Fluorescence Fluctuation Microscopy Techniques to Study mRNA Synthesis and Dynamics

Materials other than polymers, e.g. ceramic silicates, are currently being investigated for gas separation processes. The permeation characteristics of one such material, Vycor (Corning Glass #1370), have been reported for the separation of hydrogen from hydrogen iodide. This paper will describe the electron microscopy techniques applied to reveal the porous microstructure of a Vycor membrane. The application of these techniques has led to an increased understanding in the relationship between the substructure and the gas transport properties of this material.

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Acoustic microscopy techniques for the inspection of integrated circuit devices and packages

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100129462 ◽

1992 ◽

Vol 50 (2) ◽

pp. 966-967

Author(s):

Thomas M. Moore

Keyword(s):

Integrated Circuit ◽

Acoustic Microscopy ◽

Hybrid Technique ◽

Frequency Scanning ◽

Ic Packaging ◽

Ic Package ◽

Microscopy Techniques ◽

Ic Package Inspection ◽

Pulse Echo ◽

Scanning Acoustic Microscope

In the last decade, a variety of characterization techniques based on acoustic phenomena have come into widespread use. Characteristics of matter waves such as their ability to penetrate optically opaque solids and produce image contrast based on acoustic impedance differences have made these techniques attractive to semiconductor and integrated circuit (IC) packaging researchers.These techniques can be divided into two groups. The first group includes techniques primarily applied to IC package inspection which take advantage of the ability of ultrasound to penetrate deeply and nondestructively through optically opaque solids. C-mode Acoustic Microscopy (C-AM) is a recently developed hybrid technique which combines the narrow-band pulse-echo piezotransducers of conventional C-scan recording with the precision scanning and sophisticated signal analysis capabilities normally associated with the high frequency Scanning Acoustic Microscope (SAM). A single piezotransducer is scanned over the sample and both transmits acoustic pulses into the sample and receives acoustic echo signals from the sample.

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Etching of LLDPE and LLDPE/HDPE blends

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100163460 ◽

1996 ◽

Vol 54 ◽

pp. 200-201

Author(s):

M. S. Bischel ◽

J. M. Schultz

Keyword(s):

Potassium Permanganate ◽

Morphological Features ◽

Narrow Fraction ◽

Potassium Permanganate Solution ◽

Commercial Applications ◽

Microscopy Techniques

Despite its rapidly growing use in commercial applications, the morphology of LLDPE and its blends has not been thoroughly studied by microscopy techniques. As part of a study to examine the morphology of a LLDPE narrow fraction and its blends with HDPE via SEM, TEM and AFM, an appropriate etchant is required. However, no satisfactory recipes could be found in the literature. Mirabella used n-heptane, a solvent for LLDPE, as an etchant to reveal certain morphological features in the SEM, including faint banding in spherulites. A 1992 paper by Bassett included a TEM micrograph of an axialite of LLDPE, etched in a potassium permanganate solution, but no details were given.Attempts to use n-heptane, at 60°C, as an etchant were unsuccessful: depending upon thickness, samples swelled and increased in diameter by 5-10% or more within 15 minutes. Attempts to use the standard 3.5% potassium permanganate solution for HDPE were also unsuccessful: the LLDPE was severely overetched. Weaker solutions were also too severe.

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The Effects of MRNA synthesis in the Amygdala on the Acquisition and Reconsolidation of Pavlovian Fear Conditioning

PsycEXTRA Dataset ◽

10.1037/e413812005-447 ◽

2002 ◽

Author(s):

Ryan G. Parsons ◽

Georgette M. Gafford ◽

Fred J. Helmstetter

Keyword(s):

Fear Conditioning ◽

Pavlovian Fear Conditioning ◽

Mrna Synthesis

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Case Study: Combined Dynamic Laser Stimulation and Static Emission Microscopy Techniques Applied to Scan Test Failure on Mixed Mode Device

ISTFA 2012: Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2012p0228 ◽

2012 ◽

Author(s):

Magdalena Sienkiewicz ◽

Philippe Rousseille

Keyword(s):

Mixed Mode ◽

Laser Stimulation ◽

Scan Test ◽

Silicon Bulk ◽

Defect Localization ◽

Emission Microscopy ◽

Microscopy Techniques ◽

Test Failure

Abstract This paper presents a case study on scan test reject in a mixed mode IC. It focuses on the smart use of combined mature FA techniques, such as Soft Defect Localization (SDL) and emission microscopy (EMMI), to localize a random scan test anomaly at the silicon bulk level.

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Case Study in Fault Isolation of a Metal Short for Yield Enhancement

ISTFA 2010: Conference Proceedings from the 36th International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2010p0049 ◽

2010 ◽

Author(s):

Sarven Ipek ◽

David Grosjean

Keyword(s):

Failure Analysis ◽

Failure Mechanism ◽

Photon Emission ◽

Fault Isolation ◽

Yield Enhancement ◽

Analysis Technique ◽

Laser Signal ◽

Signal Injection ◽

Microscopy Techniques

Abstract The application of an individual failure analysis technique rarely provides the failure mechanism. More typically, the results of numerous techniques need to be combined and considered to locate and verify the correct failure mechanism. This paper describes a particular case in which different microscopy techniques (photon emission, laser signal injection, and current imaging) gave clues to the problem, which then needed to be combined with manual probing and a thorough understanding of the circuit to locate the defect. By combining probing of that circuit block with the mapping and emission results, the authors were able to understand the photon emission spots and the laser signal injection microscopy (LSIM) signatures to be effects of the defect. It also helped them narrow down the search for the defect so that LSIM on a small part of the circuit could lead to the actual defect.

