmitry Gorelov ◽  
Sergey Generalov ◽  
...  
Keyword(s):  
Optical Waveguides ◽  
Quartz Substrate ◽  
Side Wall ◽  
Wall Roughness ◽  
Roughness Parameters ◽  
Optical Losses ◽  
Waveguide Width ◽  
Integration Density ◽  
Frequency Domain Reflectometry ◽  
Multimode Operation

This article presents the results of the study of the influence of the most significant parameters of the side wall roughness of an ultra-thin silicon nitride lightguide layer of multimode integrated optical waveguides with widths of 3 and 8 microns. The choice of the waveguide width was made due to the need to provide multimode operation for telecommunication wavelengths, which is necessary to ensure high integration density. Scattering in waveguide structures was measured by optical frequency domain reflectometry (OFDR) of a backscattering reflectometer. The finite difference time domain method (FDTD) was used to study the effect of roughness parameters on optical losses in fabricated waveguides, the roughness parameters that most strongly affect optical scattering were determined, and methods of its significant reduction were specified. The prospects for implementing such structures on a quartz substrate are justified.

Effect of Surface Roughness on Slip Resistance of Rubber

2011 ◽  
Vol 189-193 ◽  
pp. 1538-1542
Author(s):  
Li Xiao Jia ◽  
Yong Zhen Zhang ◽  
Yong Ping Niu ◽  
San Ming Du ◽  
Jian Li
Keyword(s):  
Surface Roughness ◽  
Correlation Coefficient ◽  
Correlation Coefficients ◽  
Roughness Parameters ◽  
Test Conditions ◽  
Slip Resistance ◽  
Materials Used ◽  
Almost All ◽  
Effect Of Surface

In order to decrease accidents of slips and falls, COFs of rubber samples with different surface roughness were measured by Brungraber Mark II. And the correlation coefficients between roughness parameters and COF were calculated. The rusults have shown that the COF increases with surface roughness and the correlation coefficient between Sq and COF is highest. In general, almost all the roughness parameters used in the study have high correlation with COF. Parameters had the highest correlation with COF depends on the materials used and test conditions.

Synchrotron White-Beam X-Ray Topography Analysis of the Defect Structure of HVPE-GaN Substrates

2015 ◽  
Vol 4 (8) ◽  
pp. P324-P330 ◽  
Author(s):  
L. Kirste ◽  
A. N. Danilewsky ◽  
T. Sochacki ◽  
K. Köhler ◽  
M. Zajac ◽  
...  
Keyword(s):  
Defect Structure ◽  
X Ray ◽  
White Beam ◽  
Topography Analysis

Effect of species and grinding disc distance on the surface roughness parameters of medium density fiberboard

2016 ◽  
Vol 75 (3) ◽  
pp. 335-346 ◽  
Author(s):  
Lidia Gurau ◽  
Nadir Ayrilmis ◽  
Jan Thore Benthien ◽  
Martin Ohlmeyer ◽  
Manja Kitek Kuzman ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Medium Density Fiberboard ◽  
Medium Density ◽  
Roughness Parameters ◽  
Surface Roughness Parameters

scholarly journals Sensitivity of C-Band SAR Polarimetric Variables to the Directionality of Surface Roughness Parameters

2021 ◽  
Vol 13 (11) ◽  
pp. 2210
Author(s):  
Zohreh Alijani ◽  
John Lindsay ◽  
Melanie Chabot ◽  
Tracy Rowlandson ◽  
Aaron Berg
Keyword(s):  
Surface Roughness ◽  
Soil Moisture ◽  
Laser Scanner ◽  
Careful Attention ◽  
Roughness Parameters ◽  
Retrieval Models ◽  
Surface Roughness Parameters ◽  
The Look ◽  
The Relationship ◽  
Roughness Measurements

Surface roughness is an important factor in many soil moisture retrieval models. Therefore, any mischaracterization of surface roughness parameters (root mean square height, RMSH, and correlation length, ʅ) may result in unreliable predictions and soil moisture estimations. In many environments, but particularly in agricultural settings, surface roughness parameters may show different behaviours with respect to the orientation or azimuth. Consequently, the relationship between SAR polarimetric variables and surface roughness parameters may vary depending on measurement orientation. Generally, roughness obtained for many SAR-based studies is estimated using pin profilers that may, or may not, be collected with careful attention to orientation to the satellite look angle. In this study, we characterized surface roughness parameters in multi-azimuth mode using a terrestrial laser scanner (TLS). We characterized the surface roughness parameters in different orientations and then examined the sensitivity between polarimetric variables and surface roughness parameters; further, we compared these results to roughness profiles obtained using traditional pin profilers. The results showed that the polarimetric variables were more sensitive to the surface roughness parameters at higher incidence angles (θ). Moreover, when surface roughness measurements were conducted at the look angle of RADARSAT-2, more significant correlations were observed between polarimetric variables and surface roughness parameters. Our results also indicated that TLS can represent more reliable results than pin profiler in the measurement of the surface roughness parameters.

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