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Failure Analysis of Killer Defects and Yield Enhancement of Flat ROM Devices in Wafer Fabrication

ISTFA 2000: Conference Proceedings from the 26th International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2000p0063 ◽

2000 ◽

Author(s):

Y. N. Hua ◽

Z. R. Guo ◽

L. H. An ◽

Shailesh Redkar

Keyword(s):

Electron Microscope ◽

Failure Analysis ◽

Fault Isolation ◽

Yield Enhancement ◽

Wafer Fabrication ◽

X Ray ◽

Particle Contamination ◽

Emission Microscopy ◽

Microscopy Techniques ◽

Scanning Electron

Abstract In this paper, some low yield cases in Flat ROM device (0.45 and 0.6 µm) were investigated. To find killer defects and particle contamination, KLA, bitmap and emission microscopy techniques were used in fault isolation. Reactive ion etching (RIE) and chemical delayering, 155 Wright Etch, BN+ Etch and scanning electron microscope (SEM) were used for identification and inspection of defects. In addition, energy-dispersive X-ray microanalysis (EDX) was used to determine the composition of the particle or contamination. During failure analysis, seven kinds of killer defects and three killer particles were found in Flat ROM devices. The possible root causes, mechanisms and elimination solutions of these killer defects/particles were also discussed.

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Application of Backside Photo and Thermal Emission Microscopy Techniques to Advanced Memory Devices

ISTFA 1997: Conference Proceedings from the 23rd International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa1997p0063 ◽

1997 ◽

Author(s):

S.-S. Lee ◽

J.-S. Seo ◽

N.-S. Cho ◽

S. Daniel

Keyword(s):

Thermal Emission ◽

Test Cases ◽

Memory Devices ◽

Front Side ◽

Emission Analysis ◽

Intensity Attenuation ◽

Analysis Techniques ◽

Defect Sites ◽

Emission Microscopy ◽

Microscopy Techniques

Abstract Both photo- and thermal emission analysis techniques are used from the backside of the die colocate defect sites. The technique is important in that process and package technologies have made front-side analysis difficult or impossible. Several test cases are documented. Intensity attenuation through the bulk of the silicon does not compromise the usefulness of the technique in most cases.

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Nanoscale Structural and Chemical Segregation in Pt50Ru50 Electrocatalysts

Microscopy and Microanalysis ◽

10.1017/s1431927600031639 ◽

2001 ◽

Vol 7 (S2) ◽

pp. 1112-1113

Author(s):

Rhonda M. Stroud ◽

Jeffrey W. Long ◽

Karen E. Swider-Lyons ◽

Debra R. Rolison

Keyword(s):

Methanol Oxidation ◽

Structural Heterogeneity ◽

Oxidation Activity ◽

Bimetallic Alloy ◽

Transmission Electron ◽

Chemical Segregation ◽

High Fraction ◽

Argon Mixture ◽

Microscopy Techniques ◽

Electron Energy Loss

To address how the chemical and structural heterogeneity of Pt50Ru50 nanoparticles affects methanol oxidation activity, we have employed an arsenal of transmission electron microscopy techniques (conventional bright field-imaging, selected area diffraction, atomic-resolution lattice imaging, electron-energy loss spectroscopy, and energy-dispersive x-ray spectroscopy) to characterize 2.5-nm particles in differing oxidation and hydration states. Our studies demonstrate that electrocatalysts containing a high fraction of Ru-rich hydrous oxide, as apposed to the anhydrous PtRu bimetallic alloy, have as much as 250x higher methanol oxidation activityThe nominally 2.5-nm Pt50Ru50 particles were studied in as-received, reduced and reoxidized forms. The reducing treatment consisted of 2 h at 100 °C in flowing 10% PL/argon mixture. For re-oxidation, the reduced particles were heated for 20 h at 100 °C in an H2O-saturated oxygen atmosphere. The particles were suspended in methanol, and pipetted onto holey-carboncoated Cu grids for TEM studies.

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Biofilm Formation in Xanthomonas arboricola pv. pruni: Structure and Development

Agronomy ◽

10.3390/agronomy11030546 ◽

2021 ◽

Vol 11 (3) ◽

pp. 546

Author(s):

Pilar Sabuquillo ◽

Jaime Cubero

Keyword(s):

Biofilm Formation ◽

Extracellular Polymeric Substances ◽

Environmental Changes ◽

Nutrient Content ◽

Infection Process ◽

Bacterial Attachment ◽

Key Factors ◽

Cell Structures ◽

Microscopy Techniques

Xanthomonasarboricola pv. pruni (Xap) causes bacterial spot of stone fruit and almond, an important plant disease with a high economic impact. Biofilm formation is one of the mechanisms that microbial communities use to adapt to environmental changes and to survive and colonize plants. Herein, biofilm formation by Xap was analyzed on abiotic and biotic surfaces using different microscopy techniques which allowed characterization of the different biofilm stages compared to the planktonic condition. All Xap strains assayed were able to form real biofilms creating organized structures comprised by viable cells. Xap in biofilms differentiated from free-living bacteria forming complex matrix-encased multicellular structures which become surrounded by a network of extracellular polymeric substances (EPS). Moreover, nutrient content of the environment and bacterial growth have been shown as key factors for biofilm formation and its development. Besides, this is the first work where different cell structures involved in bacterial attachment and aggregation have been identified during Xap biofilm progression. Our findings provide insights regarding different aspects of the biofilm formation of Xap which improve our understanding of the bacterial infection process occurred in Prunus spp and that may help in future disease control approaches.

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